JPH0358441A - Tape-shaped lead - Google Patents

Tape-shaped lead

Info

Publication number
JPH0358441A
JPH0358441A JP19345189A JP19345189A JPH0358441A JP H0358441 A JPH0358441 A JP H0358441A JP 19345189 A JP19345189 A JP 19345189A JP 19345189 A JP19345189 A JP 19345189A JP H0358441 A JPH0358441 A JP H0358441A
Authority
JP
Japan
Prior art keywords
leads
lead
insulating substrate
substrates
supported
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19345189A
Other languages
Japanese (ja)
Inventor
Toshio Morita
森田 寿夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP19345189A priority Critical patent/JPH0358441A/en
Publication of JPH0358441A publication Critical patent/JPH0358441A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent the deformation of leads even in the case where the width between the leads and the interval between the adjacent leads are made narrow and to make it possible to connect reliably a semiconductor element with the leads by a method wherein the inner connecting lead parts, which are made to protrude in the opening part of an insulating substrate and are arranged in the opening part, of the leads are supported by auxiliary insulating substrates. CONSTITUTION:Each thin film lead 2 is constituted of an inner connecting lead part 3, an outer connecting lead part 4 and a pad part 5 for measurement use and the lead parts 3 are made to project in an opening part 1a provided in an insulating substrate 1. On the other hand, the substrate 1 has auxiliary insulating substrates 6 formed into the form of a square frame in the interior of the opening part 1a and these substrates 6 are connected to the lead parts 3 and the parts 3 are supported by the substrates 6. In such a way, as the lead parts 3 of the leads 2 are supported by the substrates 6, the deformation of the leads is prevented even in the case where the width between the leads and the interval between the adjacent leads are made narrow and the relative positional deviation of a semiconductor element to electrode pads is prevented. Thereby, the connection of the element with the leads can be reliably conducted an the integration of the leads 2 can be further increased.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体集積回路に用いられるテープ状リードに
関する 〔従来の技術〕 従来、この種のテープ状リード、いわゆるTAB (T
ape Autos+ated Bonding)テー
プは、第3図(a)及び(b)にそれぞれ平面図,C−
C線断面図を示すように、wAa基板1に開口部1aを
あけ、この開口部1aに臨んで薄い導電箔で形成した複
数本の薄膜リード2を取着している。これら薄膜リード
2は、前記開口部la内に突出された内部接続リード部
3と、外部接続リード部4と、測定用パッド部5を備え
、前記開口部1aの周囲に配設している。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a tape-shaped lead used in a semiconductor integrated circuit [Prior Art] Conventionally, this type of tape-shaped lead, so-called TAB (T
Ape Autos+ated Bonding) tape is shown in plan view and C-
As shown in the sectional view taken along line C, an opening 1a is formed in the wAa substrate 1, and a plurality of thin film leads 2 made of thin conductive foil are attached facing the opening 1a. These thin film leads 2 include an internal connection lead part 3 protruding into the opening la, an external connection lead part 4, and a measurement pad part 5, and are arranged around the opening la.

そして、前記開口部la内において、内部接続リード部
3に半導体素子(図示せず)を接続し、その上で測定用
パッド部5を利用して通電試験を行い、更に外部接続リ
ード部4において、パッケージ等の外部導出端子等への
接続を行っている。
Then, a semiconductor element (not shown) is connected to the internal connection lead part 3 in the opening la, and then a conduction test is performed using the measurement pad part 5. , connects to external lead-out terminals, etc. of packages, etc.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来のTABテープは、薄膜リード2が薄い導
電箔等で構威され、かつ内部接続リード部3が開口部l
a内に突出された状態にあるため、半導体集積回路の多
ビン化に伴って内部接続リード部3の幅及び隣接リード
との間隔が狭くなると、これらリード部の機械的強度が
低下されて変形され易くなり、半導体素子の電極パッド
との相対位置にずれが生じ、半導体素子の接続が困難に
なるという問題がある. 本発明は内部接続リード部の変形を防止して半導体素子
の接続を確実に行い得るようにしたTABテープを提供
することを目的とする。
In the conventional TAB tape described above, the thin film lead 2 is made of a thin conductive foil or the like, and the internal connection lead part 3 is formed in the opening l.
Since the internal connection lead part 3 is protruded into the inside part 3, as the number of bins increases in semiconductor integrated circuits, the width of the internal connection lead part 3 and the distance between adjacent leads become narrower. This causes a problem in that the relative position of the semiconductor element with the electrode pad becomes misaligned, making it difficult to connect the semiconductor element. SUMMARY OF THE INVENTION An object of the present invention is to provide a TAB tape that prevents deformation of internal connection lead portions and enables reliable connection of semiconductor elements.

[課題を解決するための手段] 本発明のTABテープは、絶縁基板に設けた開口部内に
突出配置した内部接続リード部を、該開口部内に配設し
た補助絶縁基板により支持している。
[Means for Solving the Problems] In the TAB tape of the present invention, an internal connection lead portion protruding from an opening provided in an insulating substrate is supported by an auxiliary insulating substrate disposed within the opening.

〔作用〕[Effect]

上述した構成では、薄膜リードの各内部接続リード部は
補助絶縁基板よって支持されるため、リード幅や隣接リ
ード間隔が狭くされた場合でも、その変形が防止できる
In the above-described configuration, each internal connection lead portion of the thin film lead is supported by the auxiliary insulating substrate, so that deformation can be prevented even if the lead width or the interval between adjacent leads is narrowed.

〔実施例〕〔Example〕

次に、本発明を図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の第1実施例を示しており、同図(a)
は平面図、同図(b)はそのA−A線に沿う縦断面図で
ある。図において、■は絶縁基板、2はこの絶縁基板1
の表面に導電箔等を所要パターンに形威したした薄膜リ
ードである。
FIG. 1 shows a first embodiment of the present invention, and FIG.
is a plan view, and FIG. 3(b) is a longitudinal cross-sectional view taken along the line A-A. In the figure, ■ is an insulating substrate, 2 is this insulating substrate 1
This is a thin film lead with a conductive foil or the like formed into a desired pattern on the surface.

この薄膜リート2は従来と同様に内部接続リード部3,
外部接続リード部4及び測定用パッド部5とで構威され
ており、その内部接続リード部3を前記絶縁基板lに設
けた開口部la内に突出させている。一方、前記絶縁基
板lは、開口部1aの内部に方形枠状をした補助絶縁基
板6を有しており、この補助絶縁基板6を前記内部接続
リート部3に接続支持させている。
This thin film lead 2 has internal connection lead parts 3,
It consists of an external connection lead part 4 and a measurement pad part 5, and the internal connection lead part 3 is made to protrude into an opening la provided in the insulating substrate l. On the other hand, the insulating substrate 1 has a rectangular frame-shaped auxiliary insulating substrate 6 inside the opening 1a, and this auxiliary insulating substrate 6 is connected and supported by the internal connection reat portion 3.

この補助絶縁基板6は、絶縁基板1に薄膜り一ド2を形
威し、その後絶縁基板1に開口部1aを開設する際に、
その一部を残すことで同時に形威することが可能である
This auxiliary insulating substrate 6 is used when forming the thin film adhesive 2 on the insulating substrate 1 and then opening the opening 1a in the insulating substrate 1.
By leaving a part of it, it is possible to make a statement at the same time.

このTABテープでは、薄膜リード2の各内部接続リー
ド部3は補助絶縁基板6によって支持されるため、リー
ド幅や隣接リード間隔が狭くされた場合でも、その変形
が防止され、半導体素子の電極バッドに対する相対位置
ずれが防止される。
In this TAB tape, each internal connection lead part 3 of the thin film lead 2 is supported by the auxiliary insulating substrate 6, so even if the lead width or the interval between adjacent leads is narrowed, deformation is prevented, and the electrode pad of the semiconductor element Relative positional deviation with respect to is prevented.

これにより、半導体素子の接続を確実に行うことができ
、薄膜リードを更に高集積化することが可能となる. 因に、この実施例では従来のTABテープに比較して内
部接続リード部3の間隔を1/2にでき、薄膜リード数
を20%増加させることが実現された。
This makes it possible to reliably connect semiconductor elements and to further increase the integration of thin film leads. Incidentally, in this example, compared to the conventional TAB tape, the interval between the internal connection lead portions 3 can be reduced to 1/2, and the number of thin film leads can be increased by 20%.

第2図は本発明の第2実施例を示しており、同図(a)
は平面図、同図(b)はそのB−BwA断面図である。
FIG. 2 shows a second embodiment of the present invention, and FIG.
is a plan view, and FIG.

なお、第1図と同一部分には同一符号を付してある。Note that the same parts as in FIG. 1 are given the same reference numerals.

この実施例では、補助絶縁基板6Aは単に正方形に構威
し、この補助絶縁基板6Aにおいて薄膜リードの各内部
接続リード部3を支持している。
In this embodiment, the auxiliary insulating substrate 6A has a simple square shape, and each internal connection lead portion 3 of the thin film lead is supported on the auxiliary insulating substrate 6A.

この構成によれば、第l実施例と同様の効果を得ること
ができるとともに、ここでは補助絶縁基板6Aで内部接
続リード部3に接続した半導体素子の表面を覆うことが
できるため、外部からの機械的接触に対して半導体素子
を保護することができる効果が得られる. 〔発明の効果〕 以上説明したように本発明は、絶縁基板の開口部内に突
出配置した内部接続リード部を補助絶縁基板により支持
しているので、各内部接続リード部は補助絶縁基板よっ
て支持され、リード幅や隣接リード間隔が狭くされた場
合でも、その変形が防止でき、半導体素子を確実に接続
することができる効果がある。
According to this configuration, it is possible to obtain the same effect as in the first embodiment, and here, the surface of the semiconductor element connected to the internal connection lead part 3 can be covered with the auxiliary insulating substrate 6A. This has the effect of protecting semiconductor elements from mechanical contact. [Effects of the Invention] As explained above, in the present invention, the internal connection lead portions protruding into the opening of the insulating substrate are supported by the auxiliary insulating substrate, so each internal connection lead portion is supported by the auxiliary insulating substrate. Even if the lead width or the interval between adjacent leads is narrowed, deformation can be prevented and semiconductor elements can be reliably connected.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の第1実施例を示しており、同図(a)
は平面図、同図(b)はそのA−Aiに沿う断面図、第
2図は本発明の第2実施例を示しており、同図(a)は
平面図、同図(b)はそのB−B線に沿う断面図、第3
図は従来のTABテープを示しており、同図(a)は平
面図、同図(b)はそのC−C線に沿う断面図である。 l・・・絶縁基板、1a・・・開口部、2・・・薄膜リ
ード、3・・・内部接続リード部、4・・・外部接続リ
ード部、5・・・測定用パッド部、6,6A・・・補助
絶縁基板。 (b) 第2 図 (b)
FIG. 1 shows a first embodiment of the present invention, and FIG.
is a plan view, FIG. 2(b) is a sectional view taken along the line A-Ai, and FIG. A cross-sectional view along the line B-B, the third
The figures show a conventional TAB tape, where (a) is a plan view and (b) is a cross-sectional view taken along the line CC. l... Insulating substrate, 1a... Opening, 2... Thin film lead, 3... Internal connection lead part, 4... External connection lead part, 5... Measurement pad part, 6, 6A... Auxiliary insulation board. (b) Figure 2 (b)

Claims (1)

【特許請求の範囲】[Claims] 1、絶縁基板上に薄膜リードを形成し、この薄膜リード
の内部接続リード部を前記絶縁基板に設けた開口部内に
突出配置したテープ状リードにおいて、前記開口部内に
補助絶縁基板を配設し、この補助絶縁基板で前記内部接
続リード部を支持したことを特徴とするテープ状リード
1. In a tape-shaped lead in which a thin film lead is formed on an insulating substrate, and an internal connection lead portion of the thin film lead is arranged to protrude into an opening provided in the insulating substrate, an auxiliary insulating substrate is disposed within the opening, A tape-shaped lead characterized in that the internal connection lead portion is supported by the auxiliary insulating substrate.
JP19345189A 1989-07-26 1989-07-26 Tape-shaped lead Pending JPH0358441A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19345189A JPH0358441A (en) 1989-07-26 1989-07-26 Tape-shaped lead

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19345189A JPH0358441A (en) 1989-07-26 1989-07-26 Tape-shaped lead

Publications (1)

Publication Number Publication Date
JPH0358441A true JPH0358441A (en) 1991-03-13

Family

ID=16308217

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19345189A Pending JPH0358441A (en) 1989-07-26 1989-07-26 Tape-shaped lead

Country Status (1)

Country Link
JP (1) JPH0358441A (en)

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