JPH03254135A - Structure of lead frame with semiconductor device attached - Google Patents

Structure of lead frame with semiconductor device attached

Info

Publication number
JPH03254135A
JPH03254135A JP5168590A JP5168590A JPH03254135A JP H03254135 A JPH03254135 A JP H03254135A JP 5168590 A JP5168590 A JP 5168590A JP 5168590 A JP5168590 A JP 5168590A JP H03254135 A JPH03254135 A JP H03254135A
Authority
JP
Japan
Prior art keywords
semiconductor element
lead frame
resin
conductivity wires
wires
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5168590A
Other languages
Japanese (ja)
Inventor
Tadayuki Itakura
板倉 忠幸
Makoto Orii
折井 誠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Instruments Corp
Original Assignee
Sankyo Seiki Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sankyo Seiki Manufacturing Co Ltd filed Critical Sankyo Seiki Manufacturing Co Ltd
Priority to JP5168590A priority Critical patent/JPH03254135A/en
Priority to CN 91101183 priority patent/CN1030216C/en
Priority to KR1019910002989A priority patent/KR0165544B1/en
Priority to US07/662,522 priority patent/US5264656A/en
Priority to GB9104356A priority patent/GB2243479B/en
Priority to DE4106824A priority patent/DE4106824A1/en
Priority to FR9102621A priority patent/FR2659164B1/fr
Publication of JPH03254135A publication Critical patent/JPH03254135A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

Landscapes

  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

PURPOSE:To do without a costly mold and to simplify the sealing process by conducting the seal of a semiconductor element and conductivity wires by making good use of a fluidity of the resin in the melting condition. CONSTITUTION:A semiconductor element 2 is positioned on a lead frame 1. Then, electrodes of the semiconductor element 2 and terminals of the lead frame 1 are electrically connected with conductivity wires 7 by wire bonding. A thermal-resistant sheet 5 is placed on the back of the lead frame 1 and the semiconductor element 2 and the conductivity wires 7 are covered with the resin 8 to be sealed. In this case, the sealing resin 8 is supplied amply so as to cover the semiconductor element 2 and the conductivity wires 7 perfectly. By this method, a special mold is not necessary in the sealing process to cover the semiconductor element 2 and the conductivity wires 7, resulting in simplification of the sealing process.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体素子付リードフレームの改良に関する
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an improvement of a lead frame with a semiconductor element.

〔従来の技術〕[Conventional technology]

パンケージ型の半導体ICチップは、帯状のリードフレ
ーム上に半導体素子をダイボンディング加工工程によっ
て接続し、その後熱硬化性樹脂でインサート底形し、不
要部分を切り落とすことによって製品となる。このため
、インサート成形用の金型が不可欠で、その製作が煩雑
であり、しかも高価になる。また、最近、リードフレー
ム工法で、半導体素子の他に回路の導電部分を兼ねたパ
ターンをプレス加工することが提案されているが、回路
パターンの形状が複雑になるため、インサート成形用の
金型の設計製作が難しく、それが上記欠点をさらに助長
する結果となっている。
A pancage type semiconductor IC chip is manufactured by connecting a semiconductor element onto a strip-shaped lead frame through a die bonding process, then shaping the bottom of the insert with thermosetting resin, and cutting off unnecessary parts. For this reason, a mold for insert molding is essential, and its manufacture is complicated and expensive. Recently, it has been proposed to press a pattern that also serves as the conductive part of the circuit in addition to the semiconductor element using the lead frame construction method, but since the shape of the circuit pattern becomes complicated, the mold for insert molding is It is difficult to design and manufacture, which further exacerbates the above-mentioned drawbacks.

〔発明の目的〕[Purpose of the invention]

したがって、本発明の目的は、リードフレーム上の半導
体素子をインサート底形によらないで、封止できるよう
にすることである。
Therefore, an object of the present invention is to enable a semiconductor element on a lead frame to be sealed without depending on the bottom shape of the insert.

〔発明の解決手段〕[Means for solving the invention]

そこで、本発明は、リードフレーム上に、半導体素子を
位置決めし、この半導体素子の電極部分とリードフレー
ムの端子部分とをワイヤボンディング加工によって導電
ワイヤで電気的に接続状態とし、リードフレームの裏面
側に耐熱シートを置き、半導体素子および導電ワイヤを
ボッティング工程による樹脂によって被覆し、この樹脂
で半導体素子を封止している。
Therefore, the present invention positions a semiconductor element on a lead frame, electrically connects the electrode part of the semiconductor element and the terminal part of the lead frame with a conductive wire by wire bonding, and A heat-resistant sheet is placed on the substrate, the semiconductor element and the conductive wire are covered with resin by a botting process, and the semiconductor element is sealed with this resin.

〔発明の作用〕[Action of the invention]

上記封止用の樹脂は、ポツティング工程によって、半導
体素子および導電ワイヤを充分に被覆する量だけ供給さ
れる。したがって、これらの半導体素子および導電ワイ
ヤの被覆のための封止過程で、インサート成形と異なり
、特別な金型が必要とされないため、インサート成形用
の金型の使用に伴う上記欠点が全て解決できる。しかも
、リードフレームの裏面側に耐熱シートが存在するため
、樹脂のポツティング工程で、その樹脂が流失せず、所
定の位置すなわち半導体素子および導電ワイヤを確実に
封止できる状態となる。
The above-mentioned sealing resin is supplied by the potting process in an amount sufficient to cover the semiconductor element and the conductive wire. Therefore, unlike insert molding, a special mold is not required in the sealing process for covering these semiconductor elements and conductive wires, so all of the above-mentioned drawbacks associated with the use of molds for insert molding can be solved. . Moreover, since the heat-resistant sheet is present on the back side of the lead frame, the resin does not flow away during the resin potting process, and a predetermined position, that is, the semiconductor element and the conductive wire, can be reliably sealed.

〔実施例〕〔Example〕

第1図は、本発明の半導体素子付リードフレーム1の構
造を示している。
FIG. 1 shows the structure of a lead frame 1 with a semiconductor element according to the present invention.

この半導体素子付リードフレーム1は、半導体素子2と
リードフレーム3とで組み立てられる。
This lead frame 1 with a semiconductor element is assembled with a semiconductor element 2 and a lead frame 3.

半導体素子2は、例えばICチップなどであり、外部に
対する電気的な接続のために、複数の端子21を備えて
いる。
The semiconductor element 2 is, for example, an IC chip, and includes a plurality of terminals 21 for electrical connection to the outside.

また、リードフレーム3は、第2図に示すように、帯状
の導電性薄金属板31から両側縁の連続部32を残して
、各連続部32に対し連結部33で連結された状態で、
製品単位毎にプレス打ち抜き加工によって成形され、そ
れぞれの用途に応し、スイッチ接続端子34、一対の電
池接片35の他、これらにつながり、上記半導体素子2
の端子21に接続可能な端子部36を一体的に形成して
いる。
Further, as shown in FIG. 2, the lead frame 3 is connected to each continuous portion 32 by connecting portions 33 from the strip-shaped conductive thin metal plate 31, leaving continuous portions 32 on both side edges.
Each product unit is formed by press punching, and depending on the application, it has a switch connection terminal 34, a pair of battery contact pieces 35, and the semiconductor element 2 connected thereto.
A terminal portion 36 connectable to the terminal 21 is integrally formed.

そして、リードフレーム3の取り付は位置に半導体素子
2が接着剤4などによって固定され、またこの半導体素
子2の真下位置でリードフレーム3の下面側に、耐熱プ
ラスチックなどの耐熱シート5が接着剤6によって固定
されている。半導体素子2の端子21は、導電ワイヤ7
によって、リードフレーム3の端子部36に電気的に接
続される。この状態で、半導体素子2および導電ワイヤ
7は、リードフレーム3の表面側から封止用の樹脂8に
よって覆われ、直接外部に露出しないようになっている
。したがって、半導体素子付リードフレームlは、従来
と同様に、封止用の樹脂8によって覆われているが、こ
の樹脂8は、熱溶融状態でポツティング工程によって成
形されるため、その成形に際し、成形金型などが必要と
されない。
When mounting the lead frame 3, the semiconductor element 2 is fixed in position with an adhesive 4, and a heat-resistant sheet 5 made of heat-resistant plastic is placed on the lower surface of the lead frame 3 directly below the semiconductor element 2. It is fixed by 6. The terminal 21 of the semiconductor element 2 is connected to the conductive wire 7
It is electrically connected to the terminal portion 36 of the lead frame 3 by. In this state, the semiconductor element 2 and the conductive wire 7 are covered with the sealing resin 8 from the front side of the lead frame 3 so that they are not directly exposed to the outside. Therefore, the lead frame l with a semiconductor element is covered with a sealing resin 8 as in the past, but since this resin 8 is molded in a hot molten state by a potting process, the molding No molds are required.

〔製造方法」 半導体素子付リードフレーム1は、第3図のような工程
によって製作される。
[Manufacturing method] The lead frame 1 with a semiconductor element is manufactured by the steps shown in FIG.

まず、プレス打ち抜き工程で、リードフレーム3が導電
性薄金属板31から製品単位毎に連続的に打ち抜かれる
First, in a press punching process, the lead frame 3 is continuously punched out from the conductive thin metal plate 31 for each product.

次の接着工程で、リードフレーム3の表面および裏面側
に、それぞれ接着剤4.6が塗布され、表面側に半導体
素子2が位置決め状態で接着剤4によって固定され、ま
た裏面側で、所定の大きさの耐熱シート5が接着剤6に
よって固定される。
In the next adhesion process, adhesive 4.6 is applied to the front and back sides of the lead frame 3, and the semiconductor element 2 is fixed in position on the front side with the adhesive 4, and on the back side, a predetermined A heat-resistant sheet 5 of the same size is fixed with an adhesive 6.

このあとのワイヤボンディング工程で、半導体素子2の
端子21とリードフレーム3の端子部36との間に導電
ワイヤ7が自動ワイヤポンディング機による熱圧着など
によって取り付けられる。
In the subsequent wire bonding step, the conductive wire 7 is attached between the terminal 21 of the semiconductor element 2 and the terminal portion 36 of the lead frame 3 by thermocompression bonding using an automatic wire bonding machine or the like.

最後のポツティング工程で、リードフレーム3の表面側
から、半導体素子2および導電ワイヤ7を覆うための封
止用の樹脂8が液状または熱溶融状態で、リードフレー
ム3の表面側から所定の量だけ供給される。このとき、
溶融状態の樹脂8は、その流動性によって、半導体素子
2や導電ワイヤ7の空間内にも入り込み、リードフレー
ム3の隙間から下方にも流れ出ようとするが、リードフ
レーム3の裏面側に、耐熱シート5が貼り付けられてい
るため、溶融状態の樹脂8は、耐熱シート5によって保
持され、流失しない。したがって、耐熱シート5の大き
さは、封止用の樹脂8の流失を防止するのに充分な大き
さに設定される。またその耐熱温度は、樹脂8の溶融温
度および加熱硬化過程の加熱温度によっても、変形しな
い値でなければならない。このあと、溶融状態の樹脂8
は、冷却または加熱過程で硬化し、半導体素子2や導電
ワイヤ7の外周面を覆い、リードフレーム3と一体化す
る。
In the final potting step, a predetermined amount of the sealing resin 8 in a liquid or heat-molten state for covering the semiconductor element 2 and the conductive wire 7 is poured from the surface side of the lead frame 3. Supplied. At this time,
Due to its fluidity, the molten resin 8 tends to enter the space of the semiconductor element 2 and the conductive wire 7, and also tends to flow downward through the gap in the lead frame 3. Since the sheet 5 is attached, the resin 8 in a molten state is held by the heat-resistant sheet 5 and does not flow away. Therefore, the size of the heat-resistant sheet 5 is set to be large enough to prevent the sealing resin 8 from flowing away. Further, its heat-resistant temperature must be such that it will not be deformed even by the melting temperature of the resin 8 and the heating temperature during the heat curing process. After this, the molten resin 8
hardens during the cooling or heating process, covers the outer peripheral surfaces of the semiconductor element 2 and the conductive wire 7, and becomes integrated with the lead frame 3.

これらのそれぞれの工程は、連続部32を送り真内部分
として、連続的に行われる。そして、最詩的に連結部3
3が連続部32からカソト工程で切断されることによっ
て、半導体素子付リードフレーム1は、ユニット毎に製
品化される。なお、外付けのための部品例えばスイッチ
や、その他の電気回路部品などは、カント工程後に、リ
ードフレーム3の所定の位置に取り付けられる。
Each of these steps is performed continuously using the continuous portion 32 as the inner feeding portion. And, most poetically, the connecting part 3
3 is cut from the continuous portion 32 in a kasoto process, the lead frame 1 with a semiconductor element is manufactured into units. Note that components for external attachment, such as switches and other electric circuit components, are attached to predetermined positions on the lead frame 3 after the canting process.

〔発明の効果〕〔Effect of the invention〕

本発明では、下記の効果がある。 The present invention has the following effects.

半導体素子および導電ワイヤの封止過程で、インサート
成形が行われず、溶融状態の樹脂の流動性を利用して行
われるため、インサート成形のために高価な金型が必要
とされず、封止工程が簡略化される。
In the process of encapsulating semiconductor elements and conductive wires, insert molding is not performed and the process utilizes the fluidity of the molten resin, so expensive molds are not required for insert molding, and the encapsulation process is simplified. is simplified.

しかも、半導体素子の大きさやリードフレームの形状の
変化に対しても、封止用の樹脂の量を加減するだけで、
半導体素子や導電ワイヤが完全な状態に封止できる。
Moreover, even if the size of the semiconductor element or the shape of the lead frame changes, just adjust the amount of sealing resin.
Semiconductor elements and conductive wires can be completely sealed.

さらに、熱溶融状態の封止過程で、リードフレームの裏
面側に耐熱シートが存在するため、溶融状態の樹脂が流
失せず、半導体素子および導電ワイヤの他、リードフレ
ームの空間部分にも入り込んだ状態で、完全に一体化し
、従来の成形型パッケージとほぼ同様の強度が得られる
Furthermore, during the sealing process in a hot molten state, the presence of a heat-resistant sheet on the back side of the lead frame prevents the molten resin from flowing away, allowing it to enter not only the semiconductor elements and conductive wires but also the open spaces in the lead frame. In this state, it is fully integrated and has almost the same strength as a conventional molded package.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の半導体素子付リードフレームの断面図
、第2図は帯状の導電性薄金属板およびリードフレーム
の平面図、第3図は半導体素子付リードフレームの製造
工程の説明図である。 1・・半導体素子付リードフレーム、2・・半導体素子
、3・・リードフレーム、4・・接着剤、5・・耐熱シ
ート、6・・接着剤、7・・導電ワイヤ、8・・樹脂。 特 許 出 願 人 株式会社三協精機製作所代   
理   人 弁理士 中 川 國 実弟7図 第3図 第2図 421 5
Fig. 1 is a sectional view of a lead frame with a semiconductor element of the present invention, Fig. 2 is a plan view of a strip-shaped conductive thin metal plate and the lead frame, and Fig. 3 is an explanatory diagram of the manufacturing process of the lead frame with a semiconductor element. be. 1. Lead frame with semiconductor element, 2. Semiconductor element, 3. Lead frame, 4. Adhesive, 5. Heat resistant sheet, 6. Adhesive, 7. Conductive wire, 8. Resin. Patent applicant Sankyo Seiki Seisakusho Co., Ltd.
Attorney Patent Attorney Kuni Nakagawa Younger brother 7 Figure 3 Figure 2 421 5

Claims (1)

【特許請求の範囲】[Claims] 半導体素子と、この半導体素子が取り付けられるリード
フレームと、上記半導体素子とリードフレームとを結合
する導電ワイヤと、上記半導体素子および導電ワイヤを
覆う樹脂と、上記半導体素子の真下に位置し、かつリー
ドフレームの裏面側に配置された耐熱シートとを備え、
上記樹脂で半導体素子を封止してなることを特徴とする
半導体素子付リードフレームの構造。
A semiconductor element, a lead frame to which the semiconductor element is attached, a conductive wire that connects the semiconductor element and the lead frame, a resin that covers the semiconductor element and the conductive wire, and a lead located directly below the semiconductor element. Equipped with a heat-resistant sheet placed on the back side of the frame,
A structure of a lead frame with a semiconductor element, characterized in that the semiconductor element is sealed with the resin described above.
JP5168590A 1990-03-05 1990-03-05 Structure of lead frame with semiconductor device attached Pending JPH03254135A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP5168590A JPH03254135A (en) 1990-03-05 1990-03-05 Structure of lead frame with semiconductor device attached
CN 91101183 CN1030216C (en) 1990-03-05 1991-02-22 Electronic sound-producing device
KR1019910002989A KR0165544B1 (en) 1990-03-05 1991-02-25 Electronic sound producing device
US07/662,522 US5264656A (en) 1990-03-05 1991-02-28 Electronic sound generating device
GB9104356A GB2243479B (en) 1990-03-05 1991-03-01 Electronic sound generating device
DE4106824A DE4106824A1 (en) 1990-03-05 1991-03-04 ELECTRONIC SOUND GENERATOR DEVICE AND METHOD FOR THEIR PRODUCTION
FR9102621A FR2659164B1 (en) 1990-03-05 1991-03-05

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5168590A JPH03254135A (en) 1990-03-05 1990-03-05 Structure of lead frame with semiconductor device attached

Publications (1)

Publication Number Publication Date
JPH03254135A true JPH03254135A (en) 1991-11-13

Family

ID=12893747

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5168590A Pending JPH03254135A (en) 1990-03-05 1990-03-05 Structure of lead frame with semiconductor device attached

Country Status (1)

Country Link
JP (1) JPH03254135A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5487181A (en) * 1977-12-23 1979-07-11 Hitachi Ltd Resin sealing method for semiconductor element

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5487181A (en) * 1977-12-23 1979-07-11 Hitachi Ltd Resin sealing method for semiconductor element

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