JPH0416367U - - Google Patents
Info
- Publication number
- JPH0416367U JPH0416367U JP5650390U JP5650390U JPH0416367U JP H0416367 U JPH0416367 U JP H0416367U JP 5650390 U JP5650390 U JP 5650390U JP 5650390 U JP5650390 U JP 5650390U JP H0416367 U JPH0416367 U JP H0416367U
- Authority
- JP
- Japan
- Prior art keywords
- row
- electronic component
- sides
- terminals
- probes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims 2
- 239000004020 conductor Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1990056503U JP2508732Y2 (ja) | 1990-05-31 | 1990-05-31 | 電子部品計測装置の接触装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1990056503U JP2508732Y2 (ja) | 1990-05-31 | 1990-05-31 | 電子部品計測装置の接触装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0416367U true JPH0416367U (US20090163788A1-20090625-C00002.png) | 1992-02-10 |
JP2508732Y2 JP2508732Y2 (ja) | 1996-08-28 |
Family
ID=31580387
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1990056503U Expired - Fee Related JP2508732Y2 (ja) | 1990-05-31 | 1990-05-31 | 電子部品計測装置の接触装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2508732Y2 (US20090163788A1-20090625-C00002.png) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011052969A (ja) * | 2009-08-31 | 2011-03-17 | Hioki Ee Corp | 基板検査装置におけるz軸ユニットの配線引き回し構造 |
JP2013124996A (ja) * | 2011-12-16 | 2013-06-24 | Fuji Electric Co Ltd | 半導体試験装置 |
JP2014153293A (ja) * | 2013-02-13 | 2014-08-25 | Mitsubishi Electric Corp | 測定装置 |
JP2015043277A (ja) * | 2013-08-26 | 2015-03-05 | 株式会社エンプラス | 電気部品用ソケット及び電気部品の検査システム |
WO2019171797A1 (ja) * | 2018-03-07 | 2019-09-12 | オムロン株式会社 | 検査ユニットおよび検査装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59192979A (ja) * | 1983-04-15 | 1984-11-01 | Mitsutoyo Mfg Co Ltd | 電子部品の検査方法 |
-
1990
- 1990-05-31 JP JP1990056503U patent/JP2508732Y2/ja not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59192979A (ja) * | 1983-04-15 | 1984-11-01 | Mitsutoyo Mfg Co Ltd | 電子部品の検査方法 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011052969A (ja) * | 2009-08-31 | 2011-03-17 | Hioki Ee Corp | 基板検査装置におけるz軸ユニットの配線引き回し構造 |
JP2013124996A (ja) * | 2011-12-16 | 2013-06-24 | Fuji Electric Co Ltd | 半導体試験装置 |
JP2014153293A (ja) * | 2013-02-13 | 2014-08-25 | Mitsubishi Electric Corp | 測定装置 |
JP2015043277A (ja) * | 2013-08-26 | 2015-03-05 | 株式会社エンプラス | 電気部品用ソケット及び電気部品の検査システム |
WO2019171797A1 (ja) * | 2018-03-07 | 2019-09-12 | オムロン株式会社 | 検査ユニットおよび検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JP2508732Y2 (ja) | 1996-08-28 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |