JPH0416933B2 - - Google Patents

Info

Publication number
JPH0416933B2
JPH0416933B2 JP62262411A JP26241187A JPH0416933B2 JP H0416933 B2 JPH0416933 B2 JP H0416933B2 JP 62262411 A JP62262411 A JP 62262411A JP 26241187 A JP26241187 A JP 26241187A JP H0416933 B2 JPH0416933 B2 JP H0416933B2
Authority
JP
Japan
Prior art keywords
foil
manganese
silicon
capacitance
aluminum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62262411A
Other languages
Japanese (ja)
Other versions
JPS63153811A (en
Inventor
Kozo Arai
Takao Suzuki
Shozo Umetsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Altemira Co Ltd
Original Assignee
Showa Aluminum Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Showa Aluminum Corp filed Critical Showa Aluminum Corp
Priority to JP62262411A priority Critical patent/JPS63153811A/en
Publication of JPS63153811A publication Critical patent/JPS63153811A/en
Publication of JPH0416933B2 publication Critical patent/JPH0416933B2/ja
Granted legal-status Critical Current

Links

Description

【発明の詳細な説明】[Detailed description of the invention]

産業上の利用分野 この発明は、電解コンデンサ陰極用アルミニウ
ム合金箔に関する。 この明細書において「%」は「重量%」を示す
ものとする。 従来技術とその問題点 電解コンデンサの性能を向上させるためには、
陽極用箔の静電容量だけでなく、陰極用箔の静電
容量も増大させることが必要である。箔の静電容
量を増大させるためには、箔にエツチングを施し
て箔の表面に微細な凹部を均一かつ高密度に形成
することにより、その表面積を増大させることが
有効であるが、エツチングが過度になると、腐食
減量も過度になり、結果的に箔の静電容量は低下
し、また機械的強度も低下する。また、コンデン
サの小型軽量化のために箔の厚さを薄くする必要
があり、そのためには箔の強度を大きくしなけれ
ばならない。したがつて、電解コンデンサ陰極用
アルミニウム合金箔の具備すべき条件は、静電容
量が大きいこと、エツチングのさいの腐食減量が
過度にならず適量であること、および機械的強度
が大きいことである。 従来から電解コンデンサ陰極用アルミニウム合
金箔は種々存在するが、上記3条件をすべて満た
す箔は存在しなかつたのが実情である。 この発明の目的は、上記条件をすべて満足しう
る電解コンデンサ陰極用アルミニウム合金箔を提
供することにある。 問題点を解決するための手段 この発明による電解コンデンサ陰極用アルミニ
ウム合金箔は、 ケイ素を0.5%を越えかつ1.0%以下含有し、 マンガンを0.2〜2.0%含有し、 銅0.1〜1.0%およびバナジウム0.003〜0.3%の
うちの少なくともいずれか一方を含有し、さらに 不純物としての鉄を0.3%未満含有し、残部ア
ルミニウムおよび不可避不純物からなることを特
徴とするものである。 ケイ素およびマンガンは、これらをともにアル
ミニウム中に含有せしめることにより、アルミニ
ウム合金箔の静電容量を増大させる性質を有する
が、ケイ素の含有量が0.5%以下、マンガンの含
有量が0.2%未満では上記効果が少なく、ケイ素
の含有量が1.0%を越え、マンガンの含有量が2.0
%を越えると微細なエツチング組織を得られない
ので箔の静電容量は小さくなり、腐食減量も過度
になる。したがつて、ケイ素の含有量を0.5%を
越えかつ1.0%以下、マンガンの含有量を0.2〜2.0
%の範囲内で選ぶべきである。 ケイ素およびマンガンをともに含有せしめるこ
とによりアルミニウム合金箔の静電容量が増大す
るのは、次の理由による。すなわち、周知の如
く、アルミニウム合金箔の静電容量は箔の表面積
と比例し、箔の表面積を増大させるためには、エ
ツチングによつて箔の表面に微細な凹部を均一か
つ高密度に生じさせる必要がある。アルミニウム
中にケイ素を0.5%を越えて含有せしめるととも
に、マンガンを0.2%以上含有せしめると、微細
かつ多数のAl−Si−Mn化合物がアルミニウム・
マトリツクス中に分散した組織を得ることができ
る。Al−Si−Mn化合物は、電位的に貴であつて
アルミニウム・マトリツクスと大きな電極電位差
を有するので、エツチングのさいにアルミニウ
ム・マトリツクスが優先的に腐食されて、箔の表
面に微細な凹部が均一かつ高密度に形成され、そ
の表面積が増大する。しかしながら、ケイ素の含
有量が1.0%越え、マンガンの含有量が2.0%を越
えるとAl−Si−Mn化合物が粗大になり、合金箔
中に均一に分散されなくなるために、微細なエツ
チング組織が得られず、静電容量が低下する。 また、上記において、銅およびバナジウムは、
これらのうち少なくともいずれか一方をアルミニ
ウム合金中に含有せしめると、ケイ素およびマン
ガンの固溶限を低下させてAl−Si−Mn化合物を
より多く析出させるとともに、それ自身アルミニ
ウム・マトリツクス中に固溶し、マトリツクスの
エツチング性を向上させて、上述したようなケイ
素およびマンガンを含有せしめることによる効果
を増進させることができる。しかしながら、銅の
含有量が0.1%未満、バナジウムの含有量が0.003
%未満であれば上記効果は得られず、銅の含有量
が1.0%を越え、バナジウムの含有量が0.3%を越
えると、エツチングが過度になり、かえつて静電
容量が低下する。したがつて、銅の含有量を0.1
〜1.0%の範囲内、バナジウムの含有量を0.003〜
0.3%の範囲内で選ぶべきである。 この発明によるアルミニウム合金箔には、鉄な
どの製造上不可避の不純物が含まれているが、不
純物の中で、とくに鉄の場合は、その含有量が
0.3%以上になると鋳造時に粗大なAl−Si−Mn−
Fe化合物を晶出し、上述したようなケイ素およ
びマンガンを添加することにより得られる効果を
阻害するので、不純物中鉄の含有量は0.3%未満
にすることが好ましい。 実施例 以下、この発明の実施例を対照例とともに説明
する。 下表に示す組成の15種のアルミニウム合金から
通常の製箔法によつて箔を製造した後、これらの
合金箔を液温60℃の3%塩酸および0.5%シユウ
酸水溶液中に浸漬し、電流密度30A/dm2の交流
電流を通じて1分30秒間エツチングを行い、静電
容量を測定した。その結果は下表の通りであつ
た。
INDUSTRIAL APPLICATION FIELD This invention relates to an aluminum alloy foil for an electrolytic capacitor cathode. In this specification, "%" refers to "% by weight". Conventional technology and its problems In order to improve the performance of electrolytic capacitors,
It is necessary to increase not only the capacitance of the anode foil but also the capacitance of the cathode foil. In order to increase the capacitance of foil, it is effective to increase the surface area by etching the foil and forming fine concavities uniformly and densely on the surface of the foil. If it becomes excessive, the corrosion loss will also be excessive, resulting in a decrease in the capacitance of the foil and also in its mechanical strength. Furthermore, in order to reduce the size and weight of capacitors, it is necessary to reduce the thickness of the foil, and to achieve this, the strength of the foil must be increased. Therefore, the conditions that an aluminum alloy foil for an electrolytic capacitor cathode must meet are that it has a large capacitance, that the amount of corrosion loss during etching is not excessive but is an appropriate amount, and that it has a high mechanical strength. . Although various aluminum alloy foils for electrolytic capacitor cathodes have conventionally existed, the reality is that there has been no foil that satisfies all of the above three conditions. An object of the present invention is to provide an aluminum alloy foil for an electrolytic capacitor cathode that can satisfy all of the above conditions. Means for Solving the Problems The aluminum alloy foil for an electrolytic capacitor cathode according to the present invention contains more than 0.5% and less than 1.0% silicon, 0.2 to 2.0% manganese, 0.1 to 1.0% copper, and 0.003% vanadium. -0.3%, and further contains less than 0.3% iron as an impurity, with the remainder consisting of aluminum and inevitable impurities. Silicon and manganese have the property of increasing the capacitance of aluminum alloy foil when they are both contained in aluminum, but if the silicon content is less than 0.5% and the manganese content is less than 0.2%, the above-mentioned Less effective, silicon content exceeds 1.0%, manganese content 2.0%
%, it is impossible to obtain a fine etched structure, so the capacitance of the foil becomes small and the weight loss due to corrosion becomes excessive. Therefore, the silicon content should be more than 0.5% and less than 1.0%, and the manganese content should be 0.2 to 2.0%.
It should be selected within the range of %. The reason why the capacitance of aluminum alloy foil increases by containing both silicon and manganese is as follows. In other words, as is well known, the capacitance of aluminum alloy foil is proportional to the surface area of the foil, and in order to increase the surface area of the foil, fine recesses are uniformly and densely created on the surface of the foil by etching. There is a need. When aluminum contains more than 0.5% silicon and 0.2% or more manganese, a large number of fine Al-Si-Mn compounds form in the aluminum.
A tissue dispersed in the matrix can be obtained. Since the Al-Si-Mn compound is potentially noble and has a large electrode potential difference with the aluminum matrix, the aluminum matrix is preferentially corroded during etching, resulting in uniform fine depressions on the surface of the foil. Moreover, it is formed with high density and its surface area increases. However, if the silicon content exceeds 1.0% and the manganese content exceeds 2.0%, the Al-Si-Mn compound becomes coarse and cannot be uniformly dispersed in the alloy foil, resulting in a fine etched structure. capacitance decreases. In addition, in the above, copper and vanadium are
When at least one of these is contained in an aluminum alloy, the solid solubility limit of silicon and manganese is lowered, and more Al-Si-Mn compounds are precipitated, and they themselves become solid-soluble in the aluminum matrix. , the etching properties of the matrix can be improved and the effects of containing silicon and manganese as described above can be enhanced. However, the content of copper is less than 0.1%, the content of vanadium is 0.003
If the copper content exceeds 1.0% and the vanadium content exceeds 0.3%, etching becomes excessive and the capacitance decreases. Therefore, the copper content is 0.1
Within the range of ~1.0%, vanadium content ~0.003
It should be selected within the range of 0.3%. The aluminum alloy foil according to the present invention contains impurities such as iron that are unavoidable during manufacturing.
If it exceeds 0.3%, coarse Al-Si-Mn-
The content of iron as an impurity is preferably less than 0.3% because it crystallizes Fe compounds and inhibits the effects obtained by adding silicon and manganese as described above. Examples Examples of the present invention will be described below along with comparative examples. After manufacturing foils from 15 types of aluminum alloys having the compositions shown in the table below using a normal foil manufacturing method, these alloy foils were immersed in an aqueous solution of 3% hydrochloric acid and 0.5% oxalic acid at a temperature of 60°C. Etching was performed for 1 minute and 30 seconds using an alternating current with a current density of 30 A/dm 2 to measure the capacitance. The results were as shown in the table below.

【表】 上表から明らかなように、合金L〜Oからなる
箔は、合金A〜Kからなる箔に比べて静電容量が
大きくなつている。 発明の効果 この発明の電解コンデンサ陰極用アルミニウム
合金箔は、ケイ素を0.5%を越えかつ1.0%以下、
およびマンガンを0.2〜2.0%含有しているので、
微細なAl−Si−Mn化合物がアルミニウム・マト
リツクス中に多数分散した組織を得ることができ
る。そして、Al−Si−Mn化合物は、電位的に貴
であつてアルミニウム・マトリツクスと大きな電
極電位差を有するので、エツチングのさいにアル
ミニウム・マトリツクスが優先的に腐食され、箔
の表面に微細な凹部が均一かつ高密度に形成され
てその表面積が増大し、その結果静電容量が著し
く増大する。しかも、腐食減量も過度にならな
い。また、銅0.1〜1.0%およびバナジウム0.003〜
0.3%のうちの少なくともいずれか一方を含有す
るので、ケイ素およびマンガンの固溶限を低下さ
せてAl−Si−Mn化合物をより多く析出させると
ともに、それ自身アルミニウム・マトリツクス中
に固溶し、マトリツクスのエツチング性を向上さ
せて、上述したようなケイ素およびマンガンを含
有せしめることによる効果を増進させることがで
きる。したがつて、静電容量が一層大きくなる。
さらに、不純物としての鉄の含有量が0.3%未満
であるから、鋳造時に粗大なAl−Si−Mn−Fe化
合物が晶出するのを防止できる。したがつて、ケ
イ素およびマンガンを添加することによる効果を
阻害することはない。
[Table] As is clear from the above table, the foils made of alloys L to O have a larger capacitance than the foils made of alloys A to K. Effects of the Invention The aluminum alloy foil for an electrolytic capacitor cathode of the present invention contains silicon in an amount exceeding 0.5% and not more than 1.0%.
and contains 0.2 to 2.0% manganese,
A structure in which a large number of fine Al-Si-Mn compounds are dispersed in an aluminum matrix can be obtained. Since the Al-Si-Mn compound is potentially noble and has a large electrode potential difference with the aluminum matrix, the aluminum matrix is preferentially corroded during etching, resulting in fine depressions on the surface of the foil. It is formed uniformly and densely, increasing its surface area and, as a result, significantly increasing its capacitance. Moreover, the corrosion loss does not become excessive. Also, copper 0.1~1.0% and vanadium 0.003~
Since it contains at least one of 0.3%, the solid solubility limit of silicon and manganese is lowered, and more Al-Si-Mn compounds are precipitated. It is possible to improve the etching properties of the material and enhance the effects of containing silicon and manganese as described above. Therefore, the capacitance becomes even larger.
Furthermore, since the content of iron as an impurity is less than 0.3%, it is possible to prevent coarse Al-Si-Mn-Fe compounds from crystallizing during casting. Therefore, the effects of adding silicon and manganese are not inhibited.

Claims (1)

【特許請求の範囲】 1 ケイ素を0.5%を越えかつ1.0%以下含有し、 マンガンを0.2〜2.0%含有し、 銅0.1〜1.0%およびバナジウム0.003〜0.3%の
うちの少なくともいずれか一方を含有し、さらに 不純物としての鉄を0.3%未満含有し、 残部アルミニウムおよび不可避不純物からなる
電解コンデンサ陰極用アルミニウム合金箔。
[Scope of Claims] 1 Contains more than 0.5% and 1.0% or less of silicon, 0.2 to 2.0% of manganese, and at least one of 0.1 to 1.0% of copper and 0.003 to 0.3% of vanadium. An aluminum alloy foil for an electrolytic capacitor cathode, which further contains less than 0.3% iron as an impurity, and the balance is aluminum and unavoidable impurities.
JP62262411A 1987-10-16 1987-10-16 Aluminum alloy foil for electrolytic capacitor cathode Granted JPS63153811A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62262411A JPS63153811A (en) 1987-10-16 1987-10-16 Aluminum alloy foil for electrolytic capacitor cathode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62262411A JPS63153811A (en) 1987-10-16 1987-10-16 Aluminum alloy foil for electrolytic capacitor cathode

Publications (2)

Publication Number Publication Date
JPS63153811A JPS63153811A (en) 1988-06-27
JPH0416933B2 true JPH0416933B2 (en) 1992-03-25

Family

ID=17375410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62262411A Granted JPS63153811A (en) 1987-10-16 1987-10-16 Aluminum alloy foil for electrolytic capacitor cathode

Country Status (1)

Country Link
JP (1) JPS63153811A (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5197518A (en) * 1975-02-26 1976-08-27
JPS5197520A (en) * 1975-02-26 1976-08-27
JPS5197519A (en) * 1975-02-26 1976-08-27
JPS5432112A (en) * 1977-08-16 1979-03-09 Showa Aluminium Co Ltd Aluminum alloy foil for electrolytic capacitor cathode
JPS5443564A (en) * 1977-08-22 1979-04-06 Koninkl Philips Electronics Nv Cathode foil for electrolyte condenser
JPS5498960A (en) * 1977-11-02 1979-08-04 Alusuisse Aluminium alloy foil for condenser and method of producing same

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5197518A (en) * 1975-02-26 1976-08-27
JPS5197520A (en) * 1975-02-26 1976-08-27
JPS5197519A (en) * 1975-02-26 1976-08-27
JPS5432112A (en) * 1977-08-16 1979-03-09 Showa Aluminium Co Ltd Aluminum alloy foil for electrolytic capacitor cathode
JPS5443564A (en) * 1977-08-22 1979-04-06 Koninkl Philips Electronics Nv Cathode foil for electrolyte condenser
JPS5498960A (en) * 1977-11-02 1979-08-04 Alusuisse Aluminium alloy foil for condenser and method of producing same

Also Published As

Publication number Publication date
JPS63153811A (en) 1988-06-27

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