JPH0414884A - Semiconductor laser diode control device - Google Patents

Semiconductor laser diode control device

Info

Publication number
JPH0414884A
JPH0414884A JP11802390A JP11802390A JPH0414884A JP H0414884 A JPH0414884 A JP H0414884A JP 11802390 A JP11802390 A JP 11802390A JP 11802390 A JP11802390 A JP 11802390A JP H0414884 A JPH0414884 A JP H0414884A
Authority
JP
Japan
Prior art keywords
laser diode
current
amplification transistor
circuit
power
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11802390A
Other languages
Japanese (ja)
Inventor
Takashi Hoshino
隆 星野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP11802390A priority Critical patent/JPH0414884A/en
Publication of JPH0414884A publication Critical patent/JPH0414884A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/04Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
    • H01S5/042Electrical excitation ; Circuits therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068Stabilisation of laser output parameters
    • H01S5/06825Protecting the laser, e.g. during switch-on/off, detection of malfunctioning or degradation

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To prevent overshooting when power is turned on and obtain an inexpensive control device which is superb in temperature characteristics by providing a delay element for delaying start-up of a drive power of a laser diode at a signal output circuit of a transistor for comparison and amplification. CONSTITUTION:Immediately after a power is turned on, a base current rapidly flows to a transistor for comparison and amplification 16, thus resulting in saturation region, and a collector current is limited by a delay element consisting of a current-limiting resistor 21, thus causing start-up of a transistor for power amplification 14 to be delayed due to a delay circuit which consists of the current-limiting resistor 21 and a capacitor for compensating phase 15 and preventing a rapid current to flow into the circuit. As a result, even if indicial response of the circuit is vibrating within a certain range, no overshoot appears since input signal is not in step shape, thus preventing an excessive current to flow into a laser diode 11.

Description

【発明の詳細な説明】 [産業上の利用分野J この発明は、半導体レーザダイオード制御装置、特にレ
ーザダイオードのレーザ出射光量を一定に制御する半導
体レーザダイオード制御装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application J] The present invention relates to a semiconductor laser diode control device, and particularly to a semiconductor laser diode control device that controls the amount of laser light emitted from a laser diode to a constant level.

C従来の技術] 近年、半導体レーザダイオードは各種装置、機器に幅広
く用いられており、このレーザダイオードのレーザ出射
光量を一定に制御するための半導体レーザダイオード制
御装置の需要がますます増大している。第3図は、この
ような従来の半導体レーザダイオード制御装置の回路図
であり、(1)はレーザダイオード、(2)はレーザダ
イオード内に設けられたフォトダイオード、(3)は位
相補償用コンデンサ、(4)は電力増幅用トランジスタ
である。レーザダイオード(1)と電力増幅用トランジ
スタ(4)のコレクタとの間には保護用抵抗器(5)が
接続されている。また、(6)は比較増幅用トランジス
タであり、そのコレクタは電力増幅用トランジスタ(4
)のベースに、また、エミッタは、定電圧ダイオード(
7)を介して電力増幅用トランジスタ(4)のエミッタ
に、および、電流設定抵抗器(8)を介してレーザダイ
オード(1)とフォトダイオード(2)とを接続した端
子にそれぞれ接続されている。比較増幅用トランジスタ
(6)のベースはフォトダイオード(2)の他方の端子
に接続されるとともに、出射光量調節用可変抵抗器(9
)を介して電力増幅用トランジスタ(4)のエミ・ツタ
側に接続されている。(10)は電源ノイズを力・ン卜
するためのバイパスコンデンサである。
C. Prior Art] In recent years, semiconductor laser diodes have been widely used in various devices and equipment, and the demand for semiconductor laser diode control devices to control the amount of laser light emitted from these laser diodes to a constant level is increasing. . FIG. 3 is a circuit diagram of such a conventional semiconductor laser diode control device, in which (1) is a laser diode, (2) is a photodiode provided in the laser diode, and (3) is a phase compensation capacitor. , (4) are power amplification transistors. A protective resistor (5) is connected between the laser diode (1) and the collector of the power amplification transistor (4). In addition, (6) is a comparison amplification transistor, whose collector is a power amplification transistor (4
), and the emitter is a constant voltage diode (
7) to the emitter of the power amplification transistor (4), and to the terminal connecting the laser diode (1) and photodiode (2) via a current setting resistor (8). . The base of the comparative amplification transistor (6) is connected to the other terminal of the photodiode (2), and the base is connected to the variable resistor (9) for adjusting the output light amount.
) to the emitter and ivy side of the power amplification transistor (4). (10) is a bypass capacitor for removing power supply noise.

次に、上記構成の動作について説明する。Next, the operation of the above configuration will be explained.

レーザダイオード(1)から出射されたレーザ光は外部
に出力されるとともに、出射光量検出用のフォトダイオ
ード(2)にも照射される。出射光量検出用のフォトダ
イオード(2)には出射光量調節用可変抵抗器(9)を
通して、照射された光量に応じた検出電流が流れ、出射
光量調節用可変抵抗器(9)の両端に電圧降下が発生す
る。この降下電圧と定電圧ダイオード(7)とで作られ
る基準電圧が比較増幅用トランジスタ(6)により比較
され、その結果がコレクタ電流の増減として出力される
。この出力が電力増幅用トランジスタ(4)に入力され
、増幅されて、レーザダイオード(1)の駆動電流とな
る。
The laser light emitted from the laser diode (1) is output to the outside, and is also irradiated to a photodiode (2) for detecting the amount of emitted light. A detection current according to the amount of irradiated light flows through the photodiode (2) for detecting the amount of emitted light through the variable resistor (9) for adjusting the amount of emitted light, and a voltage is applied across the variable resistor (9) for adjusting the amount of emitted light. A descent occurs. This dropped voltage and a reference voltage created by a constant voltage diode (7) are compared by a comparison and amplification transistor (6), and the result is output as an increase or decrease in collector current. This output is input to the power amplification transistor (4), is amplified, and becomes a driving current for the laser diode (1).

第3図における回路の電源投入直後は、出射光量検出用
のフォトダイオード(2)に検出電流が流れないので、
比較増幅用トランジスタ(6)に急激にベース電流か流
れ込み、回路に急激に変化する電流が流れることになる
。その結果、回路の応答特性が振動的であるとレーザダ
イオード(1)にオーバシュートによる過大電流が流れ
、レーザダイオード(1)を著しく劣化させることにな
る。
Immediately after the circuit in Figure 3 is powered on, no detection current flows through the photodiode (2) for detecting the amount of emitted light, so
A base current suddenly flows into the comparison and amplification transistor (6), causing a rapidly changing current to flow through the circuit. As a result, if the response characteristics of the circuit are oscillatory, an excessive current will flow through the laser diode (1) due to overshoot, resulting in significant deterioration of the laser diode (1).

位相補償用コンデンサ(3)は回路の高域ゲインを減衰
させる補償を行なって、前記オーバシュートによる過大
電流の発生を防止し、前記レーザダイオード(1)の劣
化を防ぐ働きをする。
The phase compensation capacitor (3) performs compensation to attenuate the high-frequency gain of the circuit, thereby preventing generation of excessive current due to the overshoot and preventing deterioration of the laser diode (1).

[発明が解決しようとする課題] 従来の半導体レーザダイオード制御装置は以上のように
構成されているので、位相補償用コンデンサ(3)は数
〜数十μF以上の容量を有し、かつ、温度特性を含めた
高周波特性が優れているものを必要とする。そのために
は高価なタンタル固体電解コンデンサを用いるか、温度
特性の劣化を覚悟の上でアルミ電解コンデンサを使用す
るほかはなく、前者ではコストアップになり、後者の場
合品質と信頼性が劣るという問題点があった。従って、
上記問題点を解消しなければならないという課題がある
[Problems to be Solved by the Invention] Since the conventional semiconductor laser diode control device is configured as described above, the phase compensation capacitor (3) has a capacitance of several to several tens of μF or more, and has a temperature A device with excellent high frequency characteristics is required. To achieve this, there is no choice but to use expensive tantalum solid electrolytic capacitors or to use aluminum electrolytic capacitors at the risk of deterioration in temperature characteristics.The former results in increased costs, while the latter suffers from inferior quality and reliability. There was a point. Therefore,
There is a problem that the above problems must be solved.

発明の目的 この発明は上記課題を解決するためになされたもので、
電源投入時のオーバシュートを防止でき、かつ、温度特
性に優れ、安価な半導体レーザダイオード制御装置を得
ることを目的とする。
Purpose of the invention This invention was made to solve the above problems,
An object of the present invention is to obtain an inexpensive semiconductor laser diode control device that can prevent overshoot when power is turned on, has excellent temperature characteristics, and is inexpensive.

[課題を解決するための手段] この発明にかかる半導体レーザダイオード制御装置は、
比較増幅用トランジスタの信号出力回路にレーザダイオ
ードの駆動電流の立ち上がりを遅らせるための遅延素子
を備えたことを特徴とする。
[Means for Solving the Problems] A semiconductor laser diode control device according to the present invention includes:
The present invention is characterized in that the signal output circuit of the comparison amplification transistor is equipped with a delay element for delaying the rise of the drive current of the laser diode.

[作用] この発明における半導体レーザダイオード制御装置は、
電力増幅用トランジスタを制御するための信号を出力す
る比較増幅用トランジスタの出力回路信号線上にレーザ
ダイオードの駆動電流の立ち上がりを遅らせるための遅
延素子を設けることにより、電源立ち上がり遅延回路を
構成し、回路に急激に電流が流れることを防止すること
かできる。従って、位相補償用コンデンサに高周波特性
が良好ではあるが高価なタンタル固体電解コンデンサを
使用する必要がなく、安価なアルミ電解コンデンサを使
用することが可能であり、コストダウンを実現すること
ができる。
[Function] The semiconductor laser diode control device in this invention has the following features:
By providing a delay element to delay the rise of the laser diode drive current on the output circuit signal line of the comparison and amplification transistor that outputs a signal to control the power amplification transistor, a power supply rise delay circuit is configured, and the circuit It is possible to prevent current from flowing suddenly. Therefore, it is not necessary to use an expensive tantalum solid electrolytic capacitor which has good high frequency characteristics as a phase compensation capacitor, and it is possible to use an inexpensive aluminum electrolytic capacitor, thereby realizing cost reduction.

[実施例コ 以下、この発明の一実施例を図について説明する。第1
図は、この発明による半導体レーザダイオード制御装置
の回路図であり、(11)はレーザダイオード、(12
)はレーザダイオードと同一のパッケージ内に設けられ
たフォトダイオードであり、両者の一方の端子は互いに
接続されている。レーザダイオード(11)の他端は、
保護用抵抗器(13)を介して電力増幅用トランジスタ
(14)のコレクタに接続されている。(15)は、電
力増幅用トランジスタ(14)のエミッタとベースとの
間に挿入された位相補償用コンデンサである。また、(
16)は比較増幅用トランジスタであり、そのエミ・ツ
タは、定電圧ダイオード(17)を介して電力増幅用ト
ランジスタ(14)のエミッタ側の電源ラインに、およ
び、電流設定抵抗器(18)を介してレーザダイオード
(11)とフォトダイオード(12)との接続端子にそ
れぞれ接続されている。比較増幅用トランジスタ(16
)のベースは、フォトダイオード(12)の他方の端子
に接続されるとともに、出射光量調節用可変抵抗器(1
9)を介して電力増幅用トランジスタ(14)のエミッ
タ側の電源ラインに接続されている。(20)は電源ノ
イズを力・ソトするためのバイパスコンデンサである。
[Example 1] An example of the present invention will be described below with reference to the drawings. 1st
The figure is a circuit diagram of a semiconductor laser diode control device according to the present invention, (11) is a laser diode, (12) is a circuit diagram of a semiconductor laser diode control device according to the present invention.
) is a photodiode provided in the same package as the laser diode, and one terminal of both is connected to each other. The other end of the laser diode (11) is
It is connected to the collector of a power amplification transistor (14) via a protection resistor (13). (15) is a phase compensation capacitor inserted between the emitter and base of the power amplification transistor (14). Also,(
16) is a transistor for comparison amplification, and its emitter is connected to the power supply line on the emitter side of the power amplification transistor (14) via a constant voltage diode (17), and to the current setting resistor (18). The laser diode (11) and the photodiode (12) are connected to connection terminals via the laser diode (11) and the photodiode (12), respectively. Comparison amplification transistor (16
) is connected to the other terminal of the photodiode (12), and the base of the variable resistor (1
9) to the power supply line on the emitter side of the power amplification transistor (14). (20) is a bypass capacitor for reducing power supply noise.

比較増幅用トランジスタ(16)のコレクタと電力増幅
用トランジスタ(14)のベースとの間は電流制限抵抗
器(21)を介して接続されている。
The collector of the comparison amplification transistor (16) and the base of the power amplification transistor (14) are connected via a current limiting resistor (21).

第3図に示す従来例においては、比較増幅用トランジス
タ(6)のコレクタが電力増幅用トランジスタ(4)の
ベースに直結されてI、sるのに対し、上記第1図に示
すこの発明の実施例においては、比較増幅用トランジス
タ(16)のコレクタと電力増幅用トランジスタ(14
)のベースとの間に電流制限抵抗器(21)が設けられ
ている点が特徴的な部分である。
In the conventional example shown in FIG. 3, the collector of the comparison amplification transistor (6) is directly connected to the base of the power amplification transistor (4), whereas in the present invention shown in FIG. In the embodiment, the collector of the comparison amplification transistor (16) and the power amplification transistor (14)
) is characterized in that a current limiting resistor (21) is provided between the base and the base.

次に、上記構成の動作について説明する。Next, the operation of the above configuration will be explained.

第1図において、電源投入直後は比較増幅用トランジス
タ(16)に急激にベース電流がながれ、比較増幅用ト
ランジスタ(16)か飽和領域となるが、コレクタ電流
は電流制限抵抗器(21)からなる遅延素子により制限
される。その結果、電流制限抵抗器(21)と位相補償
用コンデンサ(15)とで構成される遅延回路により、
電力増幅用トランジスタ(14)の立ち上がりが遅延さ
れ、回路に急激な電流か流れるのを防止する。これは電
源立ち上がり時に生じる高域成分が遅延回路により減衰
するためであり、この結果、回路のインディシセル応答
がある範囲内において振動的であっても、人力される信
号(電源の立ち上がり)かステップ状ではないためオー
バシュートか現われず、レーザダイオード(11)に過
大電流か流れる現象が抑制される。
In Figure 1, immediately after the power is turned on, the base current rapidly flows to the comparison and amplification transistor (16), and the comparison and amplification transistor (16) enters the saturation region, but the collector current is controlled by the current limiting resistor (21). Limited by delay elements. As a result, due to the delay circuit composed of the current limiting resistor (21) and the phase compensation capacitor (15),
The rise of the power amplifying transistor (14) is delayed to prevent sudden current from flowing through the circuit. This is because the high-frequency components that occur when the power supply rises are attenuated by the delay circuit. Since the laser diode (11) is not shaped like this, overshoot does not appear, and the phenomenon of excessive current flowing through the laser diode (11) is suppressed.

以上述べたように、この発明によれば、電流制限抵抗器
(21)からなる遅延素子を比較増幅用トランジスタ(
16)の出力回路信号線上ζこ設けるこ・とにより、信
号の立ち上がりのオーツ(シュート現象をなくしたので
、位相補償用コンデンサ(15)には、従来のように高
域特性の優れた高価なタンタル固体電解コンデンサを使
用する必要がなく、汎用のアルミ電解コンデンサで十分
安定した回路を構成することができる。従って、装置の
コストダウンが可能である。
As described above, according to the present invention, the delay element consisting of the current limiting resistor (21) is replaced by the comparison and amplification transistor (
16) on the output circuit signal line eliminates the shoot phenomenon at the rise of the signal. There is no need to use a tantalum solid electrolytic capacitor, and a sufficiently stable circuit can be constructed using a general-purpose aluminum electrolytic capacitor.Therefore, it is possible to reduce the cost of the device.

なお、上記実施例では比較増幅用トランジスタ(16)
のコレクタ側に電流制限抵抗器(21)を設けた場合に
ついて述べたが、第2図に示すように、比較増幅用トラ
ンジスタ(16)のエミ・ツタ側の回路信号線上に電流
制限抵抗器(22)を設けるようにしても、上記実施例
と同様の効果を得ることができる。
In addition, in the above embodiment, the comparative amplification transistor (16)
We have described the case where the current limiting resistor (21) is provided on the collector side of the transistor, but as shown in FIG. Even if 22) is provided, the same effect as in the above embodiment can be obtained.

[発明の効果] この発明は、以上説明したとおり、比較増幅用トランジ
スタの出力回路信号線上に電流制限抵抗器からなる遅延
素子を設ける構成により、電源投入時にレーザダイオー
ド回路に急激な電流か流れることを防止できる。従って
、位相補償用コンデンサに高価なタンタル固体電解コン
デンサを使用しなくとも高性能の回路を実現でき、安価
で高品質、高信頼性を有する半導体レーザダイオード制
御装置を得ることができる。
[Effects of the Invention] As explained above, the present invention has a configuration in which a delay element consisting of a current limiting resistor is provided on the output circuit signal line of the comparison amplification transistor, so that a sudden current flows through the laser diode circuit when the power is turned on. can be prevented. Therefore, a high-performance circuit can be realized without using an expensive tantalum solid electrolytic capacitor as a phase compensation capacitor, and a semiconductor laser diode control device having high quality and high reliability can be obtained at low cost.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、この発明による半導体レーザダイオード制御
装置の1実施例の回路図、第2図は、この発明の他の実
施例の回路図、第3図は、従来の半導体レーザダイオー
ド制御装置の回路図である。 図中、(11)はレーザダイオード、(12)は出射光
量検出用のフォトダイオード、(13)は保護用抵抗器
、(14)は電力増幅用トランジスタ、(15)は位相
補償用コンデンサ、(16)は比較増幅用トランジスタ
、(17)は定電圧ダイオード、(18)は電流設定抵
抗器、(19)は出射光量調節用可変抵抗器、(20)
はバイパスコンデンサ、(21)、(22)は電流制限
抵抗器である。 なお、 図中同一符号は同一または相当部分を示す。 代理人 弁理士 吉 1)研 二 (外2名) 第 図
FIG. 1 is a circuit diagram of one embodiment of a semiconductor laser diode control device according to the present invention, FIG. 2 is a circuit diagram of another embodiment of the present invention, and FIG. 3 is a circuit diagram of a conventional semiconductor laser diode control device. It is a circuit diagram. In the figure, (11) is a laser diode, (12) is a photodiode for detecting the amount of emitted light, (13) is a protection resistor, (14) is a power amplification transistor, (15) is a phase compensation capacitor, ( 16) is a transistor for comparison amplification, (17) is a constant voltage diode, (18) is a current setting resistor, (19) is a variable resistor for adjusting the amount of emitted light, (20)
is a bypass capacitor, and (21) and (22) are current limiting resistors. Note that the same symbols in the figures indicate the same or equivalent parts. Agent: Patent attorney Yoshi 1) Kenji (2 others) Fig.

Claims (1)

【特許請求の範囲】[Claims] レーザダイオードに駆動電流を供給する電力増幅用トラ
ンジスタと、前記レーザダイオードのレーザ出射光量を
検出するフォトダイオードと、このフォトダイオードの
出力に応じて前記電力増幅用トランジスタにおける電流
量を一定に制御するための信号を出力する比較増幅用ト
ランジスタと、この比較増幅用トランジスタの信号出力
回路に設けられレーザダイオードの駆動電流の立ち上が
りを遅らせるための遅延素子を備えたことを特徴とする
半導体レーザダイオード制御装置。
A power amplification transistor for supplying a drive current to the laser diode, a photodiode for detecting the amount of laser light emitted from the laser diode, and controlling the amount of current in the power amplification transistor to be constant according to the output of the photodiode. 1. A semiconductor laser diode control device comprising: a comparison amplification transistor that outputs a signal; and a delay element provided in a signal output circuit of the comparison amplification transistor to delay the rise of a laser diode drive current.
JP11802390A 1990-05-08 1990-05-08 Semiconductor laser diode control device Pending JPH0414884A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11802390A JPH0414884A (en) 1990-05-08 1990-05-08 Semiconductor laser diode control device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11802390A JPH0414884A (en) 1990-05-08 1990-05-08 Semiconductor laser diode control device

Publications (1)

Publication Number Publication Date
JPH0414884A true JPH0414884A (en) 1992-01-20

Family

ID=14726158

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11802390A Pending JPH0414884A (en) 1990-05-08 1990-05-08 Semiconductor laser diode control device

Country Status (1)

Country Link
JP (1) JPH0414884A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0910143A2 (en) * 1997-10-16 1999-04-21 Fujitsu Limited Laser diode protecting circuit
US5918258A (en) * 1996-07-11 1999-06-29 Bowers; William D. High-sensitivity instrument to measure NVR in fluids
EP0968551A1 (en) * 1996-10-22 2000-01-05 Maxim Integrated Products, Inc. Laser diode having smooth enable apc circuit
WO2016169378A1 (en) * 2015-04-22 2016-10-27 张瓯 Drive circuit for laser module and laser demarcation device having drive circuit

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5918258A (en) * 1996-07-11 1999-06-29 Bowers; William D. High-sensitivity instrument to measure NVR in fluids
US6122954A (en) * 1996-07-11 2000-09-26 Femtometrics, Inc. High sensitivity instrument to measure NVR in fluid
US6363773B1 (en) 1996-07-11 2002-04-02 Femtometrics High-sensitivity instrument to measure NVR in fluids
EP0968551A1 (en) * 1996-10-22 2000-01-05 Maxim Integrated Products, Inc. Laser diode having smooth enable apc circuit
EP0968551A4 (en) * 1996-10-22 2006-04-19 Maxim Integrated Products Laser diode having smooth enable apc circuit
EP0910143A2 (en) * 1997-10-16 1999-04-21 Fujitsu Limited Laser diode protecting circuit
EP0910143A3 (en) * 1997-10-16 2004-03-24 Fujitsu Limited Laser diode protecting circuit
WO2016169378A1 (en) * 2015-04-22 2016-10-27 张瓯 Drive circuit for laser module and laser demarcation device having drive circuit

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