JPH0329195A - Sense amplifier circuit - Google Patents

Sense amplifier circuit

Info

Publication number
JPH0329195A
JPH0329195A JP1163522A JP16352289A JPH0329195A JP H0329195 A JPH0329195 A JP H0329195A JP 1163522 A JP1163522 A JP 1163522A JP 16352289 A JP16352289 A JP 16352289A JP H0329195 A JPH0329195 A JP H0329195A
Authority
JP
Japan
Prior art keywords
channel mos
mos transistor
drain
gate
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1163522A
Other languages
Japanese (ja)
Other versions
JPH081756B2 (en
Inventor
Nobuo Shimizu
信雄 清水
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1163522A priority Critical patent/JPH081756B2/en
Publication of JPH0329195A publication Critical patent/JPH0329195A/en
Publication of JPH081756B2 publication Critical patent/JPH081756B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a sense amplifier circuit for a ternary semiconductor memory by providing the sense amplifier circuit with a specific circuit capable of reading out ternary information from two digit lines of a memory cell. CONSTITUTION:The sense amplifier circuit is provided with power supplies VDD, 1/2VDD, memory cell digit lines D, the inverse of D, 1st to 5th p-channel MOS transistors(TRs) 5, 6, 9 to 11, and 1st to 5th n-channel MOS TRs 7, 8, 12 to 14. The 3rd to 5th MOS TRs 9 to 11 and the 3rd to 5th MOS TRs 12, 13 are arranged and connected as shown in a diagram. Consequently, the sense amplifier circuit capable of reading out three ternaries from two digit lines D, the inverse of D of the memory cell can be formed.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、3値半導体メモリーのセンスアンプ回路に関
する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a sense amplifier circuit for a ternary semiconductor memory.

[従来の技術] 従来、半導体メモリーは2値型であったのでセンスアン
プも2値型(ミラー型などが一般的である)となってい
た。
[Prior Art] Conventionally, since semiconductor memories have been of a binary type, sense amplifiers have also been of a binary type (mirror type etc. are common).

第2図(a),(b)は従来の一般的なミラー型センス
アンプの回路図とデータ読み取りタイミングのタイムチ
ャートである。このセンスアンプでは、メモリーセルの
ディジット線Dが“ハイ”rVDDJ,Uが“ロウ”r
OJの時には出力端子OUTに“ハイ゜’  rVDD
Jが出力され、ディジットjJDが“ロウ゜”  ro
」.Dが“ハイ゛′「VDDJの時には出力端子OUT
に“ロウ” 「0」が出力ざれる。
FIGS. 2(a) and 2(b) are a circuit diagram of a conventional general mirror type sense amplifier and a time chart of data reading timing. In this sense amplifier, the digit line D of the memory cell is "high" rVDDJ, and the digit line U is "low" r
At the time of OJ, “high゜’ rVDD is applied to the output terminal OUT.
J is output, and digit jJD is “low゜” ro
”.. When D is “high” or VDDJ, the output terminal OUT
“Low” “0” is output.

尚、図中のVDDは電源、5,6はPチャネルMOSト
ランジスタ、7,8はNチャネルMOSトランジスタで
ある。
In the figure, VDD is a power supply, 5 and 6 are P-channel MOS transistors, and 7 and 8 are N-channel MOS transistors.

[発明が解決しようとする課題] 上述した2値型センスアンプは、2値型半導体メモリー
専用であるので、3値半導体メモリーに6は使えない。
[Problems to be Solved by the Invention] Since the above-mentioned binary sense amplifier is exclusively used for binary semiconductor memories, 6 cannot be used for ternary semiconductor memories.

そこで、3値半導体メモリーには3値専用のセンスアン
プを開発する必要がある。
Therefore, it is necessary to develop a sense amplifier dedicated to three values for three-value semiconductor memory.

本発明は上記従来の要求に鑑みなされたもので、3値半
導体メモリーのセンスアンプ回路を提供することを目的
とする。
The present invention was made in view of the above-mentioned conventional requirements, and an object of the present invention is to provide a sense amplifier circuit for a ternary semiconductor memory.

[発明の従来技術に対する相違点] 上述した従来の2値専用センスアンプに対し、本発明は
メモリーセルの2本のディジット線より3値の情報を読
み取ることができるという相違点を有する。
[Differences between the present invention and the prior art] The present invention differs from the conventional binary-only sense amplifier described above in that ternary information can be read from two digit lines of a memory cell.

[課題を解決するための手段] 本発明のセンスアンプ回路は、第1〜第5のPチャネル
MOSトランジスタおよび第1〜第5のNチャネルMO
Sトランジスタを有し、3値半導体メモリーから3値の
情報を読み取るセンスアンプ回路であって、第lのPチ
ャネルMOSトランジスタはドレインを出力端子にゲー
トを第2のPチャネルMOSトランジスタのゲートおよ
びドレインにソースをVDD電源に接続し、第2のPチ
ャネルMOSトランジスタはドレインとゲートを第lの
PチャネルMOSトランジスタのゲートにソースをVD
D電源に接続し、第3のPチャネルMOSトランジスタ
はドレインを1/2VDD電源にゲートを第5のPチャ
ネルMOSトランジスタのドレインにソースを第1およ
び第2のNチャネルMOSトランジスタのソースに接続
し、第4のPチャネルMOSトランジスタはドレインを
第5のPチャネルMOSトランジスタのソースにゲート
を一の入力端子にソースをVDD電源端子に接続し、第
5のPチャネルMOSトランジスタはドレインを第4お
よび第50NチャネルMOSトランジスタのドレインに
ゲートを他の入力端子にソースを第4のPチャネルMO
Sトランジスタのドレインに接続し、第1のNチャネル
MOSトランジスタはドレインを出力端子にゲートを前
記一の入力端子にソースを第3のPチャネルMOSトラ
ンジスタのソースに接続し、第2のNチャネルMOSト
ランジスタはドレインを第2のPチャネルMOSトラン
ジスタのゲートおよびドレインにゲートを前記他の入力
端子にソースを第3のPチャネルMOSトランジスタの
ソースに接続し、第3のNチャネルMOSトランジスタ
はドレインを出力端子にゲートを第5のPチャネルMO
Sトランジスタのドレインにソースを接地に接続し、第
4のNチャネルMOSトランジスタはドレインを第5の
PチャネルM.OSトランジスタのドレインにゲートを
前記一の入力端子にソースを接地に接続し、第50Nチ
ャネルM O S トランジスタはドレインを第5のP
チャネルMOSトランジスタのドレインにゲートを前記
他の入力端子にソースを接地に接続したことを特徴とす
る。
[Means for Solving the Problems] A sense amplifier circuit of the present invention includes first to fifth P-channel MOS transistors and first to fifth N-channel MOS transistors.
A sense amplifier circuit having an S transistor and reading three-value information from a three-value semiconductor memory, wherein a first P-channel MOS transistor has a drain connected to an output terminal and a gate connected to the gate and drain of a second P-channel MOS transistor. The source of the second P-channel MOS transistor is connected to the VDD power supply, and the drain and gate of the second P-channel MOS transistor are connected to the gate of the first P-channel MOS transistor, and the source is connected to the VDD power supply.
The third P-channel MOS transistor has its drain connected to the 1/2 VDD power supply, its gate connected to the drain of the fifth P-channel MOS transistor, and its source connected to the sources of the first and second N-channel MOS transistors. , the fourth P-channel MOS transistor has its drain connected to the source of the fifth P-channel MOS transistor, its gate connected to one input terminal, and its source connected to the VDD power supply terminal, and the fifth P-channel MOS transistor has its drain connected to the fourth and The gate is connected to the drain of the 50th N-channel MOS transistor, and the source is connected to the other input terminal of the 4th P-channel MOS transistor.
The first N-channel MOS transistor has its drain connected to the output terminal, its gate connected to the first input terminal, its source connected to the source of the third P-channel MOS transistor, and the second N-channel MOS transistor connected to the drain of the S transistor. The transistor has a drain connected to the gate and drain of the second P-channel MOS transistor, a gate connected to the other input terminal, and a source connected to the source of the third P-channel MOS transistor, and the third N-channel MOS transistor outputs the drain. Connect the gate to the terminal of the fifth P-channel MO
The drain and source of the S transistor are connected to ground, and the drain of the fourth N-channel MOS transistor is connected to the fifth P-channel M. The drain and gate of the OS transistor are connected to the first input terminal and the source is connected to ground, and the drain of the 50th N-channel MOS transistor is connected to the fifth PMOS transistor.
The channel MOS transistor is characterized in that its drain and gate are connected to the other input terminal, and its source is connected to ground.

[実施例] 第1図(a)は本発明の一実施例に係るセンスアンプ回
路の回路図、第l図(b)はデータ読み取りタイミング
のタイムチャートである。
[Embodiment] FIG. 1(a) is a circuit diagram of a sense amplifier circuit according to an embodiment of the present invention, and FIG. 1(b) is a time chart of data reading timing.

図中VDD,1/2VDDは電源、D, Uハメモリー
セルのディジット線、OUTはデイジット線D, Uよ
り読み取ったセンスアンプの出力、5,6,9〜11は
PチャネルMOSトランジスタ、7,  8.  12
〜14はNチャネルMOSトランジスタてある。また、
デイジット線D, Uは下表に示すような3状態をとり
得る。
In the figure, VDD and 1/2VDD are the power supply, D and U are the digit lines of the memory cell, OUT is the output of the sense amplifier read from the digit lines D and U, 5, 6, 9 to 11 are P channel MOS transistors, 7, 8. 12
.about.14 are N-channel MOS transistors. Also,
Digit lines D and U can have three states as shown in the table below.

(以下、余白) 本実施例の動作を第1図(b)のタイムチャートに従っ
て説明する。
(Hereinafter, blank spaces) The operation of this embodiment will be explained according to the time chart of FIG. 1(b).

いま、ディジット線D, Uより信号を読み出そうとし
て、ディジット線をプリチャージした後、あるアドレス
のメモリーセルのワード線を開いた場合、ディジット線
D, Hの両方が゛ロウ”rOJてあるときにはPチャ
ネルMOSトランジスタ10,11がオンしてNチャネ
ルMOSトランジスタl2のゲートに“ハイ” 「VD
D」が供給される。この結果、トランジスタl2がオン
して出力端子OUTに“ロウ”rOJが出力される。
Now, if you try to read signals from digit lines D and U and open the word line of a memory cell at a certain address after precharging the digit lines, both digit lines D and H will be "low" rOJ. At times, the P-channel MOS transistors 10 and 11 are turned on, and the gate of the N-channel MOS transistor l2 is set to "high".
D" is supplied. As a result, the transistor l2 is turned on and a "low" rOJ is output to the output terminal OUT.

同様に、別のアドレスのワード線を開いた場合、ディジ
ット線Dは1/2VDD, 汀はVDDであるときには
NチャネルMOSトランジスタ13がオンしてPチャネ
ルトランジスタ9のゲートに“ロウ”rQJが供給され
、トランジスタ9はオンする。これと同時にNチャネル
MOSトランジスタ7もオンして出力端子OUTに1/
2VDDが出力される。また、ディジット線DがVDD
,Dが1/2VDDの場合は同様にPチャネルMOSト
ランジスタ9,5およびNチャネルMOSトランジスタ
8がオンして、出力端子OUTにVDDが出力される。
Similarly, when the word line of another address is opened, when the digit line D is at 1/2 VDD and the digit line D is at VDD, the N-channel MOS transistor 13 is turned on and a "low" rQJ is supplied to the gate of the P-channel transistor 9. and transistor 9 is turned on. At the same time, the N-channel MOS transistor 7 is also turned on, and the output terminal OUT is 1/1.
2VDD is output. Also, digit line D is VDD
, D are 1/2 VDD, P channel MOS transistors 9, 5 and N channel MOS transistor 8 are similarly turned on, and VDD is output to the output terminal OUT.

[発明の効果コ 以上説明したように、本発明によれば3値メモリーセル
より3値を読み取り及び出力することができるセンスア
ンプ回路を実現することができる。
[Effects of the Invention] As explained above, according to the present invention, it is possible to realize a sense amplifier circuit that can read and output three values from a three-value memory cell.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a)は本発明の一実施例に係るセンスアンプ回
路の回路図、第1図(b)はその動作を説明するタイム
チャート、第2図(a)は従来のミラー型2進センスア
ンプの回路図、第2図(b)はその動作を説明するタイ
ムチャートである。 VDD,1/2VDD・・◆・・・・・電源、D・・・
・・・メモリーセルのディジット線(他の入力端子)、 F・・・・・・・メモリーセルのディジット線(一の入
力端子)、 OUT・・・・・・出力端子、 5・・・・第1のPチャネルMOSトランジスタ、6・
・・・第2のPチャネルMOSトランジスタ、9・・・
・第3のPチャネルMOSトランジスタ、10・・・第
4のPチャネルMOSトランジスタ、11・・・第5の
PチャネルMOSトランジスタ、7・・・・第1のNチ
ャネルMOSトランジスタ、8・・・・第2のNチャネ
ルMOSトランジスタ、12・・・第3のNチャネルM
OSトランジスタ、13・・・第40NチャネルMOS
トランジスタ、14・・・第50NチャネルMOSトラ
ンジスタ。
FIG. 1(a) is a circuit diagram of a sense amplifier circuit according to an embodiment of the present invention, FIG. 1(b) is a time chart explaining its operation, and FIG. 2(a) is a conventional mirror type binary circuit. The circuit diagram of the sense amplifier, FIG. 2(b), is a time chart explaining its operation. VDD, 1/2VDD...◆...Power supply, D...
...Memory cell digit line (other input terminal), F...Memory cell digit line (first input terminal), OUT...Output terminal, 5... first P-channel MOS transistor, 6.
...Second P-channel MOS transistor, 9...
- Third P-channel MOS transistor, 10... Fourth P-channel MOS transistor, 11... Fifth P-channel MOS transistor, 7... First N-channel MOS transistor, 8...・Second N-channel MOS transistor, 12...Third N-channel M
OS transistor, 13...40th N-channel MOS
Transistor, 14...50th N-channel MOS transistor.

Claims (1)

【特許請求の範囲】[Claims]  第1〜第5のPチャネルMOSトランジスタおよび第
1〜第5のNチャネルMOSトランジスタを有し、3値
半導体メモリーから3値の情報を読み取るセンスアンプ
回路であって、第1のPチャネルMOSトランジスタは
ドレインを出力端子にゲートを第2のPチャネルMOS
トランジスタのゲートおよびドレインにソースをVDD
電源に接続し、第2のPチャネルMOSトランジスタは
ドレインとゲートを第1のPチャネルMOSトランジス
タのゲートにソースをVDD電源に接続し、第3のPチ
ャネルMOSトランジスタはドレインを1/2VDD電
源にゲートを第5のPチャネルMOSトランジスタのド
レインにソースを第1および第2のNチャネルMOSト
ランジスタのソースに接続し、第4のPチャネルMOS
トランジスタはドレインを第5のPチャネルMOSトラ
ンジスタのソースにゲートを一の入力端子にソースをV
DD電源端子に接続し、第5のPチャネルMOSトラン
ジスタはドレインを第4および第5のNチャネルMOS
トランジスタのドレインにゲートを他の入力端子にソー
スを第4のPチャネルMOSトランジスタのドレインに
接続し、第1のNチャネルMOSトランジスタはドレイ
ンを出力端子にゲートを前記一の入力端子にソースを第
3のPチャネルMOSトランジスタのソースに接続し、
第2のNチャネルMOSトランジスタはドレインを第2
のPチャネルMOSトランジスタのゲートおよびドレイ
ンにゲートを前記他の入力端子にソースを第3のPチャ
ネルMOSトランジスタのソースに接続し、第3のNチ
ャネルMOSトランジスタはドレインを出力端子にゲー
トを第5のPチャネルMOSトランジスタのドレインに
ソースを接地に接続し、第4のNチャネルMOSトラン
ジスタはドレインを第5のPチャネルMOSトランジス
タのドレインにゲートを前記一の入力端子にソースを接
地に接続し、第5のNチャネルMOSトランジスタはド
レインを第5のPチャネルMOSトランジスタのドレイ
ンにゲートを前記他の入力端子にソースを接地に接続し
たことを特徴とするセンスアンプ回路。
A sense amplifier circuit having first to fifth P-channel MOS transistors and first to fifth N-channel MOS transistors and reading three-value information from a three-value semiconductor memory, the first P-channel MOS transistor connects the drain to the output terminal and the gate to the second P-channel MOS
Connect the source to the gate and drain of the transistor to VDD
The second P-channel MOS transistor has its drain and gate connected to the gate of the first P-channel MOS transistor and its source to the VDD power supply, and the third P-channel MOS transistor has its drain connected to the 1/2 VDD power supply. The gate is connected to the drain of the fifth P-channel MOS transistor, the source is connected to the sources of the first and second N-channel MOS transistors, and the fourth P-channel MOS transistor
The drain of the transistor is connected to the source of the fifth P-channel MOS transistor, the gate is connected to the first input terminal, and the source is connected to V
The fifth P-channel MOS transistor is connected to the DD power supply terminal, and the drain of the fifth P-channel MOS transistor is connected to the fourth and fifth N-channel MOS transistors.
The drain of the transistor is connected to the gate, the gate is connected to the other input terminal, and the source is connected to the drain of the fourth P-channel MOS transistor, and the drain of the first N-channel MOS transistor is connected to the output terminal, the gate is connected to the first input terminal, and the source is connected to the first input terminal. Connected to the source of P-channel MOS transistor No. 3,
The second N-channel MOS transistor has a drain connected to the second N-channel MOS transistor.
The gate and drain of the P-channel MOS transistor are connected to the other input terminal, and the source is connected to the source of the third P-channel MOS transistor, and the third N-channel MOS transistor has its drain connected to the output terminal and its gate connected to the fifth The drain and source of a fourth N-channel MOS transistor are connected to ground, the drain of a fourth N-channel MOS transistor is connected to the drain of a fifth P-channel MOS transistor, the gate is connected to the first input terminal, and the source is connected to ground, A sense amplifier circuit characterized in that the fifth N-channel MOS transistor has a drain connected to the drain of the fifth P-channel MOS transistor, a gate connected to the other input terminal, and a source connected to ground.
JP1163522A 1989-06-26 1989-06-26 Sense amplifier circuit Expired - Lifetime JPH081756B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1163522A JPH081756B2 (en) 1989-06-26 1989-06-26 Sense amplifier circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1163522A JPH081756B2 (en) 1989-06-26 1989-06-26 Sense amplifier circuit

Publications (2)

Publication Number Publication Date
JPH0329195A true JPH0329195A (en) 1991-02-07
JPH081756B2 JPH081756B2 (en) 1996-01-10

Family

ID=15775470

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1163522A Expired - Lifetime JPH081756B2 (en) 1989-06-26 1989-06-26 Sense amplifier circuit

Country Status (1)

Country Link
JP (1) JPH081756B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100370952B1 (en) * 1995-12-31 2003-03-28 주식회사 하이닉스반도체 Sensing amplification circuit of memory cell

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100370952B1 (en) * 1995-12-31 2003-03-28 주식회사 하이닉스반도체 Sensing amplification circuit of memory cell

Also Published As

Publication number Publication date
JPH081756B2 (en) 1996-01-10

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