JPS61295368A - Cathode for magnetron sputtering - Google Patents

Cathode for magnetron sputtering

Info

Publication number
JPS61295368A
JPS61295368A JP13682185A JP13682185A JPS61295368A JP S61295368 A JPS61295368 A JP S61295368A JP 13682185 A JP13682185 A JP 13682185A JP 13682185 A JP13682185 A JP 13682185A JP S61295368 A JPS61295368 A JP S61295368A
Authority
JP
Japan
Prior art keywords
target
magnetic field
cathode
target surface
pole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13682185A
Other languages
Japanese (ja)
Other versions
JPH0142350B2 (en
Inventor
Minoru Omoto
大本 稔
Takashi Ito
孝 伊東
Akira Odagiri
小田切 耀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHINKU KIKAI KOGYO KK
Original Assignee
SHINKU KIKAI KOGYO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHINKU KIKAI KOGYO KK filed Critical SHINKU KIKAI KOGYO KK
Priority to JP13682185A priority Critical patent/JPS61295368A/en
Publication of JPS61295368A publication Critical patent/JPS61295368A/en
Publication of JPH0142350B2 publication Critical patent/JPH0142350B2/ja
Granted legal-status Critical Current

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Abstract

PURPOSE:To improve by simple mechanism the use efficiency of a square-shaped target by making adjustable the inclination, to the target surface, of a magnetic- field generating device provided at the rear of the target surface of a cathode. CONSTITUTION:The magnetic-field generating device 15 is provided at the rear of the reverse side 13 of the target 51 surface of the cathode 11. The device 15 is made turnable, for example, by means of a turning axis 17 and resultingly the angle formed by a straight line joining the north and south poles and by the target 51 surface is made variable, so that a practically square- shaped closed loop constituted of a line 19 of magnetic force starting from the north pole of the above device 15, passing through the target 51 surface and terminating in the south pole and of the target 51 surface can be formed on the surface of the target 51.

Description

【発明の詳細な説明】 艮亙分更 本発明はマグネトロンスパッタリング装置に用いられる
カソードに関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a cathode used in a magnetron sputtering apparatus.

従】6鉦皮庸− 旧来のスパッタリング法においては、膜の形成速度が小
さいこと、基板の温度上昇が大きいことが大きな問題と
なっていたが、これらの問題は電場と直交するように磁
場をかけてスパッタリングすることにより、大きく改善
されるに至った。とくに、ターゲット電極(カソード)
の裏面にN極およびS極を互いに離間して配設し。
[6] In the conventional sputtering method, the slow film formation rate and the large temperature rise of the substrate were major problems, but these problems could be solved by applying a magnetic field perpendicular to the electric field. A significant improvement was achieved by sputtering. In particular, the target electrode (cathode)
N and S poles are arranged spaced apart from each other on the back side of the.

ターゲット表面上に閉じた磁界を発生させてプラズマを
閉じこめるようにしたマグネトロンスパッタ法は、大き
な成膜速度が得られ、しかも基板への電子の流入を抑え
ることができる(昭和58年12月10日、オーム社発
行、薄膜ハンドブックp186〜190)。
The magnetron sputtering method, which generates a closed magnetic field on the target surface to confine the plasma, can achieve a high deposition rate and can also suppress the inflow of electrons into the substrate (December 10, 1982) , published by Ohmsha, thin film handbook p186-190).

しかしながら、マグネトロンスパッタ法では、電界の方
向と磁界の方向とが直交する部分で最も大きな速度でス
パッタリングがおこるため、この部分のターゲットが局
部的に浸食されるという問題がある。局部的な浸食(エ
ロージョン)が発生すると、ターゲットの使用効率が悪
くなってしまう。従来、ターゲットよりも十分に小さな
磁界発生装置をターゲット裏面に設け、これをターゲッ
トと平行に移動することにより、閉ループを移動してタ
ーゲットを均一に使用することが提案されている。しか
しこの方法ではターゲットの全面が常にスパッタに利用
されず、制動機構が複雑となるという問題があった。
However, in the magnetron sputtering method, since sputtering occurs at the highest speed in a portion where the direction of the electric field and the direction of the magnetic field are perpendicular to each other, there is a problem that the target in this portion is locally eroded. When localized erosion occurs, the efficiency of target use deteriorates. Conventionally, it has been proposed to provide a magnetic field generating device sufficiently smaller than the target on the back surface of the target and move it parallel to the target, thereby moving in a closed loop and using the target uniformly. However, this method has the problem that the entire surface of the target is not always used for sputtering and the braking mechanism becomes complicated.

一方、生産用ターゲットとして、5インチX15インチ
、5インチX20インチなどの大型の角型のターゲット
が一般的に用いられるようになっており、さらにターゲ
ットの大型化が進んでいることから、ターゲットの使用
効率の向上がいっそう要望されている。
On the other hand, large rectangular targets such as 5 inches x 15 inches and 5 inches x 20 inches are now commonly used as production targets, and as targets are becoming larger, There is a growing demand for improved usage efficiency.

見匪夏且孜 本発明は、簡単な機構で、角型状のターゲットの使用効
率を改善することを目的とする。
SUMMARY OF THE INVENTION The present invention aims to improve the efficiency of using a rectangular target with a simple mechanism.

見匪血1腹 本発明のマグネトロンスパッタ用カソードは、カソード
のターゲット面の裏面側に磁界発生装置が配設され、該
磁界発生装置のN極から発してターゲット面を通過して
S極に入る磁力線とターゲット面とによる略角型の閉ル
ープがターゲット面上に形成されるようになっているス
パッタ装置において、該磁界発生装置のN極とS極とを
結ぶ直線と該ターゲット面との角度が可変となるように
、該磁界発生装置が取り付けられていることを特徴とす
る。
In the magnetron sputtering cathode of the present invention, a magnetic field generator is disposed on the back side of the target surface of the cathode, and a magnetic field is emitted from the north pole of the magnetic field generator, passes through the target surface, and enters the south pole. In a sputtering device in which a substantially rectangular closed loop is formed on the target surface by lines of magnetic force and the target surface, the angle between the straight line connecting the N pole and the S pole of the magnetic field generator and the target surface is It is characterized in that the magnetic field generating device is attached so as to be variable.

以下、添付図面に沿って本発明をさらに詳細に説明する
Hereinafter, the present invention will be described in more detail with reference to the accompanying drawings.

第1図は本発明のカソードの実施例を模式的に示す断面
図であり、カソード11のターゲット面13上には、タ
ーゲット51が配設されてスパッタされる。カソード1
1のターゲット面13の反対側には磁界発生装置15が
設けられている。
FIG. 1 is a cross-sectional view schematically showing an embodiment of the cathode of the present invention, and a target 51 is disposed on the target surface 13 of the cathode 11 for sputtering. cathode 1
A magnetic field generator 15 is provided on the opposite side of the first target surface 13 .

カソード11は絶縁体33を介して真空槽31から電気
的に浮かして配設されており、スパッタ用電源41に接
続されている。
The cathode 11 is placed electrically floating from the vacuum chamber 31 via an insulator 33, and is connected to a sputtering power source 41.

磁場発生装置15は、第2図にも示すように、永久磁石
片21a、21b、23のN極とS極とが離間するよう
に角型に配列して構成されている。また、長手方向に設
けられた回動軸17により1回動可能に配設されており
、これによりターゲット面13に対する角度を調整でき
るようになっている。
As shown in FIG. 2, the magnetic field generator 15 is constructed by arranging permanent magnet pieces 21a, 21b, and 23 in a rectangular shape so that their N and S poles are spaced apart from each other. Further, it is disposed so as to be able to rotate once by a rotation shaft 17 provided in the longitudinal direction, so that the angle with respect to the target surface 13 can be adjusted.

第3A図はターゲット51と磁界発生装置15との関係
を示す説明図であり、Aoの場所で磁界Hと電界Eとが
直交している。 19は磁力線を示す。電界Eと磁界H
とが直交するところほどスパッタ速度が大きいので、タ
ーゲット51のこれに対応する部分B0が大きくスパッ
タされることになる。そこで、このままの状態でスパッ
タリングを続けると86部のみが局部的に削られて二ロ
ーションが発生してしまう0本発明では第3B図、第3
C図に示すように磁界発生装置15を回動して、ターゲ
ット51に対する角度を変化させることができる。第3
B図では、磁界発生装置15を傾けた結果電界Eと磁界
Hとが直交する点がA1に移動している。そこで、ター
ゲット51のB工の部分が大きな速度でスパッタされる
ようになる。第3C図に示した場合も同様でありA2に
対応する部分で中心として、ターゲット51のB2が大
きく削られる。
FIG. 3A is an explanatory diagram showing the relationship between the target 51 and the magnetic field generator 15, and the magnetic field H and the electric field E are orthogonal to each other at a location Ao. 19 indicates lines of magnetic force. Electric field E and magnetic field H
Since the sputtering speed is higher at the point where these are orthogonal to each other, the corresponding portion B0 of the target 51 is sputtered to a greater extent. Therefore, if sputtering is continued in this state, only the 86th part will be locally scraped and two lotions will be generated.
As shown in Figure C, the magnetic field generator 15 can be rotated to change its angle with respect to the target 51. Third
In diagram B, as a result of tilting the magnetic field generator 15, the point where the electric field E and the magnetic field H intersect at right angles has moved to A1. Therefore, the part B of the target 51 is sputtered at a high speed. The same applies to the case shown in FIG. 3C, where B2 of the target 51 is largely shaved off at the center of the portion corresponding to A2.

このように、スパッタの進行に伴い、連続的にあるいは
断続的に磁界発生装置51を回動することにより、大き
く削れる位置をターゲットの短手方向に移動することが
でき、可能となる。
In this manner, by rotating the magnetic field generating device 51 continuously or intermittently as sputtering progresses, it is possible to move the position where large scraping can be made in the lateral direction of the target.

第2図で25で示した場所においては1回動によっても
電界Eと磁界Hとの直交位置が変化しない、そこで、短
手方向に配列した磁石片21bとして、長手方向の磁石
片21aよりも磁界の弱い磁石を用い、この部分のスパ
ッタ速度を小さくすることにより、よりいっそうの二ロ
ーションの均一化を図ることができる。 以上の実施例
では、磁界発生装置の長手方向に設けた回動軸により角
度を変化させる機構を説明したが、角度の調整手段はこ
れに限定されず適宜の方法が使用できる。
At the location indicated by 25 in FIG. 2, the orthogonal positions of the electric field E and the magnetic field H do not change even with one rotation.Therefore, as the magnet pieces 21b arranged in the transverse direction, the magnet pieces 21a are arranged in the longitudinal direction. By using a magnet with a weak magnetic field and reducing the sputtering speed in this area, it is possible to achieve even more uniformity of the two lotions. In the above embodiments, a mechanism for changing the angle using a rotating shaft provided in the longitudinal direction of the magnetic field generator has been described, but the angle adjusting means is not limited to this, and any appropriate method can be used.

見豆立腹来 本発明によれば、磁界発生装置のターゲット面に対する
傾きを調整自在とすることにより、簡単な構成でターゲ
ットのエロージョンの均一化が可能となり、ターゲット
の使用効率が改善される。
Advantageous Effects According to the present invention, by making the inclination of the magnetic field generator with respect to the target surface adjustable, the erosion of the target can be made uniform with a simple configuration, and the efficiency of use of the target is improved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は1本発明のマグネトロンスパッタ用カソードの
実施例を示す断面図である。 第2図は本発明で用いられる磁界発生装置を示す斜視図
である。 第3A図、第3B図および第3C図は、ターゲットと磁
界発生装置との関係を示す説明図である。 11・・・カ ソ − ド   13・・・ターゲット
面15・・・磁界発生装置   17・・・回 動 軸
21a、21b、23・・・磁石片  51・・・ター
ゲット特許出願人真空器械工業株式会社 消1図
FIG. 1 is a sectional view showing an embodiment of a cathode for magnetron sputtering according to the present invention. FIG. 2 is a perspective view showing a magnetic field generating device used in the present invention. FIG. 3A, FIG. 3B, and FIG. 3C are explanatory diagrams showing the relationship between the target and the magnetic field generator. 11...Cathode 13...Target surface 15...Magnetic field generator 17...Rotation shaft 21a, 21b, 23...Magnet piece 51...Target patent applicant Shinku Kikai Kogyo Co., Ltd. Company eraser 1 diagram

Claims (1)

【特許請求の範囲】[Claims] 1、カソードのターゲット面の裏面側に磁界発生装置が
配設され、該磁界発生装置のN極から発してターゲット
面を通過してS極に入る磁力線とターゲット面とによる
略角型の閉ループがターゲット面上に形成されるように
なっているスパッタ装置において、該磁界発生装置のN
極とS極とを結ぶ直線と該ターゲット面との角度が可変
となるように、該磁界発生装置が配設されていることを
特徴とするマグネトロンスパッタ用カソード。
1. A magnetic field generator is disposed on the back side of the target surface of the cathode, and a substantially rectangular closed loop is formed between the target surface and the lines of magnetic force that emanate from the N pole of the magnetic field generator, pass through the target surface, and enter the S pole. In a sputtering device designed to form a sputter on a target surface, the N of the magnetic field generating device is
A cathode for magnetron sputtering, characterized in that the magnetic field generating device is arranged so that the angle between the straight line connecting the pole and the south pole and the target surface is variable.
JP13682185A 1985-06-25 1985-06-25 Cathode for magnetron sputtering Granted JPS61295368A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13682185A JPS61295368A (en) 1985-06-25 1985-06-25 Cathode for magnetron sputtering

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13682185A JPS61295368A (en) 1985-06-25 1985-06-25 Cathode for magnetron sputtering

Publications (2)

Publication Number Publication Date
JPS61295368A true JPS61295368A (en) 1986-12-26
JPH0142350B2 JPH0142350B2 (en) 1989-09-12

Family

ID=15184294

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13682185A Granted JPS61295368A (en) 1985-06-25 1985-06-25 Cathode for magnetron sputtering

Country Status (1)

Country Link
JP (1) JPS61295368A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62142764A (en) * 1985-12-17 1987-06-26 Rohm Co Ltd Method for regulating film thickness during magnetron sputtering
US5399253A (en) * 1992-12-23 1995-03-21 Balzers Aktiengesellschaft Plasma generating device
WO2007068133A1 (en) * 2005-12-13 2007-06-21 Oc Oerlikon Balzers Ag Improved sputter target utilization
CN116855909A (en) * 2023-09-05 2023-10-10 苏州迈为科技股份有限公司 Sputtering method, sputtering cathode device and sputtering equipment for improving target utilization rate

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62142764A (en) * 1985-12-17 1987-06-26 Rohm Co Ltd Method for regulating film thickness during magnetron sputtering
US5399253A (en) * 1992-12-23 1995-03-21 Balzers Aktiengesellschaft Plasma generating device
WO2007068133A1 (en) * 2005-12-13 2007-06-21 Oc Oerlikon Balzers Ag Improved sputter target utilization
US8273221B2 (en) 2005-12-13 2012-09-25 Oerlikon Solar Ag, Trubbach Sputter target utilization
CN116855909A (en) * 2023-09-05 2023-10-10 苏州迈为科技股份有限公司 Sputtering method, sputtering cathode device and sputtering equipment for improving target utilization rate

Also Published As

Publication number Publication date
JPH0142350B2 (en) 1989-09-12

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