JPH0418354U - - Google Patents

Info

Publication number
JPH0418354U
JPH0418354U JP5933890U JP5933890U JPH0418354U JP H0418354 U JPH0418354 U JP H0418354U JP 5933890 U JP5933890 U JP 5933890U JP 5933890 U JP5933890 U JP 5933890U JP H0418354 U JPH0418354 U JP H0418354U
Authority
JP
Japan
Prior art keywords
light source
laser light
metal
ccd camera
inspection machine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5933890U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5933890U priority Critical patent/JPH0418354U/ja
Publication of JPH0418354U publication Critical patent/JPH0418354U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、この考案に係る表面疵検査機を示す
概略側面図、第2図は、その変形例を示す概略側
面図、第3図は疵検出率指数を本考案と従来とで
比較したグラフ、第4図、第5図は従来の疵検出
方法を示し、aは概略側面図、bは斜視図である
。 1……レーザ光源、2……非レーザ光棒状光源
、3……CCDカメラ。
Fig. 1 is a schematic side view showing a surface flaw inspection machine according to this invention, Fig. 2 is a schematic side view showing a modification thereof, and Fig. 3 is a comparison of flaw detection rate index between this invention and a conventional one. The graphs, FIGS. 4 and 5, show a conventional flaw detection method, in which a is a schematic side view and b is a perspective view. 1... Laser light source, 2... Non-laser bar-shaped light source, 3... CCD camera.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 金属の表面疵を検出する装置において、金属表
面に照射する光源に、レーザ光源を用い、あるい
はレーザ光源と非レーザ光棒状光源とを併用し、
反射光の受光部にCCDカメラを用いたことを特
徴とする表面疵検査機。
In an apparatus for detecting surface flaws on metal, a laser light source is used as a light source to irradiate the metal surface, or a laser light source and a non-laser light rod-shaped light source are used together,
A surface flaw inspection machine characterized by using a CCD camera as a light receiving section for reflected light.
JP5933890U 1990-06-05 1990-06-05 Pending JPH0418354U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5933890U JPH0418354U (en) 1990-06-05 1990-06-05

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5933890U JPH0418354U (en) 1990-06-05 1990-06-05

Publications (1)

Publication Number Publication Date
JPH0418354U true JPH0418354U (en) 1992-02-17

Family

ID=31585749

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5933890U Pending JPH0418354U (en) 1990-06-05 1990-06-05

Country Status (1)

Country Link
JP (1) JPH0418354U (en)

Similar Documents

Publication Publication Date Title
DE3270640D1 (en) Off-axis light beam defect detector
JPH0418354U (en)
DE3885218D1 (en) Device for the point-by-point scanning of an object.
FR2694090B1 (en) Method and apparatus for inspecting bale surface seams.
JPS6126108U (en) Precise inspection equipment for metal parts
JPS55117946A (en) Flaw detection method of hollow shaft inside surface
JPS6442409U (en)
JPH0381278U (en)
JPS6295849U (en)
JPH04483U (en)
JPS63135268U (en)
JPH0327343U (en)
JPS62181066U (en)
JPS62180758U (en)
JPH0464762U (en)
RU96119120A (en) METHOD FOR DETERMINING DUST AND AEROSOL CONCENTRATION IN ARC WELDING
JPS62195752U (en)
JPH0441651U (en)
JPS63170705U (en)
JPS62190368U (en)
JPH01127688U (en)
JPH0416345U (en)
JPS6285423U (en)
JPS63153159U (en)
JPH01160558U (en)