JPH0334003B2 - - Google Patents
Info
- Publication number
- JPH0334003B2 JPH0334003B2 JP60062278A JP6227885A JPH0334003B2 JP H0334003 B2 JPH0334003 B2 JP H0334003B2 JP 60062278 A JP60062278 A JP 60062278A JP 6227885 A JP6227885 A JP 6227885A JP H0334003 B2 JPH0334003 B2 JP H0334003B2
- Authority
- JP
- Japan
- Prior art keywords
- disk
- turntable
- error
- angle
- vertical axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
- Manufacturing Optical Record Carriers (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6227885A JPS61219815A (ja) | 1985-03-27 | 1985-03-27 | デイスク形状測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6227885A JPS61219815A (ja) | 1985-03-27 | 1985-03-27 | デイスク形状測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61219815A JPS61219815A (ja) | 1986-09-30 |
| JPH0334003B2 true JPH0334003B2 (enrdf_load_stackoverflow) | 1991-05-21 |
Family
ID=13195512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6227885A Granted JPS61219815A (ja) | 1985-03-27 | 1985-03-27 | デイスク形状測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61219815A (enrdf_load_stackoverflow) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08227523A (ja) * | 1995-02-22 | 1996-09-03 | Nec Corp | ランアウト測定装置 |
| JP5112212B2 (ja) * | 2008-07-29 | 2013-01-09 | 日本発條株式会社 | 変位測定装置および変位測定方法 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH553960A (de) * | 1973-05-14 | 1974-09-13 | Contraves Ag | Laengen oder winkel-messeinrichtung. |
| JPS5082488A (enrdf_load_stackoverflow) * | 1973-11-26 | 1975-07-03 |
-
1985
- 1985-03-27 JP JP6227885A patent/JPS61219815A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61219815A (ja) | 1986-09-30 |
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