JPH04193950A - Planar magnetron sputtering device - Google Patents

Planar magnetron sputtering device

Info

Publication number
JPH04193950A
JPH04193950A JP32810090A JP32810090A JPH04193950A JP H04193950 A JPH04193950 A JP H04193950A JP 32810090 A JP32810090 A JP 32810090A JP 32810090 A JP32810090 A JP 32810090A JP H04193950 A JPH04193950 A JP H04193950A
Authority
JP
Japan
Prior art keywords
target
permanent magnet
rail
pol
pole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP32810090A
Other languages
Japanese (ja)
Inventor
Yoshikazu Eguchi
芳和 江口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP32810090A priority Critical patent/JPH04193950A/en
Publication of JPH04193950A publication Critical patent/JPH04193950A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To attain the uniform sputtering of a target by rotating a couple of N-pole and S-pole of a permanent magnet in parallel to a face which is not contact with the plasma of the target, and simultaneously moving the poles in parallel to a direction perpendicular to an electric field impressing to the target. CONSTITUTION:Cooling water is introduced into a water jacket 105 from an introducing hole 110, and gaseous mixture of N2 and Ar is introduced into a sputtering room to be at a prescribed pressure. Then the motor 104 is revolved and S-pol and N-pol of a permanent magnet are rotated via a rotation axis 103, and the fixing base 107 of the motor 104 is moved in parallel along a rail 108 and simultaneously the rail 108 is moved in parallel along a rail 109. Accordingly, the central point of a couple of S-pol 101 and N-pol 102 of the permanent magnet is moved over the whole face of the target 106. By this method the target 106 is sputtered uniformly and utilization efficiency is improved the generation of particles is suppressed and high-quality thin films are accumulated the treated body.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、プレーナマグネトロンスパッタリング装置の
電極の構造に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to the structure of an electrode of a planar magnetron sputtering device.

[従来の技術] 従来のプレーナマグネトロンスパッタリング装置の電極
構造は、第2図(a)のような電動機204によって回
転可能な永久磁石のN極201とS極202の対が、第
2図(b)のように平板ターゲット206の中心に、回
転軸203の中心が位置するように取り付けられていた
。     □[発明が解決しようとする課!!] しかしながら、前述の従来技術では平板ターゲット20
6の中心部”と外周部がほとんどスパッタリングされず
、ターゲットの使用効率が悪いという問題を有Cていた
。又、反応性スパッタリングを行った際は、このターゲ
ットの中心部と外周部にターゲットと雰囲気ガスとの反
応物が付着し、パーティクル発生の原因となる問題を有
しfいた。
[Prior Art] The electrode structure of a conventional planar magnetron sputtering apparatus is such that a pair of N pole 201 and S pole 202 of a permanent magnet rotatable by an electric motor 204 as shown in FIG. ), the rotary shaft 203 was attached so that the center of the rotating shaft 203 was located at the center of the flat target 206. □ [The problem that the invention tries to solve! ! ] However, in the above-mentioned conventional technology, the flat target 20
There was a problem that the target was hardly sputtered at the center and outer periphery of the target, resulting in poor target usage efficiency.Also, when reactive sputtering was performed, the target was not sputtered at the center and outer periphery. There was a problem in that reactants with the atmospheric gas adhered and caused the generation of particles.

そこで、本発明はこのような問題を解決するもので、そ
の目的とするところはターゲットのプラズマと接してい
ない面と平行に永久磁石のN極とS極の対を回転させる
と同時に、前記永久磁石のN極とS極の対をターゲツト
面と平行な方向、即ちターゲットに印加される電場と垂
直な方向に平行移動させることにより、ターゲットが均
一にスパッタリングされるようにするところにある。
The present invention is intended to solve these problems, and its purpose is to rotate the pair of N and S poles of a permanent magnet parallel to the surface of the target that is not in contact with the plasma, and at the same time The target is sputtered uniformly by translating the pair of north and south poles of the magnet in a direction parallel to the target surface, that is, in a direction perpendicular to the electric field applied to the target.

[課題を解決するための手段] 本発明は、陽極と陰極を有し、これらの間に活性プラズ
マを作る機構、 前記陰極をターゲット材料で構成し、前期陰極表面に垂
直の方向に電場を作る機構、 前記陰極の活性プラズマに接していない面に永久磁石を
設け、前記電場と垂直の方向に磁場を作る機構、 前記永久磁石を前記電場と垂直の方向に移動させる機構
、 よりなることを特徴とする [実施例] 本発明であるプレーナマグネトロンスパッタリング装置
は、基本的には第1図(a)のような永久磁石を移動さ
せる機構を、第1図(b)のように平板ターゲットのプ
ラズマと接しない面に取り付けられている装置である。
[Means for Solving the Problems] The present invention has a mechanism for creating an active plasma between an anode and a cathode, the cathode is made of a target material, and an electric field is created in a direction perpendicular to the surface of the cathode. a mechanism, a mechanism that creates a magnetic field in a direction perpendicular to the electric field by providing a permanent magnet on a surface of the cathode that is not in contact with the active plasma, and a mechanism that moves the permanent magnet in a direction perpendicular to the electric field. [Example] The planar magnetron sputtering apparatus of the present invention basically replaces the mechanism for moving a permanent magnet as shown in FIG. 1(a) with the plasma of a flat target as shown in FIG. 1(b). This is a device that is attached to a surface that does not touch the surface.

第1図(a)は、平板ターゲット106のプラズマと接
しない面に取り付けられる永久磁石の移動機構の構造を
示す図で、101は永久磁石のS極、102は永久磁石
のN極、103は回転軸、104は電動機、107は電
動機104の固定台で、レール108に沿って移動でき
る。更に、レール108は、レール108に直行するレ
ール1′09に沿って移動できる。
FIG. 1(a) is a diagram showing the structure of a moving mechanism for a permanent magnet attached to the surface of the flat target 106 that does not come into contact with plasma, where 101 is the S pole of the permanent magnet, 102 is the N pole of the permanent magnet, and 103 is the N pole of the permanent magnet. A rotating shaft, 104 is an electric motor, and 107 is a fixed stand for the electric motor 104, which can be moved along a rail 108. Furthermore, the rail 108 can move along a rail 1'09 orthogonal to the rail 108.

第1図(b)は、第1図(a)のような永久磁石の移動
機構と平板ターゲット106との位置関係を示す図で、
105は平板ターゲット106を冷却するためのウォー
タージャケットである。また、110は冷却水の導入口
、111は冷却水の排圧口である。
FIG. 1(b) is a diagram showing the positional relationship between the permanent magnet moving mechanism and the flat target 106 as shown in FIG. 1(a).
105 is a water jacket for cooling the flat target 106. Further, 110 is a cooling water inlet, and 111 is a cooling water exhaust pressure port.

第1図(C)は、第1図(a)に示した永久磁石の移動
機構における回転軸103の軌跡を示す図で、112が
その軌跡である。
FIG. 1(C) is a diagram showing the trajectory of the rotating shaft 103 in the permanent magnet moving mechanism shown in FIG. 1(a), and 112 is the trajectory.

以下、詳細を第1図に基づいて説明する。まず、冷却水
導入口110より冷却水をウォータージャケット105
に導入する。この後、スパッタ室(図示せず)にスパッ
タリング雰囲気ガスである窒素とアルゴンの混合ガスを
導入し、圧力を6mtorrに調整する。そして電動機
104を回転させ永久磁石のS極101とN極102を
回転軸103を介して回転させる。回転数は約1100
rpである。そして電動機固定台107をレール108
に沿って平行移動させる。同時にレール1゜8もレール
109に沿って平行移動させる。その結果、永久磁石の
S極101とN極の対の中心点は第1図(C)のような
軌跡を描きながら移動する。この第1図(C)から分か
るように、永久磁石はターゲットの全面にわたって移動
する。この時の移動速度は毎秒5センチ程度である。
Details will be explained below based on FIG. 1. First, cooling water is supplied to the water jacket 105 from the cooling water inlet 110.
to be introduced. Thereafter, a mixed gas of nitrogen and argon, which is a sputtering atmosphere gas, is introduced into a sputtering chamber (not shown), and the pressure is adjusted to 6 mtorr. Then, the electric motor 104 is rotated to rotate the S pole 101 and the N pole 102 of the permanent magnet via the rotating shaft 103. The rotation speed is approximately 1100
It is rp. Then, the electric motor fixing stand 107 is attached to the rail 108.
Translate parallel along. At the same time, the rail 1°8 is also moved in parallel along the rail 109. As a result, the center point of the pair of S pole 101 and N pole of the permanent magnet moves while drawing a trajectory as shown in FIG. 1(C). As can be seen from FIG. 1(C), the permanent magnet moves over the entire surface of the target. The moving speed at this time is about 5 centimeters per second.

この状態で、平板ターゲットである純チタンターゲット
106に約6kWの電力を印加し、被処理基板(図示せ
ず)上に窒化チタンを堆積する。
In this state, approximately 6 kW of power is applied to the pure titanium target 106, which is a flat target, to deposit titanium nitride on the substrate to be processed (not shown).

この時の堆積速度は毎分1000人程度になる。The deposition rate at this time is about 1,000 people per minute.

ここで、永久磁石101と102は回転軸103を軸に
して回転すると同時に、平板ターゲット106に平行な
方向に移動しているので、平板ターゲット106は均一
にスパッタリングされターゲットを効率よく使用できる
。また、平板ターゲット106にパーティクル源となる
窒化チタンが再付着することもないので、欠陥密度の低
い窒化チタン膜を堆積できる。
Here, since the permanent magnets 101 and 102 rotate about the rotating shaft 103 and at the same time move in a direction parallel to the flat target 106, the flat target 106 is sputtered uniformly and the target can be used efficiently. Furthermore, since titanium nitride, which serves as a particle source, does not re-deposit on the flat target 106, a titanium nitride film with a low defect density can be deposited.

堆積を終了するときは、平板ターゲットである純チタン
ターゲット106に印加されている電力を断ち、スパッ
タ室(図示せず)へのガスの導入を停止し、永久磁石1
01と102の平行移動と回転を止めればよい。
When finishing the deposition, the power applied to the pure titanium target 106, which is a flat plate target, is cut off, the introduction of gas into the sputtering chamber (not shown) is stopped, and the permanent magnet 1 is turned off.
All you have to do is stop the parallel movement and rotation of 01 and 102.

以上本発明による1実施例について述べてきたが、特許
請求の範囲で規定した範囲から逸脱せずに各種の変更や
改変を実施できることは言うまでもない。
Although one embodiment of the present invention has been described above, it goes without saying that various changes and modifications can be made without departing from the scope defined in the claims.

[発明の効果] 以上述べた本発明のプレーナマグネトロンスパッタリン
グ装置は、ターゲットの使用効率を向上させることがで
き、またパーティクル発生を抑えることにより高品質の
薄膜を被処理体上に堆積することが出来る効果を有する
[Effects of the Invention] The planar magnetron sputtering apparatus of the present invention described above can improve the efficiency of target use, and can deposit a high-quality thin film on the object to be processed by suppressing particle generation. have an effect.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)は、本発明のプレーナマグネトロンスパッ
タリング装置における永久磁石の移動機構を示す説明図
。 第1図(b)は、本発明のプレーナマグネトロンスパッ
タリング装置における永久磁石移動機構の取り付けを示
す説明図。 第1図(C)は、本発明のプレーナマグネトロンスパッ
タリング装置における永久磁石の軌跡を示す説明図。 第2図(a)は、従来のプレーナマグネトロンスパッタ
リング装置における永久磁石の移動機構を示す説明図。 第2図(b)は、従来のプレーナマグネトロンスパッタ
リング装置における永久磁石移動機構の取り付けを示す
説明図。 101.201 永久磁石S極 102.202 永久磁石N極 103.203 回転軸 104.204 1i動機 105.205 ウォータージャケット106.206
 平板ターゲット 107     電動機固定台 108      レール 109      レール 110      冷却水導入口 111     冷却水導入口 112     永久磁石の軌跡 以上 出願人 セイコーエプソン株式会社 代理人 弁理士 鈴木喜三部(他1名)1 ′L 口 
(b) 見 二 図 (α) ノ %   z   r2I   tb)
FIG. 1(a) is an explanatory diagram showing a permanent magnet moving mechanism in the planar magnetron sputtering apparatus of the present invention. FIG. 1(b) is an explanatory diagram showing the installation of a permanent magnet moving mechanism in the planar magnetron sputtering apparatus of the present invention. FIG. 1(C) is an explanatory diagram showing the locus of the permanent magnet in the planar magnetron sputtering apparatus of the present invention. FIG. 2(a) is an explanatory diagram showing a permanent magnet moving mechanism in a conventional planar magnetron sputtering apparatus. FIG. 2(b) is an explanatory diagram showing the installation of a permanent magnet moving mechanism in a conventional planar magnetron sputtering apparatus. 101.201 Permanent magnet south pole 102.202 Permanent magnet north pole 103.203 Rotating shaft 104.204 1i motive 105.205 Water jacket 106.206
Flat target 107 Motor fixing base 108 Rail 109 Rail 110 Cooling water inlet 111 Cooling water inlet 112 More than the trajectory of the permanent magnet Applicant Seiko Epson Co., Ltd. agent Patent attorney Kizobe Suzuki (1 other person) 1'L mouth
(b) See two figures (α) ノ% z r2I tb)

Claims (1)

【特許請求の範囲】  陽極と陰極を有し、これらの間に活性プラズマを作る
機構、 前記陰極をターゲット材料で構成し、前期陰極表面に垂
直の方向に電場を作る機構、 前記陰極の活性プラズマに接していない面に永久磁石を
設け、前記電場と垂直の方向に磁場を作る機構、 前記永久磁石を前記電場と垂直の方向に移動させる機構
、 よりなることを特徴とするプレーナマグネトロンスパッ
タリング装置。
[Scope of Claims] A mechanism having an anode and a cathode and creating active plasma between them; A mechanism in which the cathode is made of a target material and creating an electric field in a direction perpendicular to the surface of the cathode; Active plasma of the cathode A planar magnetron sputtering apparatus comprising: a mechanism for providing a permanent magnet on a surface not in contact with the electric field and creating a magnetic field in a direction perpendicular to the electric field; and a mechanism for moving the permanent magnet in a direction perpendicular to the electric field.
JP32810090A 1990-11-28 1990-11-28 Planar magnetron sputtering device Pending JPH04193950A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32810090A JPH04193950A (en) 1990-11-28 1990-11-28 Planar magnetron sputtering device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32810090A JPH04193950A (en) 1990-11-28 1990-11-28 Planar magnetron sputtering device

Publications (1)

Publication Number Publication Date
JPH04193950A true JPH04193950A (en) 1992-07-14

Family

ID=18206510

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32810090A Pending JPH04193950A (en) 1990-11-28 1990-11-28 Planar magnetron sputtering device

Country Status (1)

Country Link
JP (1) JPH04193950A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100262768B1 (en) * 1996-04-24 2000-08-01 니시히라 순지 Sputter deposition system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100262768B1 (en) * 1996-04-24 2000-08-01 니시히라 순지 Sputter deposition system

Similar Documents

Publication Publication Date Title
US6113752A (en) Method and device for coating substrate
JP3164364B2 (en) Method of coating substrate with silicon-based compound
JP2002509988A (en) Method and apparatus for depositing a biaxially textured coating
JP2970317B2 (en) Sputtering apparatus and sputtering method
JPH0240739B2 (en) SUPATSUTASOCHI
JPH04193950A (en) Planar magnetron sputtering device
JP2006233240A (en) Sputtering cathode and sputtering system
JP2549291B2 (en) Magnetron sputtering equipment
JP4246546B2 (en) Sputtering source, sputtering apparatus, and sputtering method
JPH01309965A (en) Magnetron sputtering device
JPH06505051A (en) Equipment with magnetron sputter coating method and rotating magnet cathode
JPH1046334A (en) Sputter coating forming device
CN109487225A (en) Magnetron sputtering film formation device and method
JPS6217175A (en) Sputtering device
CN1040234C (en) Arc source with rotary magneitcally-controlled columnar cathode
JPS63109163A (en) Sputtering device
JPH0211761A (en) Sputtering device
JP3810132B2 (en) Sputtering equipment
JPH04371577A (en) Magnetron type sputtering device
JPS5881969A (en) Sputter source of magnetron sputtering
JPS627851A (en) Sputtering method
JPS61295368A (en) Cathode for magnetron sputtering
JPH07292468A (en) Sputtering device
JP2001207258A (en) Rotating magnet, and inline type sputtering system
JPS61208223A (en) Method and apparatus for plasma treatment