JPH0412261A - Automatic calibrating device for gas analyzer - Google Patents
Automatic calibrating device for gas analyzerInfo
- Publication number
- JPH0412261A JPH0412261A JP2116581A JP11658190A JPH0412261A JP H0412261 A JPH0412261 A JP H0412261A JP 2116581 A JP2116581 A JP 2116581A JP 11658190 A JP11658190 A JP 11658190A JP H0412261 A JPH0412261 A JP H0412261A
- Authority
- JP
- Japan
- Prior art keywords
- calibration
- gas
- range
- concentration
- microcomputer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 abstract description 5
- 230000035945 sensitivity Effects 0.000 abstract description 2
- 230000006866 deterioration Effects 0.000 abstract 1
- 239000007789 gas Substances 0.000 description 39
- 238000004458 analytical method Methods 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
Description
【発明の詳細な説明】
［産業上の利用分野］
本発明はガス分析計の自動スパン校正を行うための自動
校正装置の改良に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an improvement in an automatic calibration device for performing automatic span calibration of a gas analyzer.
（従来の技術〕
一般に、ガス分析計などの各種分析計は検出部、増幅部
などの温度ドリフトあるいは経時変化によって生ずる誤
差を補正するために、測定を行うに際してはその測定作
業に先立って、分析計のゼロ調整およびスパン校正を行
う必要がある。而して、従来からのゼロ調整およびスパ
ン校正は次のような手段で行われていた。(Prior Art) In general, various types of analyzers such as gas analyzers perform analysis prior to measurement in order to correct errors caused by temperature drift or changes over time in the detection section, amplification section, etc. It is necessary to perform zero adjustment and span calibration of the meter.Conventionally, zero adjustment and span calibration have been performed by the following means.
即ち、先ず、分析計にゼロガスを導入し、そのときの分
析計における表示器の表示値がゼロとなるようにゼロ調
整を行う。次いで分析計に連設されたマイクロコンピュ
ータを含む自動校正装置に校正用ガス（所定の既知濃度
の測定対象ガス）の濃度設定を行うとともに分析計の校
正レンジを校正用ガス濃度に適したレンジに設定し、そ
の後校正用ガスを分析計に供給する。そして表示器に表
示されたガス濃度が自動校正装置に入力した校正用ガス
の既知濃度に対応する値となるように前記マイクロコン
ピュータにおいて演算処理され、自動的にスパン校正を
おこなっていた。That is, first, zero gas is introduced into the analyzer, and zero adjustment is performed so that the displayed value on the display in the analyzer at that time becomes zero. Next, the concentration of the calibration gas (the gas to be measured with a predetermined known concentration) is set in the automatic calibration device that includes a microcomputer connected to the analyzer, and the calibration range of the analyzer is set to a range suitable for the calibration gas concentration. and then supply the calibration gas to the analyzer. Then, the microcomputer performs arithmetic processing so that the gas concentration displayed on the display corresponds to the known concentration of the calibration gas input into the automatic calibration device, thereby automatically performing span calibration.
〔発明が解決しようとする課題］
ところで一般に、校正用ガスを供給するガスボンベは製
造上の問題から全く同一の濃度のものを製作することは
不可能であるため、ガスボンベを交換するごとに新しい
校正用ガスの濃度設定と分析計の校正レンジの設定をそ
れぞれ独立して行っていた。そのため校正レンジの設定
ミスによる校正精度の低下あるいは校正不能といった事
態が起こることがあった。[Problem to be Solved by the Invention] Generally speaking, it is impossible to manufacture gas cylinders that supply calibration gas with exactly the same concentration due to manufacturing problems, so a new calibration must be performed each time a gas cylinder is replaced. The concentration of the gas used for the test and the calibration range of the analyzer were set independently. As a result, a situation may occur in which calibration accuracy decreases or calibration becomes impossible due to a setting error in the calibration range.
本発明は、上述の事柄に留意してなされたもので、その
目的とするところは、簡単な操作によって確実にスパン
校正が行えるガス分析計の自動校正装置を提供すること
にある。The present invention has been made with the above-mentioned considerations in mind, and its purpose is to provide an automatic calibration device for a gas analyzer that can reliably calibrate spans with simple operations.
上述の目的を達成するため、本発明に係るガス分析計の
自動校正装置は、校正用ガスの濃度設定に連動して自動
的に校正時の最適レンジを選択するよう構成した点に特
徴がある。In order to achieve the above object, the automatic calibration device for a gas analyzer according to the present invention is characterized in that it is configured to automatically select the optimum range for calibration in conjunction with the concentration setting of the calibration gas. .
上記特徴構成によれば、自動校正装置に設定するのは校
正用ガス濃度のみでよく、分析計の校正レンジの設定の
必要がないため、校正レンジの設定ミスによる校正精度
の低下あるいは校正不能といった事態が無くなるため、
常に高精度な測定が可能となる。According to the above characteristic configuration, only the calibration gas concentration needs to be set in the automatic calibration device, and there is no need to set the calibration range of the analyzer. Because the situation disappears,
Highly accurate measurements are always possible.
〔実施例］ 以下、本発明の実施例を図面に基づいて説明する。〔Example] Embodiments of the present invention will be described below based on the drawings.
第１図は本発明の一実施例を示し、同図において、１は
校正用ガスＫを供給するためのガスボンベであり、３は
例えば赤外線ガス分析計（以下、分析計と云う）におけ
る分析部であって、校正用ガス供給路２を介して校正用
ガスＫが導入される。FIG. 1 shows an embodiment of the present invention, in which 1 is a gas cylinder for supplying calibration gas K, and 3 is an analysis section in, for example, an infrared gas analyzer (hereinafter referred to as an analyzer). A calibration gas K is introduced through the calibration gas supply path 2.
４はＲ１−Ｒ４等の抵抗を介して例えば５／１０／２０
１５０ ｐｐｍといった測定レンジを設けて、分析部３
に設けられた検出器（図示せず）からの信号量（即ち、
ガス濃度）に適したレンジを設定するための校正レンジ
設定部である。そしてここから出力される信号は自動校
正装置９に内蔵されるＡ／Ｄ変換器６を介してマイクロ
コンピュータ７に入力される。そしてこのマイクロコン
ピュータ７において演算処理を行いスパン校正が自動的
に行われる。そして本発明では校正用ガス濃度設定に連
動して自動的に校正時の最適レンジを選択する機能を備
えている。4 is, for example, 5/10/20 via resistors such as R1-R4.
A measurement range of 150 ppm is provided, and the analysis section 3
The amount of signal from a detector (not shown) provided at
This is a calibration range setting section for setting the range suitable for the gas concentration. The signal output from this is input to the microcomputer 7 via the A/D converter 6 built in the automatic calibration device 9. The microcomputer 7 then performs arithmetic processing to automatically perform span calibration. The present invention has a function of automatically selecting the optimum range for calibration in conjunction with the calibration gas concentration setting.
而して、上記構成による自動校正装置９の作用を説明す
ると、先ず、分析部３にゼロガス（窒素または精製空気
）を導入し、表示器１０の表示値がゼロとなるようにゼ
ロ点調整を行う。次いで、スパン校正を行うにあたり、
ガスボンベ１の校正用ガスにの濃度をキーボード８等に
よりマイクロコンピュータ７に入力する。この校正用ガ
スにの濃度をマイクロコンピュータ７で処理して校正レ
ンジ４の最適レンジを判断し、所定の信号を校正レンジ
設定部４に送信することにより、校正用ガス濃度に適し
たレンジを選択する。To explain the operation of the automatic calibration device 9 with the above configuration, first, zero gas (nitrogen or purified air) is introduced into the analysis section 3, and the zero point is adjusted so that the displayed value on the display 10 becomes zero. conduct. Next, when performing span calibration,
The concentration of the calibration gas in the gas cylinder 1 is input into the microcomputer 7 using the keyboard 8 or the like. The concentration of this calibration gas is processed by the microcomputer 7 to determine the optimum range for the calibration range 4, and a predetermined signal is sent to the calibration range setting section 4 to select a range suitable for the calibration gas concentration. do.
例えば、校正用ガス濃度が４ ｐｐｍであれば５ｐｐｍ
レンジを、また、校正用ガス濃度が１８ ｐｐｍであれ
ば２０ ｐｐｍレンジというように常に最大の感度でス
パン校正が行えるように自動的に選択されるのである。For example, if the calibration gas concentration is 4 ppm, it is 5 ppm.
If the calibration gas concentration is 18 ppm, the 20 ppm range is automatically selected so that span calibration can always be performed with maximum sensitivity.
次いで、ガスボンベ１から校正用ガスＫを分析部３に導
入することにより、表示器１０に表示される検出信号が
マイクロコンピュータ７に入力しておいた校正用ガスに
の濃度に対応する値となるようにマイクロコンピュータ
７において演算処理され、自動的にスパン校正をおこな
うのである。Next, by introducing the calibration gas K from the gas cylinder 1 into the analysis section 3, the detection signal displayed on the display 10 becomes a value corresponding to the concentration of the calibration gas input into the microcomputer 7. The microcomputer 7 performs arithmetic processing to automatically perform span calibration.
なお、上述したようにキーボード８により、マイクロコ
ンピュータ７に校正用ガスにの濃度設定を行う他に、ス
パン校正周期も入力できるようにし、ある一定周期で自
動的にスパン校正を行えるようにしてもよい。As mentioned above, in addition to setting the concentration of the calibration gas in the microcomputer 7 using the keyboard 8, it is also possible to input the span calibration period, so that the span calibration can be performed automatically at a certain period. good.
以上説明したように、本発明によれば、自動校正装置に
校正用ガス濃度のみを設定するだけで、分析計の校正レ
ンジの設定操作の必要がないため、校正レンジ・の設定
ミスによる校正精度の低下あるいは校正不能といった事
態が無くなり、常に高精度な測定が可能となる。As explained above, according to the present invention, only the calibration gas concentration is set in the automatic calibration device, and there is no need to set the calibration range of the analyzer. This eliminates situations such as a drop in performance or an inability to calibrate, making it possible to always perform highly accurate measurements.
【図面の簡単な説明】
第１図は本発明に係るガス分析計の自動校正装置の一実
施例を示す全体構成図である。
１・・・ガスボンベ、４・・・校正レンジ、９・・・自
動校正装置、Ｋ・・・校正用ガス。BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is an overall configuration diagram showing an embodiment of an automatic calibration device for a gas analyzer according to the present invention. 1... Gas cylinder, 4... Calibration range, 9... Automatic calibration device, K... Calibration gas.
Claims (1)
とにより前記ガス分析計の自動スパン校正を行うガス分
析計の自動校正装置において、前記校正用ガスの濃度設
定に連動して自動的に校正時の最適レンジを選択するよ
う構成してあるガス分析計の自動校正装置。In an automatic calibration device for a gas analyzer that performs automatic span calibration of the gas analyzer by supplying calibration gas from a gas cylinder to the gas analyzer, the automatic span calibration device automatically performs calibration in conjunction with the concentration setting of the calibration gas. An automatic calibration device for gas analyzers that is configured to select the optimum range for the gas analyzer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11658190A JP2689241B2 (en) | 1990-05-01 | 1990-05-01 | Automatic analyzer for gas analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11658190A JP2689241B2 (en) | 1990-05-01 | 1990-05-01 | Automatic analyzer for gas analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0412261A true JPH0412261A (en) | 1992-01-16 |
| JP2689241B2 JP2689241B2 (en) | 1997-12-10 |
Family
ID=14690672
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11658190A Expired - Fee Related JP2689241B2 (en) | 1990-05-01 | 1990-05-01 | Automatic analyzer for gas analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2689241B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0590077A1 (en) * | 1991-06-18 | 1994-04-06 | Futrex, Inc. | A method for providing general calibration for near infrared instruments for measurement of blood glucose |
| WO2008111548A1 (en) * | 2007-03-12 | 2008-09-18 | Sanyo Electric Co., Ltd. | Culture apparatus |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52106796A (en) * | 1976-03-03 | 1977-09-07 | Kett Electric Lab | Measuring apparatus for moisture contents |
| JPS531043A (en) * | 1976-06-25 | 1978-01-07 | Toshiba Corp | Automatic range setter of automatic exhausting gas analyzer |
| JPS586128A (en) * | 1981-07-03 | 1983-01-13 | Hitachi Ltd | Method and apparatus for correcting defect of photo-mask |
| JPS5992337A (en) * | 1982-11-18 | 1984-05-28 | Mitaka Kogyo Kk | Gas analyzer |
| JPS6140936A (en) * | 1984-07-31 | 1986-02-27 | 末松 大吉 | Block for culvert |
-
1990
- 1990-05-01 JP JP11658190A patent/JP2689241B2/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52106796A (en) * | 1976-03-03 | 1977-09-07 | Kett Electric Lab | Measuring apparatus for moisture contents |
| JPS531043A (en) * | 1976-06-25 | 1978-01-07 | Toshiba Corp | Automatic range setter of automatic exhausting gas analyzer |
| JPS586128A (en) * | 1981-07-03 | 1983-01-13 | Hitachi Ltd | Method and apparatus for correcting defect of photo-mask |
| JPS5992337A (en) * | 1982-11-18 | 1984-05-28 | Mitaka Kogyo Kk | Gas analyzer |
| JPS6140936A (en) * | 1984-07-31 | 1986-02-27 | 末松 大吉 | Block for culvert |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0590077A1 (en) * | 1991-06-18 | 1994-04-06 | Futrex, Inc. | A method for providing general calibration for near infrared instruments for measurement of blood glucose |
| EP0590077A4 (en) * | 1991-06-18 | 1994-10-26 | Futrex Inc | A method for providing general calibration for near infrared instruments for measurement of blood glucose. |
| WO2008111548A1 (en) * | 2007-03-12 | 2008-09-18 | Sanyo Electric Co., Ltd. | Culture apparatus |
| JP2008220235A (en) * | 2007-03-12 | 2008-09-25 | Sanyo Electric Co Ltd | Culture apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2689241B2 (en) | 1997-12-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4337517A (en) | Method of automatically calibrating a microprocessor controlled digital multimeter | |
| US5648605A (en) | Flowmeter calibration method | |
| US4596931A (en) | Method of eliminating measuring errors in photometric analysis | |
| EP0400342B1 (en) | Method of infra red analysis | |
| US5007283A (en) | Method and device for processing measured values | |
| WO2011132049A1 (en) | Method of and system for calibrating gas flow dilutors | |
| JPH0412261A (en) | Automatic calibrating device for gas analyzer | |
| US5065613A (en) | Method for the direct presentation of a differential measured quantity in terms of its correct physical unit | |
| JPH06281477A (en) | Continuous analysis device | |
| EP0261452A2 (en) | Gas analyzer | |
| JPH06281607A (en) | Continuously analyzing device for gas concentration | |
| JPH08122246A (en) | Spectral analyzer | |
| US20030041648A1 (en) | Process and device for measuring the concentrations of a plurality of gas components in a gas sample | |
| JPH02118442A (en) | Gas sensor device | |
| JPH06273364A (en) | Corrective operation method for gas measuring equipment | |
| KR960002279B1 (en) | Flow automatic inspecting method of mass flow controller | |
| JP2921923B2 (en) | Radiation detector sensitivity calibration device | |
| JPH0249459B2 (en) | KYUKOBUNSEKIKEI | |
| US6686578B2 (en) | Apparatus for sweep synchronization measurement of optical wavelength sensitivity characteristics and method of correcting optical wavelength sensitivity thereof | |
| JPS6336265Y2 (en) | ||
| SU693172A1 (en) | Method of continuously measuring the quantity of substance in moving paper web | |
| KR960002280B1 (en) | Response velocity inspecting method of mass flow controller | |
| SU536420A1 (en) | Method for changing measurement ranges of two-beam compensation analyzers | |
| JPS59178341A (en) | Infrared gas analyzer | |
| CN117214147A (en) | Enhanced Raman analysis using absolute Raman |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |