JPH0399460A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPH0399460A JPH0399460A JP23627189A JP23627189A JPH0399460A JP H0399460 A JPH0399460 A JP H0399460A JP 23627189 A JP23627189 A JP 23627189A JP 23627189 A JP23627189 A JP 23627189A JP H0399460 A JPH0399460 A JP H0399460A
- Authority
- JP
- Japan
- Prior art keywords
- electric circuit
- film
- semiconductor device
- insulating film
- conductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 35
- 239000004020 conductor Substances 0.000 claims abstract description 38
- 239000000758 substrate Substances 0.000 claims abstract description 21
- 238000002955 isolation Methods 0.000 claims description 3
- 238000000926 separation method Methods 0.000 claims description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 abstract description 3
- 238000000034 method Methods 0.000 abstract description 3
- 238000009413 insulation Methods 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 208000011580 syndromic disease Diseases 0.000 description 1
Landscapes
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
この発明は半導体装置に関し、特にマイクロ波帯で使用
される多層MMIC(マイクロ波モノリシック集積回路
)に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor device, and particularly to a multilayer MMIC (microwave monolithic integrated circuit) used in the microwave band.
[従来の技術]
第4図は従来の半導体装置のこの発明に関連する部分の
構造の一例を示す断面図で、(1)はGaAsやSi等
の半導体基板であり、該基板(1)の面上には増幅器1
位相回路、信号処理回路等の電気回路が形成されている
。 (12)は半導体基板(1)を収容する導電性筐体
であり、上記半導体基板(1)はハンダ等により筐体(
12)に固定され且つこの筐体に電気的に接続されてい
る。(13)は金属等の導電性材料により形成された蓋
板で、該蓋板はハンダ等により筐体(12)に結合され
ており、該筺体と同電位に保たれている。一般にこのよ
うな構成をモジュール構成と呼んでいる。[Prior Art] FIG. 4 is a cross-sectional view showing an example of the structure of a portion of a conventional semiconductor device related to the present invention, in which (1) is a semiconductor substrate such as GaAs or Si; Amplifier 1 on the surface
Electric circuits such as a phase circuit and a signal processing circuit are formed. (12) is a conductive casing that houses the semiconductor substrate (1), and the semiconductor substrate (1) is attached to the casing (
12) and is electrically connected to this housing. Reference numeral (13) denotes a cover plate made of a conductive material such as metal, which is connected to the housing (12) by solder or the like, and is kept at the same potential as the housing. Generally, such a configuration is called a module configuration.
ところで、マイクロ波帯の高周波回路では、基板(1)
上に形成された回路がこれ以外の回路の影響を受けるの
を防止するために、基板(1)を高周波的に接地した導
体で囲み、マイクロ波的に外部(特に上部方向)と分離
している。第4図に示す従来の装置では、導電性筐体(
12)及び蓋板(13)を接地することにより上記の分
離を行なっている。By the way, in a microwave band high frequency circuit, the substrate (1)
In order to prevent the circuit formed on the top from being affected by other circuits, the substrate (1) is surrounded by a high-frequency grounded conductor and is isolated from the outside (especially in the upper direction) in terms of microwaves. There is. In the conventional device shown in Fig. 4, the conductive casing (
12) and the cover plate (13) are grounded to achieve the above separation.
このような従来の半導体装置では、導電性筐体(12)
内へ半導体基板(1)を設置し、さらに蓋板(13)を
筐体(12)にハンダ付けする等の組立作業が必要で、
コスト高になっていた。また、導電性筐体(12)を用
いるため、半導体装置全体が大型化し、重量も重くなる
という問題があった。In such a conventional semiconductor device, a conductive casing (12)
Assembly work such as installing the semiconductor substrate (1) inside and soldering the cover plate (13) to the housing (12) is required.
The cost was getting high. Furthermore, since the conductive casing (12) is used, there is a problem that the entire semiconductor device becomes larger and heavier.
この発明は上記のような問題を解消することを目的とし
たもので、従来の導電性筐体と同じ機能を呈する手段を
半導体装置内に設けることにより、導電性筐体が不要に
なり、組立工程が少なくなワて低コスト化を図ることが
でき、しかも小型軽量化が可能な半導体装置を提供する
ことを目的とする。The purpose of this invention is to solve the above-mentioned problems. By providing a means in a semiconductor device that has the same function as a conventional conductive housing, the conductive housing becomes unnecessary and the assembly process becomes easier. It is an object of the present invention to provide a semiconductor device that can reduce costs by requiring fewer steps, and can also be made smaller and lighter.
[課題を解決するための手段]
この発明の半導体装置の第1の実施例は、電気回路が形
成された基板上に少なくとも1層の絶縁膜を形成し、該
絶縁膜の少なくとも上記電気回路に対向する部分に導体
膜を形成し、該導体膜を高周波的に接地して構成されて
いる。[Means for Solving the Problems] In a first embodiment of the semiconductor device of the present invention, at least one layer of an insulating film is formed on a substrate on which an electric circuit is formed, and at least one layer of the insulating film is connected to the electric circuit. A conductor film is formed on opposing portions, and the conductor film is grounded at high frequency.
この発明の半導体装置の第2の実施例は、電気回路が形
成された基板上に複数層の絶縁膜を形成し、上記絶縁膜
相互間に他の電気回路を形成し、上記絶縁膜の少なくと
も上記各電気回路相互間を高周波的に分離するのに必要
な部分に導体膜を形成し、該導体膜を高周波的に接地し
て構成されている。In a second embodiment of the semiconductor device of the present invention, a plurality of layers of insulating films are formed on a substrate on which an electric circuit is formed, another electric circuit is formed between the insulating films, and at least one of the insulating films is formed. A conductor film is formed in a portion necessary for high-frequency isolation between the electric circuits, and the conductor film is grounded at high frequency.
この発明の半導体装置の第3の実施例は、電気回路が形
成された基板上に複数層の絶縁膜を形成し、上記絶縁膜
相互間に他の電気回路を形成し、上記絶縁膜の少なくと
も上記各電気回路相互間を高周波的に分離するのに必要
な部分及び絶縁膜の上面に導体膜を形成し、各導体膜を
高周波的に接地して構成されている。In a third embodiment of the semiconductor device of the present invention, a plurality of layers of insulating films are formed on a substrate on which an electric circuit is formed, another electric circuit is formed between the insulating films, and at least one of the insulating films is formed. A conductor film is formed on a portion necessary for high-frequency isolation between the electric circuits and on the upper surface of the insulating film, and each conductor film is grounded at high frequency.
[作 用]
この発明による半導体装置では、高周波的に接地された
導体膜がマイクロ波的な接地導体面として動作し、この
導体膜が装置内の電気回路と外部電気回路との間、ある
いは装置内に形成された電気回路相互間を分離する遮蔽
体として作用するので、第4図に示す従来の装置におけ
るような導電性筐体や導電性の蓋体が不要になる。[Function] In the semiconductor device according to the present invention, the high-frequency grounded conductive film acts as a microwave grounded conductive plane, and this conductive film is connected between an electric circuit inside the device and an external electric circuit, or between an electric circuit inside the device and an external electric circuit. Since it acts as a shield to isolate the electrical circuits formed therein, there is no need for a conductive casing or a conductive lid as in the conventional device shown in FIG.
[実施例]
第1図はこの発明による半導体装置の第1の実施例を示
す、同図において、(1)はGaAsやSi等の半導体
基板で、該半導体基板(1)上には第1層絶縁膜(2)
、第1層導体11N(3)、第2層絶縁膜(4)、第3
層絶縁膜(5)、及び第2層導体膜(6)がこの順序で
形成されている。第2層絶縁膜(4)と第3層絶縁膜(
5)との間には第1の電気回路(7)が形成されており
、また基板(1)上には第2の電気回路(8)が形成さ
れている。ここで、第1層導体膜(3)及び第2層導体
膜(6)は接地または電源Vddに接続されており、こ
れらの各導体膜(3) 、 (6)はマイクロ波的に接
地導体面として作用する。[Embodiment] FIG. 1 shows a first embodiment of a semiconductor device according to the present invention. In the figure, (1) is a semiconductor substrate such as GaAs or Si, and a first Layer insulation film (2)
, first layer conductor 11N (3), second layer insulating film (4), third layer conductor 11N (3), second layer insulating film (4),
A layer insulating film (5) and a second layer conductor film (6) are formed in this order. The second layer insulating film (4) and the third layer insulating film (
A first electric circuit (7) is formed between the substrate (1) and a second electric circuit (8). Here, the first layer conductor film (3) and the second layer conductor film (6) are connected to the ground or the power supply Vdd, and each of these conductor films (3) and (6) is a ground conductor in terms of microwaves. Acts as a surface.
ところで、一般にマイクロ波回路等の高周波回路では、
各回路が相互に影響し合うことがないように、各回路間
を高周波的に遮蔽する必要かある。上述のこの発明の第
1の実施例では、第1層導体!!(:l)が接地導体面
として動作し、これにより上記第1の電気回路(7)と
第2の電気回路(8)とをマイクロ波的に°完全に分離
している。また、第2層導体膜(6)は第1の電気回路
(7)とこの電気回路の上層にある電気回路あるいは外
部の電気回路との間をマイクロ波的に分離することがで
きるから、上記第1の電気回路(7)が上層あるいは外
部の電気回路の影響を受けることはない。特に半導体装
置の最上層の第3層絶縁膜(5)の上面にマイクロ波的
に接地された第2M導体膜(6)が設けられているから
、従来の半導体装置の導電性筐体や導電性の蓋体を使用
することなく当該半導体装置外の回路の影響を完全に排
除することができる。By the way, generally in high frequency circuits such as microwave circuits,
In order to prevent each circuit from influencing each other, it is necessary to shield the circuits from each other at high frequencies. In the first embodiment of the invention described above, the first layer conductor! ! (:l) acts as a ground conductor plane, thereby completely separating the first electric circuit (7) and the second electric circuit (8) in terms of microwaves. Furthermore, since the second layer conductor film (6) can isolate the first electric circuit (7) from the electric circuit in the upper layer of this electric circuit or from an external electric circuit, the above-mentioned The first electrical circuit (7) is not influenced by upper or external electrical circuits. In particular, since the second M conductor film (6) which is microwave-grounded is provided on the upper surface of the third layer insulating film (5) which is the uppermost layer of the semiconductor device, it is possible to Therefore, the influence of circuits outside the semiconductor device can be completely eliminated without using a separate lid.
第2図はこの発明の半導体装置の第2の実施例を示す。FIG. 2 shows a second embodiment of the semiconductor device of the present invention.
同図で、第1図における参照番号と同じ参照番号で示す
構成素子は第1図の半導体装置における構成素子と同じ
または同等のものを表わす、基板(1)上にはフォトダ
イオード(10)が形成されており、第1層導体膜(3
)の上記フォトダイオ−1’ (10)と対向する部分
には一辺が使用周波数での波長入よりも短い長方形の小
さい孔(9)、(9)・・・・が形成されている。フォ
トダイオード(10)はマイクロ波により変調を受けた
光信号を受信し、第2の電気回路(8)は上記フォトダ
イオード(lO)で受信されたマイクロ波変調信号を増
幅し、上層の第1の電気回路(7)は増幅されたマイク
ロ波変調信号に対する所要の処理を行なう。In the figure, components indicated by the same reference numbers as those in FIG. 1 represent the same or equivalent components in the semiconductor device of FIG. 1. A photodiode (10) is mounted on a substrate (1). The first layer conductor film (3
) are formed with small rectangular holes (9), (9), each side of which is shorter than the wavelength input at the frequency used. The photodiode (10) receives an optical signal modulated by microwaves, and the second electric circuit (8) amplifies the microwave modulated signal received by the photodiode (lO), The electrical circuit (7) performs the necessary processing on the amplified microwave modulated signal.
高周波的に接地された第1層導体8(3)には上記のよ
うに小孔(9) 、 (9)・・・・が形成されている
ので、上部からの入射光はフォトダイオード(lO)に
入射する。しかし、上記の小孔(9) 、(9’)・・
・・は使用マイクロ波変調信号の波長より短い一辺を持
つ小孔であるから、第1層導体M(3)はマイクロ波的
には遮蔽メツシュと同様な遮蔽体として作用し、第1の
電気回路(7)と第2の電気回路(8)とを分離して、
2つの電気回路が互いに影響し合うのを防止することが
できる。なお、この実施例ではフォトダイオード(lO
)の上部に小孔を形成したが、例えばレーザダイオード
等の他の回路素子上の導体膜の部分に小孔を設けてもよ
い。The first layer conductor 8 (3), which is grounded in terms of high frequency, has the small holes (9), (9), etc. formed as described above, so that the incident light from the upper part is transmitted through the photodiode (lO ). However, the small holes (9), (9') above...
... is a small hole with one side shorter than the wavelength of the microwave modulation signal used, so the first layer conductor M(3) acts as a shield similar to a shield mesh from a microwave perspective, and the first electrical separating the circuit (7) and the second electric circuit (8);
It is possible to prevent two electrical circuits from influencing each other. Note that in this example, a photodiode (lO
Although the small hole is formed in the upper part of ), the small hole may be formed in a portion of the conductive film on other circuit elements such as a laser diode, for example.
第3図はこの発明の半導体装置の第3の実施例を示す、
同図で、第1図における参照番号と同じ参照番号で示す
構成素子は第1図の半導体装置における構成素子と同じ
または同等のものを表わす、基板(1)上には第2の電
気回路の他にインダクタH)が設けられている。インダ
クタは一般にスパイラルインダクタと呼ばれるものであ
る。インダクタ(11)の上部には強い磁力線が生じる
ため、特に上部の第1の電気回路(7)に与える影響が
大きい、このため、この第3の実施例では、インダクタ
(11)の上部にのみ第1層絶縁5(31)を設け、こ
れを高周波的に接地している。なお、この実施例ではイ
ンダクタ(11)の上部にのみ選択的に導体膜を形成し
たが、同様な導体膜をFETやカップラー等の他の電気
回路素子の上に設けてもよい。要は他の電気回路に影響
を与える可能性のある電気回路、他の電気回路からの影
響を受けやすい電気回路の上にのみ上記のような導体膜
を選択的に設ければよい。FIG. 3 shows a third embodiment of the semiconductor device of the present invention.
In the same figure, constituent elements designated by the same reference numbers as those in FIG. 1 represent the same or equivalent components in the semiconductor device of FIG. Additionally, an inductor H) is provided. The inductor is generally called a spiral inductor. Strong magnetic lines of force are generated in the upper part of the inductor (11), which has a particularly large influence on the first electric circuit (7) in the upper part.Therefore, in this third embodiment, only the upper part of the inductor (11) is A first layer insulation 5 (31) is provided and is grounded in terms of high frequency. In this embodiment, a conductor film was selectively formed only on the top of the inductor (11), but a similar conductor film may be provided on other electric circuit elements such as FETs and couplers. In short, it is only necessary to selectively provide the conductor film as described above only on electrical circuits that may affect other electrical circuits or are susceptible to influence from other electrical circuits.
上記の各実施例では、第1の電気回路(7)を第2層絶
縁19 (4)と第3層絶縁膜(5)との間に形成し、
第2の電気回路(8)を基板(1)上に形成したが、2
つの回路が別の層に形成されておればよく、いずれの層
上にあってもよい、また、各実施例共電気団路は2層回
路としたが、2層以上の他層回路であってもよい。さら
に、基板(1)としては半導体基板以外にアルミナやサ
ファイア等の誘電体基板であってもよい。In each of the above embodiments, the first electric circuit (7) is formed between the second layer insulation 19 (4) and the third layer insulation film (5),
A second electrical circuit (8) was formed on the substrate (1), 2
It is sufficient that the two circuits are formed on separate layers, and the circuits may be formed on any layer.Also, in each of the examples, the electric power circuit is a two-layer circuit, but it is not necessary that the circuit is formed on two or more layers. You can. Further, the substrate (1) may be a dielectric substrate such as alumina or sapphire other than a semiconductor substrate.
[発明の効果]
以上のように、この発明によれば、絶縁膜の層間あるい
は絶縁膜の上部に形成した導体膜かマイクロ波に対する
遮蔽体として作用するから、従来の半導体装置のような
導電性筐体や導電性の蓋体を全く必要としない、従って
、装置の組立工程が従来の装置に比して少なくなり、製
造コストが低下し、また、装置を小型軽量化することが
可能になる。[Effects of the Invention] As described above, according to the present invention, the conductive film formed between the layers of the insulating film or on the top of the insulating film acts as a shield against microwaves. No housing or conductive lid is required; therefore, the assembly process for the device is reduced compared to conventional devices, reducing manufacturing costs and making it possible to make the device smaller and lighter. .
第1図はこの発明の半導体装置の第1の実施例の主要部
の構造を説明するための斜視図、第2図はこの発明の半
導体装置の第2の実施例の主要部の構造を説明するため
の斜視図、第3図はこの発明の半導体装置の第3の実施
例の主要部の構造を説明するための斜視図、第4図は従
来の半導体装置のこの発明に関連する部分の構造を説明
するための斜視図である。
(1)・・・基板、(2)・・・第1層絶縁膜、(3)
・・・第1層導体膜、(4)・・・第2層絶縁膜、(5
)・・・第3層絶縁膜、(6)・・・第2層導体膜、(
7)・・・第1の電気回路、(8)・・・第2の電気回
路、(31)・・・導体膜。
代 理 人 大 岩 増 雄第1
■
!A3図
第4
蕎林随
、イ4体箋症
2゛ 尋l!槻区体
3: 番t4イ4L坊FIG. 1 is a perspective view for explaining the structure of the main part of a first embodiment of the semiconductor device of the present invention, and FIG. 2 is a perspective view for explaining the structure of the main part of the second embodiment of the semiconductor device of the invention. 3 is a perspective view for explaining the structure of the main part of the third embodiment of the semiconductor device of the present invention, and FIG. 4 is a perspective view of the part of the conventional semiconductor device related to the present invention. FIG. 3 is a perspective view for explaining the structure. (1)...Substrate, (2)...First layer insulating film, (3)
...First layer conductor film, (4)...Second layer insulating film, (5
)...Third layer insulating film, (6)...Second layer conductor film, (
7)...First electric circuit, (8)...Second electric circuit, (31)...Conductor film. Deputy Masuo Oiwa 1st ■! A3 Diagram No. 4 Sobayashi Zui, I4 Taiji Syndrome 2゛ Hirol! Tsukiku body 3: number t4i 4L boy
Claims (3)
絶縁膜を形成し、該絶縁膜の少なくとも上記電気回路に
対向する部分に導体膜を形成し、該導体膜を高周波的に
接地したことを特徴とする半導体装置。(1) At least one layer of insulating film is formed on a substrate on which an electric circuit is formed, a conductive film is formed on at least a portion of the insulating film facing the electric circuit, and the conductive film is grounded at high frequency. A semiconductor device characterized by:
形成し、上記絶縁膜相互間に他の電気回路を形成し、上
記絶縁膜の少なくとも上記各電気回路相互間を高周波的
に分離するのに必要な部分に導体膜を形成し、該導体膜
を高周波的に接地したことを特徴とする半導体装置。(2) Forming a plurality of layers of insulating films on a substrate on which electric circuits are formed, forming other electric circuits between the insulating films, and connecting at least the electric circuits between the insulating films with high frequency. A semiconductor device characterized in that a conductor film is formed in a portion necessary for separation, and the conductor film is grounded at a high frequency.
形成し、上記絶縁膜相互間に他の電気回路を形成し、上
記絶縁膜の少なくとも上記各電気回路相互間を高周波的
に分離するのに必要な部分及び絶縁膜の上面に導体膜を
形成し、各導体膜を高周波的に接地したことを特徴とす
る半導体装置。(3) Forming a plurality of layers of insulating films on a substrate on which an electric circuit is formed, forming another electric circuit between the insulating films, and connecting at least each of the electric circuits of the insulating film with high frequency. A semiconductor device characterized in that a conductor film is formed on a portion necessary for isolation and on the upper surface of an insulating film, and each conductor film is grounded at high frequency.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1236271A JP2600389B2 (en) | 1989-09-12 | 1989-09-12 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1236271A JP2600389B2 (en) | 1989-09-12 | 1989-09-12 | Semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0399460A true JPH0399460A (en) | 1991-04-24 |
JP2600389B2 JP2600389B2 (en) | 1997-04-16 |
Family
ID=16998309
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1236271A Expired - Lifetime JP2600389B2 (en) | 1989-09-12 | 1989-09-12 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2600389B2 (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS574160A (en) * | 1980-06-10 | 1982-01-09 | Toshiba Corp | Semiconductor device |
JPS61180468A (en) * | 1985-02-06 | 1986-08-13 | Agency Of Ind Science & Technol | Laminated type semiconductor device |
JPS62136063A (en) * | 1985-12-10 | 1987-06-19 | Citizen Watch Co Ltd | Integrated circuit |
JPS63137942U (en) * | 1987-03-02 | 1988-09-12 | ||
JPS649655A (en) * | 1987-07-01 | 1989-01-12 | Nec Corp | Photodetector built-in type semiconductor integrated circuit |
-
1989
- 1989-09-12 JP JP1236271A patent/JP2600389B2/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS574160A (en) * | 1980-06-10 | 1982-01-09 | Toshiba Corp | Semiconductor device |
JPS61180468A (en) * | 1985-02-06 | 1986-08-13 | Agency Of Ind Science & Technol | Laminated type semiconductor device |
JPS62136063A (en) * | 1985-12-10 | 1987-06-19 | Citizen Watch Co Ltd | Integrated circuit |
JPS63137942U (en) * | 1987-03-02 | 1988-09-12 | ||
JPS649655A (en) * | 1987-07-01 | 1989-01-12 | Nec Corp | Photodetector built-in type semiconductor integrated circuit |
Also Published As
Publication number | Publication date |
---|---|
JP2600389B2 (en) | 1997-04-16 |
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