JPH037777Y2 - - Google Patents
Info
- Publication number
- JPH037777Y2 JPH037777Y2 JP1982147033U JP14703382U JPH037777Y2 JP H037777 Y2 JPH037777 Y2 JP H037777Y2 JP 1982147033 U JP1982147033 U JP 1982147033U JP 14703382 U JP14703382 U JP 14703382U JP H037777 Y2 JPH037777 Y2 JP H037777Y2
- Authority
- JP
- Japan
- Prior art keywords
- pulse
- circuit
- pulse train
- test pulse
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 28
- 238000012806 monitoring device Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 208000033748 Device issues Diseases 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
Landscapes
- Arrangements For Transmission Of Measured Signals (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Manipulation Of Pulses (AREA)
Description
【考案の詳細な説明】
〔考案の技術分野〕
本考案はデマンド監視装置のデマンド監視機能
を試験するための模擬電力量パルス信号を発生す
る試験パルス発生装置に関するものである。[Detailed Description of the Invention] [Technical Field of the Invention] The present invention relates to a test pulse generator that generates a simulated electric energy pulse signal for testing the demand monitoring function of a demand monitoring device.
一般にデマンド監視装置の機能試験には、電力
量を模擬するパルス発生装置が必要である。
Functional testing of demand monitoring devices generally requires a pulse generator that simulates the amount of electric power.
これに対して、従来は第１図に示すように、一
定周波数のパルスを発生するパルス発生回路１と
パルス間隔をタイマー等を用いて手動で任意に設
定するパルス間隔設定器２とそのパルス出力回路
３とを組合せたものが多く用いられている。 On the other hand, conventionally, as shown in Fig. 1, there is a pulse generation circuit 1 that generates pulses of a constant frequency, a pulse interval setting device 2 that manually sets the pulse interval arbitrarily using a timer, etc., and its pulse output. A combination of circuit 3 and circuit 3 is often used.
模擬パルスは例えば第２図の折線Ｘのようにあ
たえられる。 The simulated pulse is applied, for example, as indicated by the broken line X in FIG.
Ｙは警報ガイドラインであり、折線Ｘがガイド
ラインＹを超えるとデマンド監視装置は警報を出
すので、これによつてその機能をチエツクするこ
とができる。 Y is a warning guideline, and when the broken line X exceeds the guideline Y, the demand monitoring device issues a warning, so its function can be checked based on this.
この場合30分間にわたつて、パルス間隔を調整
する必要があるので、第１図に示す従来の装置で
はその間人間による手動操作が必要であり、面倒
であるばかりでなく省力の点でも問題があつた。 In this case, it is necessary to adjust the pulse interval over a period of 30 minutes, so the conventional device shown in Figure 1 requires manual operation by a human during that time, which is not only troublesome but also poses problems in terms of labor saving. Ta.
本考案は前もつて設定したパルス間隔で自動的
にパルスを発生し、任意のパターンで繰返し電力
模擬パルスをデマンド監視装置に入力できる試験
パルス発生装置を提供することを目的としてい
る。
An object of the present invention is to provide a test pulse generator that can automatically generate pulses at preset pulse intervals and repeatedly input simulated power pulses in an arbitrary pattern to a demand monitoring device.
本考案は一定周波数の基準パルス列を発生する
パルス発生回路を備えると共に、各段ごとに上記
基準パルス列を分周して任意のパルス間隔の試験
パルス列を出力するパルス間隔設定回路および上
記基準パルス列をカウントして任意の試験パルス
出力時間をあたえる出力時間設定回路を所要段数
分備え、上記各段ごとの試験パルス列を上記各設
定時間ずつ順次出力し、これによつて設定した任
意の折線形状の試験パルス列を発生する試験パル
ス発生装置である。
The present invention includes a pulse generation circuit that generates a reference pulse train of a constant frequency, a pulse interval setting circuit that divides the frequency of the reference pulse train for each stage and outputs a test pulse train of an arbitrary pulse interval, and a pulse interval setting circuit that counts the reference pulse train. The test pulse train for each stage is sequentially outputted for each of the set times, and thereby the set test pulse train is set in an arbitrary broken line shape. This is a test pulse generator that generates
本考案の一実施例を第３図に示す。 An embodiment of the present invention is shown in FIG.
第３図は折線Ｘを任意の傾斜で６段、合計30分
間設定できるものを示している。 Figure 3 shows a system in which the folded line X can be set at any inclination in six stages for a total of 30 minutes.
第３図において100ｍ秒間隔のパルス発生装置
４で発生した10Hzのパルス列はパルスカウント回
路５で1/10に分周されて１Hzのパルス列となり、
AND回路１１−１〜１１−６を介してそれぞれ
パルス間隔設定回路６−１〜６−６に入力される
と共に出力時間設定回路８−１〜８−６に入力さ
れる。 In Fig. 3, the 10Hz pulse train generated by the pulse generator 4 at 100 msec intervals is divided by 1/10 by the pulse count circuit 5 to become a 1Hz pulse train.
The signals are input to pulse interval setting circuits 6-1 to 6-6 via AND circuits 11-1 to 11-6, respectively, and are also input to output time setting circuits 8-1 to 8-6.
尚スイツチ７−１〜７−６はそれぞれAND回
路１１−１〜１１−６を阻止するためのパルスカ
ツトスイツチであり、これによつて折線Ｘの段数
を減らすことができる。 The switches 7-1 to 7-6 are pulse cut switches for blocking the AND circuits 11-1 to 11-6, respectively, so that the number of stages of the broken line X can be reduced.
上記１Hzパルスは先ず１段目のパルス間隔設定
回路６−１で任意に分周され、所要パルス間隔の
試験パルス列P1を出力時間設定回路８−１で任
意に設定した時間T1だけAND回路１２−１を介
して出力し、パルス出力回路３を介して出力され
る。 The above 1 Hz pulse is first arbitrarily divided in the first stage pulse interval setting circuit 6-1, and the test pulse train P 1 with the required pulse interval is output by an AND circuit for a time T 1 arbitrarily set in the output time setting circuit 8-1. 12-1, and the pulse output circuit 3.
設定時間T1が経過すると、次段のAND回路１
１−２がオンとなり、上記１段目と同じようにし
て２段目の試験パルス列P2が設定されたパルス
間隔で設定時間T2だけ出力される。 When the set time T 1 has elapsed, the next stage AND circuit 1
1-2 is turned on, and the second stage test pulse train P2 is output for the set time T2 at the set pulse interval in the same way as the first stage.
以下順次６段目までの試験パルス列が出力さ
れ、最終的に30分カウント回路１０が30分をカウ
ントアツプすると出力時間設定回路８−１〜８−
６をそれぞれリセツト回路９−１〜９−６を介し
てすべてリセツトし、上記の試験パルス列が再度
１段目から発生される。 Thereafter, test pulse trains up to the 6th stage are sequentially output, and finally, when the 30 minute count circuit 10 counts up 30 minutes, the output time setting circuits 8-1 to 8-
6 are reset through reset circuits 9-1 to 9-6, respectively, and the above test pulse train is generated again from the first stage.
これによつて任意の折線形状をもつた30分間の
試験用パルス列Ｘが繰返し得られる。 As a result, a 30-minute test pulse train X having an arbitrary broken line shape can be repeatedly obtained.
尚上記は試験パルス列が６段の場合について説
明したが回路数を変えることによつて任意の段数
をとることが可能である。 Although the case where the test pulse train has six stages has been described above, it is possible to have an arbitrary number of stages by changing the number of circuits.
以上説明したように本考案によれば、任意の傾
斜で多段な試験用パルス列を自動的に発生し、こ
れによつてデマンド監視装置の機能試験を容易且
つ確実に行なえる合理的な試験パルス発生装置が
得られる。
As explained above, according to the present invention, a multi-stage test pulse train with an arbitrary inclination is automatically generated, and thereby a rational test pulse generation that can easily and reliably perform a functional test of a demand monitoring device. A device is obtained.
第１図は従来の試験パルス発生装置の一例を示
す構成図、第２図は試験パルスの一例を示す図、
第３図は本考案の一実施例を示す回路図である。
１，４……パルス発生回路、２……パルス間隔
設定器、３……パルス出力回路、５……パルスカ
ウント回路、６−１〜６−６……パルス間隔設定
回路、７−１〜７−６……パルスカツトスイツ
チ、８−１〜８−６……出力時間設定回路、９，
９−１〜９−６……リセツト回路、１０……30分
カウント回路、１１−１〜１１−６，１２−１〜
１２−６……アンド回路。
FIG. 1 is a configuration diagram showing an example of a conventional test pulse generator, and FIG. 2 is a diagram showing an example of a test pulse.
FIG. 3 is a circuit diagram showing an embodiment of the present invention. 1, 4...Pulse generation circuit, 2...Pulse interval setter, 3...Pulse output circuit, 5...Pulse count circuit, 6-1 to 6-6...Pulse interval setting circuit, 7-1 to 7 -6...Pulse cut switch, 8-1 to 8-6...Output time setting circuit, 9,
9-1 to 9-6...Reset circuit, 10...30 minute count circuit, 11-1 to 11-6, 12-1...
12-6...AND circuit.
Claims (1)
生回路と、各段ごとに設けられ、上記基準パルス
列を分周して任意のパルス間隔の試験パルス列を
出力するパルス間隔設定回路、上記基準パルス列
をカウントして任意の試験パルス出力時間を設定
する出力時間設定回路、前段の出力時間終了に応
じて次段の試験パルス列の発生を開始させるロジ
ツク回路、上記試験パルス列を上記出力時間だけ
パルス出力回路に入力するロジツク回路、および
全体の試験パルス出力時間の終了に応じて上記出
力時間設定回路をリセツトするリセツト回路から
成る各段ごとの試験パルス発生回路と、上記各段
の出力する試験パルス列を上記各ロジツク回路を
介して順次入力し、上記各段ごとの試験パルス列
を上記各設定時間ずつ順次出力するパルス出力回
路を備えたことを特徴とする試験パルス発生装
置。 A pulse generation circuit that generates a reference pulse train of a constant frequency, a pulse interval setting circuit provided in each stage that divides the frequency of the reference pulse train and outputs a test pulse train of an arbitrary pulse interval, and a pulse interval setting circuit that counts the reference pulse train. An output time setting circuit that sets an arbitrary test pulse output time, a logic circuit that starts generating the next stage test pulse train when the output time of the previous stage ends, and a logic circuit that inputs the test pulse train to the pulse output circuit for the above output time. A test pulse generation circuit for each stage consists of a reset circuit that resets the output time setting circuit according to the end of the entire test pulse output time, and a test pulse train output from each stage is connected to each of the logic circuits. 1. A test pulse generator comprising: a pulse output circuit that sequentially inputs the test pulse train for each stage and sequentially outputs the test pulse train for each set time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14703382U JPS5952410U (en) | 1982-09-30 | 1982-09-30 | Test pulse generator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14703382U JPS5952410U (en) | 1982-09-30 | 1982-09-30 | Test pulse generator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5952410U JPS5952410U (en) | 1984-04-06 |
| JPH037777Y2 true JPH037777Y2 (en) | 1991-02-26 |
Family
ID=30327092
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14703382U Granted JPS5952410U (en) | 1982-09-30 | 1982-09-30 | Test pulse generator |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5952410U (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6134101B2 (en) * | 2012-03-14 | 2017-05-24 | 東芝三菱電機産業システム株式会社 | Partial discharge measurement system and partial discharge measurement method using repetitive impulse voltage |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5313941A (en) * | 1976-07-23 | 1978-02-08 | Chino Works Ltd | Data collecting device |
| JPS5412555A (en) * | 1977-06-29 | 1979-01-30 | Takeda Riken Ind Co Ltd | Waveform generator |
-
1982
- 1982-09-30 JP JP14703382U patent/JPS5952410U/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5313941A (en) * | 1976-07-23 | 1978-02-08 | Chino Works Ltd | Data collecting device |
| JPS5412555A (en) * | 1977-06-29 | 1979-01-30 | Takeda Riken Ind Co Ltd | Waveform generator |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5952410U (en) | 1984-04-06 |
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