JPH04109542A - High frequency induction coupled plasma mass spectrometer - Google Patents
High frequency induction coupled plasma mass spectrometerInfo
- Publication number
- JPH04109542A JPH04109542A JP2227109A JP22710990A JPH04109542A JP H04109542 A JPH04109542 A JP H04109542A JP 2227109 A JP2227109 A JP 2227109A JP 22710990 A JP22710990 A JP 22710990A JP H04109542 A JPH04109542 A JP H04109542A
- Authority
- JP
- Japan
- Prior art keywords
- flow rate
- gas flow
- mass spectrometer
- coupled plasma
- sensitivity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000006698 induction Effects 0.000 title abstract 2
- 230000035945 sensitivity Effects 0.000 claims abstract 8
- 238000004458 analytical method Methods 0.000 claims abstract 4
- 150000002500 ions Chemical class 0.000 claims description 5
- 238000009616 inductively coupled plasma Methods 0.000 claims description 4
- 238000001095 inductively coupled plasma mass spectrometry Methods 0.000 abstract description 5
- 230000008016 vaporization Effects 0.000 abstract description 2
- 238000009834 vaporization Methods 0.000 abstract description 2
- 239000007789 gas Substances 0.000 abstract 4
- 238000001514 detection method Methods 0.000 abstract 2
- XMPZLAQHPIBDSO-UHFFFAOYSA-N argon dimer Chemical compound [Ar].[Ar] XMPZLAQHPIBDSO-UHFFFAOYSA-N 0.000 abstract 1
- NYPJDWWKZLNGGM-RPWUZVMVSA-N esfenvalerate Chemical group C=1C([C@@H](C#N)OC(=O)[C@@H](C(C)C)C=2C=CC(Cl)=CC=2)=CC=CC=1OC1=CC=CC=C1 NYPJDWWKZLNGGM-RPWUZVMVSA-N 0.000 abstract 1
- 238000002474 experimental method Methods 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
Description
【発明の詳細な説明】
〈産業上の利用分野〉
本発明は、高周波誘導結合プラズマ質量分析計(以下、
ICP−MSと略す)に関し、更に詳しくは、加熱気化
導入装置で試料を気化させるときに最大信号が得られる
ようにしたICP−MSに関する。[Detailed Description of the Invention] <Industrial Application Field> The present invention is directed to a high frequency inductively coupled plasma mass spectrometer (hereinafter referred to as
The present invention relates to ICP-MS (abbreviated as ICP-MS), and more specifically relates to ICP-MS in which the maximum signal is obtained when a sample is vaporized with a heating vaporization introduction device.
〈従来の技術〉
ICP−MSは高性能元素分析装置として広く知られて
おり、高周波誘導結合プラズマを用いて試料を励起させ
、生じたイオンをノズルとスキマからなるインターフェ
イスを介して質量分析計に導いて電気的に検出し該イオ
ン量を精密に測定することにより、試料中の被測定元素
を高精度に分析するように構成されている。<Conventional technology> ICP-MS is widely known as a high-performance elemental analyzer, and uses high-frequency inductively coupled plasma to excite a sample, and the generated ions are sent to a mass spectrometer through an interface consisting of a nozzle and a gap. The device is configured to analyze the element to be measured in the sample with high precision by electrically detecting the ions and precisely measuring the amount of the ions.
Claims (1)
たイオンをノズルとスキマーからなるインターフェイス
を介して質量分析計に導いて電気的に検出し該イオン量
を精密に測定することにより、試料中の被測定元素を高
精度に分析する高周波誘導結合プラズマ質量分析計にお
いて、分析時のガス流量を感度調整時のガス流量よりも
一定値αだけ小とするコントローラを設けたことを特徴
とする高周波誘導結合プラズマ質量分析計。The sample is excited using high-frequency inductively coupled plasma, and the generated ions are guided to a mass spectrometer through an interface consisting of a nozzle and skimmer, where they are electrically detected and the amount of ions precisely measured. A high-frequency inductively coupled plasma mass spectrometer that analyzes elements to be measured with high precision, characterized by being equipped with a controller that makes the gas flow rate during analysis smaller by a fixed value α than the gas flow rate during sensitivity adjustment. Coupled plasma mass spectrometer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2227109A JPH04109542A (en) | 1990-08-29 | 1990-08-29 | High frequency induction coupled plasma mass spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2227109A JPH04109542A (en) | 1990-08-29 | 1990-08-29 | High frequency induction coupled plasma mass spectrometer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04109542A true JPH04109542A (en) | 1992-04-10 |
Family
ID=16855621
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2227109A Pending JPH04109542A (en) | 1990-08-29 | 1990-08-29 | High frequency induction coupled plasma mass spectrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04109542A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2537914A (en) * | 2015-04-30 | 2016-11-02 | Thermo Fisher Scient (Bremen) Gmbh | Flow reduction system for isotope ratio measurements |
-
1990
- 1990-08-29 JP JP2227109A patent/JPH04109542A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2537914A (en) * | 2015-04-30 | 2016-11-02 | Thermo Fisher Scient (Bremen) Gmbh | Flow reduction system for isotope ratio measurements |
JP2016212101A (en) * | 2015-04-30 | 2016-12-15 | サーモ フィッシャー サイエンティフィック (ブレーメン) ゲーエムベーハー | Flow reduction system for isotope ratio measurement |
GB2537914B (en) * | 2015-04-30 | 2019-03-20 | Thermo Fisher Scient Bremen Gmbh | Flow reduction system for isotope ratio measurements |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Jin et al. | A microwave plasma torch assembly for atomic emission spectrometry | |
Purves et al. | Investigation of bovine ubiquitin conformers separated by high-field asymmetric waveform ion mobility spectrometry: cross section measurements using energy-loss experiments with a triple quadrupole mass spectrometer | |
JP2922647B2 (en) | Interference reduction in plasma source mass spectrometers | |
Tangen et al. | Capillary electrophoresis–inductively coupled plasma mass spectrometry interface with minimised dead volume for high separation efficiency | |
JPH04109542A (en) | High frequency induction coupled plasma mass spectrometer | |
US4171341A (en) | Solid state sensor | |
JPS60228949A (en) | Method and device for detecting reducing gas in mixed gas tobe detected | |
ATE108277T1 (en) | APPARATUS FOR DETECTING PARTICLES IN LIQUID METALS. | |
Ye et al. | Flow-injection on-line column preconcentration for low powered microwave plasma torch atomic emission spectrometry | |
JPS5459972A (en) | Alternating current type surface electrometer | |
Duan et al. | Comparative studies of surfatron and microwave plasma torch sources for determination of mercury by atomic emission spectrometry | |
JP2859308B2 (en) | How to measure plasma parameters | |
JPH07325020A (en) | Sample introducing apparatus for ion analytical instrument | |
Albers et al. | Direct atomic emission determination of some trace metals in solid powder samples with a magnetically tailored capacitive discharge plasma | |
JPH08115702A (en) | Nozzle and skimmer for high frequency inductive coupling plasma mass spectrograph | |
JP2000057990A5 (en) | ||
JP2002257787A (en) | Quantitative determination method for trace boron | |
JPH03100353U (en) | ||
JPH0736324B2 (en) | High frequency inductively coupled plasma / mass spectrometer | |
JPH0241592Y2 (en) | ||
JPH0542613Y2 (en) | ||
JPH02300670A (en) | Inductance measuring instrument | |
RU2205394C2 (en) | Method of analysis of organic compounds and facility for its realization | |
JP2914389B2 (en) | Ultra-trace oxygen / hydrogen analyzer | |
Jin et al. | Some observations on the development of a gas chromatographic microwave plasma ionization detector |