JPH0369042B2 - - Google Patents

Info

Publication number
JPH0369042B2
JPH0369042B2 JP58081575A JP8157583A JPH0369042B2 JP H0369042 B2 JPH0369042 B2 JP H0369042B2 JP 58081575 A JP58081575 A JP 58081575A JP 8157583 A JP8157583 A JP 8157583A JP H0369042 B2 JPH0369042 B2 JP H0369042B2
Authority
JP
Japan
Prior art keywords
light
outputs
sample
electrodes
hold
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58081575A
Other languages
Japanese (ja)
Other versions
JPS59204785A (en
Inventor
Takashi Ito
Sumihiro Ueda
Masaaki Hirayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kawasaki Heavy Industries Ltd
Original Assignee
Kawasaki Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Heavy Industries Ltd filed Critical Kawasaki Heavy Industries Ltd
Priority to JP58081575A priority Critical patent/JPS59204785A/en
Publication of JPS59204785A publication Critical patent/JPS59204785A/en
Publication of JPH0369042B2 publication Critical patent/JPH0369042B2/ja
Granted legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00Prospecting or detecting by optical means
    • G01V8/10Detecting, e.g. by using light barriers
    • G01V8/20Detecting, e.g. by using light barriers using multiple transmitters or receivers

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  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Optical Radar Systems And Details Thereof (AREA)

Description

【発明の詳細な説明】 本発明は、発光手段からの直接光、または発光
手段からの光を対象物に反射して得られる反射光
を受光して検出する光学的検出装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical detection device that receives and detects direct light from a light emitting device or reflected light obtained by reflecting light from a light emitting device onto an object.

このような光学的検出は、対象物の表面位置を
検出したりするために必要となる。従来では、外
乱光の悪影響を減少するために光学的フイルタを
受光手段の前に設けているけれども、外乱光に対
する確実な対策とはなつていない。また他の先行
技術は、発光手段から光を変調して発射している
けれども、このような先行技術では、発光手段に
おける検出回路が複雑となり、しかも検出時間が
長い。
Such optical detection is necessary for detecting the surface position of an object. Conventionally, an optical filter is provided in front of the light receiving means in order to reduce the adverse effects of ambient light, but this is not a reliable measure against ambient light. In other prior art, light is modulated and emitted from the light emitting means, but in such prior art, the detection circuit in the light emitting means is complicated and the detection time is long.

本発明の目的は、外乱光による悪影響を防ぎ、
しかも検出に要する時間が短くてすむ光学的検出
装置を提供することである。
The purpose of the present invention is to prevent the harmful effects of ambient light,
Moreover, it is an object of the present invention to provide an optical detection device that requires less time for detection.

本発明は、対象物42に光を照射する発光手段
15と、 対象物42の反射光41を受光する受光手段1
であつて、半導体素子内に第1の一対の対向する
間隔をあけて設けられている電極2,3と、第1
の電極2,3と直交する第2の一対の対向する間
隔をあけて設けられる電極4,5とを有し、受光
する光量に対応した電流を導出する受光手段1
と、 受光手段1の各電極2,3;4,5からの出力
を保持するサンプルホールド手段51,52,5
3,54と、 発光手段15を点灯および消灯し、点灯直前の
第1の各電極2,3の出力を保持しているサンプ
ルホールド手段51,52の出力をX1n,X2nと
し、点灯直前の第2の各電極4,5の出力を保持
しているサンプルホールド手段53,54の出力
をY1n,Y2nとし、 点灯時の第1の各電極2,3の出力を保持して
いるサンプルホールド手段51,52の出力を
X^1n,X^2nとし、点灯時の第2の各電極4,5の
出力を保持しているサンプルホールド手段53,
54の出力をY^1n,Y^2nとし、 さらに消灯直後の第1の各電極2,3の出力を
保持しているサンプルホールド手段51,52の
出力をX〓1n,X〓2nとし、消灯直後の第2の各電極
4,5の出力を保持しているサンプルホールド手
段53,54の出力をY〓1n,Y〓2nとするとき、 ΔX1n=X^1n−X〓1n+X1n/2 ΔX2n=X^2n−X〓2n+X2n/2 ΔY1n=Y^1n−Y〓1n+Y1n/2 ΔX2n=Y^2n−Y〓2n+Y2n/2 を演算し2次元座標(Xn,Yn)を、 Xn=ΔX1n−ΔX2n/ΔX1n+ΔX2n Yn=ΔY1n−ΔY2n/ΔY1n+ΔY2n を演算して求める手段50とを含むことを特徴と
する光学的検出装置である。
The present invention includes a light emitting means 15 that irradiates light onto an object 42, and a light receiving means 1 that receives reflected light 41 from the object 42.
a first pair of opposing electrodes 2 and 3 provided in a spaced apart manner within the semiconductor element;
A light receiving means 1 has electrodes 2 and 3 and a second pair of opposing electrodes 4 and 5 provided at a distance, which are orthogonal to each other, and derives a current corresponding to the amount of light to be received.
and sample hold means 51, 52, 5 for holding the output from each electrode 2, 3; 4, 5 of the light receiving means 1.
3, 54, and the outputs of the sample and hold means 51, 52 which turn on and off the light emitting means 15 and hold the outputs of the first electrodes 2, 3 immediately before the lighting are X1n, X2n, The outputs of the sample hold means 53, 54 holding the outputs of the first electrodes 4, 5 are Y1n, Y2n, and the sample hold means 51 holds the outputs of the first electrodes 2, 3 during lighting. ,52 outputs
X^1n, X^2n, a sample hold means 53 which holds the output of each second electrode 4, 5 during lighting;
54 are designated as Y^1n and Y^2n, furthermore, the outputs of the sample and hold means 51 and 52 which hold the outputs of the first electrodes 2 and 3 immediately after the light is turned off are designated as X〓1n and X〓2n, When the outputs of the sample and hold means 53 and 54 holding the outputs of the second electrodes 4 and 5 immediately after the lights are turned off are Y〓1n and Y〓2n, ΔX1n=X^1n−X〓1n+X1n/2 ΔX2n =X^2n−X〓2n+X2n/2 ΔY1n=Y^1n−Y〓1n+Y1n/2 ΔX2n=Y^2n−Y〓2n+Y2n/2 Calculate the two-dimensional coordinates (Xn, Yn), Xn=ΔX1n−ΔX2n /ΔX1n+ΔX2n Yn=ΔY1n−ΔY2n/ΔY1n+ΔY2n.

第1図は、本発明の基礎となる構成のブロツク
図である。受光手段1は、発光手段15からの光
を参照符30で示されるように直接に受光し、あ
るいはまた参照符41で示されるように対象物4
2に反射した光を受光する。発光手段15は、発
光ダイオード等によつて実現される。受光手段1
は、半導体素子内に相互に直交する4個の電極
2,3,4,5が設けられている。電極2,3,
4,5から導出される光電流IX1,IX2,IY1,
IY2は、電流電圧変換回路6,7,8,9によつ
て電圧値に変化されて信号X1,X2,Y1,Y2に
変換される。受光手段1からの光電流Ix1,Ix2,
Iy1,Iy2は、受光する光量に対応したレベル、た
とえば正比例したレベルである。電流電圧変換回
路6,7,8,9からの出力は、サンプルホール
ド回路11,16;12,17;13,18;1
4,19に与えられる。これらのうち、サンプル
ホールド回路11,16からの出力は、演算回路
20に与えられて演算され、また同様にしてサン
プルホールド回路12,17;13,18;1
4,19からの出力は、演算回路21,22,2
3にそれぞれ与えられる。タイミング制御回路1
0は、発光手段15を第2図の参照符W1に示さ
れる期間だけ電力付勢して発光させ、参照符W2
で示される期間だけ消勢し、このように間欠的に
発光手段15が点灯する。第2図において受光手
段1によつて検出される外乱光による電流電圧変
換回路6からの信号X1は、参照符l1で示され
ており、また発光手段15の点灯中における電流
電圧変換回路6からの出力X1は、参照符l2で
示される。
FIG. 1 is a block diagram of the basic structure of the present invention. The light receiving means 1 receives the light from the light emitting means 15 directly, as indicated by the reference numeral 30, or alternatively, as indicated by the reference numeral 41, from the object 4.
2 receives the reflected light. The light emitting means 15 is realized by a light emitting diode or the like. Light receiving means 1
In the semiconductor device, four electrodes 2, 3, 4, and 5 are provided orthogonally to each other. electrodes 2, 3,
Photocurrents IX1, IX2, IY1, derived from 4, 5
IY2 is changed to a voltage value by current-voltage conversion circuits 6, 7, 8, and 9, and is converted into signals X1, X2, Y1, and Y2. Photocurrents Ix1, Ix2, from light receiving means 1
Iy1 and Iy2 are levels corresponding to the amount of light received, for example, levels that are directly proportional. Outputs from the current-voltage conversion circuits 6, 7, 8, 9 are sample-and-hold circuits 11, 16; 12, 17; 13, 18;
Given on April 4, 19. Among these, the outputs from the sample and hold circuits 11 and 16 are given to the arithmetic circuit 20 and calculated, and similarly, the outputs from the sample and hold circuits 12, 17;
The outputs from 4 and 19 are sent to arithmetic circuits 21, 22, and 2.
3 are given respectively. Timing control circuit 1
0, the light emitting means 15 is energized to emit light for a period indicated by the reference mark W1 in FIG.
The light emitting means 15 is turned off for a period indicated by , and the light emitting means 15 lights up intermittently in this way. In FIG. 2, a signal X1 from the current-voltage conversion circuit 6 due to the disturbance light detected by the light-receiving means 1 is indicated by reference numeral 11, and a signal X1 from the current-voltage conversion circuit 6 during lighting of the light-emitting means 15 The output X1 of is indicated by reference 12.

タイミング制御回路10は、発光手段15を点
灯する直前における電流電圧変換回路6からの信
号X1n,X2n,Y1n,Y2nをサンプルホールド回
路11,12,13,14に保持する。次に、発
光手段15を期間W1だけ点灯し、このときにお
ける電流電圧変換回路6,7,8,9の出力
X^1n,X^2n,Y^1n,Y^2nをサンプルホールド回路
16,17,18,19にそれぞれ保持する。演
算器20,21,22,23は第1式〜第4式の
演算を行う。
The timing control circuit 10 holds the signals X1n, X2n, Y1n, and Y2n from the current-voltage conversion circuit 6 immediately before lighting the light emitting means 15 in sample and hold circuits 11, 12, 13, and 14. Next, the light emitting means 15 is turned on for a period W1, and the outputs of the current-voltage conversion circuits 6, 7, 8, and 9 at this time are
X^1n, X^2n, Y^1n, and Y^2n are held in sample and hold circuits 16, 17, 18, and 19, respectively. Arithmetic units 20, 21, 22, and 23 calculate the first to fourth equations.

ΔX1n=X^1n−X1n …(1) ΔX2n=X^2n−X2n …(2) ΔY1n=Y^1n−Y1n …(3) ΔY2n=Y^2n−Y2n …(4) 演算器24,25では、光点Aの2次座標
(Xn,Yn)を第5式および第6式に基づいて演
算して求める。
ΔX1n=X^1n−X1n…(1) ΔX2n=X^2n−X2n…(2) ΔY1n=Y^1n−Y1n…(3) ΔY2n=Y^2n−Y2n…(4) In the computing units 24 and 25 , the quadratic coordinates (Xn, Yn) of the light spot A are calculated based on the fifth and sixth equations.

Xn=ΔX1n−ΔX2n/ΔX1n+ΔX2n …(5) Yn=ΔY1n−ΔY2n/ΔY1n+ΔY2n …(6) タイミング制御回路10はサンプルホールド回
路26,27を動作させ、これによつてサンプリ
ング中において不安定である値Xn,Ynが整定し
たのち、それらの値Xn,Ynを保持して導出す
る。
Xn = ΔX1n - ΔX2n / ΔX1n + ΔX2n (5) Yn = ΔY1n - ΔY2n / ΔY1n + ΔY2n (6) The timing control circuit 10 operates the sample and hold circuits 26 and 27, thereby controlling the value Xn that is unstable during sampling. , Yn are stabilized, these values Xn and Yn are held and derived.

上述の構成ではサンプル値X1n,X2n,Y1n,
Y2nは、発光手段15が点灯する直前の値であつ
たけれども、本発明の他の基礎となる構成として
発光手段15の点灯直後においてサンプルされて
もよい。
In the above configuration, the sample values X1n, X2n, Y1n,
Although Y2n was the value immediately before the light emitting means 15 was turned on, it may be sampled immediately after the light emitting means 15 is turned on as another basic structure of the present invention.

第3図は、本発明の一実施例のブロツク図であ
る。この実施例は、前述の構成に類似し、対応す
る部分には同一の参照符を付す。受光手段1の電
極2,3,4,5からの出力は、電流電圧変換回
路6,7,8,9によつて電圧値に変換され、サ
ンプルホールド回路51,52,53,54にそ
れぞれ与えられてサンプルホールドされる。サン
プルホールド回路51,52,53,54からの
出力は、マルチプレクサ55によつて選択的にか
つ順次的に切換えられ、アナログデジタル変換器
56によつてデジタル値に変換されたのち、マイ
クロコンピユータなどによつて実現される処理回
路50に与えられる。処理回路50は、サンプル
ホールド回路51,52,53,54を制御する
とともに、マルチプレクサ55の動作を制御し、
またアナログデジタル変換器56を制御する。駆
動回路57は、処理回路50からの出力に応答し
て発光手段15を間欠的に駆動する。
FIG. 3 is a block diagram of one embodiment of the present invention. This embodiment is similar to the previously described configuration, and corresponding parts are provided with the same reference numerals. The outputs from the electrodes 2, 3, 4, and 5 of the light receiving means 1 are converted into voltage values by current-voltage conversion circuits 6, 7, 8, and 9, and are applied to sample and hold circuits 51, 52, 53, and 54, respectively. sample and hold. The outputs from the sample and hold circuits 51, 52, 53, and 54 are selectively and sequentially switched by a multiplexer 55, converted to digital values by an analog-to-digital converter 56, and then sent to a microcomputer or the like. A processing circuit 50 is thus implemented. The processing circuit 50 controls the sample and hold circuits 51, 52, 53, and 54, and also controls the operation of the multiplexer 55.
It also controls the analog-to-digital converter 56. The drive circuit 57 intermittently drives the light emitting means 15 in response to the output from the processing circuit 50.

第4図を参照して動作を説明する。ステツプ
m1からステツプm2に移り、発光手段15の点灯
直前における受光手段1の出力に対応した電流電
圧変換器6,7,8,9の出力X1n,X2n,
Y1n,Y2n(第5図参照)をサンプルホールド回
路51,52,53,54によつてサンプルホー
ルドし、処理回路50に取込む。これらの値X1,
X2,Y1,Y2は、外乱光による信号レベルであ
り、その値が受光手段1の飽和光量であるかが判
断される。飽和光量でないときには、ステツプ
m4に移り発光手段15が点灯される。ステツプ
m5では、この発光手段15の点灯時における直
接光30または反射光41を受光し、電流電圧変
換回路6,7,8,9からはサンプル値X^1n,
X^2n,Y^1n,Y^2nをサンプルしてホールドし、処
理回路50に入力する。その後、ステツプm6で
は発光手段15を消灯する。ステツプm7ではサ
ンプル値X^1n,X^2n,Y^1n,Y^2nが受光手段1の
飽和光量未満であるかを判断し、そうであればス
テツプm8に移る。ステツプm8では、発光手段1
5の消灯直後における電流電圧変換回路6,7,
8,9からの出力のサンプル値X〓1n,X〓2n,
Y〓1n,Y〓2nをサンプルして処理回路52に入力す
る。ステツプm9ではこの値X〓1n,X〓2n,Y〓1n,
Y〓2nが受光手段1の飽和光量未満であるかを判断
し、そうであればステツプm10に移る。ステツプ
m10では、第7式〜第10式の演算を行つて値
ΔX1n,ΔX2n,ΔY1n,ΔY2nを求める。
The operation will be explained with reference to FIG. step
Moving from m1 to step m2, outputs X1n,
Y1n and Y2n (see FIG. 5) are sampled and held by sample and hold circuits 51, 52, 53, and 54, and taken into the processing circuit 50. These values X1,
X2, Y1, and Y2 are signal levels due to disturbance light, and it is determined whether the values are the saturated light amount of the light receiving means 1. When the amount of light is not saturated, the step
Moving to m4, the light emitting means 15 is turned on. step
m5 receives direct light 30 or reflected light 41 when the light emitting means 15 is turned on, and receives sample values X^1n,
X^2n, Y^1n, and Y^2n are sampled and held and input to the processing circuit 50. Thereafter, in step m6, the light emitting means 15 is turned off. In step m7, it is determined whether the sample values X^1n, X^2n, Y^1n, Y^2n are less than the saturation light amount of the light receiving means 1, and if so, the process moves to step m8. In step m8, the light emitting means 1
Current-voltage conversion circuits 6, 7, immediately after turning off the light of 5
Sample value of output from 8, 9 X〓1n, X〓2n,
Y〓1n and Y〓2n are sampled and input to the processing circuit 52. At step m9, these values X〓1n, X〓2n, Y〓1n,
It is determined whether Y〓2n is less than the saturated light amount of the light receiving means 1, and if so, the process moves to step m10. step
In m10, the values ΔX1n, ΔX2n, ΔY1n, and ΔY2n are obtained by calculating equations 7 to 10.

ΔX1n=X^1n−X〓1n+X1n/2 …(7) ΔX2n=X^2n−X〓2n+X2n/2 …(8) ΔY1n=Y^1n−Y〓1n+Y1n/2 …(9) ΔY2n=Y^2n−Y〓2n+Y2n/2 …(10) これらの第7式〜第10式の第2項目の値は、発
光手段15の点灯直前と直後の値の平均値であ
り、これによつて発光手段15の消灯時と点灯時
における受光手段1によるサンプル値ΔX1nを正
確に求めることができる。
ΔX1n=X^1n−X〓1n+X1n/2 …(7) ΔX2n=X^2n−X〓2n+X2n/2 …(8) ΔY1n=Y^1n−Y〓1n+Y1n/2 …(9) ΔY2n=Y^2n -Y〓2n+Y2n/2...(10) The value of the second item in these equations 7 to 10 is the average value of the values immediately before and after the lighting of the light emitting means 15. The sample value ΔX1n by the light receiving means 1 when the light is turned off and when the light is turned on can be accurately determined.

第7式〜第10式の値ΔX1n,ΔX2n,ΔY1n,
ΔY2nの値に基づいてステツプm11では第11式お
よび第12式を演算し、これによつて光点A(Xn,
Yn)を算出し、ステツプm10においてその値を
導出する。
Values of formulas 7 to 10 ΔX1n, ΔX2n, ΔY1n,
Based on the value of ΔY2n, in step m11, equations 11 and 12 are calculated, and the light point A(Xn,
Yn) is calculated and its value is derived in step m10.

Xn=ΔX1n−ΔX2n/ΔX1n+ΔX2n …(11) Xn=ΔY1n−ΔY2n/ΔY1n+ΔY2n …(12) ステツプm13において演算動作が終了したこと
が判断されると、ステツプm14において終了動作
を行う。
Xn = ΔX1n - ΔX2n / ΔX1n + ΔX2n (11) Xn = ΔY1n - ΔY2n / ΔY1n + ΔY2n (12) When it is determined in step m13 that the arithmetic operation has been completed, a termination operation is performed in step m14.

ステツプm3,m7,m9において受光手段1に
よつて受光される光量が飽和光量以上であるとき
には、ステツプm15に移り、そのサンプル値が異
常であめと判断し、ステツプm2に戻る。
If the amount of light received by the light receiving means 1 is equal to or greater than the saturated amount of light at steps m3, m7, and m9, the process moves to step m15, where it is determined that the sample value is abnormal and the process returns to step m2.

以上のように、本発明によれば、対象物42の
位置を、単一の受光手段1上の座標(Xn,Yn)
として2次元的にかつ短時間で検出することがで
きる。座標の演算は、各電極2,3;4,5から
の出力に関して、発光手段15の点灯直前のサン
プル値X1n,X2n;Y1n,Y2nおよび点灯直後の
サンプル値X〓1n,X〓2n;Y〓1n,Y〓2nの平均値と、
点灯中のサンプル値X^1n,X^2n;Y^1n,Y^2nとの
差によつて行うようにしたので、外乱光による悪
影響を防止することができる。
As described above, according to the present invention, the position of the object 42 can be determined by the coordinates (Xn, Yn) on the single light receiving means 1.
can be detected two-dimensionally and in a short time. The calculation of the coordinates is performed using the sample values X1n, X2n; Y1n, Y2n immediately before the light emitting means 15 turns on, and the sample values X〓1n, X〓2n; The average value of 〓1n, Y〓2n,
Since this is done based on the difference between the sample values X^1n, X^2n; Y^1n, Y^2n during lighting, it is possible to prevent the adverse effects of ambient light.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の基礎となる構成のブロツク
図、第2図は第1図の動作を説明するための波形
図、第3図は本発明の一実施例のブロツク図、第
4図は第3図の実施例の動作を説明するためのフ
ローチヤート、第5図は第3図および第4図に示
された実施例の動作を説明するための波形図であ
る。 1…受光手段、2,3,4,5…電極、6,
7,8,9…電流電圧変換回路、10…タイミン
グ制御回路、11〜14,16〜19,26,2
7,51〜54…サンプルホールド回路、15…
発光手段、20,21,22,23…減算器、2
4,25…演算回路、50…処理回路、55…マ
ルチプレクサ、56…アナログデジタル変換器、
57…駆動回路。
FIG. 1 is a block diagram of the basic configuration of the present invention, FIG. 2 is a waveform diagram for explaining the operation of FIG. 1, FIG. 3 is a block diagram of an embodiment of the present invention, and FIG. FIG. 5 is a flow chart for explaining the operation of the embodiment shown in FIG. 3, and FIG. 5 is a waveform diagram for explaining the operation of the embodiment shown in FIGS. 3 and 4. 1... Light receiving means, 2, 3, 4, 5... Electrode, 6,
7, 8, 9... Current voltage conversion circuit, 10... Timing control circuit, 11-14, 16-19, 26, 2
7, 51-54...sample hold circuit, 15...
Light emitting means, 20, 21, 22, 23...subtractor, 2
4, 25... Arithmetic circuit, 50... Processing circuit, 55... Multiplexer, 56... Analog-digital converter,
57...Drive circuit.

Claims (1)

【特許請求の範囲】 1 対象物42に光を照射する発光手段15と、 対象物42の反射光41を受光する受光手段1
であつて、半導体素子内に第1の一対の対向する
間隔をあけて設けられている電極2,3と、第1
の電極2,3と直交する第2の一対の対向する間
隔をあけて設けられる電極4,5とを有し、受光
する光量に対応した電流を導出する受光手段1
と、 受光手段1の各電極2,3;4,5からの出力
を保持するサンプルホールド手段51,52,5
3,54と、 発光手段15を点灯および消灯し、点灯直前の
第1の各電極2,3の出力を保持しているサンプ
ルホールド手段51,52の出力をX1n,X2nと
し、点灯直前の第2の各電極4,5の出力を保持
しているサンプルホールド手段53,54の出力
をY1n,Y2nとし、 点灯時の第1の各電極2,3の出力を保持して
いるサンプルホールド手段51,52の出力を
X^1n,X^2nとし、点灯時の第2の各電極4,5の
出力を保持しているサンプルホールド手段53,
54の出力をY^1n,Y^2nとし、 さらに消灯直後の第1の各電極2,3の出力を
保持しているサンプルホールド手段51,52の
出力をX〓1n,X〓2nとし、消灯直後の第2の各電極
4,5の出力を保持しているサンプルホールド手
段53,54の出力をY〓1n,X〓2nとするとき、 ΔX1n=X^1n−X〓1n+X1n/2 ΔX2n=X^2n−X〓2n+X2n/2 ΔY1n=Y^1n−Y〓1n+Y1n/2 ΔX2n=Y^2n−Y〓2n+Y2n/2 を演算し2次元座標(Xn,Yn)を、 Xn=ΔX1n−ΔX2n/ΔX1n+ΔX2n Yn=ΔY1n−ΔY2n/ΔY1n+ΔY2n を演算して求める手段50とを含むことを特徴と
する光学的検出装置。
[Claims] 1. Light emitting means 15 for irradiating light onto the object 42, and light receiving means 1 for receiving reflected light 41 from the object 42.
a first pair of opposing electrodes 2 and 3 provided in a spaced apart manner within the semiconductor element;
A light receiving means 1 has electrodes 2 and 3 and a second pair of opposing electrodes 4 and 5 provided at a distance, which are orthogonal to each other, and derives a current corresponding to the amount of light to be received.
and sample hold means 51, 52, 5 for holding the output from each electrode 2, 3; 4, 5 of the light receiving means 1.
3, 54, and the outputs of the sample and hold means 51, 52 which turn on and off the light emitting means 15 and hold the outputs of the first electrodes 2, 3 immediately before the lighting are X1n, X2n, The outputs of the sample hold means 53, 54 holding the outputs of the first electrodes 4, 5 are Y1n, Y2n, and the sample hold means 51 holds the outputs of the first electrodes 2, 3 during lighting. ,52 outputs
X^1n, X^2n, a sample hold means 53 which holds the output of each second electrode 4, 5 during lighting;
54 are designated as Y^1n and Y^2n, furthermore, the outputs of the sample and hold means 51 and 52 which hold the outputs of the first electrodes 2 and 3 immediately after the light is turned off are designated as X〓1n and X〓2n, When the outputs of the sample and hold means 53 and 54 that hold the outputs of the second electrodes 4 and 5 immediately after the lights are turned off are Y〓1n and X〓2n, ΔX1n=X^1n−X〓1n+X1n/2 ΔX2n =X^2n−X〓2n+X2n/2 ΔY1n=Y^1n−Y〓1n+Y1n/2 ΔX2n=Y^2n−Y〓2n+Y2n/2 Calculate the two-dimensional coordinates (Xn, Yn), Xn=ΔX1n−ΔX2n /ΔX1n+ΔX2n Yn=ΔY1n−ΔY2n/ΔY1n+ΔY2n.
JP58081575A 1983-05-09 1983-05-09 Optical detection Granted JPS59204785A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58081575A JPS59204785A (en) 1983-05-09 1983-05-09 Optical detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58081575A JPS59204785A (en) 1983-05-09 1983-05-09 Optical detection

Publications (2)

Publication Number Publication Date
JPS59204785A JPS59204785A (en) 1984-11-20
JPH0369042B2 true JPH0369042B2 (en) 1991-10-30

Family

ID=13750100

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58081575A Granted JPS59204785A (en) 1983-05-09 1983-05-09 Optical detection

Country Status (1)

Country Link
JP (1) JPS59204785A (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62245110A (en) * 1986-04-16 1987-10-26 Anritsu Corp Displacement measuring apparatus
JPS6347479A (en) * 1986-08-18 1988-02-29 五反田 基博 Magnetic key
JPS6395380A (en) * 1986-10-09 1988-04-26 Ohkura Electric Co Ltd Detector for recording paper and recording paper holder
JPS63128220A (en) * 1986-11-18 1988-05-31 Koito Ind Co Ltd Arithmetic circuit for distance measuring instrument
JPS6396464U (en) * 1986-12-15 1988-06-22
JPS6466510A (en) * 1987-09-07 1989-03-13 Matsushita Electric Ind Co Ltd Distance measuring apparatus
JPH074622Y2 (en) * 1987-11-13 1995-02-01 三洋電機株式会社 Object passage detector
JPH0189384U (en) * 1987-12-02 1989-06-13
JPH02306108A (en) * 1989-05-19 1990-12-19 Hamamatsu Photonics Kk Recognizing apparatus for three-dimensional position
JPH02306109A (en) * 1989-05-19 1990-12-19 Hamamatsu Photonics Kk Recognizing apparatus for three-dimensional position

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54121164A (en) * 1978-03-10 1979-09-20 Minolta Camera Co Ltd Photometric circuit of distance detector
JPS54148551A (en) * 1978-05-15 1979-11-20 Ricoh Co Ltd Photo detecting system
JPS5714704A (en) * 1980-07-01 1982-01-26 Rikagaku Kenkyusho Signal processing system for semiconductor position detecting sensor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54121164A (en) * 1978-03-10 1979-09-20 Minolta Camera Co Ltd Photometric circuit of distance detector
JPS54148551A (en) * 1978-05-15 1979-11-20 Ricoh Co Ltd Photo detecting system
JPS5714704A (en) * 1980-07-01 1982-01-26 Rikagaku Kenkyusho Signal processing system for semiconductor position detecting sensor

Also Published As

Publication number Publication date
JPS59204785A (en) 1984-11-20

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