JPH039609B2 - - Google Patents
Info
- Publication number
- JPH039609B2 JPH039609B2 JP9558785A JP9558785A JPH039609B2 JP H039609 B2 JPH039609 B2 JP H039609B2 JP 9558785 A JP9558785 A JP 9558785A JP 9558785 A JP9558785 A JP 9558785A JP H039609 B2 JPH039609 B2 JP H039609B2
- Authority
- JP
- Japan
- Prior art keywords
- gas
- gas ejection
- ejection plate
- pedestal
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000007789 gas Substances 0.000 claims description 97
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 21
- 239000000758 substrate Substances 0.000 claims description 19
- 239000013078 crystal Substances 0.000 claims description 18
- 239000004065 semiconductor Substances 0.000 claims description 18
- 150000001875 compounds Chemical class 0.000 claims description 17
- 238000006243 chemical reaction Methods 0.000 claims description 13
- 238000004519 manufacturing process Methods 0.000 claims description 12
- 239000010409 thin film Substances 0.000 claims description 7
- 150000002902 organometallic compounds Chemical class 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 5
- 239000002994 raw material Substances 0.000 claims description 5
- 239000012159 carrier gas Substances 0.000 claims description 4
- 238000000197 pyrolysis Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 8
- 238000005229 chemical vapour deposition Methods 0.000 description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
- 238000002156 mixing Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 206010067482 No adverse event Diseases 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000004678 hydrides Chemical class 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 230000002427 irreversible effect Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/02543—Phosphides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/02546—Arsenides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9558785A JPS61253822A (ja) | 1985-05-07 | 1985-05-07 | 化合物半導体薄膜の製造装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9558785A JPS61253822A (ja) | 1985-05-07 | 1985-05-07 | 化合物半導体薄膜の製造装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61253822A JPS61253822A (ja) | 1986-11-11 |
JPH039609B2 true JPH039609B2 (enrdf_load_stackoverflow) | 1991-02-08 |
Family
ID=14141712
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9558785A Granted JPS61253822A (ja) | 1985-05-07 | 1985-05-07 | 化合物半導体薄膜の製造装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61253822A (enrdf_load_stackoverflow) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5275686A (en) * | 1991-09-25 | 1994-01-04 | University Of New Mexico | Radial epitaxial reactor for multiple wafer growth |
US11486038B2 (en) | 2019-01-30 | 2022-11-01 | Applied Materials, Inc. | Asymmetric injection for better wafer uniformity |
KR102810068B1 (ko) * | 2019-09-09 | 2025-05-21 | 어플라이드 머티어리얼스, 인코포레이티드 | 반응물 가스를 전달하는 처리 시스템 및 방법 |
-
1985
- 1985-05-07 JP JP9558785A patent/JPS61253822A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS61253822A (ja) | 1986-11-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6837940B2 (en) | Film-forming device with a substrate rotating mechanism | |
US4565157A (en) | Method and apparatus for deposition of tungsten silicides | |
EP0502209A1 (en) | Method and apparatus for growing compound semiconductor crystals | |
JPH09330884A (ja) | エピタキシャル成長装置 | |
JP4731076B2 (ja) | 半導体膜をcvd法によって堆積する堆積方法および堆積装置 | |
JP2024503166A (ja) | 半導体成長装置及びその動作方法 | |
US5151133A (en) | Vapor deposition apparatus | |
JPH039609B2 (enrdf_load_stackoverflow) | ||
CN118241186A (zh) | 一种气体注入系统及薄膜沉积设备 | |
JPH039608B2 (enrdf_load_stackoverflow) | ||
JPS61248518A (ja) | 化合物半導体薄膜の製造装置 | |
JP2733535B2 (ja) | 半導体薄膜気相成長装置 | |
US4920908A (en) | Method and apparatus for deposition of tungsten silicides | |
JPH06302519A (ja) | 半導体製造装置 | |
JP3473251B2 (ja) | マルチチャージ横型気相成長方法及びその装置 | |
JPH0547669A (ja) | 気相成長装置 | |
JPS6316617A (ja) | 気相成長装置 | |
JPH04154117A (ja) | 減圧cvd装置 | |
JPS6252200A (ja) | 気相エピタキシヤル成長装置 | |
JPH0235814Y2 (enrdf_load_stackoverflow) | ||
JP3231312B2 (ja) | 気相成長装置 | |
CN116641042A (zh) | 一种用于分子束外延设备的等离子体发生装置 | |
JP2501436Y2 (ja) | 気相成長装置 | |
CN117926209A (zh) | 回转式mocvd设备 | |
CN116876078A (zh) | 一种提高碳化硅外延炉气源均匀性的进气过渡装置 |