JPH0327305U - - Google Patents

Info

Publication number
JPH0327305U
JPH0327305U JP1989129176U JP12917689U JPH0327305U JP H0327305 U JPH0327305 U JP H0327305U JP 1989129176 U JP1989129176 U JP 1989129176U JP 12917689 U JP12917689 U JP 12917689U JP H0327305 U JPH0327305 U JP H0327305U
Authority
JP
Japan
Prior art keywords
probe
exchange surface
head
temperature sensor
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1989129176U
Other languages
English (en)
Other versions
JPH0729450Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPH0327305U publication Critical patent/JPH0327305U/ja
Application granted granted Critical
Publication of JPH0729450Y2 publication Critical patent/JPH0729450Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0011Arrangements for eliminating or compensation of measuring errors due to temperature or weight
    • G01B5/0014Arrangements for eliminating or compensation of measuring errors due to temperature or weight due to temperature

Description

【図面の簡単な説明】
図面は本考案の複数の実施例を示すものであつ
て、第1図は交換可能な探子ピンの側面図、第2
図は交換可能な探子ヘツドの交換面を示した図、
第3a図は交換可能な光学式の探子ヘツドの斜視
図、第3b図は第3a図の探子ヘツドの内部にお
ける主要コンポーネントの原理図である。 1……交換皿、2……溝、3……取付けダイス
、4……探子ピン、5……接触ピン、7……測定
抵抗、9a……円筒体、11……交換皿、12…
…延長部、13a,13b……キヤツプナツト、
14……探子ヘツド、17……温度センサ、18
……探子ピン、21……交換皿、24……ケーシ
ング、25……接点、27……測定抵抗、28…
…レーザダイオード、29……光学系、30……
ダイオードライン。

Claims (1)

  1. 【実用新案登録請求の範囲】 1 座標測定装置の探子であつて、座標測定装置
    に探子を交換可能に固定するために役立つ交換面
    を有する形式のものにおいて、探子4,14,2
    4が探子材料と熱的に接触する温度センサ7,1
    7,27を有し、センサの接続部が交換面におけ
    る接点5,15,25と接続されていることを特
    徴とする、座標測定装置の探子。 2 探子が剛性の機械式の探子4である、請求項
    1記載の探子。 3 探子が完全な探子ヘツド14,24である、
    請求項1記載の探子。 4 交換面が探子の皿状の保持体1,11に設け
    られており、温度センサ7,17が保持体内に配
    置されている、請求項1から3までのいずれか1
    項記載の探子。 5 探子が無接触で測定する光学式の探子ヘツド
    24であり、温度センサ27が探子ヘツド24の
    ケーシング内に配置されている、請求項3記載の
    探子。
JP1989129176U 1988-11-05 1989-11-06 座標測定装置の探子 Expired - Fee Related JPH0729450Y2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE8813875U DE8813875U1 (ja) 1988-11-05 1988-11-05
DE8813875.5 1988-11-05

Publications (2)

Publication Number Publication Date
JPH0327305U true JPH0327305U (ja) 1991-03-19
JPH0729450Y2 JPH0729450Y2 (ja) 1995-07-05

Family

ID=6829584

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989129176U Expired - Fee Related JPH0729450Y2 (ja) 1988-11-05 1989-11-06 座標測定装置の探子

Country Status (4)

Country Link
US (2) US5014444A (ja)
EP (1) EP0368040B1 (ja)
JP (1) JPH0729450Y2 (ja)
DE (2) DE8813875U1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012137498A (ja) * 2004-12-16 2012-07-19 Werth Messtechnik Gmbh 座標測定装置ならびに座標測定装置を用いて加工物の幾何形状を測定する方法

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5276976A (en) * 1992-09-15 1994-01-11 Hawkes Hollis D Indicator tip turret
DE4447904B4 (de) * 1993-02-23 2004-12-30 Faro Technologies, Inc., Lake Mary Koordinatenmessmaschine zum Messen von dreidimensionalen Koordinaten
US5410817A (en) * 1993-05-18 1995-05-02 Budd Co Measuring tool with concentric point
US5341574A (en) * 1993-06-29 1994-08-30 The United States Of America As Represented By The Department Of Energy Coordinate measuring machine test standard apparatus and method
GB9401692D0 (en) * 1994-01-28 1994-03-23 Renishaw Plc Performing measurement or calibration on positioning machines
GB9413194D0 (en) * 1994-06-30 1994-08-24 Renishaw Plc Probe head
IT1279210B1 (it) * 1995-05-16 1997-12-04 Dea Spa Dispositivo e metodo di visione per la misura tridimensionale senza contatto.
DE19915012A1 (de) * 1999-04-01 2000-10-05 Metronom Indvermessung Gmbh Prüfkörper
US6941669B2 (en) * 2000-06-30 2005-09-13 Magus Gmbh Method for determining effective coefficient of thermal expansion
DE10138138A1 (de) 2001-08-09 2003-02-20 Zeiss Carl Korrektur des Temperaturfehlers bei einer Messung mit einem Koordinatenmessgerät
US7077643B2 (en) * 2001-11-07 2006-07-18 Battelle Memorial Institute Microcombustors, microreformers, and methods for combusting and for reforming fluids
JP2004117161A (ja) * 2002-09-26 2004-04-15 Sharp Corp 光学式変位センサ
AU2003277133A1 (en) * 2002-10-07 2004-05-04 Metronom U.S., Inc. Spatial reference system
US8141264B2 (en) * 2007-05-31 2012-03-27 Brunson Instrument Company Length reference bar system and method
US8402668B2 (en) * 2008-01-07 2013-03-26 Q-Mark Manufacturing, Inc. Coordinate measuring apparatus
US8832953B2 (en) * 2008-01-07 2014-09-16 Q-Mark Manufacturing, Inc. Coordinate measuring apparatus
DE102009060784A1 (de) * 2009-12-22 2011-06-30 Carl Zeiss 3D Automation GmbH, 73447 Taststift und Tastkopf für ein Koordinatenmessgerät
IT1402715B1 (it) * 2010-10-29 2013-09-18 Marposs Spa Sonda di tastaggio
CN102175146B (zh) * 2010-12-31 2012-06-27 南京工业大学 基于具有触觉功能测量笔的自动三维视觉测量系统
PL3259096T3 (pl) * 2015-02-19 2020-05-18 Kuka Systems Gmbh Instalacja do wytwarzania oraz sposób wytwarzania
US10254105B2 (en) 2016-12-05 2019-04-09 Quality Vision International, Inc. Exchangeable lens module system for probes of optical measuring machines

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH382451A (fr) * 1961-09-30 1964-09-30 Genevoise Instr Physique Machine à mesurer ou machine-outil de précision
US3332153A (en) * 1964-08-31 1967-07-25 Bausch & Lomb Temperature compensating system
DE2234146C2 (de) * 1972-07-12 1984-03-29 Hommelwerke GmbH, 7730 Villingen-Schwenningen Elektrische Längenmeßeinrichtung
US3775655A (en) * 1972-09-15 1973-11-27 Xerox Corp Method and apparatus for transducer temperature compensation
US3921300A (en) * 1974-08-16 1975-11-25 Us Navy Temperature compensated measuring gauge
JPS54103367A (en) * 1978-02-01 1979-08-14 Olympus Optical Co Ltd Thermal expansion correcting method of probe
DD152853A1 (de) * 1980-09-01 1981-12-09 Horst Donat Wechseleinrichtung fuer messeinsatztraeger bei tastkoepfen
DE3320127C2 (de) * 1983-06-03 1994-09-08 Zeiss Carl Fa Taststiftwechselhalter
DE3425476A1 (de) * 1983-07-15 1985-01-24 WERO oHG Röth & Co, 6490 Schlüchtern Laengenmessvorrichtung nach dem zweistrahl-laser-interferometerprinzip
JPS6117011A (ja) * 1984-07-03 1986-01-25 Komatsu Ltd 門型工作機械における寸法測定方法
US4956606A (en) * 1984-10-17 1990-09-11 Mine Safety Appliances Company Non-contact inductive distance measuring system with temperature compensation
GB8522984D0 (en) * 1985-09-17 1985-10-23 Renishaw Plc Tool change apparatus
DE3620118C2 (de) * 1986-06-14 1998-11-05 Zeiss Carl Fa Verfahren zur Bestimmung bzw. Korrektur des Temperaturfehlers bei Längenmessungen
DE3631825A1 (de) * 1986-09-19 1988-03-31 Zeiss Carl Fa Verfahren zur reduzierung von temperatureinfluessen auf koordinatenmessgeraete
GB8624191D0 (en) * 1986-10-08 1986-11-12 Renishaw Plc Datuming of analogue measurement probes
DE3706610A1 (de) * 1987-02-28 1988-09-08 Mauser Werke Oberndorf Mess-signalverarbeitung fuer koordinatenmessmaschinen und bearbeitungsmaschinen
DE3715627A1 (de) * 1987-05-11 1988-12-08 Hommelwerke Gmbh Vorrichtung zur messung des abstandes zwischen der vorrichtung und einer messflaeche
DE3729644C2 (de) * 1987-09-04 1997-09-11 Zeiss Carl Fa Verfahren zur Bestimmung der Temperatur von Werkstücken in flexiblen Fertigungssystemen

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012137498A (ja) * 2004-12-16 2012-07-19 Werth Messtechnik Gmbh 座標測定装置ならびに座標測定装置を用いて加工物の幾何形状を測定する方法

Also Published As

Publication number Publication date
US5014444A (en) 1991-05-14
EP0368040A3 (en) 1990-11-07
US5065526A (en) 1991-11-19
EP0368040A2 (de) 1990-05-16
JPH0729450Y2 (ja) 1995-07-05
EP0368040B1 (de) 1993-02-10
DE8813875U1 (ja) 1988-12-22
DE58903523D1 (de) 1993-03-25

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Legal Events

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LAPS Cancellation because of no payment of annual fees