JPH0378944B2 - - Google Patents
Info
- Publication number
- JPH0378944B2 JPH0378944B2 JP58191780A JP19178083A JPH0378944B2 JP H0378944 B2 JPH0378944 B2 JP H0378944B2 JP 58191780 A JP58191780 A JP 58191780A JP 19178083 A JP19178083 A JP 19178083A JP H0378944 B2 JPH0378944 B2 JP H0378944B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- horn
- electromagnetic
- microwaves
- receiving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004435 EPR spectroscopy Methods 0.000 claims description 10
- 238000001514 detection method Methods 0.000 description 7
- 238000005259 measurement Methods 0.000 description 6
- 235000012431 wafers Nutrition 0.000 description 4
- BGPVFRJUHWVFKM-UHFFFAOYSA-N N1=C2C=CC=CC2=[N+]([O-])C1(CC1)CCC21N=C1C=CC=CC1=[N+]2[O-] Chemical compound N1=C2C=CC=CC2=[N+]([O-])C1(CC1)CCC21N=C1C=CC=CC1=[N+]2[O-] BGPVFRJUHWVFKM-UHFFFAOYSA-N 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/60—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58191780A JPS6082981A (ja) | 1983-10-14 | 1983-10-14 | 電子スピン共鳴装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58191780A JPS6082981A (ja) | 1983-10-14 | 1983-10-14 | 電子スピン共鳴装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6082981A JPS6082981A (ja) | 1985-05-11 |
| JPH0378944B2 true JPH0378944B2 (enrdf_load_stackoverflow) | 1991-12-17 |
Family
ID=16280409
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58191780A Granted JPS6082981A (ja) | 1983-10-14 | 1983-10-14 | 電子スピン共鳴装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6082981A (enrdf_load_stackoverflow) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5665914B2 (ja) * | 2013-05-13 | 2015-02-04 | 株式会社東芝 | 磁気共鳴測定装置 |
-
1983
- 1983-10-14 JP JP58191780A patent/JPS6082981A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6082981A (ja) | 1985-05-11 |
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