JPH0422246U - - Google Patents
Info
- Publication number
- JPH0422246U JPH0422246U JP6425190U JP6425190U JPH0422246U JP H0422246 U JPH0422246 U JP H0422246U JP 6425190 U JP6425190 U JP 6425190U JP 6425190 U JP6425190 U JP 6425190U JP H0422246 U JPH0422246 U JP H0422246U
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- resistance value
- common electrode
- lead
- heating resistors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010438 heat treatment Methods 0.000 claims description 8
- 239000000758 substrate Substances 0.000 claims description 5
- 238000012360 testing method Methods 0.000 claims description 5
- 239000011241 protective layer Substances 0.000 claims description 3
- 239000012777 electrically insulating material Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Electronic Switches (AREA)
Description
第1図および第2図は本考案の第1および第2
の実施例を示す説明図であり、第3図はサーマル
ヘツド基板の一般的構造を示す断面図、第4図は
抵抗値検査方法を示す説明図、第5図は従来の抵
抗値検査方法を示す説明図である。
1……絶縁性基板、2……発熱抵抗体、3……
発熱抵抗体列、4……共通電極、5……リード電
極、6……保護層、7……抵抗値検査用電極パタ
ーン、8……パターンブロツク、9……ダミー基
板、10……ダミー電極。
Figures 1 and 2 are the first and second figures of the present invention.
FIG. 3 is a cross-sectional view showing the general structure of a thermal head board, FIG. 4 is an explanatory view showing a resistance value testing method, and FIG. 5 is an explanatory diagram showing a conventional resistance value testing method. FIG. 1...Insulating substrate, 2...Heating resistor, 3...
Heat generating resistor array, 4... Common electrode, 5... Lead electrode, 6... Protective layer, 7... Electrode pattern for resistance value testing, 8... Pattern block, 9... Dummy board, 10... Dummy electrode .
Claims (1)
配置してなる発熱抵抗体列と、前記発熱抵抗体に
対し、共通に電気接続される共通電極と、前記発
熱抵抗体の各々に接続されるリード電極と、少な
くとも前記発熱抵抗体列を覆い、かつ共通電極と
リード電極の外部回路と接続されるべき部分を除
いて前記発熱抵抗体及び共通電極、リード電極上
面を覆うように形成される電気的絶縁材料からな
る保護層とを有するラインサーマルヘツド基板に
おいて、前記共通電極と電気的に接続される抵抗
値検査用電極パターンを前記リード電極間の隙間
又は前記リード電極の端部方向の一部に形成し、
前記抵抗値検査用電極パターンの一部を前記保護
層外の基板上に露出させて発熱抵抗体の抵抗値を
測定するようにしたことを特徴とするラインサー
マルヘツド基板。 A heating resistor array formed by linearly arranging a plurality of heating resistors on an insulating substrate, a common electrode commonly electrically connected to the heating resistors, and connected to each of the heating resistors. The lead electrode is formed to cover at least the row of heating resistors, and to cover the upper surfaces of the heating resistor, the common electrode, and the lead electrode except for the portions of the common electrode and the lead electrode that are to be connected to an external circuit. In a line thermal head substrate having a protective layer made of an electrically insulating material, the resistance value testing electrode pattern electrically connected to the common electrode is placed in the gap between the lead electrodes or in the direction of the end of the lead electrode. formed in part,
A line thermal head substrate, characterized in that a part of the resistance value testing electrode pattern is exposed on the substrate outside the protective layer to measure the resistance value of the heating resistor.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6425190U JPH0422246U (en) | 1990-06-18 | 1990-06-18 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6425190U JPH0422246U (en) | 1990-06-18 | 1990-06-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0422246U true JPH0422246U (en) | 1992-02-25 |
Family
ID=31595024
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6425190U Pending JPH0422246U (en) | 1990-06-18 | 1990-06-18 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0422246U (en) |
-
1990
- 1990-06-18 JP JP6425190U patent/JPH0422246U/ja active Pending
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