JPH0418764B2 - - Google Patents
Info
- Publication number
- JPH0418764B2 JPH0418764B2 JP59273970A JP27397084A JPH0418764B2 JP H0418764 B2 JPH0418764 B2 JP H0418764B2 JP 59273970 A JP59273970 A JP 59273970A JP 27397084 A JP27397084 A JP 27397084A JP H0418764 B2 JPH0418764 B2 JP H0418764B2
- Authority
- JP
- Japan
- Prior art keywords
- optical flat
- reflected
- laser
- light
- gap
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27397084A JPS61153505A (ja) | 1984-12-27 | 1984-12-27 | 微小すきま測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27397084A JPS61153505A (ja) | 1984-12-27 | 1984-12-27 | 微小すきま測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61153505A JPS61153505A (ja) | 1986-07-12 |
| JPH0418764B2 true JPH0418764B2 (enExample) | 1992-03-27 |
Family
ID=17535112
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP27397084A Granted JPS61153505A (ja) | 1984-12-27 | 1984-12-27 | 微小すきま測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61153505A (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7194025B2 (ja) * | 2019-01-08 | 2022-12-21 | 三星電子株式会社 | ウェハ検査装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59216003A (ja) * | 1983-05-24 | 1984-12-06 | Toyoda Mach Works Ltd | 隙間量測定方法及び装置 |
| JPS59225308A (ja) * | 1983-06-06 | 1984-12-18 | Hitachi Ltd | 微小間隔測定装置 |
-
1984
- 1984-12-27 JP JP27397084A patent/JPS61153505A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61153505A (ja) | 1986-07-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH03223609A (ja) | タッチプローブ | |
| JPS63195513A (ja) | 光学式非接触位置測定装置 | |
| US4828390A (en) | Optical axis displacement sensor | |
| JPS5979104A (ja) | 光学装置 | |
| JPH0418764B2 (enExample) | ||
| JP4593768B2 (ja) | 光干渉装置及び位置検出装置 | |
| JPS6432105A (en) | Angle deviation measuring instrument for flat plate member | |
| JPS6370110A (ja) | 距離測定装置 | |
| JP3040131B2 (ja) | 球体表面の傷検査装置 | |
| JPH044167Y2 (enExample) | ||
| JPH02238376A (ja) | 電界測定用プローブ | |
| JP2869143B2 (ja) | 基板の傾斜検出装置 | |
| JPS58176505A (ja) | 非接触変位検出装置 | |
| SU737817A1 (ru) | Интерференционный способ измерени показател преломлени диэлектрических пленок переменной толщины | |
| JPH044966Y2 (enExample) | ||
| JPS60211304A (ja) | 平行度測定装置 | |
| JPH0694760A (ja) | Eoプローブ | |
| JP2831705B2 (ja) | 円錐レンズの透過光波面収差の検査方法及びその装置 | |
| SU1379610A1 (ru) | Сферометр | |
| JPH0382907A (ja) | 光学式微小変位測定装置 | |
| JPH0465614A (ja) | 光学式表面粗さ測定装置 | |
| JPH03249517A (ja) | 光リング式非接触測長センサー | |
| JPS61153506A (ja) | 微小すきま測定装置 | |
| JPS5735810A (en) | Measuring device for moving extent of lens | |
| JPH01233309A (ja) | 直線計 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |