JPH04113608A - Multilayer ceramic capacitor, terminal electrode paste and formation of terminal electrode - Google Patents

Multilayer ceramic capacitor, terminal electrode paste and formation of terminal electrode

Info

Publication number
JPH04113608A
JPH04113608A JP23361190A JP23361190A JPH04113608A JP H04113608 A JPH04113608 A JP H04113608A JP 23361190 A JP23361190 A JP 23361190A JP 23361190 A JP23361190 A JP 23361190A JP H04113608 A JPH04113608 A JP H04113608A
Authority
JP
Japan
Prior art keywords
metal
phase
zinc
tin
lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP23361190A
Other languages
Japanese (ja)
Other versions
JP2825327B2 (en
Inventor
Yoichiro Yokoya
横谷 洋一郎
Hamae Ando
安藤 浜江
Koichi Kugimiya
公一 釘宮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP23361190A priority Critical patent/JP2825327B2/en
Publication of JPH04113608A publication Critical patent/JPH04113608A/en
Application granted granted Critical
Publication of JP2825327B2 publication Critical patent/JP2825327B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Ceramic Capacitors (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

PURPOSE:To make solderability good, to reduce a drop in solderability when the surface of an electrode is oxidized and to relax a thermal shock to an element at a soldering operation by a method wherein the cross section of a terminal electrode part is provided with the following: a substratum layer containing an inorganic frit; and an intermediate layer as well as a surface layer which are composed of the mixed texture phase of metal phases at a specific composition. CONSTITUTION:The cross section of a terminal electrode part for a multilayer ceramic capacitor is provided with the following: a substratum layer 12 which contains inorganic frits 18 bonded to a ceramic raw body partially; an intermediate layer 13 composed of a mixed phase 17 by a metal phase composed mainly of one kind selected from (a) silver as well as (b) lead, zinc and tin, by an intermetallic compound phase or by a solid solution alloy phase and by a nickel metal phase 16; and, in addition, a surface layer 14 in which the content of said (b) component as at least one kind selected from lead, tin and zinc is more than that of said intermediate layer as an average composition. As the composition ratio of metal components contained in an electrode paste, the total weight ratio of lead, zinc and tin components is at 0.5wt.% or higher and 45wt.% or lower and the weight ratio of a nickel component is at 3wt.% or higher and 25wt.% or lower.

Description

【発明の詳細な説明】 [産業上の利用分野コ 本発明は金属部に銀を主成分とする金属を用い内部電極
引出し端面に焼き付けられたセラミック積層コンデンサ
端子電極の構成とその製造時に用いる電極ペーストおよ
びかかる電子部品の端子電極の形成方法に関するもので
ある。
[Detailed Description of the Invention] [Industrial Field of Application] The present invention relates to the structure of a ceramic multilayer capacitor terminal electrode in which the metal part is made of a metal whose main component is silver and is baked on the internal electrode lead-out end face, and the electrode used in its manufacture. The present invention relates to a paste and a method for forming terminal electrodes of such electronic components.

特に半田付は性が良好で半田付は時に素子に対する熱衝
撃性の緩和効果に優れた端子電極部の構成とその安価で
簡便な電子部品の端子電極の形成方法、電極ペーストに
関する。
In particular, the present invention relates to a structure of a terminal electrode portion that has good soldering properties and is excellent in mitigating thermal shock to an element, an inexpensive and simple method for forming terminal electrodes for electronic components, and an electrode paste.

[従来の技術] 近年回路の小型化、高密度化の進展に伴い、これに用い
る電子部品を回路基板上に表面実装して用いることが一
般化しており、特に回路部品などでは表面実装部品が主
流となっている。
[Prior Art] In recent years, with the progress of miniaturization and higher density of circuits, it has become common to use surface-mounted electronic components on circuit boards. It has become mainstream.

このうち、固定抵抗素子や積層コンデンサ素子のような
電子部品では、端子電極部は焼結した金属粉末をガラス
質フリットで素子本体に固定した構成のメタルグレーズ
型の構成をとっている。この部分は直接回路基板の配線
金属上に半田付けされるため、半田との濡れ性がよく、
かつ半田フローの溶融半田によって端子電極部か溶かし
出されて無くなってしまういわゆる半田層われ現象が発
生しないような対策がとられている。
Among these, in electronic components such as fixed resistance elements and multilayer capacitor elements, the terminal electrode portion has a metal glaze type structure in which sintered metal powder is fixed to the element body with a glass frit. This part is soldered directly onto the wiring metal of the circuit board, so it has good wettability with solder.
In addition, measures are taken to prevent the so-called solder layer cracking phenomenon in which the terminal electrode portion is melted and lost by the molten solder of the solder flow.

通常このような素子の端子電極用の金属材料としては空
気中で焼成可能な銀電極が用いられてきたが上述の問題
点を解決するため銀とパラジウム合金をこれに用いる方
法や焼き付けた銅端子電極の外側にニッケル鍍金を施し
さらにその上に錫−鉛鍍金(半田鍍金)を施すなどの手
法などがとられていた。
Usually, silver electrodes that can be baked in air have been used as the metal material for the terminal electrodes of such elements, but in order to solve the above-mentioned problems, a method using a silver and palladium alloy and a method using baked copper terminals have been developed. Techniques such as applying nickel plating to the outside of the electrode and then applying tin-lead plating (solder plating) on top of that were used.

また素子と基板上の配線を半田付けする際、溶融した半
田に素子端子部が触れた場合、端子電極部と素子との温
度差による熱膨張の差により素子の一部に大きな引っ張
り応力が発生し素子に亀裂がはいる現象が発生すること
があった。このため必要に応じて半田付は時に予め素子
を余熱して急速な温度差の発生を防ぐなどの対策がとら
れていた。
Also, when soldering the device and the wiring on the board, if the device terminal comes into contact with molten solder, a large tensile stress will be generated in a part of the device due to the difference in thermal expansion caused by the temperature difference between the terminal electrode and the device. In some cases, cracks appeared in the element. For this reason, measures have been taken to prevent rapid temperature differences by preheating the elements before soldering, if necessary.

[発明が解決しようとする課題] 上述のように鍍金法による端子電極最外層への半田層の
形成は半田付は性を改善しかつ端子電極表面の酸化を防
止して半田付は性の低下を防止する方法であるが、工程
か増えるための煩雑さ、コスト増の他に、素子を鍍金液
中に入れる必要があり、鍍金液による素子の変質、特性
劣化を招くおそれがあった。また鍍金法は半田付は時の
熱による素子中への亀裂発生を防ぐ効果はなかった。
[Problems to be Solved by the Invention] As mentioned above, forming a solder layer on the outermost layer of a terminal electrode by a plating method improves solderability and prevents oxidation of the terminal electrode surface, thereby reducing solderability. However, in addition to increasing the complexity and cost due to the increased number of steps, it is necessary to place the element in the plating solution, which may cause deterioration of the element and characteristic deterioration due to the plating solution. Furthermore, the plating method was not effective in preventing cracks from forming in the element due to the heat generated during soldering.

本発明ではかかる課題に鑑み、銅金属を用いたメタルグ
レーズ型の端子電極を有する電子部品において、低コス
トでありかつ半田付は性が良好で電極表面の酸化による
半田付は性の低下の少なく半田付は時に素子に対する熱
衝撃性の緩和効果に優れた端子電極部の構成とその安価
で簡便な電子部品端子電極の形成方法ならびにこれらに
使用する電極ペーストを提供することを目的とするもの
である。
In view of these problems, the present invention provides an electronic component having a metal glaze type terminal electrode using copper metal, which is low in cost and has good solderability, and has little deterioration in solderability due to oxidation of the electrode surface. Soldering is sometimes used for the purpose of providing a structure of a terminal electrode part that has an excellent effect of mitigating thermal shock on an element, a method of forming an inexpensive and simple terminal electrode of an electronic component, and an electrode paste used for these. be.

[課題を解決するための手段] 本発明は、前記課題を解決するために次の構成を有する
ものである。
[Means for Solving the Problems] The present invention has the following configuration in order to solve the above problems.

(1)(イ)銀と、(ロ)鉛、亜鉛、錫から選ばれた少
なくとも1種と、(ハ)ニッケルと、(ニ)無機フリッ
トと、を含有する銀糸電極金属を内部電極引出し端面に
焼き付けて形成した端子電極を有するセラミック積層コ
ンデンサにおいて、端子電極部の断面が、 (A)部分的にセラミック素体に融着した無機フリット
を含む下地層、 (B)(a)銀と(b)鉛、亜鉛、錫から選ばれた少な
くとも1種 とを主成分とする金属相、金属間化合物相もしくは固溶
体合金相と、 (C)ニッケル金属相 とからなる混合組織相からなる中間層を有し、(C)さ
らに平均組成として前記中間層より鉛、錫、亜鉛から選
ばれた少なくとも1種である前記(b)成分の含有量が
多い表面層、 を有することを特徴とするセラミック積層コンデンサ。
(1) A silver thread electrode metal containing (a) silver, (b) at least one selected from lead, zinc, and tin, (c) nickel, and (d) inorganic frit is attached to the inner electrode lead-out end surface. In a ceramic multilayer capacitor having terminal electrodes formed by baking, the cross section of the terminal electrode portion consists of (A) an underlayer containing an inorganic frit partially fused to the ceramic body, (B) (a) silver and ( b) a metal phase, an intermetallic compound phase, or a solid solution alloy phase containing at least one selected from lead, zinc, and tin as a main component; and (C) a nickel metal phase. and (C) a surface layer having a higher average composition of at least one component selected from lead, tin, and zinc than the intermediate layer (b). capacitor.

(2)内部電極引出し端面に焼き付けて形成する、積層
コンデンサ端子電極用電極ペーストにおいて、 電極ペーストが (A)(a)銀を主成分とする金属粉と、(b)鉛、亜
鉛、錫から選ばれた少なくとも1種を主成分とする金属
粉、お よびこれらの金属間化合物、合金粉 からなる金属粉より選ばれた少なく とも1種の金属粉と、 (C)ニッケル金属粉、 もしくは (A′)銀と、鉛、錫、亜鉛から選ばれた少なくとも1
種との合金粉と、ニッケル金 属粉、 ならびに (B)無機フリット若しくは加熱時に反応して無機フリ
ットを形成する酸化物、水酸化物、金属塩ないしは金属
有機化合物成分、(C)有機バインダ、 (D)有機溶剤、 を含有することを特徴とする電極ペースト。
(2) In the electrode paste for multilayer capacitor terminal electrodes that is formed by baking on the end face of the internal electrode drawer, the electrode paste is made of (A) (a) metal powder whose main component is silver, and (b) lead, zinc, and tin. At least one metal powder selected from metal powders containing at least one selected metal powder as a main component, and metal powders consisting of intermetallic compounds and alloy powders thereof, (C) nickel metal powder, or (A') ) silver and at least one selected from lead, tin, and zinc
Alloy powder with seeds, nickel metal powder, (B) an inorganic frit or an oxide, hydroxide, metal salt, or metal organic compound component that reacts to form an inorganic frit during heating, (C) an organic binder, ( D) An electrode paste characterized by containing an organic solvent.

(3)電極ペースト中に含まれる金属成分の組成比にお
いて、鉛、亜鉛、錫成分の合計の重量比が0,5wt%
以上45 w t%以下でニッケル成分の重量比が3 
w t%以上25 w t%以下である前記2項に記載
の電極ペースト。
(3) In the composition ratio of metal components contained in the electrode paste, the total weight ratio of lead, zinc, and tin components is 0.5 wt%
45 wt% or less and the weight ratio of the nickel component is 3
The electrode paste according to item 2 above, which has a content of not less than wt% and not more than 25wt%.

(4)セラミック素体に直接焼き付けて形成する電子部
品用端子電極の形成方法において電極金属の出発原料と
して、 銀を主成分とする金属粉と、鉛、亜鉛、錫から選ばれた
少なくとも1種を主成分とする金属粉と、ニッケルを主
成分とする金属粉、 および/またはこれらの金属間化合物粉あるいはこれら
の合金粉からなる粉体、 を用い、焼付は処理時にこれらの金属粉、金属間化合物
粉あるいは合金粉の共融現象若しくは一部の溶融により
部分的に金属もしくは金属間化合物間で液相が形成され
る温度以上で処理することを特徴とする電子部品端子電
極の形成方法。
(4) In the method of forming terminal electrodes for electronic components by directly baking them onto a ceramic body, the starting materials for the electrode metal include metal powder containing silver as a main component and at least one element selected from lead, zinc, and tin. A metal powder mainly composed of nickel, a metal powder mainly composed of nickel, and/or a powder consisting of an intermetallic compound powder or an alloy powder of these are used. 1. A method for forming a terminal electrode for an electronic component, which process is performed at a temperature higher than a temperature at which a liquid phase is partially formed between metals or intermetallic compounds due to eutectic phenomenon or partial melting of intermetallic powder or alloy powder.

[作用コ 本発明の請求項1に記載のコンデンサにおいては、端子
電極部の表面層が鉛、錫、亜鉛からなる群の少なくとも
1成分を多く含む金属層からなることにより、鉛−錫合
金からなる半田溶融金属と端子電極部の濡れ性が向上し
、端子電極部の半田付は性の低下が防止される。
[Function] In the capacitor according to claim 1 of the present invention, the surface layer of the terminal electrode portion is made of a metal layer containing a large amount of at least one component of the group consisting of lead, tin, and zinc. This improves the wettability of the molten solder metal and the terminal electrode portion, and prevents deterioration in soldering properties of the terminal electrode portion.

中間相にニッケル金属を主成分とする金属相が存在する
ことにより半田付は中の半田食われ現象が防止される。
The existence of a metal phase mainly composed of nickel metal in the intermediate phase prevents the solder from being eaten away during soldering.

また銀と、鉛、亜鉛、錫から選ばれた少なくとも1種と
、を主成分とする金属相、金属間化合物相もしくは固溶
体合金相と、ニッケル金属相からなる混合組織相からな
る中間層を有することにより端子電極部の熱伝導度が低
下するため半田溶融金属に浸された際の素子のセラミッ
ク端子電極界面近傍の熱衝撃を緩和する働きがある。
It also has an intermediate layer consisting of a mixed texture phase consisting of a metallic phase, an intermetallic compound phase or a solid solution alloy phase, and a nickel metallic phase, the main components of which are silver and at least one selected from lead, zinc, and tin. As a result, the thermal conductivity of the terminal electrode portion decreases, which acts to alleviate thermal shock in the vicinity of the ceramic terminal electrode interface of the element when it is immersed in solder molten metal.

また請求項4に記載した端子電極の形成方法として、焼
付は処理時に金属粉、金属間化合物粉、合金粉による共
融現象若しくは一方の溶融により部分的に金属もしくは
金属間化合物の粉末間で液相が形成される温度以上で処
理を行うことにより、電極の焼付は過程で一部液相とな
る鉛、亜鉛、錫から選ばれた少なくとも1種を多く含む
成分が表面へ偏析されるため所期の電極構成を得ること
ができる。
In addition, as the method for forming a terminal electrode according to claim 4, baking is performed by a eutectic phenomenon caused by metal powder, intermetallic compound powder, or alloy powder during processing, or by melting one of the powders, whereby liquid is formed between the powders of the metal or intermetallic compound. By performing the treatment at a temperature higher than the temperature at which a phase is formed, the baking of the electrode may occur because components containing a large amount of at least one selected from lead, zinc, and tin, which partially become a liquid phase during the process, segregate to the surface. The initial electrode configuration can be obtained.

また請求項2に記載した如く、電極ペーストの出発原料
として銀を主成分とする金属粉、鉛、亜鉛、錫から選ば
れた少なくとも1種を主成分とする金属粉、およびこれ
らの少なくとも2種の金属間化合物、合金からなる金属
粉より選ばれた金属粉とニッケル粉の混合物、もしくは
これらの合金粉とニッケル金属粉の混合物を用いること
により、容易に中間相に半田食われを防止するニッケル
金属相が生成し、また電極の焼付は過程で鉛、錫、亜鉛
から選ばれて少なくとも1種の含有量の多い液相が生成
され、冷却過程で液相成分が表面へ偏析されるためより
所期の電極構成を得ることが容易で、鍍金などの特別の
工程を必要とせず、かつ安価な電極ペーストを提供でき
る。
Further, as described in claim 2, the starting material for the electrode paste is a metal powder containing silver as a main component, a metal powder containing at least one selected from lead, zinc, and tin as a main component, and at least two of these. By using a mixture of nickel powder and a metal powder selected from metal powders consisting of intermetallic compounds and alloys, or a mixture of these alloy powders and nickel metal powder, nickel can be easily prevented from being eaten by solder in the intermediate phase. A metallic phase is generated, and a liquid phase containing a large amount of at least one selected from lead, tin, and zinc is generated during the electrode baking process, and the liquid phase component is segregated to the surface during the cooling process. It is easy to obtain a desired electrode configuration, does not require special processes such as plating, and can provide an inexpensive electrode paste.

また請求項3に記載の組成範囲を採用することにより、
より半田付は性が改善され不良率が少なくまた半田食わ
れ現象の改良された電極ペーストを提供し得る。
Furthermore, by adopting the composition range according to claim 3,
It is possible to provide an electrode paste with improved soldering properties, a lower defect rate, and an improved solder erosion phenomenon.

[実施例] 以下、本発明の実施例について説明する。[Example] Examples of the present invention will be described below.

なお、無機フリットとしては特に制限するものではない
が、亜鉛ホウ珪酸ガラスフリットが最も代表的なもので
ある。また、加熱時に反応して無機フリットを形成する
酸化物としては例えば酸化亜鉛、酸化ホウ素、酸化ケイ
素などが挙げられ1、水酸化物としては例えばZn(O
H)2など、金属塩としては無機フリットに用いられて
いる金属成分の蓚酸塩や硝酸塩が、金属有機化合物とし
てはこれら金属のアルコラードなどが代表的な例である
Incidentally, the inorganic frit is not particularly limited, but zinc borosilicate glass frit is the most typical one. In addition, examples of oxides that react to form an inorganic frit during heating include zinc oxide, boron oxide, and silicon oxide1, and examples of hydroxides include, for example, Zn(O
Representative examples of metal salts such as H)2 include oxalates and nitrates of metal components used in inorganic frits, and representative examples of metal organic compounds include alcoholades of these metals.

また電極ペーストに用いられる有機バインダとしては通
常アクリル系樹脂やポリビニルブチラール系の樹脂など
が例示されるが、特にこれに限定されるものではなく、
電極ペーストにおいて使用されている各種の有機バイン
ダが使用できる。有機溶剤としては、αターピネオール
、カルピトールアセテート、酢酸ブチルなどを適宜組合
せて用いるか、特にこれに限定されるものではなく、電
極ペーストにおいて使用されている各種の有機溶剤が使
用できる。
In addition, examples of organic binders used in electrode pastes include acrylic resins and polyvinyl butyral resins, but are not particularly limited to these.
Various organic binders used in electrode pastes can be used. As the organic solvent, α-terpineol, carpitol acetate, butyl acetate, etc. may be used in a suitable combination, or various organic solvents used in electrode pastes may be used, without being particularly limited thereto.

以下、図面を参照しながら本発明の実施例について詳細
に説明する。
Embodiments of the present invention will be described in detail below with reference to the drawings.

素子としてチタン酸バリウム系誘電体とパラジウム内部
電極を用いたセラミック積層コンデンサ素子について検
討した。素子は厚さ20μmの誘電体層1が厚さ2.1
μmのパラジウム内部電極層5を介して積層され上下に
無効層60μmが積層された構造で外形3. 2mmX
 1. 6mmX 0. 7mmの素子を用いた。
A ceramic multilayer capacitor element using a barium titanate dielectric and palladium internal electrodes was investigated. The device has a dielectric layer 1 with a thickness of 20 μm and a thickness of 2.1 μm.
It has a structure in which the palladium internal electrode layer 5 is laminated with a palladium internal electrode layer 5 of 60 μm in thickness, and an invalid layer of 60 μm is laminated above and below. 2mmX
1. 6mmX 0. A 7 mm element was used.

端子電極の出発原料としては粒径が1.5μm程度の金
属銀、金属鉛、金属錫、金属亜鉛粉末と粒径が12μm
程度のニッケル金属粉末用い所定比に混合し、平均粒径
1.8μmの亜鉛ホウ珪酸ガラスフリットを金属重量に
対し4wt%混合した粉末を用い、これに平均分子量3
000のアクリル樹脂を粉末重量に対し5wt%、αタ
ーピネオール、カルピトールアセテート混合溶媒(64
)を粉末重量に対し30 w t%加え、乳鉢で混合し
たのち3本ロールを用い混練しさらに溶剤量を調整して
20°Cの粘度8000センチポイズの電極ペーストを
作成した。
Starting materials for terminal electrodes include metallic silver, metallic lead, metallic tin, and metallic zinc powder with a particle size of about 1.5 μm and a particle size of 12 μm.
A powder containing zinc borosilicate glass frit with an average particle size of 1.8 μm and 4 wt% of the metal weight was used, and this was mixed with nickel metal powder of
000 acrylic resin at 5 wt% based on the powder weight, α-terpineol, carpitol acetate mixed solvent (64
) was added in an amount of 30 wt % based on the powder weight, mixed in a mortar and kneaded using three rolls, and the amount of solvent was adjusted to prepare an electrode paste with a viscosity of 8000 centipoise at 20°C.

電極ペーストは素子の両端にデイツプ法により塗布し、
空気中80℃で乾燥後、電気炉中で28000まで5時
間かけて昇温したのち650−800℃まで30分かけ
て昇温し、5分保持したのち室温まで30分かけて降温
した。
Electrode paste is applied to both ends of the element using the dip method.
After drying in air at 80°C, the temperature was raised to 28,000°C over 5 hours in an electric furnace, then to 650-800°C over 30 minutes, held for 5 minutes, and then lowered to room temperature over 30 minutes.

作成したコンデンサの端子電極部断面をX線マイクロア
ナライザ、X線微小回折計を用いて電極金属の分布を評
価したものの模式図を第1図に示す。電極部の最も素子
に近い部分は部分的に誘電体層11に融着した無機フリ
ット18を含む下地層12、からなり、パラジウム内部
電極層15と電気的に接合されている。次に銀金属相、
鉛金属相、錫金属相、亜鉛金属相およびその金属間化合
物相、合金相の混合組織相17中に12μm程度のニッ
ケル金属相16が一部表面酸化層とともに分散している
中間層13が存在する。鉛、錫、亜鉛の合計含有量が1
,5wt%以下の試料では銀に鉛、錫、亜鉛かわずかに
固溶した金属相中にニッケル金属相が一部表面酸化相と
ともに分散した相として中間層13は確認される。中間
層13はいずれにおいても厚み700μm程度であった
FIG. 1 shows a schematic diagram of the cross-section of the terminal electrode portion of the produced capacitor, in which the distribution of electrode metal was evaluated using an X-ray microanalyzer and an X-ray microdiffractometer. The portion of the electrode portion closest to the element is comprised of a base layer 12 including an inorganic frit 18 partially fused to a dielectric layer 11 and electrically connected to a palladium internal electrode layer 15 . Next, the silver metal phase,
There is an intermediate layer 13 in which a nickel metal phase 16 of about 12 μm is partially dispersed together with a surface oxide layer in a mixed structure phase 17 of a lead metal phase, a tin metal phase, a zinc metal phase, their intermetallic compound phase, and an alloy phase. do. The total content of lead, tin, and zinc is 1
, 5 wt% or less, the intermediate layer 13 is confirmed as a phase in which a nickel metal phase is partially dispersed together with a surface oxidation phase in a metal phase in which lead, tin, or zinc is slightly dissolved in silver. The thickness of the intermediate layer 13 was approximately 700 μm in all cases.

次に鉛、錫、亜鉛成分の含有量が中間層の平均組成より
大きい表面層14が存在する。表面層の厚さは0.5−
60μm程度であった。鉛、錫、亜鉛の少なくとも1種
を含まない試料では表面層が殆ど認められない。
Next, there is a surface layer 14 in which the content of lead, tin, and zinc components is higher than the average composition of the intermediate layer. The thickness of the surface layer is 0.5-
It was about 60 μm. Almost no surface layer is observed in samples that do not contain at least one of lead, tin, and zinc.

端子電極が形成されたコンデンサは銅配線を施したガラ
スエポキシ基板に有機接着剤で仮どめした後、230°
Cでリフロ半田づけを実施し、50試料中の半田付は不
良発生数を求めた。半田付は不良はりフロー半田付は後
、目視法で半田付は部を観察し端子電極表面に明らかに
半田の付着していない部分が認められるものを不良A1
端子電極が無くなってしまっているものを不良Bとした
The capacitor with terminal electrodes formed is temporarily fixed to a glass epoxy substrate with copper wiring using an organic adhesive, and then heated at 230°.
Reflow soldering was performed using C, and the number of soldering defects among 50 samples was determined. The soldering is defective. After flow soldering, the soldered area is visually inspected, and if there is clearly a part where no solder adheres to the terminal electrode surface, it is judged as defective A1.
Those in which the terminal electrodes were missing were classified as defective B.

第1表に端子電極の金属粉混合組成率と不良数を示す。Table 1 shows the metal powder mixed composition ratio and the number of defects in the terminal electrode.

また従来法との比較のためNo、  1の試料を端子電
極表面にニッケル電解メツキをバレル鍍金法によりほど
こしたのちアルカノールスルホン酸を主成分とする半田
鍍金液(pH:1.0)中でバレル鍍金法により半田鍍
金層を形成した。作成したコンデンサとNo、7.17
.25のコンデンサは、350℃の半田漕のなかに余熱
処理なしでデイツプしたのち両端子電極を含む中心線ま
で研磨し、端子電極の素子側面端部付近の亀裂の有無を
調べ各50試料中の亀裂不良発生数を求めた。第2表に
亀裂不良発生数(50ケ当り)を示す。
In addition, for comparison with the conventional method, samples No. 1 were subjected to nickel electrolytic plating on the surface of the terminal electrode by barrel plating method, and then barrel-plated in a solder plating solution (pH: 1.0) containing alkanolsulfonic acid as the main component. A solder plating layer was formed by a plating method. Created capacitor and No. 7.17
.. No. 25 capacitors were placed in a soldering bath at 350°C without any preheating treatment, and then polished to the center line including both terminal electrodes. The number of crack defects was calculated. Table 2 shows the number of crack defects (per 50 pieces).

第 表 第 表 (つづき) 第 表 (つづき) 第 表 (つづき) 第 表 (つづき) 第 表 (つづき) 注) *印は本発明の範囲外の比較例 **印は本発明の範囲内であるが請求項3の範囲よりは
ずれる実施例 第 表 注)*印は本発明の範囲外の比較例 第1表より明らかなように請求項1に記載した構成をと
り、あるいは請求項2に記載した電極ペーストを用い、
請求項4に記載した電極形成方法をとるものは、銀電極
単体のものに比べ、半田付は性と半田食われ現象の改善
に効果がある。また電極ペースト中の鉛、錫、亜鉛の含
有量は請求項3に記載した範囲がより好ましく、この範
囲のペーストを用いると、半田付は性の改善効果も良好
で、また、電極金属の溶融量が太き(なり端子電極部と
素子本体の接着性が低下したり、半田付は時にその部分
が剥離して不良数が増大する率が極めて少なくなる。ニ
ッケルの含有量も請求項3に記載の範囲がより好ましく
、半田付は性の改善効果をあまり低下させずに半田食わ
れ現象のより良好な改善効果が達成できる。
Table (Continued) Table (Continued) Table (Continued) Table (Continued) Table (Continued) Note: * indicates comparative example outside the scope of the present invention ** indicates comparative example within the scope of the present invention Examples in Table 1 Note: Comparative Examples outside the scope of Claim 3 Note: The * mark indicates an example having the structure described in Claim 1, as is clear from Table 1 of Comparative Examples outside the scope of the present invention, or as described in Claim 2. Using the electrode paste,
The electrode forming method described in claim 4 is more effective in improving soldering properties and the solder erosion phenomenon than in the case of a single silver electrode. Further, the content of lead, tin, and zinc in the electrode paste is more preferably in the range described in claim 3. When a paste in this range is used, the soldering properties are improved and the melting of the electrode metal is improved. If the amount of nickel is thick (the adhesiveness between the terminal electrode part and the element body will deteriorate, and the soldering part will sometimes peel off, the rate of increase in the number of defects will be extremely reduced.) The content of nickel is also in claim 3. The described range is more preferable, and soldering can achieve a better effect of improving the solder erosion phenomenon without significantly reducing the effect of improving the properties.

また第2表より明らかなように請求項1に記載した構成
とくに金属銀と金属鉛、金属錫、金属亜鉛の少なくとも
1種、より好ましくは少なくとも2種と、金属ニッケル
およびそれらの金属間化合物相、合金相が混合組織相を
形成した中間層の存在するNo、  7.17.25の
試料は熱衝撃による亀裂不良が発生しにくいのに対し、
No、  1のように中間相が銅金属単相よりなるもの
は亀裂不良が発生しやすい。このことは、請求項1に記
載した端子電極部の構成において、従来例との相違点で
ある金属銀と金属鉛、金属錫、金属亜鉛の少な(とも1
種と、金属ニッケル、およびそれらの金属間化合物相、
合金相よる混合組織相よりなる中間相が素子に対する耐
熱衝撃性の向上に効果があることを示している。
Further, as is clear from Table 2, the composition described in claim 1 is particularly composed of at least one, more preferably at least two of metal silver, metal lead, metal tin, and metal zinc, and metal nickel and an intermetallic compound phase thereof. , sample No. 7.17.25, which has an intermediate layer in which the alloy phase forms a mixed texture phase, is less likely to crack due to thermal shock.
In cases where the intermediate phase is a single copper metal phase, such as No. 1, cracks are likely to occur. This means that in the configuration of the terminal electrode section according to claim 1, the difference from the conventional example is that the amount of metal silver, metal lead, metal tin, and metal zinc is small (both 1 and 1).
species, metallic nickel, and their intermetallic phases,
This shows that the intermediate phase consisting of a mixed structure phase formed by an alloy phase is effective in improving the thermal shock resistance of the device.

[発明の効果コ 本発明では、銀電極金属を用いた端子電極を有する電子
部品において、低コストでありかつ半田付は性が良好で
端子電極表面の酸化による半田付は性の低下が少なく、
半田付は時に素子に対する熱衝撃性の緩和効果に優れた
端子電極部の構成とその安価で簡便な端子電極の形成方
法ならびにこれらに用いられる電極ペーストが提供でき
る。
[Effects of the Invention] According to the present invention, an electronic component having a terminal electrode using a silver electrode metal is low in cost and has good soldering properties, and there is little deterioration in soldering properties due to oxidation of the terminal electrode surface.
Soldering can sometimes provide a configuration of a terminal electrode portion that has an excellent effect of alleviating thermal shock to the device, an inexpensive and simple method for forming the terminal electrode, and an electrode paste used therefor.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施形態である、セラミック積層コ
ンデンサ素子の端子電極部の断面の模式11・・・誘電
体層、12・・・無機フリットを含む下地層、13・・
・中間層、14・・・表面層、15・・・パラジウム内
部電極層、16・・・ニッケル金属相、17・・・混合
組織相、18・・・無機フリット。
FIG. 1 is a schematic cross-sectional view of a terminal electrode portion of a ceramic multilayer capacitor element according to an embodiment of the present invention.
- Intermediate layer, 14... Surface layer, 15... Palladium internal electrode layer, 16... Nickel metal phase, 17... Mixed texture phase, 18... Inorganic frit.

Claims (4)

【特許請求の範囲】[Claims] (1)(イ)銀と、(ロ)鉛、亜鉛、錫から選ばれた少
なくとも1種と、(ハ)ニッケルと、(ニ)無機フリッ
トと、を含有する銀系電極金属を内部電極引出し端面に
焼き付けて形成した端子電極を有するセラミック積層コ
ンデンサにおいて、端子電極部の断面が、 (A)部分的にセラミック素体に融着した無機フリット
を含む下地層、 (B)(a)銀と(b)鉛、亜鉛、錫から選ばれた少な
くとも1種、 とを主成分とする金属相、金属間化合物 相もしくは固溶体合金相と、 (c)ニッケル金属相、 とからなる混合組織相からなる中間層を有し、(C)さ
らに平均組成として前記中間層より鉛、錫、亜鉛から選
ばれた少なくとも1種である前記(b)成分の含有量が
多い表面層、 を有することを特徴とするセラミック積層コンデンサ。
(1) A silver-based electrode metal containing (a) silver, (b) at least one selected from lead, zinc, and tin, (c) nickel, and (d) inorganic frit is drawn out as an internal electrode. In a ceramic multilayer capacitor having terminal electrodes formed by baking on the end face, the cross section of the terminal electrode portion consists of (A) an underlayer containing an inorganic frit partially fused to the ceramic body, (B) (a) silver and (b) a metal phase, an intermetallic compound phase, or a solid solution alloy phase whose main component is at least one selected from lead, zinc, and tin; and (c) a nickel metal phase. It has an intermediate layer, and (C) a surface layer having a higher average composition of the component (b), which is at least one selected from lead, tin, and zinc, than the intermediate layer. Ceramic multilayer capacitor.
(2)内部電極引出し端面に焼き付けて形成する、積層
コンデンサ端子電極用電極ペーストにおいて、 電極ペーストが (A)(a)銀を主成分とする金属粉と、 (b)鉛、亜鉛、錫から選ばれた少なく とも1種を主成分とする金属粉、お よびこれらの金属間化合物、合金粉 からなる金属粉より選ばれた少なく とも1種の金属粉と (c)ニッケル金属粉、 もしくは (A′)銀と、鉛、錫、亜鉛から選ばれた少なくとも1
種との合金粉と、ニッケル金 属粉、 ならびに (B)無機フリット若しくは加熱時に反応して無機フリ
ットを形成する酸化物、水酸化 物、金属塩ないしは金属有機化合物成分、 (C)有機バインダ、 (D)有機溶剤、 を含有することを特徴とする電極ペースト。
(2) In the electrode paste for multilayer capacitor terminal electrodes that is formed by baking on the end face of the internal electrode drawer, the electrode paste is made of (A) (a) metal powder whose main component is silver, and (b) lead, zinc, and tin. At least one metal powder selected from metal powders containing at least one selected metal powder as a main component, and metal powders consisting of intermetallic compounds and alloy powders thereof, and (c) nickel metal powder, or (A') silver and at least one selected from lead, tin, and zinc
Alloy powder with seeds, nickel metal powder, (B) an inorganic frit or an oxide, hydroxide, metal salt, or metal organic compound component that reacts to form an inorganic frit during heating, (C) an organic binder, ( D) An electrode paste characterized by containing an organic solvent.
(3)電極ペースト中に含まれる金属成分の組成比にお
いて、鉛、亜鉛、錫成分の合計の重量比が0.5wt%
以上45wt%以下でニッケル成分の重量比が3wt%
以上25wt%以下である請求項2に記載の電極ペース
ト。
(3) In the composition ratio of metal components contained in the electrode paste, the total weight ratio of lead, zinc, and tin components is 0.5 wt%
The weight ratio of nickel component is 3wt% or more and 45wt% or less
The electrode paste according to claim 2, wherein the content is 25 wt% or less.
(4)セラミック素体に直接焼き付けて形成する電子部
品用端子電極の形成方法において電極金属の出発原料と
して、 銀を主成分とする金属粉と、鉛、亜鉛、錫から選ばれた
少なくとも1種を主成分とする金属粉と、ニッケルを主
成分とする金属粉、 および/またはこれらの金属間化合物粉あるいはこれら
の合金粉からなる粉体、 を用い、焼付け処理時にこれらの金属粉、金属間化合物
粉あるいは合金粉の共融現象若しくは一部の溶融により
部分的に金属もしくは金属間化合物間で液相が形成され
る温度以上で処理することを特徴とする電子部品端子電
極の形成方法。
(4) In the method of forming terminal electrodes for electronic components by directly baking them onto a ceramic body, the starting materials for the electrode metal include metal powder containing silver as a main component and at least one element selected from lead, zinc, and tin. A metal powder mainly composed of nickel, a metal powder mainly composed of nickel, and/or a powder consisting of an intermetallic compound powder or an alloy powder of these are used, and during the baking process, these metal powders and intermetallic 1. A method for forming a terminal electrode for an electronic component, which process is carried out at a temperature higher than that at which a liquid phase is partially formed between metals or intermetallic compounds due to eutectic phenomenon or partial melting of compound powder or alloy powder.
JP23361190A 1990-09-03 1990-09-03 Ceramic multilayer capacitor, terminal electrode paste and method of forming terminal electrode Expired - Fee Related JP2825327B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23361190A JP2825327B2 (en) 1990-09-03 1990-09-03 Ceramic multilayer capacitor, terminal electrode paste and method of forming terminal electrode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23361190A JP2825327B2 (en) 1990-09-03 1990-09-03 Ceramic multilayer capacitor, terminal electrode paste and method of forming terminal electrode

Publications (2)

Publication Number Publication Date
JPH04113608A true JPH04113608A (en) 1992-04-15
JP2825327B2 JP2825327B2 (en) 1998-11-18

Family

ID=16957761

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23361190A Expired - Fee Related JP2825327B2 (en) 1990-09-03 1990-09-03 Ceramic multilayer capacitor, terminal electrode paste and method of forming terminal electrode

Country Status (1)

Country Link
JP (1) JP2825327B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003282332A (en) * 2002-03-25 2003-10-03 Murata Mfg Co Ltd Ceramic electronic component and method of manufacturing the ceramic electronic component

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003282332A (en) * 2002-03-25 2003-10-03 Murata Mfg Co Ltd Ceramic electronic component and method of manufacturing the ceramic electronic component

Also Published As

Publication number Publication date
JP2825327B2 (en) 1998-11-18

Similar Documents

Publication Publication Date Title
US7285232B2 (en) Conductive paste and ceramic electronic component
EP0412259B1 (en) Electronic devices, method for forming end terminations thereof and paste material for forming same
JPH04169002A (en) Conductive paste and manufacture of multilayer ceramic wiring substrate using it
JP2658509B2 (en) Method of forming electronic component, electrode paste and terminal electrode
JP2005085495A (en) Conductive paste and ceramic electronic component
JPH037130B2 (en)
JP2973558B2 (en) Conductive paste for chip-type electronic components
JP4081865B2 (en) Method for producing conductor composition
JPH08330173A (en) Multilayer ceramic capacitor and its manufacture
JPH04113608A (en) Multilayer ceramic capacitor, terminal electrode paste and formation of terminal electrode
JP3798979B2 (en) Conductive paste and use thereof
JP2996016B2 (en) External electrodes for chip-type electronic components
JPS6127003A (en) Conductive paste composition
JP2631010B2 (en) Thick film copper paste
JP3293440B2 (en) Multilayer ceramic electronic component and method of manufacturing the same
JP6260169B2 (en) Ceramic electronic components
JPH0878279A (en) Formation of outer electrode on electronic chip device
JPH0440803B2 (en)
JPH0349108A (en) Copper conductor composition material
JP2996015B2 (en) External electrodes for chip-type electronic components
JPS63283184A (en) Circuit substrate covered with conductor composition
JP3760359B2 (en) Conductive composition for semiconductor ceramic capacitor and semiconductor ceramic capacitor
JP2000260654A (en) Ultra-small chip type electronic component
JPH06302927A (en) Ceramic wiring board, its manufacture and electrode paste
JPH06349316A (en) Conductive paste

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees