JPH0326816B2 - - Google Patents
Info
- Publication number
- JPH0326816B2 JPH0326816B2 JP57216304A JP21630482A JPH0326816B2 JP H0326816 B2 JPH0326816 B2 JP H0326816B2 JP 57216304 A JP57216304 A JP 57216304A JP 21630482 A JP21630482 A JP 21630482A JP H0326816 B2 JPH0326816 B2 JP H0326816B2
- Authority
- JP
- Japan
- Prior art keywords
- metal
- solution
- compound
- exposure
- pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910052751 metal Inorganic materials 0.000 claims description 20
- 239000002184 metal Substances 0.000 claims description 20
- 238000000034 method Methods 0.000 claims description 18
- 239000000758 substrate Substances 0.000 claims description 17
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 13
- 239000000463 material Substances 0.000 claims description 10
- 150000001875 compounds Chemical class 0.000 claims description 9
- 150000003839 salts Chemical class 0.000 claims description 7
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 6
- 239000004408 titanium dioxide Substances 0.000 claims description 6
- 230000015572 biosynthetic process Effects 0.000 claims description 5
- 238000007772 electroless plating Methods 0.000 claims description 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 5
- 239000010931 gold Substances 0.000 claims description 5
- 229910052737 gold Inorganic materials 0.000 claims description 5
- 238000000151 deposition Methods 0.000 claims description 4
- 150000002500 ions Chemical class 0.000 claims description 3
- 229910021645 metal ion Inorganic materials 0.000 claims description 3
- 239000011787 zinc oxide Substances 0.000 claims description 3
- 229910001020 Au alloy Inorganic materials 0.000 claims description 2
- 239000003638 chemical reducing agent Substances 0.000 claims description 2
- 239000003353 gold alloy Substances 0.000 claims description 2
- 230000002787 reinforcement Effects 0.000 claims description 2
- 238000001228 spectrum Methods 0.000 claims description 2
- 239000000243 solution Substances 0.000 description 22
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 9
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 239000007864 aqueous solution Substances 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- 239000000049 pigment Substances 0.000 description 4
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 description 3
- 230000002209 hydrophobic effect Effects 0.000 description 3
- 150000002736 metal compounds Chemical class 0.000 description 3
- 238000007747 plating Methods 0.000 description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 2
- XFXPMWWXUTWYJX-UHFFFAOYSA-N Cyanide Chemical compound N#[C-] XFXPMWWXUTWYJX-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N argon Substances [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- -1 argon ion Chemical class 0.000 description 2
- 239000011230 binding agent Substances 0.000 description 2
- 229910000365 copper sulfate Inorganic materials 0.000 description 2
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 2
- 239000003365 glass fiber Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 229910052700 potassium Inorganic materials 0.000 description 2
- 239000011591 potassium Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 241000694440 Colpidium aqueous Species 0.000 description 1
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 1
- 101150003085 Pdcl gene Proteins 0.000 description 1
- 206010034972 Photosensitivity reaction Diseases 0.000 description 1
- QAOWNCQODCNURD-UHFFFAOYSA-L Sulfate Chemical compound [O-]S([O-])(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-L 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- 125000002877 alkyl aryl group Chemical group 0.000 description 1
- LPRSRULGRPUBTD-UHFFFAOYSA-N butan-2-one;hydrate Chemical compound O.CCC(C)=O LPRSRULGRPUBTD-UHFFFAOYSA-N 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- WSFSSNUMVMOOMR-NJFSPNSNSA-N methanone Chemical compound O=[14CH2] WSFSSNUMVMOOMR-NJFSPNSNSA-N 0.000 description 1
- 230000006911 nucleation Effects 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- GYUPBLLGIHQRGT-UHFFFAOYSA-N pentane-2,4-dione;titanium Chemical compound [Ti].CC(=O)CC(C)=O GYUPBLLGIHQRGT-UHFFFAOYSA-N 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000151 polyglycol Polymers 0.000 description 1
- 239000010695 polyglycol Substances 0.000 description 1
- 239000002952 polymeric resin Substances 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000080 wetting agent Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1603—Process or apparatus coating on selected surface areas
- C23C18/1607—Process or apparatus coating on selected surface areas by direct patterning
- C23C18/1608—Process or apparatus coating on selected surface areas by direct patterning from pretreatment step, i.e. selective pre-treatment
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1603—Process or apparatus coating on selected surface areas
- C23C18/1607—Process or apparatus coating on selected surface areas by direct patterning
- C23C18/1612—Process or apparatus coating on selected surface areas by direct patterning through irradiation means
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03C—PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES; PHOTOGRAPHIC PROCESSES, e.g. CINE, X-RAY, COLOUR, STEREO-PHOTOGRAPHIC PROCESSES; AUXILIARY PROCESSES IN PHOTOGRAPHY
- G03C1/00—Photosensitive materials
- G03C1/705—Compositions containing chalcogenides, metals or alloys thereof, as photosensitive substances, e.g. photodope systems
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/18—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material
- H05K3/181—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material by electroless plating
- H05K3/182—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material by electroless plating characterised by the patterning method
- H05K3/185—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material by electroless plating characterised by the patterning method by making a catalytic pattern by photo-imaging
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/146—Laser beam
Description
【発明の詳細な説明】
技術分野
本発明は、露光後に金属イオン溶液からこの金
属を物理的現像または無電解メツキ溶液によつて
補力される核の形態で堆積することができる感光
性の半導電性化合物を含有する基板あるいは該化
合物からなる基板の表面の上または下の少くとも
一方に、金属像または金属パターンを形成する方
法に関するものである。DETAILED DESCRIPTION OF THE INVENTION TECHNICAL FIELD The present invention relates to the production of photosensitive semi-conductors in which, after exposure to light, the metal can be deposited from a metal ion solution in the form of nuclei which are enhanced by physical development or by an electroless plating solution. The present invention relates to a method for forming a metal image or pattern on at least one of the top and bottom surfaces of a substrate containing a conductive compound or a substrate made of the compound.
従来技術
米国特許第3380823号明細書は重合体の樹脂結
合剤中の半導電性顔料の層を紙支持体に設けてな
る媒体上に像を形成するこのような方法を開示し
ている。この方法では、像のネガを通して露光す
ることにより顔料を可逆的に活性化し、次いで前
記媒体を像形成性還元−酸化系と接触させ、この
結果として像を不可逆的に形成する。Prior Art U.S. Pat. No. 3,380,823 discloses such a method of forming images on a medium comprising a paper support provided with a layer of semiconducting pigment in a polymeric resin binder. In this method, the pigment is reversibly activated by exposure through the image negative, and the medium is then contacted with an image-forming reduction-oxidation system, thereby irreversibly forming an image.
プリント回路板のような絶縁性重合体基板材料
上に導電性金属パターンを形成する対応する方法
は米国特許第3674485号明細書に記載されており、
この方法も感光性の半導電性金属化合物を疎水性
樹脂結合剤中に均一に分散させてなる層を表面に
設けた基板材料を基材とする。この方法では、選
択的露光および関連する金属イオンの溶液との接
触により金属核のパターンを形成し、次いで金属
核からなる像を物理的現像剤または無電解メツキ
液により補力して導電性パターンを形成する。 A corresponding method for forming conductive metal patterns on insulating polymeric substrate materials, such as printed circuit boards, is described in U.S. Pat. No. 3,674,485;
This method also uses a substrate material on the surface of which a layer is formed by uniformly dispersing a photosensitive semiconductive metal compound in a hydrophobic resin binder. In this method, a pattern of metal nuclei is formed by selective exposure and contact with a solution of the relevant metal ions, and the image of the metal nuclei is then enhanced with a physical developer or an electroless plating solution to form a conductive pattern. form.
これらの方法ではスクリーンパターンまたは場
合によつてはネガを用いる必要がある。また核像
の形成中およびその補力中に選択性を維持するに
はカブリ防止手段を使用するような追加の処理が
必要である。 These methods require the use of screen patterns or, in some cases, negatives. Also, maintaining selectivity during formation of the nuclear image and its intensification requires additional processing, such as the use of antifogging means.
発明の目的
本発明はこれらの手段および保護パターンの使
用を不必要にし、かつ像の形成または場合によつ
てはパターンの形成を著しく簡単にすることを目
的とする。OBJECTS OF THE INVENTION The present invention aims at making the use of these measures and guarding patterns superfluous and significantly simplifying the formation of the image or, as the case may be, the formation of the pattern.
発明の構成
本発明は、内部または表面上に前記感光性の半
導電性金属化合物が存在する前記基板表面を、核
形成性金属のイオンを含有する溶液中に浸漬し、
次いで前記基板に対して制御されて移動しかつ前
記の関連する半導電性化合物によつて吸収される
ような波長をスペクトルの紫外部または可視部に
有するレーザー光の集束ビームによりパターンに
従つて露光することを特徴とする。Structure of the Invention The present invention provides the steps of: immersing the surface of the substrate, in which the photosensitive semiconductive metal compound is present inside or on the surface, in a solution containing ions of a nucleating metal;
then patternwise exposure by a focused beam of laser light moving in a controlled manner relative to said substrate and having a wavelength in the ultraviolet or visible part of the spectrum such that it is absorbed by said associated semiconducting compound. It is characterized by
先ず、内部に半導電性化合物が含有されていて
レーザー光線の入射する表面部分上に、金属核を
かかる溶液から光化学的に堆積させる。しかる後
に、これ以上露光せずに、露光を伴わない無電解
堆積法によりこの接触的(catalytic)核像上に
像金属を堆積させることができる。この場合に
は、基板を同じ浴中に浸漬したままにしておく必
要はない。 First, metal nuclei are photochemically deposited from such a solution onto a surface portion that contains a semiconducting compound and is incident on the laser beam. Image metal can then be deposited on this catalytic nuclear image by electroless deposition without further exposure. In this case, there is no need to keep the substrate immersed in the same bath.
既知のプログラム技術により所要のパターンに
従つて光ビームを移動させることにより露光を行
うことができる。 Exposure can be performed by moving the light beam according to a desired pattern using known programming techniques.
本発明の他の例では、無電解メツキまたは物理
的現像に適当な金属塩およびこの金属塩の還元剤
の溶液中で露光を行う。 In another embodiment of the invention, the exposure is carried out in a solution of a metal salt suitable for electroless plating or physical development and a reducing agent for the metal salt.
特公昭50−92830号(C.A.84,94240n(1976)
参照)は金パターンをGa−As−表面に被着させ
る方法を開示している。しかし、これを行うため
に主として波長10μmの放射を発生するCO2−レ
ーザーを使用している。この波長範囲では本発明
方法で行われるような光化学プロセスは勿論不可
能である。これらの刊公物に記載されている金属
堆積物は熱作用の結果であるに相違ない。 Special Publication No. 50-92830 (CA 84 , 94240n (1976)
) discloses a method for depositing gold patterns on Ga--As surfaces. However, to do this they primarily use CO 2 -lasers which generate radiation at a wavelength of 10 μm. In this wavelength range, photochemical processes such as those carried out in the method of the invention are of course not possible. The metal deposits described in these publications must be the result of thermal effects.
保護パターンを使用する代りに、形成すべきパ
ターンに従つて基板に対して移動する制御された
光ビームによる放射を使用する方法による作業を
可能にするには、核形成を十分に迅速に行う必要
がある。このためには本発明方法に用いる半導電
性金属化合物が、使用レーザービームの強さと協
働して、極めて短い露光時間を可能とするのに十
分な程度に感光性であることが必要である。さら
に、表面を浸漬させる溶液は使用する光に対し十
分に高度な透過性を持つていることが必要であ
る。 Instead of using a guard pattern, the nucleation needs to be sufficiently rapid to allow working with methods that use radiation with a controlled light beam that moves relative to the substrate according to the pattern to be formed. There is. This requires that the semiconducting metal compound used in the method of the invention be sufficiently photosensitized to allow, in conjunction with the intensity of the laser beam used, very short exposure times. . Furthermore, it is necessary that the solution in which the surface is immersed has a sufficiently high degree of transparency for the light used.
本発明の範囲内の極めて適当な半導電性金属酸
化物は二酸化チタンまたは酸化亜鉛である。 Highly suitable semiconducting metal oxides within the scope of the invention are titanium dioxide or zinc oxide.
核像金属のイオンの溶液は使用した光に対して
可能な最高の透過性を持つことが必要であるとい
う必要条件を考慮すれば、金または金合金を無電
解堆積することができる溶液を核の形成および次
の核の補力に用いることは、極めて興味あること
である。オランダ国特許出願第8103174号および
イギリス国特許第1322203号明細書に開示されて
いるこれらの溶液は、感光性半導体に適した波長
範囲において、例えば、無電解銅メツキ溶液より
著しく高い透過性を持つており、最後に挙げた溶
液だけは本発明方法において比較的低濃度で使用
するかあるいは溶液を通る一層短い光通路と共に
使用するのが適当である。 Nucleating solutions in which gold or gold alloys can be deposited electrolessly, taking into account the requirement that the solution of ions of the nucleating metal must have the highest possible transparency to the light used. It is of great interest to use it for the formation and subsequent reinforcement of the nucleus. These solutions, which are disclosed in Dutch Patent Application No. 8103174 and British Patent No. 1322203, have significantly higher transparency than, for example, electroless copper plating solutions in the wavelength range suitable for photosensitive semiconductors. Only the last-mentioned solutions are suitable for use in the process of the invention at relatively low concentrations or with shorter optical paths through the solution.
次に本発明を実施例について説明する。 Next, the present invention will be explained with reference to examples.
実施例 1
ガラス繊維強化エポキシ樹脂に4重量%の分量
の二酸化チタン粒子(ルチル型)を分散させてな
る基板材料を、50℃においてメチルエチルケトン
−水(1:2)混合物で6分間処理し、次いでこ
れを周波数50Hzの振動に6分間さらしながら1
当り:
Na2Cr2O7 120g
H2SO4(d=1.84) 400mlおよび
H3PO4(d=1.88) 200mlと水
を含有する溶液で処理することにより疎水性にし
た。Example 1 A substrate material comprising a 4% by weight of titanium dioxide particles (rutile type) dispersed in a glass fiber reinforced epoxy resin was treated with a methyl ethyl ketone-water (1:2) mixture for 6 minutes at 50°C, and then While exposing this to vibrations with a frequency of 50Hz for 6 minutes,
Per: 120 g of Na 2 Cr 2 O 7 made hydrophobic by treatment with a solution containing 400 ml of H 2 SO 4 (d=1.84) and 200 ml of H 3 PO 4 (d=1.88) and water.
しかる後に、この基板材料を水中で洗浄し、次
いで1当り次の組成:
硫酸銅 0.04モル
エチレンジアミン四酢酸の四ナトリウム塩
0.072モル
NaOH 0.12モル
ホルムアルデヒド 0.10モル
を有する50℃の水溶液を入れた石英キユベツト中
に置いた。 Thereafter, the substrate material is washed in water and then mixed with the following composition per unit: Copper sulfate 0.04 mol Tetrasodium salt of ethylenediaminetetraacetic acid
A quartz cuvette was placed in a 50° C. aqueous solution containing 0.072 mol NaOH, 0.12 mol formaldehyde, and 0.10 mol formaldehyde.
次いで、この基板材料を前記溶液中でパルス化
窒素レーザーの集束ビームに露光した。このレー
ザーは出力1MW、波長337nm、パルス持続時間
4nsおよびパルス周波数10Hzであつた。前記溶液
を通る光の通路を最短に維持した。有効露光時間
を12×10-8秒とし、10分間補力した後に明確な像
を得た。 The substrate material was then exposed to a focused beam of a pulsed nitrogen laser in the solution. This laser has a power output of 1 MW, a wavelength of 337 nm, and a pulse duration of
The pulse frequency was 4 ns and the pulse frequency was 10 Hz. The light path through the solution was kept to a minimum. The effective exposure time was 12×10 -8 seconds, and a clear image was obtained after 10 minutes of intensification.
エポキシ−ガラス繊維材料にZnO粉末を分散さ
せたものを用いた場合に匹敵する結果が得られ
た。 Comparable results were obtained using ZnO powder dispersed in epoxy-glass fiber material.
実施例 3
二酸化チタンを充填した基板材料を、同様な予
備処理工程の後に、1当り:
エチレンジアミン四酢酸の四ナトリウム塩
0.072モル
NaOH 0.12モル
シアン化金()カリウム 0.014モル
を含有し、50℃に加熱された水溶液中に置いた。Example 3 A substrate material loaded with titanium dioxide was prepared after a similar pre-treatment step per: tetrasodium salt of ethylenediaminetetraacetic acid.
It was placed in an aqueous solution containing 0.072 mol NaOH 0.12 mol potassium gold() cyanide 0.014 mol and heated to 50°C.
このシート材料を実施例1で用いたと同様なパ
ルス化窒素レーザーに露光した。明確な可視像を
得るには有効露光時間4×10-9秒の1個のパルス
で充分であつた。 This sheet material was exposed to a pulsed nitrogen laser similar to that used in Example 1. One pulse with an effective exposure time of 4 x 10 -9 seconds was sufficient to obtain a clear visible image.
実施例 3
実施例1と同様にして二酸化チタン顔料を充填
した板を疎水性にし、次いで実施例1と同様な無
電解銅メツキ溶液中に置き、アルゴンイオンレー
ザー(出力約0.70W、波長334351および364nm)
に16秒間連続的に露光した。露光中この板を約7
mmの距離にわたつて直線状に移動させた。露光後
溶液中に約10分間留めた後に導電性の良好な銅ラ
インを得た。Example 3 A plate filled with titanium dioxide pigment was made hydrophobic in the same manner as in Example 1, then placed in an electroless copper plating solution similar to Example 1, and heated with an argon ion laser (output approximately 0.70 W, wavelength 334351 and 364nm)
was exposed continuously for 16 seconds. During exposure, this plate is exposed for about 7
It was moved in a straight line over a distance of mm. After being left in the solution for about 10 minutes after exposure, a copper line with good conductivity was obtained.
実施例 4
実施例1と同様にしてTiO2顔料を充填し、予
備処理した板を1当り:
PdCl2 5.6×10-3モル
HCl 0.12モルおよび
「テンサゲクス(Tensagex:商品名)DP24」
すなわちアルキルアリールポリグリコール
エーテルサルフエートからなる湿潤剤
0.4重量%
を含有する水溶液中に置いた。Example 4 Each plate was filled with TiO 2 pigment and pretreated as in Example 1: PdCl 2 5.6×10 −3 mol HCl 0.12 mol and “Tensagex DP24”, i.e. alkylaryl It was placed in an aqueous solution containing 0.4% by weight of a wetting agent consisting of polyglycol ether sulfate.
この板に対する露光は実施例3のアルゴンイオ
ンレーザー(出力約0.70W)を用いて1,1/2,
1/4,1/8,1/16,1/32および1/64秒の露光時間の
範囲で行つた。50℃に加熱した銅メツキ溶液中に
約1分間留めた後に、すべての露光時間において
露光板に黒色像を得た。 This plate was exposed to light at 1,1/2 using the argon ion laser of Example 3 (output approximately 0.70W).
The exposure times ranged from 1/4, 1/8, 1/16, 1/32, and 1/64 seconds. After remaining in the copper plating solution heated to 50° C. for about 1 minute, a black image was obtained on the exposed plate at all exposure times.
実施例 5
Al2O3セラミツクからなる板をアセチルアセト
ンチタン25重量%とプロパノール−2 75重量%
とからなる溶液中に浸漬し、次いでこの溶液から
徐々に取出した。ヘヤ・ドライヤーを用いて乾燥
した後に、この板を500℃に8分間維持し、次い
で熱分解により二酸化チタンをAl2O3基板上に形
成した。次いでこの板を1当り:
シアン化金()カリウム 0.014モル
硫酸銅 0.005モル
エチレンジアミン四酢酸の四ナトリウム塩
0.072モル
NaOH 0.12モルおよび
ホルムアルデヒド 0.13モル
を含有する水溶液を入れたキユベツト中に置い
た。Example 5 A plate made of Al 2 O 3 ceramic was mixed with 25% by weight of acetylacetone titanium and 75% by weight of propanol-2.
and then gradually removed from this solution. After drying using a hair dryer, the plate was maintained at 500° C. for 8 minutes and then titanium dioxide was formed on the Al 2 O 3 substrate by pyrolysis. Then per plate: Potassium gold() cyanide 0.014 mol Copper sulfate 0.005 mol Tetrasodium salt of ethylenediaminetetraacetic acid
It was placed in a cuvette containing an aqueous solution containing 0.072 mol NaOH 0.12 mol and formaldehyde 0.13 mol.
この板を実施例4と同様な露光時間範囲で露光
させた。露光後溶液中に15分間留めた後に適正な
可視金属像が形成した。 This plate was exposed for the same exposure time range as in Example 4. A proper visible metal image was formed after 15 minutes in the solution after exposure.
Claims (1)
的現像または無電解メツキ溶液によつて補力され
る核の形態で堆積することができる感光性の半導
電性化合物が内部または表面上に存在する基板材
料あるいは該化合物からなる基板材料の表面の上
または下の少くとも一方に、金属像または金属パ
ターンを形成するに当り、 内部または表面上に前記感光性の半導電性化合
物が存在する前記基板表面を、核形成性金属のイ
オンを含有する溶液中に浸漬し、次いで前記基板
に対して制御されて移動しかつ前記の関連する半
導電性化合物によつて吸収されるような波長をス
ペクトルの紫外部または可視部に有するレーザー
光の集束ビームによりパターンに従つて露光する
ことを特徴とする金属像または金属パターンの形
成方法。 2 無電解メツキまたは物理的現像に適当な金属
塩およびこの金属塩の還元剤の溶液中で露光を行
う特許請求の範囲第1項に記載の方法。 3 感光性の半導電性化合物が二酸化チタンまた
は酸化亜鉛である特許請求の範囲第1項または第
2項に記載の方法。 4 金または金合金を堆積させるための無電解溶
液を核の形成および次の核の補力に用いる特許請
求の範囲第1〜3項のいずれか一つの項に記載の
方法。[Claims] 1. A photosensitive semiconducting compound capable of depositing this metal from a metal ion solution in the form of nuclei after exposure by physical development or by an electroless plating solution is present inside or In forming a metal image or metal pattern on at least one side of the surface of the substrate material existing on the surface or the substrate material made of the compound, the photosensitive semiconductive compound is added inside or on the surface. is present on the substrate surface in a solution containing ions of the nucleating metal, which then move in a controlled manner relative to the substrate and are absorbed by the associated semiconducting compound. 1. A method for forming a metal image or pattern, which comprises exposing according to the pattern to a focused beam of laser light having a wavelength in the ultraviolet or visible part of the spectrum. 2. A method according to claim 1, wherein the exposure is carried out in a solution of a metal salt suitable for electroless plating or physical development and a reducing agent for this metal salt. 3. The method according to claim 1 or 2, wherein the photosensitive semiconductive compound is titanium dioxide or zinc oxide. 4. The method according to any one of claims 1 to 3, wherein an electroless solution for depositing gold or a gold alloy is used for the formation of nuclei and the reinforcement of subsequent nuclei.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8105633A NL8105633A (en) | 1981-12-15 | 1981-12-15 | METHOD FOR MANUFACTURING METAL IMAGES OR PATTERNS ON AND / OR UNDER THE SURFACE OF A SUBSTRATE WITH A SEMICONDUCTIVE PHOTOGRAPHIC COMPOUND |
NL8105633 | 1981-12-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58106537A JPS58106537A (en) | 1983-06-24 |
JPH0326816B2 true JPH0326816B2 (en) | 1991-04-12 |
Family
ID=19838548
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57216304A Granted JPS58106537A (en) | 1981-12-15 | 1982-12-11 | Formation of metal image or metal pattern |
Country Status (5)
Country | Link |
---|---|
US (1) | US4426442A (en) |
EP (1) | EP0081889B1 (en) |
JP (1) | JPS58106537A (en) |
DE (1) | DE3267190D1 (en) |
NL (1) | NL8105633A (en) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3237205C2 (en) * | 1982-10-07 | 1985-11-07 | Karl-Heinz Dipl.-Chem. 8900 Augsburg Stadler | Process for depositing metals and / or semi-metals on photoconductors and the use of this process |
NL8702219A (en) * | 1987-09-16 | 1989-04-17 | Philips Nv | METHOD FOR LOCALLY APPLYING METAL TO A SUBSTRATE SURFACE |
US4814259A (en) * | 1987-11-09 | 1989-03-21 | Rockwell International Corporation | Laser generated electrically conductive pattern |
NL9000502A (en) * | 1990-03-05 | 1991-10-01 | Philips Nv | METHOD FOR REPAIRING A DEFECT IN A LITHOGRAPHIC MASK. |
US5206102A (en) * | 1991-11-15 | 1993-04-27 | Rockwell International Corporation | Photoelectrochemical imaging system |
US5260108A (en) * | 1992-03-10 | 1993-11-09 | International Business Machines Corporation | Selective seeding of Pd by excimer laser radiation through the liquid |
US5378508A (en) * | 1992-04-01 | 1995-01-03 | Akzo Nobel N.V. | Laser direct writing |
US5834069A (en) * | 1996-04-30 | 1998-11-10 | Zentox Corporation | In situ method for metalizing a semiconductor catalyst |
FR2822167B1 (en) * | 2001-03-15 | 2004-07-16 | Nexans | METHOD FOR METALLIZING A SUBSTRATE PART |
GB2385863A (en) * | 2001-10-29 | 2003-09-03 | Qinetiq Ltd | High resolution patterning method |
JP4521228B2 (en) * | 2003-07-28 | 2010-08-11 | 正也 市村 | Gold plating method by light deposition and gold plating film forming apparatus |
EP1610597A1 (en) * | 2004-06-22 | 2005-12-28 | Technomedica AG | Precipitation of copper for producing conductive tracks |
US9435035B2 (en) | 2010-01-15 | 2016-09-06 | Byd Company Limited | Metalized plastic articles and methods thereof |
CN102071424B (en) * | 2010-02-26 | 2012-05-09 | 比亚迪股份有限公司 | Plastic product and preparation method thereof |
CN102071411B (en) | 2010-08-19 | 2012-05-30 | 比亚迪股份有限公司 | Plastic product and preparation method thereof |
JP6311310B2 (en) * | 2012-10-04 | 2018-04-18 | 東レ株式会社 | Manufacturing method of conductive pattern |
KR20150018368A (en) | 2013-08-09 | 2015-02-23 | 주식회사 엘지화학 | Method for forming conductive pattern by direct radiation of electromagnetic wave, and resin structure having conductive pattern thereon |
CN103813651B (en) * | 2013-11-07 | 2017-05-10 | 溧阳市江大技术转移中心有限公司 | CCL (Copper Clad Laminate) manufacturing method |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3732100A (en) * | 1968-04-01 | 1973-05-08 | Itek Corp | Method of making electrical capacitors |
FR1601856A (en) * | 1968-09-12 | 1970-09-21 | Display system |
-
1981
- 1981-12-15 NL NL8105633A patent/NL8105633A/en not_active Application Discontinuation
-
1982
- 1982-11-15 US US06/441,580 patent/US4426442A/en not_active Expired - Fee Related
- 1982-12-11 JP JP57216304A patent/JPS58106537A/en active Granted
- 1982-12-14 EP EP82201599A patent/EP0081889B1/en not_active Expired
- 1982-12-14 DE DE8282201599T patent/DE3267190D1/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
NL8105633A (en) | 1983-07-01 |
EP0081889B1 (en) | 1985-10-30 |
EP0081889A3 (en) | 1983-07-20 |
JPS58106537A (en) | 1983-06-24 |
DE3267190D1 (en) | 1985-12-05 |
US4426442A (en) | 1984-01-17 |
EP0081889A2 (en) | 1983-06-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0326816B2 (en) | ||
US4753821A (en) | Process for the partial metallization of substrate surfaces | |
US3562005A (en) | Method of generating precious metal-reducing patterns | |
US3994727A (en) | Formation of metal images using reducible non-noble metal salts and light sensitive reducing agents | |
EP0180101B1 (en) | Deposition of patterns using laser ablation | |
US5328811A (en) | Method of printing an image on a substrate particularly useful for producing printed circuit boards | |
CA1224957A (en) | Method for depositing a metal on a surface | |
EP0687136A1 (en) | Method for selectively metallizing a substrate | |
EP0357124B1 (en) | Method of selectively providing a metal from the liquid phase on a substrate by means of a laser | |
US3791340A (en) | Method of depositing a metal pattern on a surface | |
US3950570A (en) | Method of depositing a metal on a surface | |
US3783005A (en) | Method of depositing a metal on a surface of a nonconductive substrate | |
DE19642922C2 (en) | Activating catalytic solution for electroless plating and method of preparing a substrate for electroless plating | |
KR100292652B1 (en) | Activation Catalysts for Electroless Plating and Electroless Plating Methods | |
CA1050357A (en) | Process for the formation of real images and products produced thereby | |
JPH02305969A (en) | Pretreatment for electroless plating | |
US3811893A (en) | Photomask | |
US3791939A (en) | Method of selectively depositing a metal on a surface | |
US4304849A (en) | Methods of depositing metallic copper on substrates | |
JPS6177393A (en) | Partial metalization of substrate surface | |
CA1045909A (en) | Processes and products of sensitizing substrates | |
CA1082817A (en) | Method of depositing metal conducting patterns on large area surfaces | |
JPH026833B2 (en) | ||
JPH0577748B2 (en) | ||
JP3161407B2 (en) | Activating catalyst solution for electroless plating and electroless plating method |