JPH0336174B2 - - Google Patents
Info
- Publication number
- JPH0336174B2 JPH0336174B2 JP59018292A JP1829284A JPH0336174B2 JP H0336174 B2 JPH0336174 B2 JP H0336174B2 JP 59018292 A JP59018292 A JP 59018292A JP 1829284 A JP1829284 A JP 1829284A JP H0336174 B2 JPH0336174 B2 JP H0336174B2
- Authority
- JP
- Japan
- Prior art keywords
- pedestal
- specimen
- test piece
- holder
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 claims description 109
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 43
- 238000009863 impact test Methods 0.000 claims description 12
- 238000007654 immersion Methods 0.000 claims description 6
- 230000000087 stabilizing effect Effects 0.000 claims description 6
- 238000000034 method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000013001 point bending Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/30—Investigating strength properties of solid materials by application of mechanical stress by applying a single impulsive force, e.g. by falling weight
Description
【発明の詳細な説明】
本発明は衝撃試験用試験片取付け装置に関す
る。更に詳しくは衝撃試験用試験片を低温あるい
は高温の一定温度に保持した後、正確、迅速かつ
安定に試験片を取付け位置に取付けることを可能
にした装置に関するものである。
金属材料などの靭性を判定する試験法として衝
撃試験がある。その工業的試験法としては、一般
に中央に切欠を入れた３点曲げ衝撃のシヤルピー
衝撃試験法が用いられている。室温においては、
位置ゲージを用いて試験片を正確に試験片支持台
に取付ければよいが、材料の脆性挙動を求めるに
は、種々の温度で衝撃試験を行つて、延性−脆性
遷移温度を求める必要がある。わが国のJISでは
（Ｚ−2242、金属材料衝撃試験法）試験片を支持
台に取付けた時の支持台間の中心と、試験片の中
心とのずれを0.4mm以内、室温以外の温度による
試験の場合には、試験温度に保持する時間を液槽
中では少なくとも10分、気槽中では20分間保持
し、液槽または気槽から取出して衝撃を与えるま
での時間は５秒以内と規定されている。
従来の試験機においては、室温以外の温度にお
ける試験では、位置ゲージによる取付けができな
いので、試験片を案内付の手持ちホルダー上にの
せ所定温度に保持した後、ホルダーを持つて試験
片を支持台上に取付ける方法が行われている。し
かし、この方法では手持ちで手早く取付けなけれ
ばならないので、(1)案内部分のクリアランスを大
きくしなければならないので取付け精度が悪くな
る。(2)ホルダーを取除く時に試験片の位置ずれが
生じ易い。(3)この動作には習熟を必要とする。(4)
ハンマーの下に身体を入れなければ試験片の取付
けを行うことができないので危険が伴うなどの欠
点があつた。
また、自動衝撃試験機では、試験片支持台の一
端と試験片との間に試験片位置ぎめ具を置き、取
付け位置の決定を行つているが、この方法では、
(1)試験片を取付けた後の位置ぎめ具を取外す際
に、試験片位置ずれが生じ易い。(2)試験片端面と
切欠との間の距離を正確に仕上げなければならな
いなどの欠点がある。
本発明は、これらの従来法の欠点を解消すべく
なされたもので、その目的は、迅速、正確、且つ
安全に、試験片を試験片支持台に取付けることが
でき、また、試験温度も容易に変更し得られる装
置を提供するにある。
本発明の衝撃試験機における試験片取付け装置
を図面に基いて説明すると、図面は本発明装置の
実施態様を示すもので、第１図及び第２図はガイ
ドレール型の態様図で、第１図はその平面図、第
２図は第１図のＡ−Ｂにおける断面図で、ａは試
験片受台押下げ前、ｂは押下げ後の状態を示す。
第３図及び第４図は回転型の実施態様図で、第３
図はその平面図、第４図はその側面図で、ａは試
験片受台押下げ前、ｂは押下げ後の状態を示す。
第５図は恒温槽中に試験片を浸漬した状態図を示
す。
１は試験片支持台、２は試験片、３は試験片受
台、４は受台支持具、５は試験片押え板、６は受
台回転軸、７は受台押上げバネ、８は受台戻止
め、９は試験片送り具、１０は浸漬用回転軸、１
１は受台支持具ガイド棒、１２は試験片受台戻し
レバー、１３はガイドレール、１４はレール支持
台、１５は送り具止め、１６は受台固定具、１７
はハンドル、１８は回転軸、１９は回転アーム、
２０はセンターピン、２１は受台引下げ用斜面、
２２は受台引下げ用テコ、２３は姿勢安定用突
起、２４は恒温槽を示す。
本発明の装置は、(1)ガイドレール１３とレール
支持台１４（第１図）または回転軸１８と回転ア
ーム１９（第３図）からなる試験片の誘導部、(2)
試験片送り具９、試験片受台３、受台支持具４、
及び試験片押え板５からなる試験片取付け部、及
び(3)試験片送り具９に設けた試験片の浸漬用回転
軸１０の周りに回転し、試験片２を試験片受台３
と共に恒温層２４中に浸漬するための回転機構部
からなつている。
試験片誘導部は、試験片２を試験片取付け位置
に送るためのものであり、試験片支持台１の前方
にガイドレール１３を設け、試験片送り具９が自
由に走行し得るようにするか（第１図）、あるい
は試験機側方に設けた回転軸１８と回転アーム１
９によつて誘導する（第３図）。ガイドレール１
３または回転軸１８を固定するときは、試験片受
台３の先端中央に取付けたセンターピン２０が試
験片支持台１の中央に来るように調整する。
試験取付け部には、試験片受台３の前面中心に
センターピン２０を取付け、試験片２の切欠と一
致させる。この方法として次の方法が挙げられ
る。
(1) 斜面押下げ型（第１図、第２図）
試験片送り具９中を貫通する受台支持具ガイ
ド棒１１の前方先端に受台支持具４を固定し、
この受台支持具４には受台回転軸６を介して試
験片受台３を取付ける。試験片受台３の後方端
は下面に対して約45°傾斜させ、この面と接す
る試験片送り具９の面を同様の角度の受台引下
げ用斜面２１とする。試験片受台３の後方端上
部を受台押上げバネ７で押え、試験片受台３を
水平に保つ。試験片受台３にのせた試験片２は
バネを介して押え板５で固定する。
試験片２を取付けた試験片送り具９を試験機
の方向へ送り、試験片２が試験片支持台１の壁
に達すると、試験片２と試験片受台３及び受台
支持具４は移動を止められる。さらに試験片送
り具９を送込むと、受台支持具４と試験片送り
具９との間隙が狭くなり、第２図ｂに示すよう
に試験片受台３の後端部が試験片送り具９の引
下げ用斜面２１に沿つて押上げられる。これに
よつて試験片受台３は受台回転軸６を中心に回
転し、試験片受台３の先端は下方に押下げられ
る。
この時、受台支持具ガイド棒１１に付した溝
の中に受台戻止め８がバネによつて押出され、
試験片受台３の先端が下方に押下げられた姿勢
を保つ。試験片送り具９を引戻すと、試験片２
は試験片支持台１の正しい位置に取付けられ
る。次に試験片送り具９を戻し、レール支持台
１４に押しつけると、受台戻止め８が外れて試
験片受台３は水平に復帰して試験片取付け準備
状態になる。
(2) テコ押下げ型（第３図、第４図）
浸漬用回転軸１０によつて試験片送り具９に
取付けられた受台支持具４に受台回転軸６を介
して試験片受台３が固定され、受台回転軸６を
中心に試験片受台３の先端が上下に回転する。
試験片受台３の後端には受台引下げ用テコ２２
と姿勢安定用突起２３を有し、該突起２３の先
端部分は受台押上げバネ７によつて押出された
受台戻止め８と接触している。試験片受台３の
先端を上方に持上げると、姿勢安定用突起２３
の頂部を受台戻止め８で押し、テコ作用で試験
片受台３は水平位置に保つ。試験片受台３の先
端中央にセンターピン２０を取付け試験片位置
決めとする。
試験片受台３に取付けた試験片２は押え板５で
固定する。試験片送り具９を試験機の方へ送り試
験片支持台１の壁に達すると、試験片２の移動は
止められ、受台引下げテコ２２が試験片支持台１
の前面に接する。さらに送込むと、受台引下げ用
テコ２２の作用で試験片受台３の先端が押下げら
れ、試験片２が試験片支持台１上に残る。また、
試験片受台３の回転によつて姿勢安定用突起２３
が受台戻止め８の先端から外れ、試験片受台３の
先端を押下げる状態に保つ（第４図ｂ）。
【表】DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a test piece mounting device for impact testing. More specifically, the present invention relates to a device that makes it possible to accurately, quickly and stably mount an impact test specimen at a mounting position after holding the test specimen at a constant temperature, either low or high. Impact testing is a testing method for determining the toughness of metal materials. As an industrial test method, the Charpy impact test method, which involves a three-point bending impact with a notch in the center, is generally used. At room temperature,
It is sufficient to accurately attach the specimen to the specimen support using a position gauge, but to determine the brittle behavior of the material, it is necessary to perform impact tests at various temperatures to determine the ductile-brittle transition temperature. . Japan's JIS (Z-2242, Metallic Material Impact Testing Method) requires testing at a temperature other than room temperature, with the deviation between the center of the support stand and the center of the test piece within 0.4 mm when the test piece is attached to the support stand. In this case, the test temperature must be maintained for at least 10 minutes in a liquid bath and 20 minutes in an air bath, and the time from when it is removed from the liquid bath or air bath until it is subjected to impact is 5 seconds or less. ing. With conventional testing machines, when testing at temperatures other than room temperature, it is not possible to mount the test piece using a position gauge, so after placing the test piece on a hand-held holder with a guide and maintaining it at the specified temperature, hold the holder and place the test piece on the support stand. The method used is to attach it to the top. However, since this method requires quick hand-held installation, (1) the clearance of the guide portion must be increased, resulting in poor installation accuracy; (2) When removing the holder, the test piece is likely to be misaligned. (3) This operation requires skill. (Four)
There were drawbacks such as the danger of attaching a test piece without placing one's body under the hammer. In addition, in automatic impact testing machines, a test piece positioning tool is placed between one end of the test piece support stand and the test piece to determine the mounting position, but with this method,
(1) When removing the positioning tool after installing the test piece, the test piece is likely to be misaligned. (2) There are drawbacks such as the need to accurately finish the distance between the end face of the test piece and the notch. The present invention was made to eliminate these drawbacks of conventional methods, and its purpose is to quickly, accurately, and safely attach a test specimen to a test specimen support, and to easily control the test temperature. We are here to provide you with a device that can be modified to suit your needs. The test piece mounting device in the impact testing machine of the present invention will be explained based on the drawings. The drawings show an embodiment of the device of the present invention, and FIGS. 1 and 2 are guide rail type embodiments; The figure is a plan view thereof, and FIG. 2 is a sectional view taken along line A-B in FIG. 1, where a shows the state before the test piece holder is pressed down, and b shows the state after it is pressed down.
Figures 3 and 4 are embodiment diagrams of the rotary type;
The figure is a plan view thereof, and FIG. 4 is a side view thereof, in which a shows the state before the test piece holder is pushed down, and b shows the state after it is pushed down.
FIG. 5 shows a state diagram in which a test piece is immersed in a constant temperature bath. 1 is a test piece support stand, 2 is a test piece, 3 is a test piece pedestal, 4 is a pedestal support, 5 is a test piece holding plate, 6 is a pedestal rotating shaft, 7 is a pedestal push-up spring, 8 is a holder detent, 9 test piece feeder, 10 rotation shaft for immersion, 1
1 is a pedestal support guide rod, 12 is a test piece pedestal return lever, 13 is a guide rail, 14 is a rail support, 15 is a feeder stop, 16 is a pedestal fixing device, 17
is a handle, 18 is a rotating shaft, 19 is a rotating arm,
20 is a center pin, 21 is a slope for pulling down the pedestal,
22 is a lever for pulling down the pedestal, 23 is a projection for stabilizing the posture, and 24 is a constant temperature bath. The apparatus of the present invention includes (1) a test piece guiding section consisting of a guide rail 13 and a rail support 14 (Fig. 1) or a rotating shaft 18 and a rotating arm 19 (Fig. 3); (2)
test piece feeder 9, test piece holder 3, holder support 4,
and (3) a test piece mounting part consisting of a test piece holding plate 5, and (3) rotating around a test piece immersion rotating shaft 10 provided on a test piece feeder 9, and transferring the test piece 2 to a test piece holder 3.
It also consists of a rotating mechanism section for immersing it in the constant temperature layer 24. The test piece guiding section is for sending the test piece 2 to the test piece mounting position, and a guide rail 13 is provided in front of the test piece support stand 1 so that the test piece feeder 9 can freely run. (Fig. 1), or the rotating shaft 18 and rotating arm 1 installed on the side of the testing machine.
9 (Fig. 3). Guide rail 1
3 or when fixing the rotating shaft 18, adjust so that the center pin 20 attached to the center of the tip of the test piece holder 3 comes to the center of the test piece support 1. A center pin 20 is attached to the test mounting portion at the center of the front surface of the test piece holder 3, and is aligned with the notch of the test piece 2. Examples of this method include the following method. (1) Slope push-down type (Figs. 1 and 2) The pedestal support 4 is fixed to the front end of the pedestal support guide rod 11 that passes through the specimen feeder 9,
A test piece holder 3 is attached to this pedestal support 4 via a holder rotating shaft 6. The rear end of the test piece holder 3 is inclined at an angle of about 45 degrees with respect to the lower surface, and the surface of the test piece feeder 9 in contact with this surface forms a slope 21 for lowering the holder at a similar angle. The upper rear end of the test piece holder 3 is held down by the holder push-up spring 7 to keep the test piece holder 3 horizontal. The test piece 2 placed on the test piece holder 3 is fixed with a holding plate 5 via a spring. The test piece feeder 9 with the test piece 2 attached is sent in the direction of the testing machine, and when the test piece 2 reaches the wall of the test piece support stand 1, the test piece 2, the test piece holder 3, and the holder support 4 are You can stop moving. When the test piece feeder 9 is further fed, the gap between the pedestal support 4 and the test piece feeder 9 becomes narrower, and as shown in FIG. The tool 9 is pushed up along the downward slope 21. As a result, the test piece holder 3 rotates around the holder rotating shaft 6, and the tip of the test piece holder 3 is pushed down. At this time, the pedestal detent 8 is pushed out by the spring into the groove made on the pedestal support guide rod 11,
The tip of the test piece holder 3 is maintained in a downwardly pressed position. When the test piece feeder 9 is pulled back, the test piece 2
is attached to the correct position on the specimen support stand 1. Next, when the test piece feeder 9 is returned and pressed against the rail support stand 14, the pedestal detent 8 is removed and the test piece holder 3 returns to the horizontal position, becoming ready for test piece attachment. (2) Lever push-down type (Figures 3 and 4) The specimen is placed in the pedestal support 4 attached to the specimen feeder 9 by the immersion rotation shaft 10 via the pedestal rotation shaft 6. The stand 3 is fixed, and the tip of the test piece holder 3 rotates up and down about the holder rotation shaft 6.
At the rear end of the test piece holder 3 there is a lever 22 for lowering the holder.
and a posture stabilizing projection 23, the tip of which is in contact with the pedestal detent 8 pushed out by the pedestal push-up spring 7. When the tip of the specimen holder 3 is lifted upward, the posture stabilizing projection 23
The top of the specimen holder 3 is pushed by the pedestal detent 8, and the specimen holder 3 is kept in a horizontal position by lever action. A center pin 20 is attached to the center of the tip of the test piece holder 3 to position the test piece. The test piece 2 attached to the test piece holder 3 is fixed with a holding plate 5. When the test piece feeder 9 is sent toward the testing machine and reaches the wall of the test piece support stand 1, the movement of the test piece 2 is stopped, and the stand lowering lever 22 is moved toward the test piece support stand 1.
in contact with the front of the When it is further fed, the tip of the test piece holder 3 is pushed down by the action of the holder lowering lever 22, and the test piece 2 remains on the test piece support 1. Also,
By rotating the test piece holder 3, the posture stabilizing protrusion 23
is removed from the tip of the pedestal detent 8, and the tip of the test piece holder 3 is kept pressed down (FIG. 4b). 【table】
図面は本発明の装置の実施態様を示す図面で、
第１図はガイドレール、傾斜面押下げ型平面図、
第２図は第１図Ａ−Ｂ部の断面図で、ａは試験片
受台押下げ前、ｂは押下げ後を示す。第３図は回
転軸テコ押下げ型平面図、第４図はその側面図
で、ａは試験片受台押下げ前、ｂは押下げ後を示
す。第５図は恒温槽へ浸漬状態図を示す。
１：試験片支持台、２：試験片、３：試験片受
台、４：受台支持具、５：試験片押え板、６：受
台回転軸、７：受台押上げバネ、８：受台戻止
め、９：試験片送り具、１０：浸漬用回転軸、１
１：受台支持具ガイド棒、１２：試験片受台戻し
レバー、１３：ガイドレール、１４：レール支持
台、１５：送り具止め、１６：受台固定具、１
７：ハンドル、１８：回転軸、１９：回転アー
ム、２０：センターピン、２１：受台引下げ用斜
面、２２：受台引下げ用テコ、２３：姿勢安定用
突起、２４：恒温槽。
The drawings are drawings showing embodiments of the device of the present invention,
Figure 1 is a plan view of the guide rail, inclined surface push-down type,
FIG. 2 is a sectional view taken along the line A-B in FIG. 1, where a shows the specimen holder before it is pressed down, and b shows it after it is pressed down. FIG. 3 is a plan view of the rotary shaft lever pressing type, and FIG. 4 is a side view thereof, in which a shows the specimen holder before being pushed down, and b shows the state after being pushed down. FIG. 5 shows a state diagram of immersion in a constant temperature bath. 1: Test piece support stand, 2: Test piece, 3: Test piece holder, 4: holder support, 5: Test piece holding plate, 6: holder rotation shaft, 7: holder push-up spring, 8: Holder detent, 9: Test specimen feeder, 10: Rotating shaft for immersion, 1
1: pedestal support guide rod, 12: test specimen pedestal return lever, 13: guide rail, 14: rail support, 15: feeder stop, 16: pedestal fixture, 1
7: Handle, 18: Rotating shaft, 19: Rotating arm, 20: Center pin, 21: Slope for lowering the pedestal, 22: Lever for lowering the pedestal, 23: Posture stabilizing protrusion, 24: Constant temperature chamber.
Claims (1)
と回転アームと、 (b) 浸漬用回転軸に軸支した、またはこれを有す
る試験片送り具と、 (c) この試験片送り具に接続した受台支持具と、 (d) センターピンを前面中央部に有し、受台支持
具に受台回転軸を介して軸支した回動自在な試
験片受台と、 (e) 受台支持具前部にバネを介して接続した試験
片押え板と、 (f) 試験片の試験片支持台への取付け時に、試験
片受台を下方へ押下げる試験片受台押下げ機構
と、 (g) その時の試験片受台の姿勢を保持する試験片
受台姿勢保持機構からなることを特徴とする衝
撃試験用試験片取付け装置。 ２ 試験片受台押下げ機構が、試験片受台後方端
に設けた傾斜面と、この傾斜面に接する試験片送
り具前方端の受台引下げ用斜面と、試験片受台後
端部を押圧する受台押上げバネとからなる特許請
求の範囲第１記載の衝撃試験用試験片取付け装
置。 ３ 試験片受台姿勢保持機構が、試験片送り具を
貫通する受台支持具ガイド棒に設けた溝部と、こ
の溝部に挿脱自在に係合する受台戻止めとからな
る特許請求の範囲第１記載の衝撃試験用試験片取
付け装置。 ４ 試験片受台押下げ機構および試験片受台姿勢
保持機構が、試験片受台後端部に設けた受台引下
げ用テコと、このテコ近傍に設けた姿勢安定用突
起と、この突起を支持する、受台押上げバネに接
続した受台戻止めとからなる特許請求の範囲第１
記載の衝撃試験用試験片取付け装置。[Claims] 1. The following configuration; (a) a guide rail and a rail support, or a rotating shaft and a rotating arm; (b) a test specimen feeder that is pivotally supported on or has a rotating shaft for immersion; , (c) a pedestal support connected to this specimen feeder, and (d) a rotatable pedestal support that has a center pin in the center of the front and is supported on the pedestal support via a pedestal rotation shaft. (e) A specimen holding plate connected to the front part of the pedestal support via a spring; (f) A specimen holder that moves the specimen holder downward when attaching the specimen to the specimen holder. A test piece mounting device for impact testing, comprising: a test piece holder push-down mechanism; (g) a test piece holder posture holding mechanism that maintains the posture of the test piece holder at that time. 2. The specimen holder push-down mechanism connects the inclined surface provided at the rear end of the specimen holder, the pedestal lowering slope at the front end of the specimen feeder that is in contact with this inclined surface, and the rear end of the specimen holder. A test piece mounting device for impact testing according to claim 1, comprising a pedestal for pushing and a spring for pushing up. 3 Claims in which the test specimen pedestal posture holding mechanism comprises a groove provided in the pedestal support guide rod that passes through the test specimen feeder, and a pedestal return stop that engages with the groove in a freely insertable and removable manner. The test piece mounting device for impact testing according to the first aspect. 4. The test specimen pedestal push-down mechanism and the specimen pedestal posture holding mechanism operate by connecting a lever for lowering the pedestal provided at the rear end of the specimen pedestal, a posture stabilizing protrusion provided near this lever, and Claim 1 comprising a supporting pedestal detent connected to a pedestal push-up spring.
Specimen mounting device for impact testing as described.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1829284A JPS60162933A (en) | 1984-02-06 | 1984-02-06 | Attaching apparatus of test piece for impact test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1829284A JPS60162933A (en) | 1984-02-06 | 1984-02-06 | Attaching apparatus of test piece for impact test |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60162933A JPS60162933A (en) | 1985-08-24 |
| JPH0336174B2 true JPH0336174B2 (en) | 1991-05-30 |
Family
ID=11967535
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1829284A Granted JPS60162933A (en) | 1984-02-06 | 1984-02-06 | Attaching apparatus of test piece for impact test |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60162933A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100857704B1 (en) | 2006-10-24 | 2008-09-08 | 주식회사 포스코 | Fixing device of a fringeless specimen for use in a high speed collision test of a steel sheet for automobile use |
| CN102507330B (en) * | 2011-11-15 | 2014-08-06 | 煤炭科学研究总院 | Overall drawing test device for mining anchor rod |
| CN105403454B (en) * | 2015-12-21 | 2017-12-01 | 中国船舶重工集团公司第七○二研究所 | The anchor of single hole steel strand wires fatigue test clip type anchor |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS579725U (en) * | 1980-06-19 | 1982-01-19 |
-
1984
- 1984-02-06 JP JP1829284A patent/JPS60162933A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS579725U (en) * | 1980-06-19 | 1982-01-19 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60162933A (en) | 1985-08-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |