JPH0351854U - - Google Patents

Info

Publication number
JPH0351854U
JPH0351854U JP11283889U JP11283889U JPH0351854U JP H0351854 U JPH0351854 U JP H0351854U JP 11283889 U JP11283889 U JP 11283889U JP 11283889 U JP11283889 U JP 11283889U JP H0351854 U JPH0351854 U JP H0351854U
Authority
JP
Japan
Prior art keywords
metal layer
semiconductor region
formed adjacent
nickel
electrically connected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11283889U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11283889U priority Critical patent/JPH0351854U/ja
Publication of JPH0351854U publication Critical patent/JPH0351854U/ja
Pending legal-status Critical Current

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  • Electrodes Of Semiconductors (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例を示すPn接合ダイオ
ードの断面図、第2図は種々の金属の原子半径と
電気陰性度との関係を示すグラフである。 1……半導体領域、7……多層電極、11……
第1の金属層、12……第2の金属層、13……
第3の金属層、14……第4の金属層。
FIG. 1 is a cross-sectional view of a Pn junction diode showing an embodiment of the present invention, and FIG. 2 is a graph showing the relationship between atomic radius and electronegativity of various metals. 1... Semiconductor region, 7... Multilayer electrode, 11...
First metal layer, 12... Second metal layer, 13...
Third metal layer, 14...Fourth metal layer.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体領域1と、該半導体領域1に隣接して形
成された多層電極7とを有し、前記多層電極7は
、前記半導体領域1に良好に密着する金属から成
りかつ前記半導体領域1に隣接して形成された第
1の金属層11と、ニツケルから成りかつ前記第
1の金属層11に電気的に接続されて形成された
第2の金属層12と、パラジウムから成りかつ前
記第2の金属層12に隣接して形成された第3の
金属層13と、銀から成りかつ前記第3の金属層
13に隣接して形成された第4の金属層14とを
有することを特徴とする多層電極を有する半導体
装置。
It has a semiconductor region 1 and a multilayer electrode 7 formed adjacent to the semiconductor region 1, and the multilayer electrode 7 is made of metal that adheres well to the semiconductor region 1 and is adjacent to the semiconductor region 1. a first metal layer 11 made of nickel and electrically connected to the first metal layer 11; and a second metal layer 12 made of nickel and electrically connected to the first metal layer 11; Multilayer, characterized in that it has a third metal layer 13 formed adjacent to layer 12 and a fourth metal layer 14 made of silver and formed adjacent to said third metal layer 13 A semiconductor device with electrodes.
JP11283889U 1989-09-28 1989-09-28 Pending JPH0351854U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11283889U JPH0351854U (en) 1989-09-28 1989-09-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11283889U JPH0351854U (en) 1989-09-28 1989-09-28

Publications (1)

Publication Number Publication Date
JPH0351854U true JPH0351854U (en) 1991-05-20

Family

ID=31661274

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11283889U Pending JPH0351854U (en) 1989-09-28 1989-09-28

Country Status (1)

Country Link
JP (1) JPH0351854U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6038823A (en) * 1983-08-11 1985-02-28 Nec Corp Semiconductor device
JPS61116847A (en) * 1984-08-31 1986-06-04 テキサス インスツルメンツ インコ−ポレイテツド Back contact construction for semiconductor device and manufacture thereof

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6038823A (en) * 1983-08-11 1985-02-28 Nec Corp Semiconductor device
JPS61116847A (en) * 1984-08-31 1986-06-04 テキサス インスツルメンツ インコ−ポレイテツド Back contact construction for semiconductor device and manufacture thereof

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