JPH04131759U - Foreign matter inspection device for transparent transparent objects - Google Patents

Foreign matter inspection device for transparent transparent objects

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Publication number
JPH04131759U
JPH04131759U JP3861991U JP3861991U JPH04131759U JP H04131759 U JPH04131759 U JP H04131759U JP 3861991 U JP3861991 U JP 3861991U JP 3861991 U JP3861991 U JP 3861991U JP H04131759 U JPH04131759 U JP H04131759U
Authority
JP
Japan
Prior art keywords
transparent
foreign matter
edge
pallet
transparent body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3861991U
Other languages
Japanese (ja)
Inventor
弘一 増田
周次 大仲
Original Assignee
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気株式会社 filed Critical 日本電気株式会社
Priority to JP3861991U priority Critical patent/JPH04131759U/en
Publication of JPH04131759U publication Critical patent/JPH04131759U/en
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Closed-Circuit Television Systems (AREA)

Abstract

(57)【要約】 【構成】不透明な材料のパレット2は,不定形かつ透光
性の偏形透光体1を搭載し,そのエッジ13をマスクす
るエッジマスク部21を周辺に配設した切欠22を有す
る。光源3はパレットに搭載した偏形透光体1を下方か
ら照射し,エッジ13をマスクした状態でカメラ41に
よってパレット2ならびに偏形透光体1の重合画像を撮
像し,画像処理装置4によって異物12の存在を判定す
る。 【効果】エッジ13による影,照射状態の不定による誤
認識を排除できる。
(57) [Summary] [Structure] A pallet 2 made of an opaque material is equipped with an amorphous translucent body 1 of irregular shape and transparent, and an edge mask portion 21 for masking the edge 13 is arranged around the pallet 2. It has a notch 22. The light source 3 illuminates the transparent transparent body 1 mounted on the pallet from below, and with the edge 13 masked, a camera 41 captures a superimposed image of the pallet 2 and the transparent transparent body 1. The presence of foreign matter 12 is determined. [Effect] Erroneous recognition due to shadows caused by the edge 13 and uncertain irradiation conditions can be eliminated.

Description

【考案の詳細な説明】[Detailed explanation of the idea]

【0001】0001

【産業上の利用分野】[Industrial application field]

本考案は偏形透光体の異物検査装置に関し,特に透明もしくは半透明な不定形 の偏形透光体に含まれている異物の有無を検査する偏形透光体の異物検査装置に 関する。 The present invention relates to a foreign matter inspection device for transparent or semi-transparent objects, especially transparent or semi-transparent irregular objects. A foreign object inspection device for flat transparent bodies that inspects the presence of foreign substances contained in flat transparent bodies. related.

【0002】0002

【従来の技術】[Conventional technology]

透明もしくは半透明な不定形の偏形透光体としては,たとえば半透明な扇風機 ファンなどがある。 Examples of transparent or translucent irregular shaped translucent bodies include translucent electric fans. There are fans, etc.

【0003】 このような偏形透光体に含まれる気泡などの異物を検査する方法として光学的 な方法がある。この方法では,検査物体に光を当てて撮像カメラによる画像をと り,この画像データを分析することによって異物の有無判定が行なわれていた。0003 Optical methods are used to inspect foreign substances such as air bubbles contained in such shaped translucent materials. There is a method. In this method, the inspection object is illuminated with light and an image is taken by an imaging camera. The presence or absence of foreign objects was determined by analyzing this image data.

【0004】 このような光学的処理の場合,検査物体の輪郭を示すエッジの影も画像データ として出力することが多く,これが異物有無判定に誤りをもたらす原因となるた め,エッジは非検査エリアとして投光に対して遮蔽するマスク処理が行なわれて いる。0004 In the case of such optical processing, the shadow of the edge showing the outline of the inspection object is also included in the image data. , which causes errors in determining the presence or absence of foreign objects. Therefore, the edges are treated as non-inspection areas and are masked to shield them from the projected light. There is.

【0005】 従来,非検査エリアのマスク処理は,検査物体の画像を取得する画像処理装置 にマスク用のメモリを備え,マスク領域を記憶しておいて,非検査エリアに含ま れる不透明部分は電気回路的に排除するようにしていた。[0005] Conventionally, masking of non-inspection areas is performed using an image processing device that acquires images of the inspection object. is equipped with a mask memory to store the mask area and to store it in the non-inspection area. The opaque parts that could be exposed were eliminated from the electrical circuit.

【0006】[0006]

【考案が解決しようとする課題】[Problem that the idea aims to solve]

上述した従来のマスク領域処理方法では,画像処理装置の電気回路にマスク用 のメモリが必要となり回路も複雑化するという欠点がある。また,撮像カメラと 検査物体の位置関係がずれてしまうと正しいマスク効果が得られないという欠点 がある。 In the conventional mask area processing method described above, the electrical circuit of the image processing device is The drawback is that it requires more memory and the circuit becomes more complex. In addition, an imaging camera and The disadvantage is that if the positional relationship of the inspection object is misaligned, the correct mask effect cannot be obtained. There is.

【0007】 本考案の目的は上述した欠点を除去し,簡素な構成で,かつ撮像カメラと検査 物体の相対位置関係のずれの影響を大幅に抑圧しうる偏形透光体の異物検査装置 を提供することにある。[0007] The purpose of this invention is to eliminate the above-mentioned drawbacks, have a simple configuration, and use an imaging camera and inspection system. A foreign object inspection device for oblique transparent objects that can significantly suppress the effects of deviations in the relative position of objects. Our goal is to provide the following.

【0008】[0008]

【課題を解決するための手段】[Means to solve the problem]

本考案の装置は,外形が不定形状で透光性のある透明もしくは半透明の偏形透 光体に含まれる異物の有無を検査する偏形透光体の異物検査装置であって,前記 偏形透光体のエッジならびに所定の範囲のエッジ外囲を光学的に不透明状態にマ スクして搭載するパレットと,前記パレットに搭載した前記偏形透光体を下方か ら照射する光源と,前記光源による照射光景を撮像して前記偏形透光体の異物の 有無を判定する画像処理装置とを備えて構成される。 The device of this invention has an irregular shape and is transparent or translucent. A foreign matter inspection device for a flat transparent body that inspects the presence or absence of foreign matter contained in a light body, the device comprising: Mapping the edge of a translucent object and a predetermined area of the edge into an optically opaque state. The pallet to be mounted by scrolling and the oblique transparent body mounted on the pallet are placed in a downward direction. A light source that irradiates from and an image processing device that determines the presence or absence.

【0009】 また本考案の装置は,前記パレットに,前記偏形透光体を平面的に嵌入して保 持する段付き構造の不透明なエッジマスク部ならびに前記エッジマスク部を境界 とする切欠を配設した構成を有する。[0009] Further, the device of the present invention is configured to fit the flat transparent body into the pallet in a flat manner for storage. an opaque edge mask portion with a stepped structure and a boundary between said edge mask portions; It has a configuration in which a notch is provided.

【0010】0010

【実施例】【Example】

次に,本考案について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

【0011】 図1は,本考案の一実施例の偏形透光体の異物検査装置の構成図である。[0011] FIG. 1 is a block diagram of a foreign matter inspection device for a transparent transparent body according to an embodiment of the present invention.

【0012】 図1に示す実施例は,検査物体としての不定形外形を有する半透明な偏形透光 体1,偏形透光体1を安定に搭載する不透明なエッジマスク部21と,エッジマ スク部21を境界とする切欠22を配設した,搬送機能(図示せず)で保持され たパレット2,パレット2に下方から光を照射する光源3,光源3で照射された 偏形透光体1搭載のパレット2を撮像するカメラ4を含む画像の連結性解析可能 な画像処理装置41とを備えて成る。0012 The embodiment shown in FIG. An opaque edge mask part 21 on which the body 1 and the transparent transparent body 1 are stably mounted, and an edge mask It is held by a conveying function (not shown) provided with a notch 22 bordering on the screen portion 21. pallet 2, light source 3 that irradiates pallet 2 with light from below, and light source 3 that illuminates pallet 2 Connectivity analysis of images including the camera 4 that images the pallet 2 equipped with the transparent translucent body 1 is possible. An image processing device 41 is provided.

【0013】 次に,本実施例の動作について説明する。[0013] Next, the operation of this embodiment will be explained.

【0014】 パレット2は,異物11,キズ12を含むエッジ13の外形をもつ偏形透光体 1を水平に搭載する不透明なエッジマスク部21が配設され,さらに,このエッ ジマスク部21に搭載してエッジをマスクした偏形透光体1に光源3から照射光 を直射しうる切欠22を有する。[0014] The pallet 2 is a rectangular transparent body having an outer shape of an edge 13 including foreign matter 11 and scratches 12. 1 is mounted horizontally, and an opaque edge mask portion 21 is disposed on which the edge mask 1 is mounted horizontally. Light is irradiated from the light source 3 onto the rectangular transparent body 1 which is mounted on the mask section 21 and whose edges are masked. It has a notch 22 through which it can be directly irradiated.

【0015】 図2は,図1のエッジマスク部21に対する偏形透光体の搭載状態を示す断面 図である。[0015] FIG. 2 is a cross-sectional view showing the state in which the flat transparent body is mounted on the edge mask portion 21 of FIG. 1. It is a diagram.

【0016】 パレット2は,偏形透光体1を搭載してカメラ41と光源3の対向する位置に 移動し,光源3の照射を受けた光景をカメラ41で撮像される。[0016] The pallet 2 is equipped with the transparent translucent body 1 and placed at a position facing the camera 41 and the light source 3. The camera 41 captures an image of the scene illuminated by the light source 3 while moving.

【0017】 カメラ41で撮像されたデータは画像処理装置で処理され,図3(a),(b )に示すような偏形透光体像10を出力する。図3(a)は,斜線で表現した不 透明なパレット2の影103と,エッジ13の影を排除した偏形透光体像101 を有し,さらに偏形透光体像10の中に異物11の影102を表示している。[0017] The data captured by the camera 41 is processed by the image processing device, and is shown in FIGS. ) outputs an image 10 of a polarized transparent body as shown in FIG. Figure 3(a) shows the deficiencies represented by diagonal lines. Shaped transparent body image 101 excluding the shadow 103 of the transparent palette 2 and the shadow of the edge 13 Furthermore, a shadow 102 of the foreign object 11 is displayed in the image 10 of the oblong transparent body.

【0018】 図3(a)における異物11の影102は画像処理装置4によって抽出される 。[0018] The shadow 102 of the foreign object 11 in FIG. 3(a) is extracted by the image processing device 4. .

【0019】 カメラ41で撮像した画像データを,画像処理装置4で画像データ間の連結性 に着目した連結性解析を行なうと,図3(b)の如く表示される。偏形透光体1 に異物11が含まれているときは,図3(b)のように画像データ間の連結性が 証明されたもの以外の非連結性のデータはキズを含み異物に対応するものと判定 されて図3(a)に示す如く表示される。つまり,エッジを含むマスク領域と偏 形透光体の形状によって得られるあらかじめ既知の連結性データ以外はキズ12 による形状の乱れとしてのキズ12の影104を含み異物として判定表示し,こ れによって異物混入の有無が容易に検査できる。[0019] The image data captured by the camera 41 is processed by the image processing device 4 to create connectivity between the image data. When a connectivity analysis is performed focusing on this, the result is displayed as shown in FIG. 3(b). Shaped transparent body 1 When the foreign object 11 is included in the image data, the connectivity between the image data becomes Disconnection data other than those that have been proven is determined to include scratches and correspond to foreign objects. and is displayed as shown in FIG. 3(a). In other words, the mask region including edges and Scratches 12 other than the previously known connectivity data obtained from the shape of the transparent body This includes the shadow 104 of the scratch 12 as a shape disturbance due to This makes it easy to check for the presence of foreign matter.

【0020】 図3(a),(b)と対比して示すのが図4である。[0020] FIG. 4 is shown in comparison with FIGS. 3(a) and 3(b).

【0021】 図4は,パレット2を用いないで撮像した画像であり,この場合には,異物1 1の影105と,エッジ13の影106と,キズ12の影107が表示されるが ,エッジ13の影106とキズ12の影107は撮像状態に対応して変動するた め一定ではなく,従って場所データの確認等さらに調査が必要となる。[0021] FIG. 4 is an image taken without using the pallet 2, and in this case, the foreign object 1 1 shadow 105, edge 13 shadow 106, and scratch 12 shadow 107 are displayed. , the shadow 106 of the edge 13 and the shadow 107 of the scratch 12 vary depending on the imaging state. Therefore, further investigation such as confirmation of location data is required.

【0022】[0022]

【考案の効果】[Effect of the idea]

以上説明したように本考案は,検査物体にエッジ撮像を抑圧する不透明物体の パレットを重合して撮像することにより,画面の中に検査物体が入る限り,検査 物体の位置変動に対しても異物の誤検知を行なわずにすみ,かつ不定形マスク機 能をもたなくてすむ画像処理装置が利用できるという効果がある。 As explained above, the present invention uses an opaque object that suppresses edge imaging on the inspection object. By superimposing the pallets and taking images, as long as the object to be inspected is within the screen, inspection is possible. This eliminates the need for false detection of foreign objects even when the object's position changes, and it is also possible to use an amorphous mask machine. This has the advantage that it is possible to use an image processing device that does not have any functions.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本考案の一実施例の偏形透光体の異物検査装置
の構成図である。
FIG. 1 is a configuration diagram of a foreign matter inspection device for a rectangular transparent body according to an embodiment of the present invention.

【図2】図1の偏形透光体1をパレット2に搭載した状
態の部分断面図である。
2 is a partial cross-sectional view of the flat transparent body 1 of FIG. 1 mounted on a pallet 2. FIG.

【図3】図1の実施例における異物の含む画像例を示す
(a),および異物を含まない画像例を示す(b)であ
る。
3(a) shows an example of an image including a foreign object in the embodiment of FIG. 1, and FIG. 3(b) shows an example of an image without a foreign object.

【図4】従来の偏形透光体の画像例を示す図である。FIG. 4 is a diagram showing an example of an image of a conventional transparent transparent body.

【符号の説明】[Explanation of symbols]

1 偏形透光体 2 パレット 3 光源 4 画像処理装置 11 異物 12 キズ 13 エッジ 21 エッジマスク部 22 切欠 101 偏形透光体像 102 異物11の影 103 パレット2の影 104 キズ12の影 105 異物11の影 106 エッジ13の影 107 キズ12の影 1 Shaped transparent body 2 Palette 3 Light source 4 Image processing device 11 Foreign matter 12 Scratches 13 Edge 21 Edge mask section 22 Notch 101 Shaped transparent body image 102 Shadow of foreign object 11 103 Palette 2 shadow 104 Shadow of scratch 12 105 Shadow of foreign object 11 106 Shadow of Edge 13 107 Shadow of scratch 12

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 外形が不定形状で透光性のある透明もし
くは半透明の偏形透光体に含まれる異物の有無を検査す
る偏形透光体の異物検査装置であって,前記偏形透光体
のエッジならびに所定の範囲のエッジ外囲を光学的に不
透明状態にマスクして搭載するパレットと,前記パレッ
トに搭載した前記偏形透光体を下方から照射する光源
と,前記光源による照射光景を撮像して前記偏形透光体
の異物の有無を判定する画像処理装置とを備えて成るこ
とを特徴とする偏形透光体の異物検査装置。
1. A foreign matter inspection device for a flat transparent body that inspects the presence or absence of foreign matter contained in a transparent or semi-transparent flat transparent body with an irregular external shape, which a pallet on which the edge of a transparent body and a predetermined range of edge surroundings are masked in an optically opaque state; a light source that irradiates the flat transparent body mounted on the pallet from below; 1. A foreign matter inspection device for a flat transparent body, comprising: an image processing device that images an irradiation scene and determines the presence or absence of foreign matter in the flat transparent body.
【請求項2】 前記パレットに,前記偏形透光体を平面
的に嵌入して保持する段付き構造の不透明なエッジマス
ク部ならびに前記エッジマスク部を境界とする切欠を配
設したことを特徴とする請求項1記載の偏形透光体の異
物検査装置。
2. The pallet is provided with an opaque edge mask portion having a stepped structure into which the transparent translucent body is fitted and held in a plane, and a notch with the edge mask portion as a boundary. 2. A foreign matter inspection device for a shaped translucent body according to claim 1.
JP3861991U 1991-05-29 1991-05-29 Foreign matter inspection device for transparent transparent objects Pending JPH04131759U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3861991U JPH04131759U (en) 1991-05-29 1991-05-29 Foreign matter inspection device for transparent transparent objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3861991U JPH04131759U (en) 1991-05-29 1991-05-29 Foreign matter inspection device for transparent transparent objects

Publications (1)

Publication Number Publication Date
JPH04131759U true JPH04131759U (en) 1992-12-04

Family

ID=31920078

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3861991U Pending JPH04131759U (en) 1991-05-29 1991-05-29 Foreign matter inspection device for transparent transparent objects

Country Status (1)

Country Link
JP (1) JPH04131759U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6262249B2 (en) * 1982-04-30 1987-12-25 Matsushita Electric Ind Co Ltd
JPS6345543A (en) * 1986-06-14 1988-02-26 バッテレ−インスティチュ−ト・エ−・ファウ Test apparatus for unconformability and occlusion of surface of transparent material element

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6262249B2 (en) * 1982-04-30 1987-12-25 Matsushita Electric Ind Co Ltd
JPS6345543A (en) * 1986-06-14 1988-02-26 バッテレ−インスティチュ−ト・エ−・ファウ Test apparatus for unconformability and occlusion of surface of transparent material element

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