JPH04258826A - Information recording and/or reproducing device - Google Patents

Information recording and/or reproducing device

Info

Publication number
JPH04258826A
JPH04258826A JP4249191A JP4249191A JPH04258826A JP H04258826 A JPH04258826 A JP H04258826A JP 4249191 A JP4249191 A JP 4249191A JP 4249191 A JP4249191 A JP 4249191A JP H04258826 A JPH04258826 A JP H04258826A
Authority
JP
Japan
Prior art keywords
movable part
piezoelectric element
frame
spring
information recording
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4249191A
Other languages
Japanese (ja)
Other versions
JP2934037B2 (en
Inventor
Masahiro Tagawa
昌宏 多川
Toshihiko Miyazaki
俊彦 宮▲崎▼
Toshimitsu Kawase
俊光 川瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP4249191A priority Critical patent/JP2934037B2/en
Publication of JPH04258826A publication Critical patent/JPH04258826A/en
Application granted granted Critical
Publication of JP2934037B2 publication Critical patent/JP2934037B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Control Of Position Or Direction (AREA)

Abstract

PURPOSE:To improve driving accuracy for a probe mounted on the movable part and to attain high speed driving by supporting a frame with parallel springs within a frame-shaped base and also supporting the movable part with parallel springs within the frame. CONSTITUTION:The frame 41 is supported inside of the frame-shaped base 40 through elastic hinge springs 42, and further the movable part 43 mounted with a probe electrode is supported inside of the frame 41 through elastic hinge springs 44. Then, a piezoelectric element 45 for the y-direction and a piezoelectric element 46 for the x-direction are mounted, thereby the movable part 43 is driven in the x,y-directions. As a result, the movement of movable part 43 can be made independently in two axial directions, therefore, the accuracy of positional control for writing/reading is high, and a high speed scanning is easily made, then the error for writing/reading is reduced.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、針状電極を用いて記録
媒体に対し情報を記録し、また記録媒体から情報を再生
する情報記録及び/又は再生装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an information recording and/or reproducing apparatus for recording information on and reproducing information from a recording medium using needle-like electrodes.

【0002】0002

【従来の技術】近年、走査型トンネル顕微鏡の原理を応
用した情報記録再生装置の研究が進められている。走査
型トンネル顕微鏡(以下STMと云う)が開発され、[
G.Binnig et al.,Helvetica
 Physica Acta.,55,726(198
2)]、単結晶、非結晶を問わず実空間で高い分解能を
有する測定ができるようになった。STMは金属の探針
と導電性物質の間に電圧を加えて、1nm程度の距離ま
で近付けるとトンネル電流が流れることを利用している
。 この電流は両者の間の距離変化に非常に敏感なため、ト
ンネル電流を一定に保つように探針を走査することによ
り、導電性物質の表面の実空間像を高い分解能で測定す
ることができる。
2. Description of the Related Art In recent years, research has been progressing on information recording and reproducing devices that apply the principles of scanning tunneling microscopes. A scanning tunneling microscope (hereinafter referred to as STM) was developed, and
G. Binnig et al. , Helvetica
Physica Acta. ,55,726(198
2)], it has become possible to perform measurements with high resolution in real space, regardless of whether it is single crystal or amorphous. STM utilizes the fact that a tunnel current flows when a voltage is applied between a metal probe and a conductive substance and the probe is brought close to a distance of about 1 nm. This current is very sensitive to changes in the distance between the two, so by scanning the probe while keeping the tunneling current constant, it is possible to measure a real space image of the surface of a conductive material with high resolution. .

【0003】STMを用いた測定は導電性材料に限られ
るが、導電性材料の表面に薄く形成された絶縁膜の構造
解析にも応用され始めている。更に、STMは微小電流
を検知する方法を用いているため、測定材料に損傷を与
えず、かつ低電力で観察できる利点をも有する。また、
超高真空中のみならず大気中、溶媒中でも動作し、種々
の材料に対して用いることができるため、広範囲な応用
が期待されている。
Although measurement using STM is limited to conductive materials, it is also beginning to be applied to structural analysis of thin insulating films formed on the surfaces of conductive materials. Furthermore, since STM uses a method of detecting minute currents, it has the advantage of not damaging the measurement material and allowing observation with low power. Also,
It operates not only in ultra-high vacuum, but also in the atmosphere and in solvents, and can be used with a variety of materials, so it is expected to have a wide range of applications.

【0004】このようなSTMを応用して、使用中に高
密度に情報を書込み、呼び出す情報記録及び/又は再生
装置には、探針つまりプローブ電極をxy方向に微動移
動させるための微動機構が用いられている。従来の微動
機構には、圧電素子を可動部の片側にのみ配置する片押
しタイプと、可動部の両側に一対の圧電素子の伸縮特性
を逆にして配した圧電素子に、位相が逆の駆動電圧を加
える両押しタイプに大別される。
[0004] An information recording and/or reproducing device that uses STM to write and retrieve information at high density during use has a fine movement mechanism for finely moving the probe tip, that is, the probe electrode, in the x and y directions. It is used. Conventional fine movement mechanisms include a single push type in which a piezoelectric element is placed only on one side of the movable part, and a drive type in which a pair of piezoelectric elements with opposite expansion and contraction characteristics are placed on both sides of the movable part, with opposite phases. It is broadly divided into double push type that applies voltage.

【0005】図4は片押しタイプのものを示した平面図
であり、一体切欠形ばね機構による2自由度微動機構と
なっている。部材1は切り欠きによってL字形の固定部
1aとその他の部分に分かれ、固定部1aのx方向に平
行な腕の内側に、y方向に平行な2個のリンク1bを介
して第1の可動部1cが支持され、可動部1cは固定部
1aに対してx方向に可動とされている。この可動部1
aのy方向に平行な腕の内側にx方向に平行な2個のリ
ンク1dを介して第2の可動部1eが支持されている。 固定部1aのy方向での先端と第1の可動部1cの間に
圧電素子2が取り付けられ、圧電素子2の伸縮により第
1の可動部1cはx方向に駆動される。また、第1の可
動部1cと第2の可動部1e内に圧電素子3が取り付け
られ、この圧電素子3の伸縮により第2の可動部1eは
第1の可動部1cに対してy方向に駆動される。この機
構では、圧電素子2、3に加える電圧によって、第2の
可動部1eを固定部1aに対してxy平面内で移動する
ことができる。
[0005] FIG. 4 is a plan view showing a one-sided push type, which has a two-degree-of-freedom fine movement mechanism using an integral notched spring mechanism. The member 1 is divided into an L-shaped fixed part 1a and other parts by a notch, and a first movable part is connected to the inside of the arm of the fixed part 1a parallel to the x direction via two links 1b parallel to the y direction. The portion 1c is supported, and the movable portion 1c is movable in the x direction with respect to the fixed portion 1a. This movable part 1
A second movable portion 1e is supported inside the arm parallel to the y direction of a through two links 1d parallel to the x direction. A piezoelectric element 2 is attached between the tip of the fixed part 1a in the y direction and the first movable part 1c, and the expansion and contraction of the piezoelectric element 2 drives the first movable part 1c in the x direction. Moreover, a piezoelectric element 3 is attached in the first movable part 1c and the second movable part 1e, and the expansion and contraction of the piezoelectric element 3 causes the second movable part 1e to move in the y direction with respect to the first movable part 1c. Driven. In this mechanism, the second movable part 1e can be moved within the xy plane with respect to the fixed part 1a by voltage applied to the piezoelectric elements 2 and 3.

【0006】図5は両押しタイプの微動機構の斜視図で
あり、探針10にはx方向に伸縮する圧電素子11a、
11bがx方向の両側に取り付けられ、y方向に伸縮す
る圧電素子12a、12bがy方向の両側に取り付けら
れ、上方からはz方向に伸縮する圧電素子13が取り付
けられている。圧電素子11〜13の他端は図示しない
固定部に固定されている。圧電素子11、12に加える
電圧により、探針10をxy平行面で駆動できる。
FIG. 5 is a perspective view of a double push type fine movement mechanism, in which the probe 10 includes a piezoelectric element 11a that expands and contracts in the x direction;
11b is attached to both sides in the x direction, piezoelectric elements 12a and 12b that expand and contract in the y direction are attached to both sides in the y direction, and a piezoelectric element 13 that expands and contracts in the z direction is attached from above. The other ends of the piezoelectric elements 11 to 13 are fixed to a fixed part (not shown). The probe 10 can be driven in the xy parallel plane by the voltage applied to the piezoelectric elements 11 and 12.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、片押し
タイプの微動機構では圧電素子2、3の温度ドリフトに
よる変位ずれが生じ易く、これを防止するために温度を
高精度で制御すると装置全体を巨大化せざるを得ず、電
気的に温度ドリフトを補正することも容易ではない。ま
た、両押しタイプの場合は温度ドリフトは相殺されるが
、圧電素子11、12を直接に探針10に接合している
ため、x方向とy方向の駆動が完全に独立にはならず、
正確な位置決めが不可能で、高速走査に向いていない。 そして、何れの微動機構も剛性強化が難しいという問題
点を有する。
[Problems to be Solved by the Invention] However, in the single-push type fine movement mechanism, displacement deviation due to temperature drift of the piezoelectric elements 2 and 3 tends to occur, and if the temperature is controlled with high precision to prevent this, the entire device will become huge. It is not easy to electrically correct temperature drift. In addition, in the case of the double push type, the temperature drift is canceled out, but since the piezoelectric elements 11 and 12 are directly connected to the probe 10, the drives in the x and y directions are not completely independent.
Accurate positioning is not possible and it is not suitable for high-speed scanning. Both fine movement mechanisms have the problem that it is difficult to strengthen their rigidity.

【0008】本発明の目的は、圧電素子の温度ドリフト
による可動部の変位がなく、同一面内での2つの軸方向
の駆動が独立していて、かつ駆動機構の剛性強化が容易
な情報記録及び/又は再生装置を提供することにある。
An object of the present invention is to provide information recording in which there is no displacement of the movable part due to temperature drift of the piezoelectric element, the two axial directions are driven independently within the same plane, and the rigidity of the drive mechanism can be easily strengthened. and/or to provide a reproduction device.

【0009】[0009]

【課題を解決するための手段】上述の目的を達成するた
めの本発明に係る情報記録及び/又は再生装置は、書込
み及び読み出しを行うプローブ電極と、該プローブ電極
に対向して設けた記録媒体を相対移動させ情報の記録及
び/又は再生を行う固定部に対し、第1の可動部を第1
の軸方向に案内する第1のばねと、前記第1の可動部を
挟んで前記第1の軸方向に直列に対向して前記固定部に
設けた第1の圧電素子と、前記第1の可動部に対し第2
の可動部を第2の軸方向に案内する第2のばねと、前記
第2の可動部を挟んで前記第2の軸方向に直列に対向し
て前記第1の可動部に設けた第2の圧電素子とから成る
微動機構の第2の可動部に、前記プローブ又は前記記録
媒体を保持することを特徴とするものである。
[Means for Solving the Problems] An information recording and/or reproducing apparatus according to the present invention for achieving the above object includes a probe electrode for writing and reading, and a recording medium provided opposite to the probe electrode. The first movable part is moved relative to the fixed part that records and/or reproduces information.
a first spring that guides in the axial direction of the first piezoelectric element, a first piezoelectric element provided on the fixed part facing in series in the first axial direction with the first movable part in between; 2nd to the movable part
a second spring that guides the movable part in the second axial direction; and a second spring provided on the first movable part facing in series in the second axial direction with the second movable part in between. The probe or the recording medium is held in a second movable part of a fine movement mechanism comprising a piezoelectric element.

【0010】0010

【作用】上述の構成を有する情報記録及び/又は再生装
置は、第1の圧電素子に加える電圧により、第1の可動
部を介して第2の可動部の第1の軸方向の移動及び位置
決めを行い、第2の圧電素子に加える電圧により第2の
可動部の第2の軸方向の移動及び位置決めを行い、第2
の可動部に保持されたプローブ又は記録媒体の相対位置
を変化させる。
[Operation] The information recording and/or reproducing device having the above-mentioned configuration moves and positions the second movable part in the first axial direction via the first movable part by applying a voltage to the first piezoelectric element. The second movable part is moved and positioned in the second axial direction by the voltage applied to the second piezoelectric element, and the second
The relative position of the probe or the recording medium held by the movable part of is changed.

【0011】[0011]

【実施例】本発明を図1〜図3に図示の実施例に基づい
て詳細に説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be explained in detail based on the embodiments shown in FIGS. 1 to 3.

【0012】図1は情報記録及び/又は再生装置の構成
図であり、xy方向粗動機構21の上に記録媒体22が
載置され、xy面内での粗動が可能とされており、この
上方にz方向微動粗動機構23が配設され、その下面の
被駆動部に取り付けられたxy方向微動機構24は、電
解研磨法で作成されたタングステン製のプローブ電極2
5を駆動可能に支持し、プローブ電極25の先端は記録
媒体22の表面に近接している。記録媒体22はガラス
を研磨して製作した基板26の上に、クロムを下引層と
して金(Au)を真空蒸着して下地電極27を形成し、
その上にグラファイト(HOPG)から成る記録層28
を導電性接着剤で接着したものであり、記録層28の表
面の記録再生領域は劈開により原子オーダで平滑にされ
ている。一方、情報記録及び/又は再生装置の上位装置
との接続を行うインタフェース29は以下の電気回路を
介して上記の駆動機構及び記録媒体22とプローブ電極
25に接続されている。つまり、情報記録及び/又は再
生装置内の各ブロック間の相互動作の集中制御を行う制
御回路30、書込み読出しデータを制御回路30からの
指示により書込んだり読出したりする書込読出回路31
、この書込読出回路31からの信号に基づいて、x方向
とy方向との間にパルス状電圧を印加しデータを書込み
、読出し時には読出し電圧を印加する電圧印加回路32
、x方向とy方向との間に流れる電流を増幅し、これを
読出し時には読出し情報信号として書込読出回路31に
送る電圧増幅回路33、制御回路30等の指示により電
圧増幅回路33や後述する位置検出回路の信号を基にx
方向やy方向の位置を決定する位置決め回路34、この
位置決め回路34からのサーボ信号を基にx方向やy方
向の位置をサーボ制御するサーボ回路35、サーボ回路
35の信号に従ってz方向微動粗動機構23を駆動する
z方向駆動回路36、サーボ回路35の信号に従いxy
方向微動機構24やxy方向粗動機構21を駆動するx
y方向駆動回路37、x方向とy方向との相対位置を検
出する位置検出回路38が設けられている。
FIG. 1 is a configuration diagram of an information recording and/or reproducing apparatus, in which a recording medium 22 is placed on an xy direction coarse movement mechanism 21, and coarse movement within the xy plane is possible. A z-direction fine movement coarse movement mechanism 23 is arranged above this, and an xy-direction fine movement mechanism 24 attached to the driven part on the lower surface is a probe electrode 2 made of tungsten made by electrolytic polishing.
The tip of the probe electrode 25 is close to the surface of the recording medium 22. The recording medium 22 is made by vacuum-depositing gold (Au) using chromium as an undercoat layer on a substrate 26 made by polishing glass to form a base electrode 27.
Thereon a recording layer 28 made of graphite (HOPG)
are bonded together with a conductive adhesive, and the recording/reproducing area on the surface of the recording layer 28 is smoothed on the atomic order by cleavage. On the other hand, an interface 29 for connecting the information recording and/or reproducing apparatus to a host device is connected to the drive mechanism, recording medium 22, and probe electrode 25 via the following electric circuit. That is, a control circuit 30 performs centralized control of mutual operations between blocks in the information recording and/or reproducing apparatus, and a write/read circuit 31 writes/reads write/read data according to instructions from the control circuit 30.
, a voltage application circuit 32 that applies a pulse voltage between the x direction and the y direction to write data based on the signal from the write/read circuit 31, and applies a read voltage during reading.
, amplifies the current flowing between the x direction and the y direction, and sends this as a read information signal to the write/read circuit 31 when reading out the voltage amplifying circuit 33 according to instructions from the control circuit 30, etc. x based on the signal of the position detection circuit
A positioning circuit 34 that determines the position in the direction and y direction, a servo circuit 35 that servo controls the position in the x direction and y direction based on the servo signal from the positioning circuit 34, and fine and coarse movement in the z direction according to the signal of the servo circuit 35. xy according to the signals from the z-direction drive circuit 36 and servo circuit 35 that drive the mechanism 23
x that drives the direction fine movement mechanism 24 and the xy direction coarse movement mechanism 21
A y-direction drive circuit 37 and a position detection circuit 38 for detecting relative positions in the x and y directions are provided.

【0013】次に、xy方向微動機構24の構成を図2
の平面図に基づいて説明する。z方向微動粗動機構23
によって紙面に垂直なz方向に可動に支持された枠状の
ベース40の内側に、同様に枠状のフレーム41がx方
向に平行な弾性ヒンジばね42を介して支持され、更に
正方形の可動部43がy方向に平行な弾性ヒンジばね4
4を介してフレーム41の内側に支持されている。弾性
ヒンジばね42はベース40とフレーム41の間のy軸
に平行な部分に2個ずつ取り付けられて平行ばねを構成
し、ベース40に対してフレーム41をy方向に微動可
能としており、弾性ヒンジばね44は同様にx軸に平行
な可動部43とフレーム41の間の部分で、フレーム4
1に対して可動部43をx方向に微動可能としている。 また、ベース40とフレーム41のx軸に平行な2つの
間隙には、y方向に伸縮可能なy方向圧電素子45a、
45bがそれぞれ挟設され、フレーム41と可動部43
のy軸に平行な2つの間隙x方向に伸縮可能なx方向圧
電素子46a、46bがそれぞれ挟設されている。そし
て、可動部43には図1に示すプローブ電極25が取り
付けられ駆動されるようになっており、可動部43をx
方向プラス側に動かすには2つのx方向圧電素子46a
、46bのうち、x方向マイナス側に位置するx方向圧
電素子46aに伸長するような極性の電圧を印加し、x
方向プラス側に位置するx方向圧電素子46bに縮小す
るように電圧を印加する。また、例えば可動部43をy
方向プラス側に動かす場合には、y方向圧電素子45a
に縮小する方向に電圧を印加して、圧電素子45bに伸
長するように電圧を印加して、フレーム41をy方向プ
ラス側に移動することにより、可動部43も共にy方向
に移動される。このように、可動部43は弾性ヒンジば
ね42、44によってx方向とy方向が独立して、圧電
素子45、46により駆動できる。
Next, the configuration of the xy direction fine movement mechanism 24 is shown in FIG.
The explanation will be based on the plan view. Z-direction fine and coarse movement mechanism 23
A frame-shaped frame 41 is similarly supported via an elastic hinge spring 42 parallel to the x-direction on the inside of a frame-shaped base 40 supported movably in the z-direction perpendicular to the plane of the paper, and a square movable part 43 is an elastic hinge spring 4 parallel to the y direction
4 is supported inside the frame 41. The elastic hinge springs 42 are attached in pairs parallel to the y-axis between the base 40 and the frame 41 to form parallel springs, and allow the frame 41 to move slightly in the y direction with respect to the base 40. Similarly, the spring 44 is a part between the movable part 43 and the frame 41 parallel to the x-axis, and is located between the frame 4
1, the movable part 43 can be moved slightly in the x direction. Further, in the two gaps between the base 40 and the frame 41 parallel to the x-axis, a y-direction piezoelectric element 45a that can be expanded and contracted in the y-direction,
45b are sandwiched between the frame 41 and the movable part 43.
X-direction piezoelectric elements 46a and 46b, which can be expanded and contracted in the x-direction, are sandwiched between two gaps parallel to the y-axis of the y-axis. The probe electrode 25 shown in FIG. 1 is attached to the movable part 43 and driven, and the movable part 43 is
To move in the positive direction, two x-direction piezoelectric elements 46a are used.
, 46b, a voltage with a polarity such that it expands is applied to the x-direction piezoelectric element 46a located on the negative side of the x-direction,
A voltage is applied to the x-direction piezoelectric element 46b located on the positive side of the direction so as to reduce the size. For example, the movable part 43 may be
When moving in the positive direction, the y-direction piezoelectric element 45a
By applying a voltage in the direction of contraction to the piezoelectric element 45b and applying a voltage to the piezoelectric element 45b so as to make it expand, the frame 41 is moved to the positive side in the y direction, so that the movable part 43 is also moved in the y direction. In this way, the movable portion 43 can be driven by the piezoelectric elements 45 and 46 independently in the x direction and the y direction by the elastic hinge springs 42 and 44.

【0014】次に、情報記録及び/又は再生装置の動作
を説明する。プローブ電極25は記録媒体22との接触
を避けるため、初期位置は稍々上方にあり、使用時には
z方向微動粗動機構23によって記録媒体22に接近さ
れる。このとき、電圧印加回路32により200mVの
読取り電圧をプローブ電極25と記録媒体22の下地電
極27の間に印加しておき、電流増幅回路33で検出し
ている電流が100pAになるまで接近させ、z方向微
動粗動機構23を保持し、その後にxy方向微動機構2
4を用いて記録媒体22上を走査して記録再生を行う。 記録は記録媒体22の記録領域上を1列ずつプローブ電
極25で走査しながら、制御回路30で指令された書込
み位置で電圧印加回路32よりパルス状電圧を印加する
ことにより行われる。このパルス状電圧はパルス高さ4
V、パルス幅1μSであり、グラファイト膜の電圧を印
加された部分が凹状に変化するための閾値である。再生
は電圧印加回路32よりプローブ電極25と下地電極2
7の間に200mVの読み取り電圧を印加しながら、x
y方向微動機構24を用いてプローブ電極25で記録領
域を走査し、電流増幅回路33での電流の変化から読み
取りを行う。実験では、可動部43のx方向の固有振動
数は約3kHzであり、y方向の固有振動数は約1.5
kHzであった。また、記録ビットの寸法は直径4nm
であり、書き込み及び読み出しの条件は上記の例には限
定されることはない。
Next, the operation of the information recording and/or reproducing apparatus will be explained. In order to avoid contact with the recording medium 22, the probe electrode 25 is initially positioned slightly above the probe electrode 25, and is brought close to the recording medium 22 by the z-direction fine and coarse movement mechanism 23 during use. At this time, a read voltage of 200 mV is applied between the probe electrode 25 and the base electrode 27 of the recording medium 22 by the voltage application circuit 32, and the probe electrodes 25 and the base electrode 27 of the recording medium 22 are brought close together until the current detected by the current amplification circuit 33 reaches 100 pA. The z-direction fine movement mechanism 23 is held, and then the xy-direction fine movement mechanism 2 is held.
4 to scan the recording medium 22 for recording and reproduction. Recording is performed by applying a pulsed voltage from the voltage application circuit 32 at a write position commanded by the control circuit 30 while scanning the recording area of the recording medium 22 one row at a time with the probe electrode 25 . This pulsed voltage has a pulse height of 4
V and a pulse width of 1 μS, which is the threshold value for the part of the graphite film to which voltage is applied to change into a concave shape. Reproduction is performed using the voltage application circuit 32 between the probe electrode 25 and the base electrode 2.
x while applying a reading voltage of 200 mV during 7
The recording area is scanned with the probe electrode 25 using the y-direction fine movement mechanism 24, and reading is performed from changes in the current in the current amplification circuit 33. In the experiment, the natural frequency of the movable part 43 in the x direction was approximately 3 kHz, and the natural frequency in the y direction was approximately 1.5.
It was kHz. Also, the recording bit size is 4 nm in diameter.
The write and read conditions are not limited to the above example.

【0015】図3は第2の実施例のxy方向微動機構2
4の平面図を示し、第1の実施例の弾性ヒンジばね42
、44の代りに平行板ばね51、52が用いられている
。ベース40の内側に2組の平行板ばね51を介してフ
レーム41がy方向に可動に支持され、y方向圧電素子
45a、45bによりy方向に結合され、y方向に駆動
されるようになっており、フレーム41の内側の可動部
43は平行板ばね52によりx方向に可動とされ、x方
向圧電素子46a、46bによりx方向に駆動されるよ
うになっている。また、図示しない記録媒体はマイカを
劈開して得られた平滑な基板の上に金をエピタキシャル
成長させ、電気メモリ効果を有するスクアリリウム−ビ
ス−6−オクチルアズレンをLB法により8層累積した
ものを用いている。その他の構成は第1の実施例と同様
であり、この実施例では従来のものよりも位置決め精度
が向上し、これによる書込み読み出しエラーが改善され
た。
FIG. 3 shows the xy direction fine movement mechanism 2 of the second embodiment.
4 shows a top view of the elastic hinge spring 42 of the first embodiment.
, 44 are replaced by parallel leaf springs 51, 52. A frame 41 is supported movably in the y direction inside the base 40 via two sets of parallel plate springs 51, and is coupled in the y direction by y direction piezoelectric elements 45a and 45b, so that it can be driven in the y direction. The movable portion 43 inside the frame 41 is movable in the x direction by a parallel plate spring 52, and is driven in the x direction by x direction piezoelectric elements 46a and 46b. The recording medium (not shown) is made by epitaxially growing gold on a smooth substrate obtained by cleaving mica, and stacking 8 layers of squarylium-bis-6-octylazulene, which has an electric memory effect, by the LB method. ing. The rest of the configuration is the same as the first embodiment, and in this embodiment, positioning accuracy is improved compared to the conventional one, and write/read errors caused by this are improved.

【0016】以上の実施例では、何れも可動部43つま
りプローブ電極25のxy方向の微動がx軸とy軸で独
立に行われるため、位置決め精度が向上し、高速走査が
可能である。
In all of the embodiments described above, the movable portion 43, that is, the probe electrode 25, is finely moved in the x and y directions independently on the x and y axes, so that positioning accuracy is improved and high-speed scanning is possible.

【0017】なお、実施例では情報記録再生装置に、x
y方向微動機構を適用したが、STMの走査機構に用い
るものとしてもよい。
In the embodiment, x
Although the y-direction fine movement mechanism is used, it may also be used as an STM scanning mechanism.

【0018】[0018]

【発明の効果】以上説明したように本発明に係る情報記
録及び/又は再生装置は、可動部の移動が、2つの軸方
向で独立に行えるため、書き込み、読み出しの位置制御
の精度が高く、高速走査が容易であり、書き込み読み出
しエラーが少ない。
As explained above, in the information recording and/or reproducing apparatus according to the present invention, since the movable part can be moved independently in two axial directions, the accuracy of position control for writing and reading is high. High-speed scanning is easy and there are fewer write/read errors.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】第1の実施例のブロック回路構成図である。FIG. 1 is a block circuit configuration diagram of a first embodiment.

【図2】xy方向微動機構の平面図である。FIG. 2 is a plan view of the xy direction fine movement mechanism.

【図3】第2の実施例のxy方向微動機構の平面図であ
る。
FIG. 3 is a plan view of the xy direction fine movement mechanism of the second embodiment.

【図4】従来の片押しタイプの微動機構の平面図である
FIG. 4 is a plan view of a conventional single-push type fine movement mechanism.

【図5】従来の両押しタイプの微動機構の平面図である
FIG. 5 is a plan view of a conventional double push type fine movement mechanism.

【符号の説明】[Explanation of symbols]

40  ベース 41  フレーム 42、44  弾性ヒンジばね 43  可動部 45  y方向圧電素子 46  x方向圧電素子 51、52  平行板ばね 40 base 41 Frame 42, 44 Elastic hinge spring 43 Movable part 45 y-direction piezoelectric element 46 x direction piezoelectric element 51, 52 Parallel leaf spring

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】  書込み及び読み出しを行うプローブ電
極と、該プローブ電極に対向して設けた記録媒体を相対
移動させ情報の記録及び/又は再生を行う固定部に対し
、第1の可動部を第1の軸方向に案内する第1のばねと
、前記第1の可動部を挟んで前記第1の軸方向に直列に
対向して前記固定部に設けた第1の圧電素子と、前記第
1の可動部に対し第2の可動部を第2の軸方向に案内す
る第2のばねと、前記第2の可動部を挟んで前記第2の
軸方向に直列に対向して前記第1の可動部に設けた第2
の圧電素子とから成る微動機構の第2の可動部に、前記
プローブ又は前記記録媒体を保持することを特徴とする
情報記録及び/又は再生装置。
Claim 1: A first movable part is connected to a fixed part that records and/or reproduces information by relatively moving a probe electrode that performs writing and reading and a recording medium provided opposite to the probe electrode. a first spring guided in the axial direction of the first piezoelectric element; a first piezoelectric element provided on the fixed part facing in series in the first axial direction with the first movable part in between; a second spring that guides the second movable part in the second axial direction with respect to the movable part; and a second spring that faces the second movable part in series in the second axial direction with the second movable part in between. The second part provided in the movable part
An information recording and/or reproducing apparatus characterized in that the probe or the recording medium is held in a second movable part of a fine movement mechanism comprising a piezoelectric element.
【請求項2】  前記第2の軸方向を主走査方向とした
請求項1に記載の情報記録及び/又は再生装置。
2. The information recording and/or reproducing apparatus according to claim 1, wherein the second axis direction is a main scanning direction.
【請求項3】  前記ばねを板ばねとした請求項1に記
載の情報記録及び/又は再生装置。
3. The information recording and/or reproducing apparatus according to claim 1, wherein the spring is a leaf spring.
【請求項4】  前記ばねを弾性ヒンジばねとした請求
項1に記載の情報記録及び/又は再生装置。
4. The information recording and/or reproducing apparatus according to claim 1, wherein the spring is an elastic hinge spring.
【請求項5】  前記圧電素子を積層型とした請求項1
に記載の情報記録及び/又は再生装置。
5. Claim 1, wherein the piezoelectric element is of a laminated type.
The information recording and/or reproducing device described in .
JP4249191A 1991-02-13 1991-02-13 Information recording and / or playback device Expired - Fee Related JP2934037B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4249191A JP2934037B2 (en) 1991-02-13 1991-02-13 Information recording and / or playback device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4249191A JP2934037B2 (en) 1991-02-13 1991-02-13 Information recording and / or playback device

Publications (2)

Publication Number Publication Date
JPH04258826A true JPH04258826A (en) 1992-09-14
JP2934037B2 JP2934037B2 (en) 1999-08-16

Family

ID=12637533

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4249191A Expired - Fee Related JP2934037B2 (en) 1991-02-13 1991-02-13 Information recording and / or playback device

Country Status (1)

Country Link
JP (1) JP2934037B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7855946B2 (en) 2007-03-27 2010-12-21 Kabushiki Kaisha Toshiba Recording and reproducing apparatus provided with probe memory

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7855946B2 (en) 2007-03-27 2010-12-21 Kabushiki Kaisha Toshiba Recording and reproducing apparatus provided with probe memory

Also Published As

Publication number Publication date
JP2934037B2 (en) 1999-08-16

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