JPH04127581U - pogo pin - Google Patents
pogo pinInfo
- Publication number
- JPH04127581U JPH04127581U JP500091U JP500091U JPH04127581U JP H04127581 U JPH04127581 U JP H04127581U JP 500091 U JP500091 U JP 500091U JP 500091 U JP500091 U JP 500091U JP H04127581 U JPH04127581 U JP H04127581U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- pogo pin
- side terminal
- pogo
- electrical wiring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000002184 metal Substances 0.000 claims description 11
- 238000012360 testing method Methods 0.000 abstract description 6
- 238000005259 measurement Methods 0.000 abstract description 5
- 239000004065 semiconductor Substances 0.000 abstract description 4
- 230000000694 effects Effects 0.000 abstract description 3
- 238000009429 electrical wiring Methods 0.000 description 14
- 230000006835 compression Effects 0.000 description 5
- 238000007906 compression Methods 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】
【構成】ポゴピンの接触側端子12として、螺旋状に巻
いた渦巻き状ねじり板ばねを用いている。
【効果】このポゴピンを半導体装置などの電気的特性の
検査・試験に用いれば、従来のポゴピンに比べて、高精
度で安定した測定を行なうことができる。部品点数を減
らすことが可能であり、従来のものに比べてコストを低
減することができる。
(57) [Summary] [Structure] A spirally wound spiral torsion leaf spring is used as the contact side terminal 12 of the pogo pin. [Effect] If this pogo pin is used for inspecting and testing the electrical characteristics of semiconductor devices, it is possible to perform more accurate and stable measurements than with conventional pogo pins. It is possible to reduce the number of parts, and costs can be reduced compared to conventional ones.
Description
【0001】0001
本考案は、一方の基板表面に設けられた電気配線パターンと他方の基板表面に 設けられた電気配線パターンとを接触によって電気的に接続するためのポゴピン に関する。 This invention has an electrical wiring pattern on the surface of one board and an electric wiring pattern on the surface of the other board. Pogo pin for electrically connecting with the provided electrical wiring pattern by contact Regarding.
【0002】0002
この種のポゴピンは、例えば、半導体装置の製造工程において、ウエーハ状態 でのチップや完成された半導体装置の、電気的特性を検査したり試験したりする 時などに用いられるものである。 This type of pogo pin is used, for example, in the wafer state in the semiconductor device manufacturing process. Inspecting and testing the electrical characteristics of chips and completed semiconductor devices. It is used at times.
【0003】 図2は、上述の検査・試験における測定装置と被測定物との電気的な接続関係 を、ポゴピンの部分を中心にして、模式的に表したものである。0003 Figure 2 shows the electrical connection relationship between the measuring device and the object to be measured in the above-mentioned inspection/test. is schematically represented with the pogo pins in the center.
【0004】 図において、可動側基板1の表面には電気配線2がプリント配線されている。 このプリント配線は、ICテスタ3の電気回路に接続されている。0004 In the figure, electrical wiring 2 is printed on the surface of a movable substrate 1. This printed wiring is connected to the electric circuit of the IC tester 3.
【0005】 一方、固定側基板4の表面にも電気配線5がプリント配線されている。このプ リント配線された電気配線5は、例えば、プローブカード6などを介して、被測 定物であるICチップ7に電気的に接続されている。[0005] On the other hand, electric wiring 5 is also printed on the surface of the fixed substrate 4. This program The lint-wired electrical wiring 5 is connected to the test target via a probe card 6, for example. It is electrically connected to an IC chip 7 which is a fixed object.
【0006】 そして、固定側基板4の電気配線5の一部分にはスルーホールが設けられてい て、ここに、金属製のソケット8がはんだなどで固定されている。この金属製の ソケット8には、ポゴピンの固定側端子9がはめ込まれている。この固定側端子 9は、金属製でチューブ状の形状をしている。[0006] A through hole is provided in a portion of the electric wiring 5 of the fixed board 4. A metal socket 8 is fixed here with solder or the like. This metal A fixed side terminal 9 of a pogo pin is fitted into the socket 8. This fixed side terminal 9 is made of metal and has a tube-like shape.
【0007】 ここで、従来のポゴピンの構造は、金属製の針状をした接触側端子10と圧縮 コイルばね11とが、固定側端子9の内部に収納された構造となっている。[0007] Here, the structure of the conventional pogo pin consists of a metal needle-shaped contact terminal 10 and a compressed The coil spring 11 is housed inside the fixed terminal 9.
【0008】 このような構成で、ICチップ7の電気特性を測定する場合には、可動側基板 1を下方に降し、電気配線2とポゴピンの接触側端子10とを接触させる。[0008] With such a configuration, when measuring the electrical characteristics of the IC chip 7, the movable side substrate 1 is lowered to bring the electrical wiring 2 into contact with the contact side terminal 10 of the pogo pin.
【0009】 このようにすると、電気配線2と接触側端子10とは、圧縮コイルばね11の 反発力で接触が保たれ、ICテスタ3とICチップ7とが電気的に接続され、検 査・試験を行なうことができる。[0009] In this way, the electrical wiring 2 and the contact side terminal 10 are connected to the compression coil spring 11. The contact is maintained by the repulsive force, and the IC tester 3 and the IC chip 7 are electrically connected and tested. Examinations and tests can be conducted.
【0010】 尚、図2には、簡単のためにポゴピンを一本しか描いてないが、通常、このよ うなポゴピンは1つの基板に非常に多数設けられている。例えば、512本も設 けられている例もある。0010 Although only one pogo pin is shown in Figure 2 for simplicity, it is usually A large number of eel pogo pins are provided on one board. For example, 512 lines were installed. There are also examples of people being kicked out.
【0011】 従って、上述したポゴピンでは、一本一本のポゴピンと電気配線2との接触が 確実に行なわれることが非常に大切である。[0011] Therefore, in the pogo pins described above, each pogo pin and the electrical wiring 2 are not in contact with each other. It is very important that this is done reliably.
【0012】 このため、従来、電気配線2との接触を良くするために色々な構造のポゴピン が考案され、接触側端子10の先端の形状としては、例えば、多点メッシュ状、 1点円錐状、4点円錐状などをしたものなどがある。0012 For this reason, conventionally, pogo pins with various structures have been used to improve contact with the electrical wiring 2. has been devised, and the shape of the tip of the contact side terminal 10 is, for example, a multi-point mesh shape, There are 1-point conical shapes, 4-point conical shapes, etc.
【0013】[0013]
以上説明したように、従来、ポゴピンの接触側端子10の形状をいろいろ工夫 して、電気配線2との接触を良好にしようとしてきた。 As explained above, conventionally, the shape of the contact side terminal 10 of the pogo pin has been devised in various ways. In this way, attempts have been made to improve contact with the electrical wiring 2.
【0014】 ところで、従来のポゴピンにおいては、接触側端子10の先端形状がどのよう なものであれ、一旦製造されてしまった後では、その形状を変更することができ ない。又、可動側基板4を接触側端子10に接触させて圧力を加えても、接触側 端子10の先端形状自身には、基本的に変化がない。[0014] By the way, in the conventional pogo pin, what is the shape of the tip of the contact side terminal 10? Once a product has been manufactured, its shape cannot be changed. do not have. Moreover, even if the movable side substrate 4 is brought into contact with the contact side terminal 10 and pressure is applied, the contact side There is basically no change in the tip shape of the terminal 10 itself.
【0015】 このため、たとえ、接触側端子10の先端形状を多点メッシュ状にして電気配 線2と多点で接触するようにし、又、接触面が平坦で接触に有利な条件であって も、接触面の傾きによっては、ほんのわずかな点でしか接触しないようなことが 起る。[0015] For this reason, even if the tip shape of the contact side terminal 10 is made into a multi-point mesh shape, the electrical wiring It should be in contact with line 2 at multiple points, and the contact surface should be flat, which is an advantageous condition for contact. However, depending on the inclination of the contact surface, contact may occur at only a small point. It happens.
【0016】 このような場合には、測定系内で、ポゴピン接触部の接触抵抗が他の部分の抵 抗に比べて比較にならないほど大きくなり、又、大電流を流すような場合には、 ポゴピンの接触端面での酸化などによる接触抵抗の経時的な変化も起るなどのた め、高精度の測定を安定して行なうことができなくなってしまう。[0016] In such a case, the contact resistance of the pogo pin contact part may be higher than the resistance of other parts in the measurement system. When the resistor becomes incomparably larger than the resistor, and when a large current flows, Contact resistance may change over time due to oxidation on the contact end surface of the pogo pin. Therefore, it becomes impossible to stably perform high-precision measurements.
【0017】 又、従来のポゴピンにおいては、固定側端子9、接触側端子10、圧縮コイル ばね11のそれぞれに高い加工精度が要求され、組み立てに多くの工数が掛かる ため、重量当りのコストを低減することが難しいという問題点があった。[0017] In addition, the conventional pogo pin has a fixed side terminal 9, a contact side terminal 10, and a compression coil. Each of the springs 11 requires high processing precision, and assembly requires a lot of man-hours. Therefore, there was a problem in that it was difficult to reduce the cost per weight.
【0018】[0018]
本考案のポゴピンは、金属板を螺旋状に巻いて中心線方向に反発力を持たせた 接触側端子を、金属製の固定側端子内に嵌挿し保持したことを特徴とする。 The pogo pin of this invention is made by winding a metal plate in a spiral to create a repulsive force in the direction of the center line. It is characterized in that the contact side terminal is inserted into and held within the metal fixed side terminal.
【0019】[0019]
次に、本考案の最適な実施例について、図面を参照して説明する。図1(a) は、本考案の一実施例によるポゴピンの斜視図である。 Next, a preferred embodiment of the present invention will be described with reference to the drawings. Figure 1(a) 1 is a perspective view of a pogo pin according to an embodiment of the present invention; FIG.
【0020】 本実施例では、ポゴピンの接触側端子12として、金属板を螺旋状に巻いた渦 巻き状ねじり板ばねを用い、これを、金属製の固定側端子9に入れてある。[0020] In this embodiment, the contact side terminal 12 of the pogo pin is a vortex made of a metal plate spirally wound. A coiled torsion leaf spring is used, and this is inserted into a metal fixed terminal 9.
【0021】 従来のポゴピンに用いられていた圧縮コイルばねは用いていない。これは、上 述のような構造の接触側端子12は、これを中心線方向に圧縮すると、それ自身 で反発力を発生するからである。[0021] It does not use the compression coil springs used in conventional pogo pins. This is the top When the contact side terminal 12 having the above-mentioned structure is compressed in the direction of the center line, it will expand by itself. This is because a repulsive force is generated.
【0022】 図1(b)は、本実施例のポゴピンの使用時の状態を示す断面図である。図1 (a)に示すポゴピン全体を金属製ソケット8に挿入し、固定側基板4に固定す る。[0022] FIG. 1(b) is a sectional view showing the pogo pin of this embodiment in use. Figure 1 Insert the entire pogo pin shown in (a) into the metal socket 8 and fix it to the fixed board 4. Ru.
【0023】 固定側基板4には従来と同様に電気配線5がプリント配線され、ソケット8は この電気配線5にはんだ付けされる。[0023] Electrical wiring 5 is printed on the fixed side board 4 as in the conventional case, and the socket 8 is This electrical wiring 5 is soldered.
【0024】 この状態で可動側基板1を上から接触させ、圧迫すると、接触側端子12は次 第に縮み、可動側基板1表面の電気配線2との間に電気接触が得られる。この場 合、接触側端子12が、圧縮力の大きさと接触面の傾き具合に応じて形状が変化 するので、常に線状ないし面状の接触となり、良好な接触が保たれる。[0024] In this state, if the movable side board 1 is brought into contact with it from above and pressed, the contact side terminal 12 will be Second, it contracts, and electrical contact is established between it and the electrical wiring 2 on the surface of the movable substrate 1. this place In this case, the shape of the contact side terminal 12 changes depending on the magnitude of the compressive force and the degree of inclination of the contact surface. Therefore, the contact is always linear or planar, and good contact is maintained.
【0025】[0025]
以上説明したように、本考案では、ポゴピンの接触側端子として、螺旋状に巻 いた渦巻き状ねじり板ばねを用いているので、可動側基板との接触に際して、端 子そのものが接触面に対して形状変化を起し、接触が線状ないし面状で行なわれ る。 As explained above, in the present invention, the pogo pin is wound spirally as the contact side terminal. Since a spiral torsion leaf spring is used, the end of the spring will not touch the moving board. The child itself changes its shape with respect to the contact surface, and the contact is linear or planar. Ru.
【0026】 このため、本考案を半導体装置などの電気的特性の検査・試験に用いれば、従 来のポゴピンに比べて、測定系での接触抵抗が小さく、また、大電流を流しても 接触端面の酸化などによる接触抵抗の経時変化が起りにくいので、高精度で安定 した測定を行なうことができるという効果がある。[0026] Therefore, if the present invention is used for inspecting and testing the electrical characteristics of semiconductor devices, etc., it will be possible to Compared to conventional pogo pins, the contact resistance in the measurement system is lower, and even when a large current is applied, High accuracy and stability as contact resistance is less likely to change over time due to oxidation of the contact end surface, etc. This has the advantage that accurate measurements can be made.
【0027】 又、本考案は、接触側端子そのものが、従来のポゴピンにおける圧縮コイルば ねの役目を果すため、部品点数を減らすことが可能であり、従来のものに比べて コストを低減することができるという効果を有する。[0027] In addition, in this invention, the contact side terminal itself is different from the compression coil spring in the conventional pogo pin. Because it plays the role of a screw, it is possible to reduce the number of parts, compared to conventional ones. This has the effect of reducing costs.
【図1】本考案の一実施例の斜視図および使用時の断面
図である。FIG. 1 is a perspective view and a sectional view of an embodiment of the present invention in use.
【図2】従来のポゴピンの使用時の模式的断面図であ
る。FIG. 2 is a schematic cross-sectional view of a conventional pogo pin in use.
【符号の説明】 1 可動側基板 2,5 電気配線 3 ICテスタ 4 固定側基板 6 プローブカード 7 ICチップ 8 ソケット 9 固定側端子 10,12 接触側端子 11 圧縮コイルばね[Explanation of symbols] 1 Movable side board 2,5 Electrical wiring 3 IC tester 4 Fixed side board 6 Probe card 7 IC chip 8 socket 9 Fixed side terminal 10, 12 Contact side terminal 11 Compression coil spring
Claims (1)
発力を持たせた接触側端子を、金属製の固定側端子内に
嵌挿し保持したことを特徴とするポゴピン。1. A pogo pin characterized in that a contact side terminal made of a spirally wound metal plate to provide a repulsive force in the direction of a center line is inserted into and held within a metal fixed side terminal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP500091U JPH04127581U (en) | 1991-02-08 | 1991-02-08 | pogo pin |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP500091U JPH04127581U (en) | 1991-02-08 | 1991-02-08 | pogo pin |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04127581U true JPH04127581U (en) | 1992-11-20 |
Family
ID=31898788
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP500091U Pending JPH04127581U (en) | 1991-02-08 | 1991-02-08 | pogo pin |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04127581U (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997039361A1 (en) * | 1996-04-12 | 1997-10-23 | Nhk Spring Co., Ltd. | Conductive contact unit system |
JP2001056345A (en) * | 1999-08-19 | 2001-02-27 | Tokyo Electron Ltd | Probing card and its manufacture |
WO2009014357A2 (en) * | 2007-07-25 | 2009-01-29 | Korea Institute Of Machinery & Materials | Concentric buckling based vertical probe and its fabrication method |
-
1991
- 1991-02-08 JP JP500091U patent/JPH04127581U/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997039361A1 (en) * | 1996-04-12 | 1997-10-23 | Nhk Spring Co., Ltd. | Conductive contact unit system |
JP2001056345A (en) * | 1999-08-19 | 2001-02-27 | Tokyo Electron Ltd | Probing card and its manufacture |
JP4514855B2 (en) * | 1999-08-19 | 2010-07-28 | 東京エレクトロン株式会社 | Probing card manufacturing method |
WO2009014357A2 (en) * | 2007-07-25 | 2009-01-29 | Korea Institute Of Machinery & Materials | Concentric buckling based vertical probe and its fabrication method |
WO2009014357A3 (en) * | 2007-07-25 | 2009-03-19 | Korea Mach & Materials Inst | Concentric buckling based vertical probe and its fabrication method |
KR100952195B1 (en) * | 2007-07-25 | 2010-04-15 | 한국기계연구원 | Concentric buckling-based vertical probe and its fabrication method |
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