JPH0376412B2 - - Google Patents

Info

Publication number
JPH0376412B2
JPH0376412B2 JP58045149A JP4514983A JPH0376412B2 JP H0376412 B2 JPH0376412 B2 JP H0376412B2 JP 58045149 A JP58045149 A JP 58045149A JP 4514983 A JP4514983 A JP 4514983A JP H0376412 B2 JPH0376412 B2 JP H0376412B2
Authority
JP
Japan
Prior art keywords
temperature
mirror surface
output
frost
dew point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58045149A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59170754A (ja
Inventor
Sakae Fukuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TOKYO HIKARI DENSHI KOGYO KK
Original Assignee
TOKYO HIKARI DENSHI KOGYO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TOKYO HIKARI DENSHI KOGYO KK filed Critical TOKYO HIKARI DENSHI KOGYO KK
Priority to JP4514983A priority Critical patent/JPS59170754A/ja
Publication of JPS59170754A publication Critical patent/JPS59170754A/ja
Publication of JPH0376412B2 publication Critical patent/JPH0376412B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/56—Investigating or analyzing materials by the use of thermal means by investigating moisture content
    • G01N25/66—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
    • G01N25/68—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
JP4514983A 1983-03-16 1983-03-16 露点計 Granted JPS59170754A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4514983A JPS59170754A (ja) 1983-03-16 1983-03-16 露点計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4514983A JPS59170754A (ja) 1983-03-16 1983-03-16 露点計

Publications (2)

Publication Number Publication Date
JPS59170754A JPS59170754A (ja) 1984-09-27
JPH0376412B2 true JPH0376412B2 (enrdf_load_stackoverflow) 1991-12-05

Family

ID=12711220

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4514983A Granted JPS59170754A (ja) 1983-03-16 1983-03-16 露点計

Country Status (1)

Country Link
JP (1) JPS59170754A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7736051B2 (en) 2004-03-30 2010-06-15 Yamatake Corporation Thermoelectric device and mirror surface state detection device
JP2012177553A (ja) * 2011-02-25 2012-09-13 Hioki Ee Corp 鏡面冷却式露点計

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4345455A (en) * 1980-03-28 1982-08-24 Eg&G, Inc. Dew point hygrometer with continuous balancing system
JPS625642Y2 (enrdf_load_stackoverflow) * 1980-12-15 1987-02-09
JPS57108144U (enrdf_load_stackoverflow) * 1980-12-25 1982-07-03

Also Published As

Publication number Publication date
JPS59170754A (ja) 1984-09-27

Similar Documents

Publication Publication Date Title
US4276768A (en) Relates to apparatus for measuring the dew point
US6184511B1 (en) Photoelectric conversion apparatus
JPH0376412B2 (enrdf_load_stackoverflow)
JP3049469B2 (ja) レーザ出力検出装置
JPS6039788Y2 (ja) 放射温度計
JPS63286729A (ja) サ−モパイル検出装置
US4605852A (en) Condensation prevention apparatus
JPS58113839A (ja) 露点検出装置
JPS5847654B2 (ja) ハンノウコンゴウブツノ キユウコウドオ ソクテイスルソツコウホウホウオヨビ ソウチ
JPH01235390A (ja) 半導体レーザの温度制御方式
JPH02196933A (ja) 赤外線検知装置
US3967904A (en) Precision radiation source regulation circuit
Harmer et al. An infra-red radiation pyrometer
JP3656877B2 (ja) 放射温度計
CN113092974B (zh) Igbt模块内部芯片结温测量系统、测量方法及igbt模块
CA1073976A (en) Dewpointmeters
JP3210222B2 (ja) 温度測定装置
JPH04113234A (ja) 屋外赤外放射測定方法及びその放射計
JPH08278203A (ja) 赤外線放射温度計
JPH051991B2 (enrdf_load_stackoverflow)
SU1032388A1 (ru) Автоматический конденсационный гигрометр
JPS5942669Y2 (ja) 光源用ランプの輝度特性補償回路
JPS6242364Y2 (enrdf_load_stackoverflow)
JPH11128179A (ja) 放射温度計
JPH11281483A (ja) 放射温度検出素子