JPH0378266U - - Google Patents

Info

Publication number
JPH0378266U
JPH0378266U JP13925089U JP13925089U JPH0378266U JP H0378266 U JPH0378266 U JP H0378266U JP 13925089 U JP13925089 U JP 13925089U JP 13925089 U JP13925089 U JP 13925089U JP H0378266 U JPH0378266 U JP H0378266U
Authority
JP
Japan
Prior art keywords
test point
circuit board
printed circuit
point
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13925089U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13925089U priority Critical patent/JPH0378266U/ja
Publication of JPH0378266U publication Critical patent/JPH0378266U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Multi-Conductor Connections (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図は本考案実施例を示し、第1
図は、本考案拡大斜視図、第2図は、同上の使用
状態を示す一部切欠斜視図、第3図は、従来例を
示す斜視図である。 1……テストポイント、3……天面部、4……
通孔。
1 and 2 show an embodiment of the present invention, and the first
The figure is an enlarged perspective view of the present invention, FIG. 2 is a partially cutaway perspective view showing the same usage condition, and FIG. 3 is a perspective view showing a conventional example. 1...Test point, 3...Top section, 4...
Through hole.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] プリント基板のパターン配線上における所要測
定点に特性チエツクの為に予め設置したテストポ
イントにおいて、該テストポイントの上面に開口
した補助テストピン用の凹所を形成したことを特
徴とするプリント配線上のチツプ型テストポイン
ト。
A test point on a printed circuit board, characterized in that a recess for an auxiliary test pin is formed in the upper surface of the test point, which is set in advance for checking characteristics at a required measurement point on the pattern wiring of a printed circuit board. Chip type test point.
JP13925089U 1989-11-29 1989-11-29 Pending JPH0378266U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13925089U JPH0378266U (en) 1989-11-29 1989-11-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13925089U JPH0378266U (en) 1989-11-29 1989-11-29

Publications (1)

Publication Number Publication Date
JPH0378266U true JPH0378266U (en) 1991-08-07

Family

ID=31686308

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13925089U Pending JPH0378266U (en) 1989-11-29 1989-11-29

Country Status (1)

Country Link
JP (1) JPH0378266U (en)

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