JPH039407A - Inspection system for controller - Google Patents

Abstract

PURPOSE:To shorten the time required for deriving an output value by storing the input value of a parameter to be inputted to a controller and an output value outputted from the control value, setting up a required input value based upon the stored contents and inputting the set value. CONSTITUTION:When the controller 1 is connected to an inspecting device 1, the maximum and minimum values of each parameter are read out from a memory 22 in a personal computer 2 to a central processing unit 6. The central processing unit 6 dispersedly sets up the set values of a 1st parameter from the maximum value to the minimum value, a simulator 3 outputs analog values corresponding to respective set values to a control device 1, the control device 1 outputs output values changed interlocking with the inputted analog values to a processing circuit 4, and the output values are fed back to the personal computer 2. The fed-back digital values are applied to the central processing unit 6 and the analog values to be inputted to the controller 1 and the digital values to be outputted are correspondingly stored in the memory 22. Consequently, the time required for the inspection process can be shortened.

Description

DETAILED DESCRIPTION OF THE INVENTION Overview Generally speaking, setting values input from a testing device may not be determined as normal values by the control device to be tested due to the effects of noise and delay.

Therefore, the analog value corresponding to the set value is corrected and input to the control device. In the present invention, the correction is corrected and output from the control device according to the analog value to be input in advance and the analog value. The relationship with the digital value is measured discretely and stored in memory. After that 1. When the test starts and the set value is set, the analog value R'a to be input is immediately read out according to the set value based on the above relationship, and is input to the control device to ensure a good test process. In this way, the time required for initial operations such as setting inspection conditions for each parameter immediately before inspection can be sufficiently shortened. In addition, since the above-mentioned intermediary is measured in a 1llt manner,
There is no need to increase the memory capacity for storing the above-mentioned information,
You can save a lot of money.

Industrial Application Field The present invention is applicable to, for example, E CU (E++gine Co.
The present invention relates to an inspection method for inspecting a control device such as a control device such as a control device, and more particularly relates to an initial system for providing each parameter to the control device when starting the inspection.

2. Description of the Related Art For example, an ECU is a control device that controls fuel injection of an internal combustion engine. Before the ECU is installed in a vehicle, it is inspected to see if it provides normal control output. For the inspection, a personal computer that sets the outputs of a water temperature sensor, a vehicle speed sensor, etc. as inspection conditions, a simulator that outputs a pseudo signal according to the inspection conditions, and the like are used. In other words, by using the outputs from various sensors as parameters and setting values indicating inspection conditions on a personal computer, the simulator converts analog pseudo signals based on the settings values to the control device. After that, control outputs such as fuel injection amount are inspected.

However, the pseudo signals given to the control device tend to cause so-called setting errors, such as noise and delay within the control device, which are not necessarily determined as the setting values set in the personal computer due to the 11E application. Due to the setting error, the control 2g output from the control device output during the inspection does not correspond to the set inspection conditions, that is, the inspection is performed with low accuracy. For proper testing, the setting error must be corrected and input so that the control device can reliably judge the input analog value as a value corresponding to the testing conditions.

By correcting the setting error and inputting it to the control device, the control device determines the test conditions set by the examiner and outputs the control rp based on the test conditions, thus performing the desired test. It will be done.

Problems to be Solved by the Invention Conventionally, when inspection conditions are set for each parameter, only the set values are corrected, and after the correction, the test conditions are provided to the control device. For example, when test conditions for a water temperature sensor are input, the simulator inputs analog values corresponding to the test conditions to the control device. The analog value is controlled by a controller (for example, an analog/digital converter in the wholesale equipment).
The data is fed back to the personal computer as a digital value via an A/D converter (hereinafter referred to as an "A/D converter"). The digital value is a signal that changes in conjunction with the analog value input to the control device, and a setting error is detected by comparing it with a setting value set by the personal computer. That is, since the setting error is caused by comparing the digital value output from the control device with the set value, it can be considered that it is caused by the effects of noise, delay, etc. within the control device.

In this way, the setting error calculated for each input parameter setting value is corrected, and the simulator outputs an analog value according to the corrected value, which is input to the control device.

The control device determines that a value corresponding to the test condition has been input for each parameter, and thereafter tests according to the test strip ('1-) are performed.

However, in the above-mentioned method, since the inspection starts after the correction operation is performed every time the set value is input, time is required for the correction operation f%, and the initial process before the start of the inspection takes time. Therefore, for example, when the test conditions are subject to changes over time, time is spent on correction operations for set values that change every unit time, resulting in poor test responsiveness.

On the other hand, in addition to this, - all setting errors are calculated for the range of inspection conditions that should be set for each transformation parameter, the relationship between the setting value and the value corrected for the setting error is stored in memory in advance, and the setting There is also a method in which the corrected bamboo is read out each time a value is input and inputted to the control device. According to the above method, -dan,
By storing the relationship between set values and corrected values, when each set value is set, the corrected value is output, and the simulator outputs an appropriate analog value.
A test corresponding to the test conditions can be performed on the control device. That is, it is possible to shorten the time required for the initial process until the inspection starts each time each set value is input. However, since the number of parameters varies and also differs depending on the control device to be inspected, it is difficult to store corrected values for all inspection conditions within the range that should be set. The required memory I becomes enormous and is not practical.

SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide a control device inspection method that can shorten the inspection process time and save the required memory capacity.

Means for Solving the Problems The present invention provides a control device inspection method in which predetermined parameters are input to a control device to be inspected and a control output of the control device is inspected. A value is changed discretely within a predetermined range, and an output value outputted from the control device in response to the change and the input value are stored, and the control device changes the predetermined value based on the stored value. This is an output (control device type) inspection method characterized by setting an input value to be input in order to output a direct signal, inputting it to the control device, and inspecting the control output of the control device.

According to the inspection method of the control device of the present invention, the input value of the parameter input to the control device to be inspected is changed numerically within a predetermined range to correspond to the above-mentioned 2fH. An output value output from the control device is calculated. The output value changes in conjunction with the input value. The input value and output value are stored in a predetermined memory. Since the values are calculated discretely, the required memory capacity may be small.

Then, based on the stored values, input values to be inputted in order for the control (X-device to output a predetermined output value) are set and inputted to the control (il device), and the control output is checked. Therefore, the input values to be input based on the stored values are immediately set, so the time required for the inspection process can be shortened.

Embodiment FIG. 1 is a simplified configuration diagram for carrying out an inspection method for an ear device according to an embodiment of the present invention.The configuration will be explained with reference to FIG.

The control device 1 to be inspected, such as an ECU, is the object to be inspected.
The inspection device is attached to an inspection device, and the quality evaluation inspection is performed by confirming the control output S output based on the signal from the inspection device.

The inspection device includes a personal computer 2, a simulator 3, a processing circuit 4, and a ROM (need on l).
yMemory) Emulator 5, etc.

Inspection conditions corresponding to outputs from various sensors serving as parameters for inspection, such as a water temperature sensor and a throttle valve opening sensor, are set in the central processing unit 6 of the personal computer 2 by input means such as a keyboard (not shown). Then, the set value P indicating the test condition is given to the simulator 3 via the two adapters and the input/output circuit 7.

The simulator 3 converts the set value P, generates pseudo signals that simulate actual signals from various sensors, and supplies them to the control device=1. In FIG. 1, D of the input/output circuit 7 is
/' A drive voltage is generated from the analog signal passed through the A converter 8 via the power amplifier 9 of the simulator 3, and is supplied to the control device 1.

Further, the analog signals from the D/A converters 8 and 10 pass through the input amplifier 11 of the simulator 3 to generate the pseudo signal, and are supplied to the control device 1. In addition, the pulse generation circuit 12 of the input/output circuit 7 passes through the rotation angle and vehicle speed signal generation circuit 13 of the simulator 3 to generate the pseudo signal of the pulse signal and gives it to the control (ear device 1). The switch signal generating circuit 14 of the circuit 7 generates an on/off signal, which is sent to the ear device 1 as an on/off signal for various switches via an isolator 15.

The control device 1 controls f3 in response to each of the pseudo signals.
'f Outputs output S. The control output S is given to the pseudo load correction circuit 16 of the simulator 3, which corrects the amount of load such as engine speed to the control output S, and the resulting signal is sent to the isolator 15 and the input/output circuit. 7, the data is taken into the central processing unit 6 and evaluated.

The itE relationship between the pseudo signal and the control output S is controlled by a program stored in the ROM of the ECU to be tested. The control constants, etc. in the above-mentioned 10 graphs are fixed, and in order to change the fixed control constants, etc. during inspection under each condition, the ROM emulator 5 in which other programs are stored is used. The processing circuit 4 changes the program in the control device 1 with the ROM emulator 5, and various tests are performed.

The ROM emulator 5 is also connected to the central processing section 6 of the personal computer 2, and can exchange 10 grams with the memory 22 in the central processing section 6. The control status in the processing circuit 4 and the central processing unit 6 is controlled by the processing circuit 4 via the bus interface 17, and from the central processing unit 6 by G P -I B (G
eneral PurposeInterface [
+11! Logic analyzer 1 connected via
Monitored by 8. In addition, control results and inspection results are
A CRT (Catl+ode) connected to the central processing unit 6
It is visually displayed by a flay tube) 19, etc. The information is also printed out from the printer 20.

In this embodiment, as an initial operation before the test, a control (correction operation of input values such as analog values input to the ear device 1) is performed. In other words, when the control device 1 is connected to the test device, the personal The maximum and minimum values of the range that can be set in advance for each parameter are read out from the memory 22 in the computer 2 to the central processing unit 6. First, for the first parameter, discrete values from the maximum value to the minimum value are read out. set values P and input them to the simulator 3.The simulator 3 outputs analog values corresponding to each set value P to the control device 1.The control device 1 outputs analog values corresponding to each set value P to the control device 1. is subjected to one of the processes, and outputs an output value that changes in conjunction with the processing circuit 4, and outputs an output value that changes in conjunction with the bus interface 17 and R A M (Random＾cces
sMeIIIory) Feedback is provided to the input/output circuit 7 of the personal computer via the measurement card 23. The output value may be, for example, a digital value passed through an A, -'D converter 1a built in the control device 1.

The digital value fed back to the personal computer 2 is provided to the central processing unit 6 after passing through the input circuit 24 of the input/output circuit 7. In this way, in the memory 22, the analog value input to the ear device and the digital value output are stored in correspondence with each other.

212I is a flowchart for explaining storage processing. This program starts when the control device 1 is attached to the inspection device.

In step S1, the analog value X to be input is set to the maximum value X m a x 4. : is set, and in step S2, the control (is given to the ear device 1. In step S3, the digital value Y output according to the analog value X is measured. In step S4, the analog value X and the digital (
Direct Y is stored in memory 22. Then step S
In Step 5, the analog value [iX to be input next is set smaller by ΔX, and if the newly set analog value X in step S6 is equal to or greater than the minimum value Similar processing is performed to store analog value X and digital value Y. Thereafter, when the set analog value X reaches the minimum value Xm1n, the process proceeds to the final process.In this way, digital values are individually mapped to correspond to the discrete analog values X.

The storage process is performed sequentially for each parameter. That is, after storing the above relationship for the output from the water temperature sensor as the first parameter, the above relationship is stored for the output from the throttle valve opening sensor as the subsequent parameter, and in this way, from now on, for each parameter. It will be done. Note that when storage processing is performed for each parameter, parameters that are not being stored are fixed.

The third [2I] is a diagram for calculating the analog value X from the set value P. FIG. 3(1) is a diagram showing the relationship between the set value P and the desired digital value YO output from the control device 1, and this characteristic is registered in advance in the memory 22, for example. In this embodiment, the digital value YO is set to an A in which an analog value X input to the control device 1 is stored.
The value outputted via the /D transformer 1a is assumed.

FIG. 3(2) is a diagram showing the relationship between the analog value X and the digital value Y stored in the memory 22 by the storage process.

When the setting value Pi indicating the inspection condition is set, the value shown in FIG.
) to be output from the control device 1 from the digital value YOi
is derived. Then, a digital [Yi] having the same value as the derived desired digital value YOi is selected,
Using the digital value Y i as an address, the 3111mth
Recall the analog value Xi having the relationship (2). In addition,
In the third (2I(2)), the desired value Xi is calculated by the linear interpolation method from the discrete measurement points Xa, Xt+ measured during the storage process.In this way, the desired digital value is An analog value Xi necessary for outputting Yi from the control device 1 is set.In other words, for the setting jfi F''i, the analog value Xi, which the control device 1 determines to be the value corresponding to the value Pi, is immediately set. You will get it.

The characteristics that comprehensively show Figure 3 (1) and (2) are shown in Figure 31.
21(3). That is, the relationship in which the 30th (2) analog value Xi is calculated from the setting value Pi set in FIG. 3 (1) is shown. Even if I memorize it instead of Figures (1) and (2), can I immediately perform the correction motion in the same way? Yes,
An analog value Xi to be input to the system 1 is derived.

FIG. 4 is a flowchart for explaining the correction movement (t=. This program starts when the set value P is input. When the program starts, step rn
In step m2, a set value P set in the central processing unit 6 of the personal computer 2 is output to the simulator 3, and an analog value X converted according to the set value P is given to the control device 1. The digital value Y that has passed through the A/D converter 1a is output, further fed back, and measured in the central processing unit 6. Note that, at this point, the characteristics shown in FIG. 3 are not used.

In step rn3, it is determined whether the measured digital value Y is a desired value or not, that is, whether the input analog value X is accurately determined by the control device 1 as a value indicating the inspection condition. be judged. If it is not the desired value,
The process proceeds to step rn4, in which the analog value input to the control device 1 is corrected based on the relationship shown in FIG. 3 as described above, and the process proceeds to step m3 again. When the digital value becomes the desired value,
The process proceeds to step rn 5 /\, after which the inspection is started.

After that, processing proceeds to other processing.

As described above, according to this embodiment, the analog values for each parameter that should be input in order to perform a good inspection on the control device to be inspected are stored in the memory as set values P. - Immediately using the analog value X relationship! & It can be set to an appropriate value, and the time required before starting the inspection can be sufficiently shortened. Furthermore, since the setting value P-analog direct

FIG. 5 is a diagram showing the relationship between set value P and analog value X in another embodiment. In Section 5 [2I, Fig. 3 (
3>, an analog value X that numerically corresponds to a finer set value P is calculated. in this way,
If there is a more precise correspondence, even if the setting values Pi between the discretely selected setting values P are specified, analog Value
By inputting an analog value

6th (2I) is a diagram showing a state in which the setting value P is set according to a change in time.In testing the ear device 1, each parameter is set as an examination condition by adding a change in time to each parameter. In other words, the setting value P set in the burner computer 2 is set to change every unit time T, for example, as shown by the 6121st solid line 11. Set value P
When P changes, conventionally, the correction operation of the analog value input to the control device is performed every time the set value P changes, so it takes time to input the desired analog value, and as a result, The inspection process was delayed, and the committee was at fault.
However, as in this embodiment, the time required for correction in order to input a desired analog value can be sufficiently shortened, so that a situation where the set value P changes with respect to the unit time T can be avoided. Even if it is, the inspection process can be performed with sufficient follow-up without delay, and the inspection accuracy is significantly improved.

In this example #1, the analog value input to the control device 1 is corrected based on the digital value output from the A/D converter 1a of the ILJ control device 1, but this is a limitation. For example, it may be a digital value outputted from another circuit part of the control device, or it may be a digital value output from another circuit part of the control device. A7' of the personal computer via input amplifier 130
D 2 conversion
An analog value or a pulse signal may be used as long as it is a signal that causes f-hi.Furthermore, the correction may be performed on other than analog values, for example, the rotation angle and vehicle speed signal generation circuit 13 shown in No. 11121 may be applied to a pulse signal.

Further, in this embodiment, the relationship between the analog value and the digital value is stored in the memory 22 of the central processing unit 6 in the personal computer 2, but this is not a limitation. , for example, may be stored in the memory 35 within the processing circuit 4.

Furthermore, although this embodiment shows a control device installed in the vehicle body, such as an ECU, as the object to be inspected,
This is not a limitation and may also be a pond control device.

Effects of the Invention According to the present invention, i! , the input values of the parameters input to the IItn device and the output values output from the control device are stored, and based on the memory, desired input values are immediately set and inputted to the control device. The time required to derive the output value can be sufficiently shortened,
The inspection process time can be shortened.

Furthermore, since the input value and the output value are stored numerically within a predetermined range of the input value, the memory capacity required for the storage can be small and can be saved. .

[Brief explanation of the drawing]

1 (21) is a simplified configuration diagram for implementing the inspection method of a control device which is an embodiment of the present invention, 2 (21) is a flowchart for explaining storage processing, and 3. FIG. 11 is a flowchart for explaining the correction operation; FIG. 5 is a diagram showing the relationship between setting 1a P and analog value It is a diagram showing a state in which the set value P is set according to a time change. 1... Control device, 2... Personal computer,
3... Simulator, 4... Processing circuit, 6... Central processing unit, 7... Input/output circuit, 17... Bus interface, 22... Memory, 23... RAM measurement card , S...Control output, X...Analog value (input 1a), Y...Digital value (output value) Analog box

Claims (1)

[Claims] Inputting predetermined parameters to the control device to be inspected,
In a control device inspection method for inspecting the control output of the control device, input values of parameters input to the control device are discretely cultured within a predetermined range, and outputs from the control device are adjusted in response to the changes. storing an output value to be input and the input value, and setting an input value to be input in order for the control device to output a predetermined output value based on the stored value;
An inspection method for a control device, characterized in that input is input to the control device, and a control output of the control device is inspected.