JPH04204336A - Infrared radiation temperature measuring device - Google Patents

Abstract

PURPOSE:To promptly and reliably observe overall temperature change by selecting one of maximum, minimum and average temperature values at plural specific points set on a temperature measurement object to perform automatical setting at a center temperature level. CONSTITUTION:Infrared light naturally emitted from a temperature measurement object is detected 1 to output a temperature detection signal S1, which is converted into a digital signal to obtain temperature distribution and specific point temperature data through the control of CPUs 16, 18 for use in measurement condition setting and control and image processing and to store them in a memory 50 at a selection section 50 through the control of the CPU 16. Next, the selection section 50 first calculates the average value of the specific point temperature data and selects one of the maximum, minimum and average values at plural specific points, which is fed into a bus line 22 and image- displayed on a CRT 15 through the control of the CPU 18. At the same time, a center temperature level in a measurement range is automatically changed and set to the value selected through the control of the CPUs 16, 18. It is thus possible to promptly and reliably observe overall temperature change in the temperature measurement object.

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to an infrared radiation temperature measuring device suitable for application to a temperature measuring device that measures temperature in a non-contact manner.

[Summary of the invention]

The present invention relates to an infrared radiation temperature measurement bag suitable for use in a temperature measurement device that measures temperature without contact, and includes a setting means for setting designated points for temperature measurement at a plurality of locations on an object to be measured. , the maximum value of temperature at multiple specified points,
selection means for selecting either the minimum value or the average value;
By providing an automatic setting means for automatically setting the center temperature level at one of the selected maximum value, minimum value, and average value, observation of the overall temperature change of the temperature measurement object can be quickly and reliably performed. It has been made possible.

[Conventional technology]

2. Description of the Related Art Conventionally, a so-called thermography apparatus has been used to measure temperature by detecting infrared rays naturally emitted from an object to be measured using a non-contact infrared camera.

In this thermography apparatus, for example, an optical mechanism of an infrared camera scans infrared radiation emitted from an object to be measured in the horizontal and vertical directions, and an infrared detector detects infrared energy related to the surface. Then, the converted electric signal is generated into a temperature signal proportional to the temperature, and further converted into a digital signal such as 8 bits, and then the temperature distribution and arbitrary Obtaining temperature data at specified points in the area.

Furthermore, the temperature distribution and designated point temperature data are analyzed by a computer, and images thereof are displayed, for example, thermal images, isothermal images, three-dimensional images, histograms, and trend images.

FIGS. 8A and 8B show examples of image display for temperature measurement using thermal images.

In the example of temperature measurement shown in FIG. 8A, a specified point (cross point - CP T (+)) is set at an arbitrary measurement site on the temperature measurement object under the control of the measurement condition setting control CPU.
is set. If the CPT temperature in this case is 20 degrees, the center temperature level between the upper and lower values of the measurement range R is 20 degrees (T2O).

After this, when the temperature of the CPT rises to 100 degrees as shown in Figure 8B, the center temperature level in the measurement range R is automatically changed to 100 degrees (T100) under the control of the CPU in response to this temperature change. Set.

By changing the center temperature and input in response to temperature changes in the CPT in this manner, temperature measurements that effectively respond to temperature changes are performed.

[Problem to be solved by the invention]

However, in the infrared radiation temperature measuring device according to the above-mentioned conventional technology, when the CPT is within the range of the temperature rising area, the temperature change can be measured (observed).
In this case, it is good if the temperature of the object to be measured changes uniformly, but partial temperature changes, that is, temperature changes in other parts, cannot be confirmed. In other words, there is a drawback that the overall temperature change of the object to be measured cannot be measured.

The present invention has been made in view of the above problems, and an object of the present invention is to provide an excellent infrared radiation temperature measurement device that can quickly and reliably observe the overall temperature change of an object to be measured.

(Means for Solving the Problems) The present invention detects infrared rays from an object to be temperature measured and sends out an output signal, as shown, for example, in the infrared radiation temperature measuring device of FIGS. 1 to 7. Infrared detection part (lO)
In an infrared radiation temperature measuring device equipped with a measurement signal processing unit (12) for measuring changes in the temperature of the object to be measured from this output signal, the temperature can be measured at multiple locations on the object to be measured. Setting means (14), (16) for setting designated points for.

(1B), (20), (26), (30), (36),
(40), (42) (44), selection means (50) for selecting one of the maximum value, minimum value, and average value of temperature at a plurality of designated points; and the selected maximum value, minimum value, and average value. automatic setting means (14), (16), (
18), (20), (26), (30)
, (36), (40).

(42L (44)).

[Function] According to the infrared radiation temperature measuring device of the present invention, one of the maximum value, minimum value, and average value of temperature at specified points set at a plurality of parts on the temperature measurement object is selected,
The center temperature level is automatically set, and the overall temperature change of the object to be measured can be observed quickly and reliably.

〔Example〕

EMBODIMENT OF THE INVENTION Hereinafter, one embodiment of the infrared radiation temperature measuring device of the present invention will be described in detail with reference to the drawings.

FIG. 1 is a block diagram showing the configuration of the embodiment, FIG. 2 is a block diagram showing the detailed configuration of the selection section, FIG. 3 is a block diagram showing the specific configuration of the maximum value/minimum value detection circuit, and FIG. The figure is used to explain the designated points of the measurement area, Figure 5 is used to explain when the automatic setting of the center temperature level is set to the maximum value, and Figure 6 is used to explain when the automatic setting of the center temperature level is set to the maximum value. FIG. 7 is a diagram used to explain the case where the center temperature level is automatically set to the average value.

In Fig. 1, (10) detects the infrared rays naturally emitted from the temperature measurement object and sends a detection signal S corresponding to the temperature.
This is a detection unit that outputs 1, a so-called infrared camera. (1
2) The temperature of the object to be measured is set from the keyboard (14) based on the signal from the detection unit (10), and the signal processed here is displayed as an image on the CRT (15) and measured (observed). This is the measurement signal processing section for the

The configuration consisting of this detection section (10) and measurement signal processing section (12) is a well-known thermography apparatus.

The detection unit (10) scans the infrared rays emitted from the temperature measurement object in the horizontal and vertical directions using an optical mechanism, such as a galvanometer, and also scans the infrared rays emitted from the temperature measurement object in the horizontal and vertical directions.
A control signal from 2) is supplied, and infrared energy related to the surface of the object to be temperature measured is incident on the infrared detector. The detection signal S+, which is converted here and generated into a temperature signal proportional to the temperature, is supplied to the measurement signal processing section (12).

The measurement signal processing section (12) includes a first CPU (16) for measurement condition setting control and a second CPU (16) for image signal processing.
18) and a pass line (20) respectively.
.

(22).

The first CPU (16) includes an A/D converter (
22) is connected to the buffer memory (24), and the first ROM (26) stores the control program here.
, an I10 boat (28) for sending control signals to the detection unit (10), and an I10 boat (28) for the keyboard (14).
30), GB-IB interface (32), R3-
2320 interface (34L pass line (20)
and a pass line (22).

Furthermore, the second CPU (1B) has a pass line (2
2) a second ROM (40) in which the image processing control program is stored, and a working R
A M (42), memory with relatively large storage capacity (44)
and an RGB generator (46), and a CRT (15) is connected to this RGB generator (46).

Furthermore, a selection section (50) is connected between the pass line (20) and the lotus line (22), and here, for example, up to 10 designated points can be selected from the keyboard (I4) on the temperature measurement object. The central temperature level is set, and selection processing is performed when automatically setting one of the maximum value, minimum value, and average value of the center temperature level at the specified point.

FIG. 2 shows the configuration of the selection section (50).

Temperature data at designated points set at a maximum of 10 locations on the temperature measurement object is supplied from the pass line (20). Then, there are memories (51), (52), which store this information.
(53), (54)...(60), a maximum value detection circuit (62) that detects the maximum value of the temperature at the specified point, an adder (64) for obtaining the added value of the temperature at the specified point, and the specified point. It is equipped with a minimum value detection circuit (66) for detecting the minimum value of the temperature at a point, a division circuit (68) for obtaining an arithmetic average value by dividing the added value by 1/n (here, 1/10), and furthermore, detecting the maximum value. Detection circuit (62
), a division circuit (68), and a selection circuit (70) that selects the output signal of the minimum value detection circuit (66).

Figure 3 shows the maximum value detection circuit (62) and the minimum value detection circuit (62).
A detailed configuration example of 6) is shown below.

This example is controlled by the first CP tJ (16), and the memories (51), (52), (53), (5
4) )...(60) consists of a switch (80) for selecting the readout signal, a comparator (82) to which this signal is supplied, and a latch circuit (84). ) Initial value signal S0 or 5ZS input to
S, that is, output signal S by 8-bit processing of 0 for the maximum value detection circuit (62) and 255 for the minimum value detection circuit (66). UT is obtained.

Next, the operation of the above configuration will be explained.

The infrared radiation emitted from the object to be temperature measured is scanned horizontally and vertically by the optical mechanism of the detection unit (10), the infrared energy on the surface is detected by the infrared detector, and the electrical signal converted here is converted into temperature. A proportional temperature signal is generated.

The detection signal S1 here is a temperature signal proportional to the temperature, and is then converted into an 8-bit digital signal and used, for example, in a CP for measurement condition setting control and image processing.
Temperature distribution and specified point temperature data are obtained by controlling IJ (16) and (18).

In this case, under the control of the CPUs (16) and (1B), one horizontal scanning line is stored in the memory (44), and then stored in the memory (44). After this, 60
It is read out at the timing of the video signal of
Mixed with signals and character signals. here,
Converted to ROB color video signal and sent to CRT (15)
The image is displayed.

Further, based on the temperature distribution and specified point temperature data, image display is performed by computer analysis (not shown), such as thermal image, isothermal zone image, three-dimensional image, histogram, and trend image display.

Here, when obtaining temperature distribution and specified point temperature data by controlling the CPU (16) and (1B), the selection unit (50) selects the maximum value of temperature at a plurality of specified points on the temperature measurement object, The center temperature level is automatically set by selecting either the minimum value or the average value.

As shown in Fig. 4, designated points on the temperature measurement object are the parts where the temperature is to be measured, here there are four designated points a, b, and c.
, d are set. Then, these four specified points a, b
, c, d are designated point temperatures Ta, Tb, Tc, Td,
It is also assumed that Ta>Tb>Tc>Td.

The temperature data of the specified points a, b, c, and d, that is, the values of the specified point temperatures Ta, Tb, Tc, and Td are sent to the CPU (16).
Memory (51), (52), (5
3).

(54) are respectively stored.

After this, an average value is calculated. First, Memo IJ (51)
.

The values (data) of designated point temperatures Ta, Tb, Tc, and Td read from (52), (53), and (54) are input to an adder (64) and added. After this, the output signal from the adder (64) is divided by 1/4. That is, the calculation process expressed by the following equation (1) is executed.

Arithmetic average (Tave) = Ta + T b + T
c + T d - T n / N - (1) The arithmetic average value (T ave) in this calculation process is determined by the selection circuit (
70).

At the same time, the maximum value is calculated. Memory (51), (5
2).

Specified point temperature Ta read from (53) and (54)
, Tb, Tc, Td values (data) are detected by the maximum value detection circuit (
62) and the maximum value, here the designated point temperature Ta
is derived.

Also, the minimum value is calculated. Similarly, memory (51)
, (52), (53), and (54) are input to the minimum value detection circuit (66) to obtain the minimum designated point temperature Td.

If this maximum or minimum value is selected, the specified point a
Data of d to d are supplied from memories (51) to (54), and are selected by a switch (80) and sent to a comparator (8).
2) is input to input terminal A.

The input terminal B of the comparator (82) receives the latch initial value signal S0.
Or, 325% (for the maximum value detection circuit (62): 0, for the minimum value detection circuit (66): 255) is input, and in the case of maximum value detection, if A>B, the read signal is output, the data is latched and inputted to the input terminal of the comparator (82). This operation is executed from designated point a to designated point d.

Further, in the case of minimum value detection, when A<B, a read signal is output, the data is latched, and the data is input to the input terminal B of the comparator (82). This operation is executed from designated point a to designated point d, respectively.

Note that when A=B, no read signal is output.

Here, the value obtained by selecting one of the maximum value, minimum value and average value in the selection circuit (70) is the lotus line (22).
will be sent to.

Then, under the control of the CPU (18), the display image with the maximum value selected as shown in FIG. 5, the display image with the minimum value selected as shown in FIG. 6, and the arithmetic average value shown in FIG. If any of the displayed images with is selected is CRT (15
) is displayed.

1 At the same time, set the center temperature level of measurement range R to CPU (1
6) Selected Ta, T by control of (1B)
The values of ave and Td are automatically changed and set.

As shown in step 2, by automatically setting the center temperature level by selecting one of the maximum, minimum, and average temperature values at multiple specified points on the temperature measurement target, the entire temperature measurement target can be automatically set. It will be possible to observe temperature changes.

〔Effect of the invention〕

As can be understood from the above description, according to the infrared radiation temperature measuring device of the present invention, one of the maximum value, minimum value, and average value of temperature at a plurality of designated points on the temperature measurement object is selected. Since the center temperature level is automatically set, there is an advantage that the overall temperature change of the object to be measured can be observed quickly and reliably.

[Brief explanation of the drawing]

FIG. 1 is a block diagram showing the configuration of an embodiment of the infrared radiation temperature measuring device of the present invention, FIG. 2 is a block diagram showing the detailed configuration of the selection section shown in FIG. 1, and FIG. Figure 2 is a block diagram showing the specific configuration of the maximum value/minimum value detection circuit shown in Figure 4. Figure 4 is a diagram used to explain the designated points of the measurement site on the temperature measurement object. Figure 5 is a diagram showing the central temperature. Figure 6 is a diagram used to explain when the automatic setting of the level is set to the maximum value. Figure 6 is a diagram used to explain when the automatic setting of the center temperature level is set to the minimum value. Figure 7 is a diagram used to explain when the automatic setting of the center temperature level is set to the minimum value. FIGS. 8A and 8B are diagrams for explaining the case where the automatic setting is an average value, and FIGS. 8A and 8B are diagrams for explaining the operation of the conventional technique. (10) is the detection unit, (12) is the signal processing unit, (14) is the keyboard, (15) is the CRT, and (16) is the first CP.
U, (18) is the second CPU, (20), (22)
is the pass line, (26) is the first ROM, (36) is the D
P-RAM, (40) is second ROM, (42) is RA
M, (44) is memory, (50) is selection section, (51)
, (52) , (53) , (54) )...
(60) is a memory, (62) is a maximum value detection circuit, (64)
) is an adder, (66) is a minimum value detection circuit, (68) is a division circuit, (70) is a selection circuit, (80) is a switch, (
82) is a comparator, (84) is a latch circuit, S is a detection signal, So, 525S is an initial value signal, SQLIT
is the output signal. 4 pictures! h, Fζii i゛ and Ichishi ELF=] Tomoroku 1's l Ken 1〒
a. Figure 5. High value and selection (9)

Claims (1)

[Scope of Claims] An infrared ray comprising an infrared detection section that detects infrared rays from an object to be temperature measured and sends out an output signal, and a measurement signal processing section that measures a change in temperature of the object to be temperature measured from the output signal. In the radiation temperature measuring device, a setting means for setting specified points for temperature measurement at a plurality of parts on the temperature measurement object, and a maximum value, a minimum value, and an average value of the temperature at the plurality of specified points. An infrared radiation temperature measurement device comprising: a selection means for selecting a central temperature level; and an automatic setting means for automatically setting a center temperature level at one of the selected maximum value, minimum value, and average value.