JPH0425663Y2 - - Google Patents

Info

Publication number
JPH0425663Y2
JPH0425663Y2 JP567384U JP567384U JPH0425663Y2 JP H0425663 Y2 JPH0425663 Y2 JP H0425663Y2 JP 567384 U JP567384 U JP 567384U JP 567384 U JP567384 U JP 567384U JP H0425663 Y2 JPH0425663 Y2 JP H0425663Y2
Authority
JP
Japan
Prior art keywords
input
test
board
output contact
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP567384U
Other languages
English (en)
Japanese (ja)
Other versions
JPS60118975U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP567384U priority Critical patent/JPS60118975U/ja
Publication of JPS60118975U publication Critical patent/JPS60118975U/ja
Application granted granted Critical
Publication of JPH0425663Y2 publication Critical patent/JPH0425663Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
JP567384U 1984-01-17 1984-01-17 プリント板試験治具 Granted JPS60118975U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP567384U JPS60118975U (ja) 1984-01-17 1984-01-17 プリント板試験治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP567384U JPS60118975U (ja) 1984-01-17 1984-01-17 プリント板試験治具

Publications (2)

Publication Number Publication Date
JPS60118975U JPS60118975U (ja) 1985-08-12
JPH0425663Y2 true JPH0425663Y2 (h) 1992-06-19

Family

ID=30482392

Family Applications (1)

Application Number Title Priority Date Filing Date
JP567384U Granted JPS60118975U (ja) 1984-01-17 1984-01-17 プリント板試験治具

Country Status (1)

Country Link
JP (1) JPS60118975U (h)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10976660B2 (en) 2016-09-13 2021-04-13 Changzhou Tronly Advanced Electronic Materials Co , Ltd. Fluorene photoinitiator, preparation method therefor, photocurable composition having same, and use of same in photocuring field
US11118065B2 (en) 2017-02-17 2021-09-14 Changzhou Tronly Advanced Electronic Materials Co., Ltd. Fluorenylaminoketone photoinitiator, preparation method thereof, and UV photocurable composition containing same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10976660B2 (en) 2016-09-13 2021-04-13 Changzhou Tronly Advanced Electronic Materials Co , Ltd. Fluorene photoinitiator, preparation method therefor, photocurable composition having same, and use of same in photocuring field
US11118065B2 (en) 2017-02-17 2021-09-14 Changzhou Tronly Advanced Electronic Materials Co., Ltd. Fluorenylaminoketone photoinitiator, preparation method thereof, and UV photocurable composition containing same

Also Published As

Publication number Publication date
JPS60118975U (ja) 1985-08-12

Similar Documents

Publication Publication Date Title
JPS63304180A (ja) 印刷回路板テスト装置
JPWO2012023180A1 (ja) 接続装置、それを備えた半導体ウェハ試験装置、及び接続方法
KR20220014633A (ko) 집적 회로 모듈의 테스트 소켓
CN110058116A (zh) 一种连接器pin在内腔的测试机构
JPH0425663Y2 (h)
US6483331B2 (en) Tester for semiconductor device
US7147499B1 (en) Zero insertion force printed circuit assembly connector system and method
JPH034941Y2 (h)
CN211043570U (zh) 一种单面pcb的测试装置
CN211017466U (zh) 显示面板检测用转接装置
CN109212275B (zh) 一种马达控制中心抽屉开关试验转接装置和试验方法
CN110672998A (zh) 一种连接器的导通耐压测试方法和导通耐压测试组件
CN220207690U (zh) 测试插座
KR20220154956A (ko) 고속의 ssd 번인 소켓 및 ssd 컨트롤러 칩 동시 테스트를 위한 번인 보드
JP3090255U (ja) プローブ構造
CN207336713U (zh) 电路板测试装置及系统
CN112540251A (zh) 智能功率模块测试装置及系统
CN218272595U (zh) 一种测试板卡搭源验证板
JPS58119185A (ja) 電気用コネクタ
CN118731825A (zh) 一种电能表兼容测试装置
CN214101604U (zh) 一种摄像头模组的高效测试装置
CN113675702B (zh) 一种插拔机构
CN209280817U (zh) 一种磁芯测量系统
CN113281541B (zh) 用于空间电子元器件的非焊接式引线装置
JP2556153B2 (ja) 試験用配線端子接続工具