JPH0348525Y2 - - Google Patents

Info

Publication number
JPH0348525Y2
JPH0348525Y2 JP8336685U JP8336685U JPH0348525Y2 JP H0348525 Y2 JPH0348525 Y2 JP H0348525Y2 JP 8336685 U JP8336685 U JP 8336685U JP 8336685 U JP8336685 U JP 8336685U JP H0348525 Y2 JPH0348525 Y2 JP H0348525Y2
Authority
JP
Japan
Prior art keywords
screen
light
inspected
defect inspection
line sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8336685U
Other languages
English (en)
Japanese (ja)
Other versions
JPS61199661U (US07709020-20100504-C00041.png
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8336685U priority Critical patent/JPH0348525Y2/ja
Publication of JPS61199661U publication Critical patent/JPS61199661U/ja
Application granted granted Critical
Publication of JPH0348525Y2 publication Critical patent/JPH0348525Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP8336685U 1985-06-04 1985-06-04 Expired JPH0348525Y2 (US07709020-20100504-C00041.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8336685U JPH0348525Y2 (US07709020-20100504-C00041.png) 1985-06-04 1985-06-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8336685U JPH0348525Y2 (US07709020-20100504-C00041.png) 1985-06-04 1985-06-04

Publications (2)

Publication Number Publication Date
JPS61199661U JPS61199661U (US07709020-20100504-C00041.png) 1986-12-13
JPH0348525Y2 true JPH0348525Y2 (US07709020-20100504-C00041.png) 1991-10-16

Family

ID=30631932

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8336685U Expired JPH0348525Y2 (US07709020-20100504-C00041.png) 1985-06-04 1985-06-04

Country Status (1)

Country Link
JP (1) JPH0348525Y2 (US07709020-20100504-C00041.png)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6759869B2 (ja) * 2016-08-31 2020-09-23 株式会社リコー 検査装置

Also Published As

Publication number Publication date
JPS61199661U (US07709020-20100504-C00041.png) 1986-12-13

Similar Documents

Publication Publication Date Title
US4966457A (en) Inspecting apparatus for determining presence and location of foreign particles on reticles or pellicles
US4301363A (en) Alignment device
US6075591A (en) Optical method and apparatus for detecting low frequency defects
US20020018219A1 (en) Method for three-dimensional inspection using patterned light projection
JP2510786B2 (ja) 物体の形状検出方法及びその装置
JPS63765B2 (US07709020-20100504-C00041.png)
JPH0412062B2 (US07709020-20100504-C00041.png)
JPH0348525Y2 (US07709020-20100504-C00041.png)
US4984886A (en) Surface inspection apparatus for objects
US5149982A (en) Foreign particle inspection apparatus
US4592637A (en) Focus detecting device
JP3040131B2 (ja) 球体表面の傷検査装置
JPS5863906A (ja) 顕微鏡用合焦位置検出装置
JPS61112905A (ja) 光応用計測装置
JP2970235B2 (ja) 表面状態検査装置
JPH0643893B2 (ja) 距離測定装置
EP0162973A1 (en) Distance measuring device
JPS61186806A (ja) 透明体の欠点検出装置
JPH03173452A (ja) 面板の欠陥検査装置
JPS60228908A (ja) 表面欠陥検査方法
JPH0334577B2 (US07709020-20100504-C00041.png)
JPS58201005A (ja) 粒径測定装置
JPS6321854B2 (US07709020-20100504-C00041.png)
US20040007659A1 (en) Focus error detection apparatus and method
JPH0731135B2 (ja) びん胴部の欠陥検出装置