JPH0415002U - - Google Patents

Info

Publication number
JPH0415002U
JPH0415002U JP5546290U JP5546290U JPH0415002U JP H0415002 U JPH0415002 U JP H0415002U JP 5546290 U JP5546290 U JP 5546290U JP 5546290 U JP5546290 U JP 5546290U JP H0415002 U JPH0415002 U JP H0415002U
Authority
JP
Japan
Prior art keywords
rods
plate
shape measuring
measuring device
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5546290U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5546290U priority Critical patent/JPH0415002U/ja
Publication of JPH0415002U publication Critical patent/JPH0415002U/ja
Pending legal-status Critical Current

Links

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  • A Measuring Device Byusing Mechanical Method (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は被測定物上面部分の外形輪郭の測定に
適用した本考案の形状測定装置に関する実施例を
示す図で、Aは測定前における形状測定装置の基
準調整を示す断面図で、BのA−A断面に当たる
図、BはAにおけるB−B矢視図、Cは形状測定
装置による被測定物の測定状態を示す断面図であ
る。第2図は第1図における測定信号の処理装置
を示す図である。 1……被測定物、2……定盤、3……ジヤツキ
、4……外プレート、5……内プレート、6……
ロツド、7……エアシリンダ、8……ピストン、
9……ピストンロツド、10……支持プレート、
11……コイル、12……リード線、13……底
プレート、14……側プレート、15……ゲージ
板15、16……軸方向位置検出器、17……プ
リンタ、18……データ。
FIG. 1 is a diagram showing an embodiment of the shape measuring device of the present invention applied to measuring the external contour of the upper surface of an object to be measured; A is a cross-sectional view showing reference adjustment of the shape measuring device before measurement; B is a view corresponding to the A-A cross section, B is a view taken along the B-B arrow in A, and C is a cross-sectional view showing the measurement state of the object to be measured by the shape measuring device. FIG. 2 is a diagram showing the measurement signal processing device in FIG. 1. 1...Object to be measured, 2...Surface plate, 3...Judge, 4...Outer plate, 5...Inner plate, 6...
Rod, 7...Air cylinder, 8...Piston,
9...Piston rod, 10...Support plate,
DESCRIPTION OF SYMBOLS 11... Coil, 12... Lead wire, 13... Bottom plate, 14... Side plate, 15... Gauge plate 15, 16... Axial position detector, 17... Printer, 18... Data.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 平面上における所定位置に位置決めされた複数
個のロツドと、該複数個のロツドが垂直に挿通す
る第1プレートおよび第2プレートと、前記複数
個の各ロツドを軸方向に駆動する駆動装置と、前
記複数個の各ロツドの位置検出装置とから成るこ
とを特徴とする形状測定装置。
a plurality of rods positioned at predetermined positions on a plane; a first plate and a second plate through which the plurality of rods vertically pass; and a drive device that drives each of the plurality of rods in an axial direction; A shape measuring device comprising: a position detecting device for each of the plurality of rods.
JP5546290U 1990-05-28 1990-05-28 Pending JPH0415002U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5546290U JPH0415002U (en) 1990-05-28 1990-05-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5546290U JPH0415002U (en) 1990-05-28 1990-05-28

Publications (1)

Publication Number Publication Date
JPH0415002U true JPH0415002U (en) 1992-02-06

Family

ID=31578436

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5546290U Pending JPH0415002U (en) 1990-05-28 1990-05-28

Country Status (1)

Country Link
JP (1) JPH0415002U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023000339A (en) * 2021-06-17 2023-01-04 Necプラットフォームズ株式会社 Measuring system, measuring method, and measuring program

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023000339A (en) * 2021-06-17 2023-01-04 Necプラットフォームズ株式会社 Measuring system, measuring method, and measuring program

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