JPH0348181A - Divided continuity inspection for printed circuit board - Google Patents
Divided continuity inspection for printed circuit boardInfo
- Publication number
- JPH0348181A JPH0348181A JP1182694A JP18269489A JPH0348181A JP H0348181 A JPH0348181 A JP H0348181A JP 1182694 A JP1182694 A JP 1182694A JP 18269489 A JP18269489 A JP 18269489A JP H0348181 A JPH0348181 A JP H0348181A
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- continuity
- circuit board
- printed circuit
- divided
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 31
- 238000012360 testing method Methods 0.000 claims description 29
- 238000010998 test method Methods 0.000 claims description 5
- 239000000758 substrate Substances 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000004904 shortening Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0266—Marks, test patterns or identification means
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明はプリント基板の導通検査方法に係シ。[Detailed description of the invention] [Industrial application field] The present invention relates to a method for testing continuity of a printed circuit board.
特に導通検査機の検査範囲よシ大きいプリント基板の分
割導通検査法に関する。In particular, it relates to a divided continuity testing method for printed circuit boards that are larger than the testing range of a continuity testing machine.
導通検査機の検査範囲より大きいプリント基板の導通検
査では、従来プリント基板内の各ネット全てを導通検査
できるように複数個に分割し、複数回導通検査を行って
いた。このため、検査が複雑でしかも検査時間を多大に
要した。なお、この種の分割導通検査を目的としたもの
はないが、検査用のスルーホールなどをあらかじめ設け
ているもＯＫは例えば特開昭６１−５７８６４号が挙げ
られる。Conventionally, when testing continuity of a printed circuit board that is larger than the testing range of a continuity testing machine, the printed circuit board is divided into multiple pieces so that all of the nets within the circuit board can be tested for continuity, and the continuity testing is performed multiple times. Therefore, the inspection was complicated and required a lot of time. Although there is no one designed for this type of divided continuity test, for example, Japanese Patent Application Laid-Open No. 61-57864 does have a through-hole for testing.
上記従来技術は、導通検査機の検査範囲より大きいプリ
ント基板の導通検査時に、全ネットが検査できるように
分割し表ければならず、さらにネットの配置によっては
分割数が増加するため検査工数が多大にかかるという問
題があった。In the above conventional technology, when testing the continuity of a printed circuit board that is larger than the testing range of the continuity testing machine, it is necessary to divide the board so that all the nets can be tested, and the number of divisions increases depending on the arrangement of the nets, resulting in an increase in testing man-hours. The problem was that it cost a lot of money.
本発明の目的は、導通検査機の検査範囲より大きいプリ
ント基板の導通検査時間を低減することにある。An object of the present invention is to reduce the time required for continuity testing of a printed circuit board that is larger than the testing range of a continuity testing machine.
上記目的は、導通検査機の検査範囲よシ大きいプリント
基板において、プリントパターン設計段階から分割検査
用のスルーホールを設けることにより、達成される。The above object is achieved by providing through-holes for divided inspection from the printed pattern design stage in a printed circuit board that is larger than the inspection range of the continuity tester.
導通検査機の検査範囲よシ大きいプリント基板に、プリ
ントパターン設計段階で一方の分割領域と他方の分割領
域Ｋまたがるパターン配線の途中に、しかもそれぞれの
分割領域に含まれる位置に検査用のスルーホールを設け
る。そして、導通検査時に導通検査機で検査用スルーホ
ールを含む一方の分割領域を検査する。つぎに、同一の
検査用スルーホールを含む他方の分割領域を検査する。On a printed circuit board that is larger than the inspection range of the continuity tester, a through hole for inspection is installed in the middle of the pattern wiring that spans one divided area and the other divided area K, and at a position that is included in each divided area, at the printed pattern design stage. will be established. Then, during the continuity test, one divided area including the test through hole is tested using a continuity test machine. Next, the other divided area including the same inspection through hole is inspected.
これによ）、二重の分割検査で、一方の分割領域と他方
の分割領域にまたがるパターン配線の導通検査が、検査
用スルーホールを介して可能となるため、分割数が低減
され、導通検査時間を短縮できる。As a result, continuity testing of pattern wiring spanning one divided area and the other divided area can be performed via the inspection through-hole in a double divided inspection, reducing the number of divisions and conducting continuity testing. It can save time.
以下、本発明をＭ１図〜第５図を用いて説明する。 Hereinafter, the present invention will be explained using FIG. M1 to FIG.
第１図は本発明に係るプリント基板の一方の分割領域の
導通検査方法の模式図、第２図は他方の分割領域の導通
検査方法の模式図、第３図は第１図、第２図？合成した
模式図である。FIG. 1 is a schematic diagram of a method for testing continuity of one divided region of a printed circuit board according to the present invention, FIG. 2 is a schematic diagram of a method of testing continuity of the other divided region, and FIG. 3 is a diagram of FIGS. 1 and 2. ? It is a synthesized schematic diagram.
本発明のプリント基板の分割導通検査方法は、第１図に
示すように、プリントパターン設計段階で一方の分割領
域と他方の分割領域の両領域におよぶパターン配線９上
で１）、さらに両領域に含まれる位置に検査用のスルー
ホール４を有する構成としているプリント基板１の一方
の分割領域をまず検査する。このとき、スルーホール２
、検査・用スルーホール４間は導通検査機の検査ピン６
゜７によシ検査される。As shown in FIG. 1, the divided continuity test method for printed circuit boards of the present invention is carried out at the printed pattern design stage by checking 1) on the pattern wiring 9 that covers both one divided area and the other divided area, and then One divided area of the printed circuit board 1, which has a through hole 4 for inspection at a position included in the figure, is first inspected. At this time, through hole 2
, the test pin 6 of the continuity tester is placed between the through holes 4 for inspection.
It is inspected according to ゜7.
つぎに、＃Ｉ２図に示すようＫ、プリント基板１の他方
の分割領域を検査する。このとき、パターン配ａ９上の
スルーホールＳ、検査用スルーホール４間は導通検査機
の検査ピン８，７によ）検査さｎる。Next, as shown in Figure #I2, the other divided area of the printed circuit board 1 is inspected. At this time, the space between the through hole S on the pattern arrangement a9 and the inspection through hole 4 is inspected by the inspection pins 8 and 7 of the continuity tester.
これらの動作を合成すると、第３図に示すように、検査
用スルーホール４を介して二重の分割検査に！ｆｉスル
ーホール２、スルーホール３間の導通検査が可能となる
。When these operations are combined, as shown in Figure 3, a double split inspection is performed through the inspection through-hole 4! It becomes possible to test the continuity between the fi through hole 2 and the through hole 3.
本実施例によれば、スルーホール２、スルーホール３間
の領域を余分に検査する必要がなくなるため、検査時間
短縮の効果がある。According to this embodiment, there is no need to extra inspect the area between the through holes 2 and 3, so there is an effect of shortening the inspection time.
本発明によれば、導通検査機の検査範囲よ）大きいプリ
ント基板の分割導通検−ｉにおいて、分割数を低減でき
るため、検査時間の短縮が可能となる。According to the present invention, it is possible to reduce the number of divisions in the divided continuity test-i of a printed circuit board that is larger than the test range of the continuity tester, and thus the test time can be shortened.
第１図は本発明の一実施例のプリント基板の一方の分割
領域の導通検査方法の説明図、第２図はプリント基板の
他方の分割領域の導通検査方法の説明図、第３図は第１
図、第２図を合成した説明図である。
１・・・プリント基板、２．３・・・スルーホール、４
・・・検査用スルーホール、５・・・導通検査機の検査
範囲、６．７．８・・・検査ピン、９・・・パターン配
線。FIG. 1 is an explanatory diagram of a method for testing continuity of one divided area of a printed circuit board according to an embodiment of the present invention, FIG. 2 is an explanatory diagram of a method of testing continuity of the other divided area of a printed circuit board, and FIG. 1
FIG. 2 is an explanatory diagram that combines FIG. 1... Printed circuit board, 2.3... Through hole, 4
...Through hole for inspection, 5...Inspection range of continuity tester, 6.7.8...Inspection pin, 9...Pattern wiring.
Claims (1)
り、分割して導通検査をおこなう場合に一方の分割した
領域と他方の分割した領域にまたがるパターン配線があ
るプリント基板の導通検査法として、一方の分割した領
域と他方の分割した領域にまたがるパターン配線の途中
であり、しかも各分割領域に含まれる一つの検査用スル
ーホールを設け、検査ピンを当てて検査することを特徴
とするプリント基板の分割導通検査方法。1. The printed circuit board is larger than the inspection range of the continuity tester, and when conducting the continuity test by dividing it, as a continuity test method for the printed circuit board that has pattern wiring that spans one divided area and the other divided area. The printed circuit board is located in the middle of the pattern wiring that spans one divided area and the other divided area, and furthermore, one through hole for inspection included in each divided area is provided, and the printed circuit board is inspected by applying an inspection pin to it. Split continuity test method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1182694A JPH0348181A (en) | 1989-07-17 | 1989-07-17 | Divided continuity inspection for printed circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1182694A JPH0348181A (en) | 1989-07-17 | 1989-07-17 | Divided continuity inspection for printed circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0348181A true JPH0348181A (en) | 1991-03-01 |
Family
ID=16122802
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1182694A Pending JPH0348181A (en) | 1989-07-17 | 1989-07-17 | Divided continuity inspection for printed circuit board |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0348181A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008546991A (en) * | 2005-06-17 | 2008-12-25 | アーテーゲー ルーテル ウント メルツァー ゲーエムベーハー | Method for inspecting a large non-component printed circuit board using a finger tester |
-
1989
- 1989-07-17 JP JP1182694A patent/JPH0348181A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008546991A (en) * | 2005-06-17 | 2008-12-25 | アーテーゲー ルーテル ウント メルツァー ゲーエムベーハー | Method for inspecting a large non-component printed circuit board using a finger tester |
| KR101035244B1 (en) * | 2005-06-17 | 2011-05-18 | 에이티지 루터 엔드 맬저 게엠바하 | Method of testing non-componented large printed circuit boards with a finger tester |
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