JPH0364816B2 - - Google Patents

Info

Publication number
JPH0364816B2
JPH0364816B2 JP24078186A JP24078186A JPH0364816B2 JP H0364816 B2 JPH0364816 B2 JP H0364816B2 JP 24078186 A JP24078186 A JP 24078186A JP 24078186 A JP24078186 A JP 24078186A JP H0364816 B2 JPH0364816 B2 JP H0364816B2
Authority
JP
Japan
Prior art keywords
light
preform
refractive index
lens
order diffraction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP24078186A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6395336A (ja
Inventor
Hajime Kishi
Ryozo Yamauchi
Takeru Fukuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujikura Ltd
Original Assignee
Fujikura Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujikura Ltd filed Critical Fujikura Ltd
Priority to JP24078186A priority Critical patent/JPS6395336A/ja
Publication of JPS6395336A publication Critical patent/JPS6395336A/ja
Publication of JPH0364816B2 publication Critical patent/JPH0364816B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/412—Index profiling of optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Light Guides In General And Applications Therefor (AREA)
JP24078186A 1986-10-10 1986-10-10 屈折率分布の測定方法 Granted JPS6395336A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24078186A JPS6395336A (ja) 1986-10-10 1986-10-10 屈折率分布の測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24078186A JPS6395336A (ja) 1986-10-10 1986-10-10 屈折率分布の測定方法

Publications (2)

Publication Number Publication Date
JPS6395336A JPS6395336A (ja) 1988-04-26
JPH0364816B2 true JPH0364816B2 (fr) 1991-10-08

Family

ID=17064608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24078186A Granted JPS6395336A (ja) 1986-10-10 1986-10-10 屈折率分布の測定方法

Country Status (1)

Country Link
JP (1) JPS6395336A (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5365329A (en) * 1988-11-15 1994-11-15 York Technology Limited Apparatus and method for measuring refractive index
GB8826643D0 (en) * 1988-11-15 1988-12-21 York Technology Ltd Measurement of refractive index
JP2661001B2 (ja) * 1989-04-17 1997-10-08 理化学研究所 屈折率分布の測定方法及び測定装置
JPH07109381B2 (ja) * 1989-04-17 1995-11-22 理化学研究所 屈折率分布測定装置
US5078488A (en) * 1989-04-17 1992-01-07 Rikagaku Kenkyusho Method and apparatus for determining refractive index distribution
JPH07117476B2 (ja) * 1989-05-24 1995-12-18 信越化学工業株式会社 屈折率分布の測定方法及び測定装置
JPH0812130B2 (ja) * 1989-05-24 1996-02-07 信越化学工業株式会社 屈折率分布の測定方法及び測定装置
JP3735063B2 (ja) * 2001-12-13 2006-01-11 古河電気工業株式会社 光ファイバ母材の屈折率測定方法
KR20030097242A (ko) * 2002-06-20 2003-12-31 학교법인 한양학원 광굴절재료의 이득계수 측정장치
CN102494639B (zh) * 2011-10-18 2013-11-13 北京理工大学 基于全自动套孔法激光发散角的测量装置及测量方法

Also Published As

Publication number Publication date
JPS6395336A (ja) 1988-04-26

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