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Priority to JP13202283UpriorityCriticalpatent/JPS6040192U/ja
Publication of JPS6040192UpublicationCriticalpatent/JPS6040192U/ja
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Publication of JPH0338698Y2publicationCriticalpatent/JPH0338698Y2/ja
Device and method for the material testing and/or thickness measurements of a test object that contains at least fractions of electrically conductive and ferromagnetic material