JPH0425373A - Polishing device - Google Patents

Polishing device

Info

Publication number
JPH0425373A
JPH0425373A JP2127790A JP12779090A JPH0425373A JP H0425373 A JPH0425373 A JP H0425373A JP 2127790 A JP2127790 A JP 2127790A JP 12779090 A JP12779090 A JP 12779090A JP H0425373 A JPH0425373 A JP H0425373A
Authority
JP
Japan
Prior art keywords
workpiece
polishing
work
substrate
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2127790A
Other languages
Japanese (ja)
Other versions
JP2556605B2 (en
Inventor
Yoichi Sato
洋一 佐藤
Ryo Hashimoto
橋本 凉
Michitaka Hashimoto
通孝 橋本
Isao Tezuka
功 手塚
Yoshinobu Kimura
義信 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Altemira Co Ltd
Original Assignee
Showa Aluminum Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Showa Aluminum Corp filed Critical Showa Aluminum Corp
Priority to JP2127790A priority Critical patent/JP2556605B2/en
Publication of JPH0425373A publication Critical patent/JPH0425373A/en
Application granted granted Critical
Publication of JP2556605B2 publication Critical patent/JP2556605B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

PURPOSE:To receive a polished work without its damaging at a receiving part, by providing a work receiver in which liquid is stored at a work receiving part. CONSTITUTION:A work (aluminum substrate for magnetic disc) A transferred to a work receiving part 3 by a transfer device 5 from a polishing part 1 is apart from the transfer device 5 in the position of the work receiver 24 of the receiving part 3 and received into this receiver 24 while receiving the cushioning action by the liquid. In this case, the work A is arranged inside the liquid stored in the receiver 24 while under its standby at the receiving part 3, so it is not dried and no sticking of dirt while under polishing, etc., is caused.

Description

【発明の詳細な説明】 産業上の利用分野 この発明は、例えば磁気ディスク用アルミニウム基板等
のワークに研磨加工を施す研磨装置に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a polishing apparatus for polishing a workpiece such as an aluminum substrate for a magnetic disk.

従来の技術及び課題 従来、例えば磁気ディスク用アルミニウム基板の研磨を
行う研磨加工機として、第3図に示されるような加工機
(51)が用いられている。
2. Description of the Related Art Conventionally, a processing machine (51) as shown in FIG. 3 has been used as a polishing machine for polishing, for example, an aluminum substrate for a magnetic disk.

同図の研磨加工機(51)は、回転駆動可能に保持され
かつ上面にドーナツ盤状の砥石(52)が取着された下
部定盤(53)と、該下部定盤(53)の上方位置に該
定盤(53)と対向同軸状に配置されると共に回転駆動
及び昇降作動可能に保持されかつ下面に同じくドーナツ
盤状の砥石(54)が取むされた上部定盤(55)と、
各砥石(52)  (54)間において砥石の軸芯位置
に配置された太陽歯車(57)と、該太陽歯車(57)
の径方向外方位置に同心状に配置された内歯歯車(59
)と、該内歯歯車(59)及び太陽歯車(57)の両歯
車に噛合され下定盤(53)の砥石(52)上に載置さ
れた状態で両歯車(57)  (59)間に配置された
外歯歯車状のワークキャリアー(56)とからなる。な
お、このワークキャリアー (5G)は、磁気ディスク
用基板(A)の外周形状に沿う円形の保持孔(60)を
偏心状態に有し、該保持孔(60)内に磁気ディスク用
基板(A)が配置された状態で該基板の上下両面がキャ
リア(56)の保持孔(60)から外方に突出した状態
となるようにその板厚が基板(A)よりも薄く形成され
ている。
The polishing machine (51) in the figure includes a lower surface plate (53) which is rotatably held and has a donut-shaped grindstone (52) attached to the upper surface, and an upper part of the lower surface plate (53). an upper surface plate (55) which is disposed coaxially with the surface plate (53), is rotatably driven and movable up and down, and has a donut-shaped grindstone (54) on its lower surface; ,
A sun gear (57) arranged between each grinding wheel (52) (54) at the axis of the grinding wheel;
An internal gear (59
) between the internal gears (59) and the sun gear (57) and placed on the grindstone (52) of the lower surface plate (53). It consists of a work carrier (56) arranged in the form of an external gear. This work carrier (5G) has an eccentric circular holding hole (60) that follows the outer circumferential shape of the magnetic disk substrate (A), and the magnetic disk substrate (A) is placed in the holding hole (60). ) is formed to be thinner than the substrate (A) so that both upper and lower surfaces of the substrate protrude outward from the holding hole (60) of the carrier (56).

そして、この研磨加工機(51)では、上部定盤(55
)が上方待機位置に位置された状態で磁気ディスク用基
板(A)がワークキャリアー(56)の保持孔(60)
内に配置され、上部定盤(55)が下降作動されて磁気
ディスク用基板(A)の両面が上下の砥石(52)  
(54)で挾まれる。そして、加圧状態において、太陽
歯車(57)が回転されることによりワークキャリアー
 (5B)が自転されながら太陽歯車(57)の回りで
公転され、更に上下の定盤(53)  (55)も回転
されて、磁気ディスク用基板(A)の両面の研磨加工が
なされる。研磨後は、上部定盤(55)が上昇され、キ
ャリアー(56)に保持されている基板(A)が取り出
され、また新たな基板がキャリアー(56)に保持せし
められて研磨が再開される。
In this polishing machine (51), the upper surface plate (55
) is located at the upper standby position, the magnetic disk substrate (A) is inserted into the holding hole (60) of the work carrier (56).
The upper surface plate (55) is lowered and both sides of the magnetic disk substrate (A) are placed inside the upper and lower grinding wheels (52).
It is caught in (54). In the pressurized state, the sun gear (57) is rotated, so that the work carrier (5B) is rotated and revolved around the sun gear (57), and the upper and lower surface plates (53) and (55) are also rotated. The magnetic disk substrate (A) is rotated, and both sides of the magnetic disk substrate (A) are polished. After polishing, the upper surface plate (55) is raised, the substrate (A) held by the carrier (56) is taken out, a new substrate is held by the carrier (56), and polishing is restarted. .

ところで、従来、上記加工機を用いた磁気ディスク用基
板の研磨は、作業者が、ラックから基板(A)を取り出
してこれをワークキャリアー (56)の各保持孔(6
0)に配置し、また、研磨完了後にキャリアー(56)
の基板(A)を取り出すという作業を繰り返しながら実
施されていた。
By the way, conventionally, when polishing a magnetic disk substrate using the above processing machine, an operator takes out the substrate (A) from the rack and inserts it into each holding hole (6) of the work carrier (56).
0) and the carrier (56) after polishing is completed.
The process was carried out by repeatedly taking out the board (A).

しかしながら、上記のような人手による繰返し作業は、
作業者に大きな負担を与え、また、装置のワーク処理効
率の向上に限界を生じさせていた。
However, the repetitive manual work described above is
This places a heavy burden on workers and limits the ability to improve the workpiece processing efficiency of the device.

そのため、研磨加工工程の自動化を図り、基板を研磨加
工機(51)内に自動的にローデングすると共に、研磨
完了後にはこれを自動的にアンローデングするという自
動化設備の開発が要請されていた。
Therefore, there has been a demand for the development of automated equipment that automates the polishing process and automatically loads the substrate into the polishing machine (51) and automatically unloads it after polishing is completed.

そこで、本発明者らは、そのような自動化設備の一態様
として、上記のような研磨加工機(51)に隣接して、
未加工ワーク取出し部と、加工済ワーク受取り部とをそ
れぞれ配置し、かつ取出し部の未加工基板を研磨加工機
(51)に、また、研磨加工機(5■)で研磨加工を終
えた基板を加工済ワーク受取り部に移送するワーク移送
装置を備えた研磨装置の実用化を試みている。
Therefore, as one aspect of such automated equipment, the present inventors installed a polishing machine (51) adjacent to the polishing machine (51) as described above.
A raw workpiece take-out part and a processed workpiece receiving part are arranged respectively, and the unprocessed board in the takeout part is sent to the polishing machine (51), and the board that has been polished by the polishing machine (5■) We are attempting to put into practical use a polishing machine equipped with a workpiece transfer device that transfers processed workpieces to a receiving section.

そして、かかる研磨装置の実用化を図る上において、研
磨加工機(51)で研磨を終えた基板を該基板に傷をつ
けることなくいかに加工済ワーク受取り部に受けさせる
か、ということか解決すべき課題の一つとして取り上げ
られた。
In order to put such a polishing device into practical use, it is necessary to solve the problem of how to receive the substrate that has been polished by the polishing machine (51) into the processed workpiece receiving section without damaging the substrate. This was taken up as one of the issues that should be addressed.

即ち、ワーク移送装置によって受取り部に基板を配置す
る際に、該基板が受取り部の受けの底面に落下したり、
押し付けられたりして基板に傷をつけてしまうことが起
こりうる。このことは、特にワークが上記の磁気ディス
ク用基板のような高い表面性状の要求されるものである
場合に深刻な問題となる。
That is, when placing a substrate in the receiving section by the work transfer device, the substrate may fall onto the bottom surface of the receiver in the receiving section, or
The board may be damaged by being pressed against it. This becomes a serious problem, especially when the workpiece requires a high surface quality, such as the above-mentioned magnetic disk substrate.

また一方、加工済ワーク受取り部で待機させている間に
、研磨加工中等において付着した研磨液、切粉、砥粒等
の汚れが乾燥により基板にこびりついて、研磨後におい
て行われる洗浄工程での基板の洗浄に困難を生じること
もある。
On the other hand, while waiting in the processed workpiece receiving section, dirt such as polishing liquid, chips, abrasive grains, etc. that adhered during polishing processes dry and stick to the substrate, causing problems in the cleaning process performed after polishing. Difficulties may also arise in cleaning the substrate.

この発明は、かかる課題を解決し、研磨加工部で研磨を
終えたワークを傷をつけるとなく加工済ワーク受取り部
に受けさせることができ、しかも該受取り部での待機中
のワークへの汚れのこびりつきが発生するのを防止する
ことができる研磨装置を提供することを目的とする。
The present invention solves these problems and allows the workpieces that have been polished in the polishing section to be received in the finished workpiece receiving section without causing any damage. It is an object of the present invention to provide a polishing device capable of preventing the occurrence of sticking.

課題を解決するための手段 上記目的において、この発明は、ワークの研磨加工を行
う研磨加工部に隣接して、加工済ワクを受け取る加工済
ワーク受取り部が配置され、かつ該ワーク受取り部に、
前記研磨加工部で研磨加工されたワークを移送するワー
ク移送装置が具備された研磨装置であって、前記ワーク
受取り部が、液体の収容されたワーク受けを備えている
ことを特徴とする研磨装置を要旨とする。
Means for Solving the Problems In order to achieve the above-mentioned object, the present invention provides a machined workpiece receiving section in which a processed workpiece receiving section for receiving a processed workpiece is disposed adjacent to a polishing section that performs a polishing process on the workpiece, and in the workpiece receiving section,
A polishing device equipped with a workpiece transfer device for transporting a workpiece polished in the polishing section, wherein the workpiece receiving section includes a workpiece receiver containing a liquid. The gist is:

作用 上記構成では、研磨加工部から移送装置によってワーク
受取り部に移送されてきたワークは、該受取り部のワー
ク受けの位置において移送装置から離され、該受け内に
、液体によるクツション作用を受けながら受けられる。
Operation In the above configuration, the workpiece transferred from the polishing section to the workpiece receiving section by the transfer device is separated from the transfer device at the position of the workpiece receiver of the receiving section, and is placed in the receiver while receiving a cushioning action from the liquid. I can accept it.

しかも、ワークは受取り部での待機中、液体内に配置さ
れるので、乾燥することがなく、研磨加工中等において
付着した汚れがこびりつくというようなことが起こらな
い。
Moreover, since the work is placed in the liquid while it is waiting at the receiving section, it does not dry out, and dirt that has adhered during polishing or the like does not become stuck.

実施例 以下、この発明を円盤状の磁気ディスク用アルミニウム
基板の研磨加工を自動的に行う研磨装置に適用する場合
の実施例につき、図面に拭づいて説明する。
EXAMPLE Hereinafter, an example in which the present invention is applied to a polishing apparatus for automatically polishing a disk-shaped aluminum substrate for a magnetic disk will be described with reference to the drawings.

第1図に示される研磨装置において、(1)は研磨加工
部、(2)は未加工ワーク特機部、(3)はワーク受取
り部としての加工済ワーク特機部、(4)は未加工ワー
クー括移送装置、(5)は加工済ワーク−摺移送装置で
ある。また、(6)は未加工ワーク収容ラック、(7)
は洗浄・乾燥装置、(8)は未加工ワーク個別移送装置
、(9)は加工済ワーク個別移送装置である。
In the polishing apparatus shown in Fig. 1, (1) is a polishing processing section, (2) is an unprocessed workpiece special section, (3) is a processed workpiece special section as a work receiving section, and (4) is an unprocessed workpiece special section. Processed workpiece bulk transfer device (5) is a processed workpiece sliding transfer device. In addition, (6) is a raw workpiece storage rack, (7)
(8) is a cleaning/drying device, (8) is an unprocessed workpiece individual transfer device, and (9) is a processed workpiece individual transfer device.

研磨加工部(1)は、上下の定盤(11)  (12)
と、太陽歯車(13) 、内歯歯車(14) 、ワーク
キャリアー(15)で構成された研磨加工機によるもの
で、太陽歯車(13)の回転によりキャリアー(15)
が自転公転され、更に上下の定盤(11)  (12)
も回転駆動されて、基板(A)の研磨を行う。
The polishing part (1) has upper and lower surface plates (11) (12)
This polishing machine consists of a sun gear (13), an internal gear (14), and a work carrier (15).The carrier (15) is rotated by the rotation of the sun gear (13).
rotates and revolves, and then the upper and lower surface plates (11) (12)
is also rotationally driven to polish the substrate (A).

この研磨加工部(1)において、下部定盤(11)は、
その上部に所定厚さのドーナツ盤状の砥石(17)が取
着されたもので、図示しない駆動装置により自軸回りで
の回転及び上下方向への移動を行いうるものとなされて
いる。
In this polishing part (1), the lower surface plate (11) is
A donut-shaped grindstone (17) with a predetermined thickness is attached to the upper part of the grindstone, and can be rotated around its own axis and moved in the vertical direction by a drive device (not shown).

上部定盤(I2)は、下部定盤(11)の上方位置に同
軸状に対向配置され、その下部に同じくドーナツ盤状の
砥石(18)が前記砥石(17)に対向するように取着
されたものである。そして、この上部定盤(12)も、
図示しない駆動装置により、自軸回りでの回転及び上下
方向の移動を行いうるちのとなされている。
The upper surface plate (I2) is disposed above the lower surface plate (11) coaxially and oppositely, and a donut-shaped grindstone (18) is attached to the bottom thereof so as to face the grindstone (17). It is what was done. And this upper surface plate (12) also,
A drive device (not shown) rotates about its own axis and moves vertically.

太陽歯車(13)は、上下両定盤(11)  (12)
間において砥石(17)  (1g)の軸芯位置に配置
されており、図示しない駆動装置により自軸回りで回転
されるものとなされている。
The sun gear (13) has both upper and lower surface plates (11) (12)
The grinding wheel (17) (1g) is placed between the grinding wheels at the center of its axis, and is rotated about its own axis by a drive device (not shown).

内歯歯車(14)は、太陽歯車(13)の径方向外方位
置に太陽歯車(13)との間にドーナツ状のスペースを
おいて同心状に配置されている。
The internal gear (14) is arranged concentrically at a position radially outward of the sun gear (13) with a donut-shaped space between the internal gear (14) and the sun gear (13).

ワークキャリアー(15)は、薄板状外歯歯車によるも
ので、上記太陽歯車(13)と内歯歯車(14)との間
のドーナツ状のスペース内に1個ないし複数個配置され
、太陽、内歯の両歯車(13)  (14)に噛合され
ている。また、このワークキャリアー(15)には、そ
の中心位置から偏心した位置に、磁気ディスク用U板(
A)の外周形状に沿う円形の保持孔(19)が1個ない
し複数個設けられている。なお、このワークキャリアー
(15)の厚さは、磁気ディスク用基板(A)の厚さよ
りも薄く形成され、前記保持孔(19)内に磁気ディス
ク用基板(A)を配置した状態でその上下の面が保持孔
(19)の外方に突出しうるちのとなされている。
The work carrier (15) is a thin plate-shaped external gear, and one or more work carriers (15) are arranged in a donut-shaped space between the sun gear (13) and the internal gear (14). It meshes with both gears (13) and (14). The work carrier (15) also has a magnetic disk U plate (
One or more circular holding holes (19) are provided along the outer circumferential shape of A). The thickness of this work carrier (15) is formed to be thinner than that of the magnetic disk substrate (A), and when the magnetic disk substrate (A) is placed in the holding hole (19), The surface of the holding hole (19) protrudes outward from the holding hole (19).

ここに、上記太陽歯車(13) 、内歯歯車(14)及
びワークキャリアー(15)相互間の歯数比は、1:3
:1に設定されており、太陽歯車(13)が4の整数倍
数回回転されると、ワークキャリアー(15)が公転開
始時に位置していた位置に復帰し、かつキャリアー(1
5)のワーク保持孔(19)も自転開始時に位置してい
た位置に復帰するようにされている。
Here, the ratio of the number of teeth between the sun gear (13), internal gear (14), and work carrier (15) is 1:3.
:1, and when the sun gear (13) is rotated an integral multiple of 4 times, the work carrier (15) returns to the position where it was at the start of revolution, and the carrier (1
The workpiece holding hole (19) (5) is also adapted to return to the position where it was at the start of rotation.

未加工ワーク特機部(2)及び加工済ワーク特機部(3
)は、研磨加工部(1)の両サイドに配置されている。
Unprocessed work special equipment section (2) and processed work special equipment section (3
) are arranged on both sides of the polishing section (1).

これらの特機部(2)(3)は、テーブル(21)  
(22)によるもので、未加工ワーク特機部(2)のテ
ーブル(21)の上面には、基板の外周形状に沿う所定
高さの輪状のワーク受け(23)が設けられている。
These special parts (2) and (3) are the table (21)
According to (22), a ring-shaped work receiver (23) of a predetermined height along the outer circumferential shape of the substrate is provided on the upper surface of the table (21) of the unprocessed work special equipment section (2).

そして、加工済ワーク特機部(3)側のテーブル(22
)の上面には浅底状のトレー(28)が配置されると共
に、該トレー(28)内に前記と同様の輪状のワーク受
け(24)が配置され、かつ該ワーク受け(24)以外
の位置においてトレー (28)の上方位置には、水道
管(29)の出口部が配設されている。なお、ワーク受
け(24)は、第2図に示されるように、その高さがト
レー (28)の高さよりも相対的に低くされ、トレー
 (2B)内に水道管(29)の水が供給されることに
よって水が満たされた状態にされる。また、このワーク
受け(24)は、基板(A)をその中に配置した状態で
該基板(A)が水面下に没することができるような深さ
を有するものに形成されているのが好ましい。
Then, the table (22
A shallow-bottomed tray (28) is arranged on the upper surface of ), and a ring-shaped workpiece receiver (24) similar to the one described above is arranged inside the tray (28), and other than the workpiece receiver (24) An outlet portion of the water pipe (29) is disposed above the tray (28). As shown in Figure 2, the height of the workpiece receiver (24) is made relatively lower than the height of the tray (28), so that water from the water pipe (29) can flow into the tray (2B). It is filled with water by being supplied with water. Further, the workpiece receiver (24) is formed to have a depth such that the substrate (A) can be submerged under the water surface with the substrate (A) placed therein. preferable.

上記の両持機部(2)(3)における各ワーク受け部(
23)  (24)は、研磨加工部(1)の太陽歯車(
13)が停止した状態におけるキャリアー(15)の保
持孔(19)の位置に対応して配置されている。
Each work receiving part (
23) (24) is the sun gear (
13) is arranged corresponding to the position of the holding hole (19) of the carrier (15) in a stopped state.

未加工ワークー括移送装置(4)は、研磨加工部(1)
、ワーク特機部(2)(3)の背後にこれらと平行状に
配設されたガイドレール(25)に案内されて未加工ワ
ーク待機用テーブル(21)の上方位置と研磨加工部(
1)の上下の定盤(11)  (12)間の位置との間
で往復作動されるものとなされている。また、加工済ワ
ーク−摺移送装置(5)は同じく背後のガイドレール(
25)に案内されて研磨加工部(1)の上下の定盤(1
1)  (12)間の位置と加工済ワーク待機用テーブ
ル(22)の上方位置との間で往復作動されるものとな
されている。そして、両移送装置(4)(5)のそれぞ
れには、待機用テーブル(21)  (22)のワーク
受け部(23)  (24)の位置に対応して基板(A
)をその軸孔において拡径してチャックする基板チャツ
カー(26)(27)が備えられている。
The unprocessed workpiece bulk transfer device (4) is connected to the polishing section (1)
, the position above the unprocessed work waiting table (21) and the polishing part (
1) It is designed to be reciprocated between the positions between the upper and lower surface plates (11) and (12). Also, the processed workpiece-sliding transfer device (5) is also connected to the guide rail (
25) and are guided by the upper and lower surface plates (1) of the polishing section (1).
It is designed to reciprocate between the position between 1) and (12) and the position above the processed work standby table (22). Both transfer devices (4) and (5) each have substrates (A
) is provided with substrate chuckers (26) and (27) for chucking the substrate by enlarging its diameter in its shaft hole.

未加工ワーク収容ラック(6)は、基板(A)を立積み
状態で収容するもので、未加工ワーク特機部(2)にコ
ンベア等により隣接状態に配置されるものとなされてい
る。
The unprocessed work storage rack (6) stores the substrates (A) in a stacked state, and is arranged adjacent to the unprocessed work special equipment section (2) by a conveyor or the like.

また、未加工ワーク個別移送装置(8)はラック(6)
と未加工ワーク特機部(2)との間に配置され、ラック
(6)から基板(A)を1個づつチャックして取り出し
これを未加工ワーク待機用テーブル(21)のワーク受
け部(23)に配置していくパターン化された動作を繰
り返し行うものとなされている。
In addition, the unprocessed work individual transfer device (8) is connected to the rack (6).
The board (A) is chucked and taken out one by one from the rack (6) and transferred to the work receiving part (21) of the unprocessed work standby table (21). 23), the patterned movement of placing the parts in the pattern is repeated.

洗浄・乾燥装置(7)は加工済ワーク特機部(3)に隣
接配置されている。そして、加工済ワーク個別移送装置
(9)は洗浄・乾燥装置(7)と加工済ワーク特機部(
3)との間に配置され、加工済ワーク待機用テーブル(
22)のワーク受け部(24)に待機されている基板(
A)を1個づつチャックして取り出しこれを洗浄・乾燥
装置(7)に渡していくパターン化された動作を繰り返
し行うものとなされている。
The cleaning/drying device (7) is arranged adjacent to the processed workpiece special equipment section (3). The processed workpiece individual transfer device (9) is connected to the washing/drying device (7) and the processed workpiece special equipment section (
3) is placed between the machined workpiece standby table (
The substrate (
The patterned operation of chucking and taking out A) one by one and passing it on to the washing/drying device (7) is repeated.

次に、上記研磨装置の作動をその制御方式と併せて説明
する。
Next, the operation of the polishing apparatus will be explained together with its control system.

上記研磨装置では、未加工ワーク個別移送装置(8)に
より、ラック(6)内の基板(A)が未加工ワーク待機
用テーブル(21)のワーク受け部(23)内に順次配
置されていく。
In the above-mentioned polishing apparatus, the substrates (A) in the rack (6) are sequentially placed in the work receiving part (23) of the raw work standby table (21) by the unprocessed work individual transfer device (8). .

配置完了後、未加工ワークー括移送装置(4)が、該テ
ーブル(21)の上方位置に位置した状態で下降し、チ
ャツカー(26)で基板(A)を−括してチャックし、
上昇する。そして、研磨加工部(1)側に移行し、下部
定盤(11)上に位置する。そして、下降し、基板(A
)をキャリアー(15)の保持孔(19)内に一括配置
後チャッカー(2B)を解除して、上昇し、再び未加工
ワーク待機用テーブル(21)上に移行していく。
After the arrangement is completed, the unprocessed workpiece bulk transfer device (4) is lowered while being positioned above the table (21), and the chucker (26) collectively chucks the substrates (A).
Rise. Then, it moves to the polishing part (1) side and is located on the lower surface plate (11). Then, it descends and the substrate (A
) is placed in the holding hole (19) of the carrier (15), the chucker (2B) is released, the work is raised, and the unprocessed work is placed on the standby table (21) again.

そして、研磨加工部(1)では、上部定盤(12)が下
降作動し、基板(A)の上下面が上下の砥石(17) 
 (18)で加圧状態に挾持され、その状態で太陽歯車
(13)が回転作動され、更に上下の定盤(11)  
(12)も回転作動されて基板(A)の研磨処理がなさ
れる。そして、太陽歯車(13)の所定回数(4の整数
倍数回)の回転完了後、上部定盤(12)が上昇作動さ
れる。
In the polishing section (1), the upper surface plate (12) is moved downward, and the upper and lower surfaces of the substrate (A) are placed on the upper and lower grinding wheels (17).
(18) is held in a pressurized state, and in that state the sun gear (13) is rotated, and the upper and lower surface plates (11)
(12) is also rotated to polish the substrate (A). After the sun gear (13) completes rotation a predetermined number of times (an integral multiple of 4), the upper surface plate (12) is moved upward.

そのときワーク(A)は太陽歯車(13)の回転開始時
の位置関係と同じ位置関係においてキャリアー(15)
に保持されている。
At that time, the workpiece (A) is placed on the carrier (15) in the same positional relationship as the sun gear (13) when it starts rotating.
is maintained.

しかるのち、加工済ワーク−括移送装置(5)が下部定
盤(11)上に移行し、下降、基板の一括チャック、上
昇を行って、加工済ワーク待機用テーブル(22)側に
移行する。
After that, the machined workpiece bulk transfer device (5) moves onto the lower surface plate (11), lowers, chucks the substrates all at once, ascends, and moves to the machined workpiece waiting table (22). .

そして、加工済ワーク−括移送装置(5)は、該テーブ
ル(22)上で下降され、所定の高さ位置において基板
(A)のチャックが解除されて、該基板(A)はワーク
受け(24)内に水没状態に配置される。その際、基板
(A)は、受け(24)の底面との間に存在する水によ
りクツション作用を受けて、該ワーク受け(24)の底
面に衝撃的に当たることなく配置される。
Then, the machined workpiece bulk transfer device (5) is lowered on the table (22), the chuck of the substrate (A) is released at a predetermined height position, and the substrate (A) is transferred to the workpiece receiver ( 24) placed submerged in the interior of the vehicle. At this time, the substrate (A) receives a cushioning effect from the water existing between it and the bottom surface of the workpiece receiver (24), and is placed without impacting the bottom surface of the workpiece receiver (24).

その後、移送装置(5)は、加工済ワーク待機用テーブ
ル(22)の上方位置に移行される。
Thereafter, the transfer device (5) is moved to a position above the processed work standby table (22).

そして、加工済ワーク待機用テーブル(22)に待機さ
れた基板(A)は、加工済ワーク個別移送装置(9)に
よって1個づつ取り出され、濡れた状態で洗浄・乾燥装
置(7)に順次波され、洗浄、乾燥に付される。
Then, the substrates (A) waiting on the processed work standby table (22) are taken out one by one by the processed work individual transfer device (9), and are sequentially transferred to the cleaning/drying device (7) in a wet state. Waved, washed and dried.

上記のように、加工済ワーク受取り部とじての特機部(
3)が水の収容された受け(24)を備えたものに構成
されていることにより、加工済ワーク−括移送装置(5
)による該受け(24)への基板(A)の配置を該受け
(24)内に収容された水によるクツション作用によっ
て該基板(A)に傷をつけることなく行うことができる
As mentioned above, the special equipment section (as the processed workpiece receiving section)
3) is configured with a receiver (24) containing water, so that the machined workpiece bulk transfer device (5
) can be carried out without damaging the substrate (A) by the cushioning action of the water contained in the receiver (24).

特に磁気ディスク用基板(A)のように平面的なワーク
の場合には、水によるクツション作用が強く現れ、受け
(24)との衝突による基板(A)への傷つき防止効果
がより有効的に発揮される。しかも、上記のように水の
収容された受け(24)内に基板(A)が配置される構
成が採用されていることにより、研磨加工直後に基板(
A)が水にさらされることで研磨液、切粉、砥粒等の汚
れが容易に落とされ、かつ受け(24)内で待機中に基
板(A)が乾燥して汚れのこびりつきを生じるというこ
とも防止され、従って次の洗浄工程での基板(A)の洗
浄を能率よく、しかも確実に行うことが可能となる。更
に、加工済ワーク特機部(3)に待機された基板(A)
を加工済ワーク個別移送装置(9)で取り出す際にも、
水のクツション作用により、基板(A)に衝撃を与える
ことなく取り出すことができる。
Particularly in the case of a flat work such as a magnetic disk substrate (A), the cushioning effect of water is strong, and the effect of preventing damage to the substrate (A) due to collision with the receiver (24) is more effective. Demonstrated. Moreover, since the substrate (A) is arranged in the water-containing container (24) as described above, the substrate (A) is placed immediately after polishing.
When A) is exposed to water, dirt such as polishing liquid, chips, abrasive grains, etc. is easily removed, and while waiting in the receiver (24), the board (A) dries and becomes caked with dirt. Therefore, it becomes possible to efficiently and reliably clean the substrate (A) in the next cleaning step. Furthermore, a board (A) is placed on standby in the machined workpiece special equipment section (3).
When taking out processed workpieces with the individual transfer device (9),
Due to the cushioning effect of water, the substrate (A) can be taken out without impacting it.

なお、本発明における研磨加工部は、外歯歯車によるワ
ークキャリアーを太陽歯車と内歯歯車との作用で自転公
転させてワークを一括して研磨加工する上記のような研
磨加工機によるものの他、例えばワークを上方突出固定
状態に保持して上方から研磨盤を当て、該研磨盤を回転
させることにより、ワークの研出を行う研磨加工機等に
よるものであってもよい。また、研磨加工部は、砥石を
使用した研磨機によるものの他、砥石に替えて研磨布を
使用した、いわゆるパフ研磨方式による研磨機等による
ものであってもよい。
In addition, the polishing section in the present invention includes a polishing machine as described above that polishes the workpieces all at once by rotating and revolving a work carrier formed by an external gear by the action of a sun gear and an internal gear. For example, a polishing machine or the like may be used, which polishes the workpiece by holding the workpiece in an upwardly protruding fixed state, applying a polishing disk from above, and rotating the polishing disk. Further, the polishing section may be a polishing machine using a grindstone, or a polishing machine using a so-called puff polishing method using a polishing cloth instead of a grindstone.

また、上記実施例ではワーク受け(24)内に収容され
る液体として水が用いられているが、本発明装置はこれ
に限定されるものではなく、要はワークを受ける際にク
ツションとなり、かつワークの乾燥を防止しうるような
液体であれば液体の種類に特に制限はない。
Further, in the above embodiment, water is used as the liquid contained in the workpiece receiver (24), but the device of the present invention is not limited to this. There is no particular restriction on the type of liquid as long as it can prevent the workpiece from drying out.

発明の効果 上述の次第で、この発明の研磨装置は、研磨加工部から
のワークを受け取るワーク受取り部が、液体の収容され
たワーク受けを具備したものとなされているから、ワー
クは、受けに収容された液体のクツション作用を受けつ
つ受け内に配置される。従って、研磨加工済のワークに
傷をつけることなく受取り部に受けさせることができる
Effects of the Invention As described above, in the polishing apparatus of the present invention, the workpiece receiving section that receives the workpiece from the polishing section is equipped with a workpiece receiver containing liquid. It is placed in the receptacle under the cushioning action of the liquid contained therein. Therefore, the polished workpiece can be received by the receiving portion without being damaged.

しかも、加工済ワークが液体を介して受けられるから、
乾燥されることがなく、研磨液、切粉、砥粒等の汚れの
乾燥によるこびりつきを防止することができる。
Moreover, since the processed workpiece can be received via liquid,
It does not dry and can prevent stains such as polishing fluid, cutting chips, abrasive grains, etc. from drying out and sticking to the surface.

殊に、磁気ディスク用アルミニウム基板のような高い表
面性状が要求されるワークの研磨を行う場合には、この
研出装置の使用により、かかるワークに傷をつけずに受
取り部に受けさせることができ、その製造歩留りの向上
に寄与しうる。
In particular, when polishing workpieces that require high surface quality, such as aluminum substrates for magnetic disks, this polishing device allows the workpieces to be received by the receiving section without being damaged. This can contribute to improving the manufacturing yield.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の研磨装置の一実施例を示す全体斜視
図、第2図は加工済ワーク受取り部の垂直断面図である
。第3図は従来より用(1られている研磨加工機の構成
を示す斜視図である。 (1)・・・研磨加工部、(3)・・・加工済ワーク特
機部(加工済ワーク受取り部)、(5)・・・ワーク移
送装置、(24)・・・ワーク受け、(A)・・・磁気
ディスク用アルミニウム基板(ワーク)。 以上 第3 図
FIG. 1 is an overall perspective view showing an embodiment of the polishing apparatus of the present invention, and FIG. 2 is a vertical sectional view of a processed workpiece receiving section. FIG. 3 is a perspective view showing the configuration of a conventional polishing machine. (1) Polishing section, (3) Finished workpiece special section (5)... Workpiece transfer device, (24)... Workpiece receiver, (A)... Aluminum substrate for magnetic disk (workpiece).

Claims (1)

【特許請求の範囲】[Claims] ワークの研磨加工を行う研磨加工部に隣接して、加工済
ワークを受け取る加工済ワーク受取り部が配置され、か
つ該ワーク受取り部に、前記研磨加工部で研磨加工され
たワークを移送するワーク移送装置が具備された研磨装
置であって、前記ワーク受取り部が、液体の収容された
ワーク受けを備えていることを特徴とする研磨装置。
A processed workpiece receiving section for receiving a processed workpiece is arranged adjacent to a polishing section that performs polishing processing of a workpiece, and a workpiece transfer section that transfers the workpiece polished in the polishing section to the workpiece receiving section. What is claimed is: 1. A polishing apparatus equipped with a polishing apparatus, wherein the workpiece receiving section includes a workpiece receiver containing a liquid.
JP2127790A 1990-05-17 1990-05-17 Polishing equipment Expired - Lifetime JP2556605B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2127790A JP2556605B2 (en) 1990-05-17 1990-05-17 Polishing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2127790A JP2556605B2 (en) 1990-05-17 1990-05-17 Polishing equipment

Publications (2)

Publication Number Publication Date
JPH0425373A true JPH0425373A (en) 1992-01-29
JP2556605B2 JP2556605B2 (en) 1996-11-20

Family

ID=14968746

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2127790A Expired - Lifetime JP2556605B2 (en) 1990-05-17 1990-05-17 Polishing equipment

Country Status (1)

Country Link
JP (1) JP2556605B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007283457A (en) * 2006-04-19 2007-11-01 Showa Denko Kk Apparatus for wet polishing
JP2008155323A (en) * 2006-12-25 2008-07-10 Showa Denko Kk Wet polishing method and wet polishing device
US9481007B2 (en) 2009-12-21 2016-11-01 Henkel IP & Holding GmbH Method and system for regulating adhesive application

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62136365A (en) * 1985-12-04 1987-06-19 Toshiba Mach Co Ltd Polishing device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62136365A (en) * 1985-12-04 1987-06-19 Toshiba Mach Co Ltd Polishing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007283457A (en) * 2006-04-19 2007-11-01 Showa Denko Kk Apparatus for wet polishing
JP2008155323A (en) * 2006-12-25 2008-07-10 Showa Denko Kk Wet polishing method and wet polishing device
US9481007B2 (en) 2009-12-21 2016-11-01 Henkel IP & Holding GmbH Method and system for regulating adhesive application

Also Published As

Publication number Publication date
JP2556605B2 (en) 1996-11-20

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