JPH03249572A - Device and method for inspecting electrical contact - Google Patents

Device and method for inspecting electrical contact

Info

Publication number
JPH03249572A
JPH03249572A JP2045836A JP4583690A JPH03249572A JP H03249572 A JPH03249572 A JP H03249572A JP 2045836 A JP2045836 A JP 2045836A JP 4583690 A JP4583690 A JP 4583690A JP H03249572 A JPH03249572 A JP H03249572A
Authority
JP
Japan
Prior art keywords
electrical contact
gauge
inspected
tested
contacts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2045836A
Other languages
Japanese (ja)
Other versions
JPH0782062B2 (en
Inventor
Kunihiro Tsuchiya
土屋 都広
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Pencil Co Ltd
Original Assignee
Mitsubishi Pencil Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Pencil Co Ltd filed Critical Mitsubishi Pencil Co Ltd
Priority to JP2045836A priority Critical patent/JPH0782062B2/en
Publication of JPH03249572A publication Critical patent/JPH03249572A/en
Publication of JPH0782062B2 publication Critical patent/JPH0782062B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To simplify a structure and to reduce the cost drastically as compared with a conventional picture processor by discriminating respectively whether an electrical connection is accomplished or not between a gage and electrical contacts to be inspected when the gage is moved for a specified distance. CONSTITUTION:When a gap 1a of the electrical contacts 1 to be inspected is narrower than the minimum allowable value in the specified allowance range, the gage 2 can not be inserted to the gap 1a of contacts 1 to be inspected and the tip of gape 2 is abutted to the tip of contacts 1. The gage 2 is pushed back, and a slider 6 goes back then the back end part of which is detected by a proximity switch 11. On the other hand, when the gap 1a of contacts 1 to be inspected exceeds the maximum allowable value, the gage 2 becomes non-contact state with the contacts 1 to be inspected in the vertical movement of a lifter 12, therefore becomes non-connection state with a connecting terminal 13. Consequently, only when both contacts are electrically connected with the connecting terminal 13, a discriminating means is operated, whereby the dimension of gap 1a is confirmed as normal.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は電子部品としての電気接点の検査装置及びその
検査方法に係り、より詳しくは二股形状の電気接点の隙
間寸法が正常か否かを検査する電気接点検査装置及びそ
の検査方法に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to an inspection device and an inspection method for electrical contacts as electronic components, and more specifically, to a method for inspecting whether the gap size of a bifurcated electrical contact is normal or not. The present invention relates to an electrical contact testing device and its testing method.

〔従来の技術〕[Conventional technology]

一般に、電子部品としてのコネクタにおける二股形状の
電気接点1は第5図に示すように先端に隙間1aを有し
、この隙間1aは概ね1 wasと狭小であって、従来
では隙間1aの寸法が正常か否かを画像処理装置によっ
て検査している。
Generally, a bifurcated electrical contact 1 in a connector as an electronic component has a gap 1a at the tip as shown in FIG. 5, and this gap 1a is as narrow as approximately 1 was. An image processing device is used to check whether it is normal or not.

すなわち、上記画像処理装置はテレビカメラのような撮
像機で二股形状の電気接点1を撮像し、この映像を受像
機に拡大して映し出し、受像機の画面上において電気接
点1の先端部の左右方向及び上下方向の座標を読取るこ
とで、隙間1aの寸法が正常か否かを検査している。
That is, the above-mentioned image processing device images the bifurcated electrical contact 1 with an imaging device such as a television camera, enlarges and projects this image on the receiver, and displays the right and left ends of the electrical contact 1 on the screen of the receiver. By reading the coordinates in the direction and the vertical direction, it is inspected whether the dimensions of the gap 1a are normal or not.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、上記画像処理装置は撮像機や受像機など
が必要であるため、構造が複雑であるとともに高価であ
り、そして上記画像処理装置は電気接点1を一個づつ受
像機に映し出して検査するため、検査に要する時間が長
くなってしまうという問題点があった。
However, since the image processing device requires an image pickup device, a receiver, etc., it has a complicated structure and is expensive, and since the image processing device inspects the electrical contacts 1 one by one by projecting them onto the receiver, There is a problem in that the time required for the inspection becomes long.

そこで、本発明は上記事情を考慮してなされたもので、
その目的とするところは、機械的接触方式を用いて安価
で、且つ検査時間を短縮化した電気接点検査装置及びそ
の検査方法を提供することにある。
Therefore, the present invention has been made in consideration of the above circumstances.
The purpose is to provide an electrical contact testing device and its testing method that uses a mechanical contact method and is inexpensive and shortens the testing time.

〔課題を解決するための手段〕[Means to solve the problem]

上記の目的を達成するために、本発明に係る電気接点検
査装置にあっては、櫛歯形状に形成し且つ二股形状に形
成した被検査電気接点の隙間許容範囲における最小許容
値に等しく厚さを設定した導電性のゲージと、このゲー
ジを固定して被検査電気接点の開口部方向に所定距離移
動させる第一の移動手段と、この第一の移動手段による
ゲージの移動方向に対して直交する両方向にゲージを所
定距離各々移動させる第二の移動手段と、上記被検査電
気接点とゲージの各端部を電気的に接続する接続手段と
を備え、上記第二の移動手段でゲージを所定距離各々移
動させた際に上記被検査電気接点との間で導通の成否を
各々識別することを特徴とする。
In order to achieve the above object, the electrical contact testing device according to the present invention has a thickness equal to the minimum allowable gap in the gap tolerance range of the electrical contact to be tested, which is formed in a comb shape and a bifurcated shape. a conductive gauge, a first moving means that fixes this gauge and moves it a predetermined distance in the direction of the opening of the electrical contact to be inspected, and a conductive gauge that is perpendicular to the direction in which the gauge is moved by the first moving means. a second moving means for moving the gauge a predetermined distance in both directions, and a connecting means for electrically connecting the electrical contact to be inspected and each end of the gauge; It is characterized in that when each distance is moved, the success or failure of continuity with the electrical contact to be tested is determined.

上記第一の移動手段が被検査電気接点の開口部方向に対
して逆方向に移動した場合に、これを近接スイッチで検
知することが好ましい。
When the first moving means moves in a direction opposite to the opening direction of the electrical contact to be inspected, it is preferable that this is detected by a proximity switch.

また、本発明に係る電気接点検査方法は、櫛歯形状に形
成し且つ二股形状に形成した被検査電気接点の隙間許容
範囲における最小許容値に等しく厚さを設定した導電性
のゲージを被検査電気接点の開口部方向に所定距離移動
させ、次いで上記ゲージを被検査電気接点の開口部方向
に対して直交する両方向に所定距離各々移動させて被検
査電気接点とゲージとの間で導通の成否を各々識別する
ことを特徴とする。
In addition, the electrical contact testing method according to the present invention uses a conductive gauge formed in a comb shape and a bifurcated shape and whose thickness is set equal to the minimum allowable value in the gap tolerance range of the electrical contact to be tested. The gauge is moved a predetermined distance in the direction of the opening of the electrical contact to be tested, and then the gauge is moved a predetermined distance in both directions perpendicular to the opening direction of the electrical contact to be tested to determine whether continuity is established between the electrical contact to be tested and the gauge. It is characterized by identifying each.

〔作  用〕[For production]

上記の構成を有する本発明において、被検査電気接点の
隙間が所定の許容範囲にあるときは、まずゲージを被検
査電気接点の開口部方向に所定距離移動させ、次いでゲ
ージを被検査電気接点の開口部方向1′一対して直交す
る両方向に所定距離各々移動させると、その両方向にお
いてゲージが被検査電気接点との間で導通することとな
って、隙間が正常寸法であると識別される。ここで、隙
間が所定の許容範囲における最大許容値を超えたとき、
或いは被検査電気接点の先端が破損している場合には、
少なくとも一方の接点がゲージとの間で不導通となる。
In the present invention having the above configuration, when the gap between the electrical contacts to be tested is within a predetermined tolerance range, the gauge is first moved a predetermined distance in the direction of the opening of the electrical contacts to be tested, and then the gauge is moved between the electrical contacts to be tested. When the gauge is moved a predetermined distance in both directions perpendicular to the opening direction 1', the gauge becomes electrically conductive with the electrical contact to be tested in both directions, and the gap is identified as having a normal size. Here, when the gap exceeds the maximum allowable value in the predetermined allowable range,
Or, if the tip of the electrical contact to be inspected is damaged,
At least one contact becomes non-conductive with the gauge.

また、被検査電気接点の隙間が所定の許容範囲における
最小許容値に満たないときは、ゲージを開口部方向に所
定距離移動させようとしても、ゲージの厚さを被検査電
気接点の隙間許容範囲における最小許容値に等しく設定
していることがら、隙間に挿入不可能である。
In addition, if the gap between the electrical contacts to be tested is less than the minimum allowable value within the specified tolerance range, even if you try to move the gauge a certain distance in the direction of the opening, the thickness of the gauge will be reduced to within the allowable gap of the electrical contacts to be tested. Since it is set equal to the minimum allowable value, it is impossible to insert it into the gap.

〔実 施 例〕〔Example〕

以下、本発明の実施例を図面に基づいて説明する。第4
図及び第5図に示すように、検査を受ける二股形状の被
検査電気接点1はその先端に概ね1■■と狭小な隙間1
aか形成されており、被検査電気接点1はハウジング3
に形成した複数の凹部に圧入され多極数とされている。
Embodiments of the present invention will be described below based on the drawings. Fourth
As shown in the figure and FIG.
A is formed, and the electrical contact 1 to be inspected is located in the housing 3.
It is press-fitted into a plurality of concave portions formed in the plate to provide a large number of poles.

ゲージ2は全体の厚さを被検査電気接点1の隙間許容範
囲の最小許容値に等しく設定することにより、最小許容
値に満たない隙間に対して開口部方向への挿入を不可能
としている。このゲージ2は櫛歯形状に形成されている
ことから、ハウジング3に圧入された多極数の被検査電
気接点1を一度で検査することができるようになってい
る。
The entire thickness of the gauge 2 is set equal to the minimum allowable gap range of the electrical contact 1 to be inspected, thereby making it impossible to insert the gauge 2 in the direction of the opening into a gap that is less than the minimum allowable value. Since the gauge 2 is formed in a comb-teeth shape, it is possible to test a large number of electrical contacts 1 press-fitted into the housing 3 at one time.

ゲージ2は導電性を有しホルダー4によって固定保持さ
れている。基台5は図示しない治具に固定した被検査電
気接点1に向って前後移動可能であり、基台5の上部に
は同様に被検査電気接点1に向って摺動自在に第一の移
動手段としてのスライダー6を取付けている。このスラ
イダー6にはホルダー4を一体的に固定している。これ
により、ゲージ2も基台5に対するスライダー6の摺動
により被検査電気接点1に向って前後移動可能である。
The gauge 2 has electrical conductivity and is fixedly held by a holder 4. The base 5 is movable back and forth toward the electrical contact 1 to be inspected fixed to a jig (not shown), and the base 5 has a first movable member on the top that is also slidable toward the electrical contact 1 to be inspected. A slider 6 is attached as a means. A holder 4 is integrally fixed to this slider 6. Thereby, the gauge 2 can also be moved back and forth toward the electrical contact 1 to be tested by sliding the slider 6 with respect to the base 5.

なお、基台5は図示しない駆動源によって被検査電気接
点1に向って所定距離前後移動するように構成されてい
る。
The base 5 is configured to move back and forth a predetermined distance toward the electrical contact 1 to be inspected by a drive source (not shown).

スライダー6の後端部にはスライダー6を前方向に付勢
するスプリング7の一端が装着されているとともに、ス
プリング7の他端が基台5の後部に固定された支持台8
に螺合する調節ねじ9の先端に取付けられ、スプリング
7の付勢力は調節ねじりを調節することで変更可能にな
っている。また、基台5に対するスライダー6の前進限
の位置は支持台8の上部に設けたストッパねじ10によ
って調節可能になっている。そして、スライダー6の後
退位置と対応する位置の支持台8には近接スイッチ11
が配置されている。
One end of a spring 7 that urges the slider 6 forward is attached to the rear end of the slider 6, and the other end of the spring 7 is fixed to a support base 8 at the rear of the base 5.
The biasing force of the spring 7 can be changed by adjusting the adjustment twist. Further, the forward limit position of the slider 6 relative to the base 5 can be adjusted by a stopper screw 10 provided on the upper part of the support base 8. A proximity switch 11 is mounted on the support base 8 at a position corresponding to the retreated position of the slider 6.
is located.

基台5は第二の移動手段としてのりフタ−12に取付け
られ、このリフター12は基台5を図示しない駆動源に
よって所定距離上下動可能に構成している。
The base 5 is attached to a lifter 12 as a second moving means, and the lifter 12 is configured to be able to move the base 5 up and down a predetermined distance by a drive source (not shown).

検査を受ける電気接点1の後端部には、接続手段として
の接続端子13が取付けられ、接続端子13としてはプ
ローブが用いられ、このプローブにはゲージ2の後端部
と接続するためのCOM(共通)端子が備えられている
。そして、接続端子13とゲージ2の後端部との間には
、被検査電気接点1にゲージ2の先端部が接触して導通
状態になった場合にこれを識別するために、電流計或い
はブザーやランプなどの識別手段、これを作動させるた
めの電源などが接続されている。
A connecting terminal 13 as a connecting means is attached to the rear end of the electrical contact 1 to be inspected, a probe is used as the connecting terminal 13, and this probe has a COM for connecting to the rear end of the gauge 2. (common) terminal is provided. Between the connection terminal 13 and the rear end of the gauge 2, there is an ammeter or It is connected to identification means such as buzzers and lamps, and the power supply to operate them.

次に、本実施例の作用を説明する。Next, the operation of this embodiment will be explained.

ゲージ2の上下方向の位置が被検査電気接点1の隙間1
aの中心となる位置でリフター12を停止させた状態に
おいて、隙間1aが所定の許容範囲にあるときは基台5
が被検査電気接点1に対し、所定位置まで前進して、第
3図(A)に示すようにゲージ2は被検査電気接点1の
開口部方向より隙間]aに挿入される。
The vertical position of the gauge 2 is the gap 1 of the electrical contact 1 to be tested.
When the lifter 12 is stopped at the center position of a, if the gap 1a is within the predetermined tolerance range, the base 5
The gauge 2 is advanced to a predetermined position relative to the electrical contact 1 to be tested, and the gauge 2 is inserted into the gap [a] from the direction of the opening of the electrical contact 1 to be tested, as shown in FIG. 3(A).

次いで、リフター12が上下方向に隙間1aの最大許容
値の範囲で移動を行う。すなわち、ゲージ2を被検査電
気接点1の開口部方向に対して直交する両方向に所定距
離各々移動させる。すると、第3図(B)、(C)に示
すようにゲージ2は被検査電気接点1と接続端子13と
の間で共に導通状態となる。
Next, the lifter 12 moves vertically within the maximum allowable value of the gap 1a. That is, the gauge 2 is moved a predetermined distance in both directions orthogonal to the opening direction of the electrical contact 1 to be inspected. Then, as shown in FIGS. 3(B) and 3(C), the gauge 2 becomes electrically conductive between the electrical contact 1 to be tested and the connecting terminal 13.

ここで、被検査電気接点1の隙間1aが所定の許容範囲
における最小許容値に満たないときは、基台5が所定位
置までに前進してもゲージ2が被検査電気接点1の隙間
1aに挿入できず、第3図(D)に示すように電気接点
1の先端にゲージ2の先端が当接するので、ゲージ2は
押し返されてスライダー6が基台5に対して後退し、ス
ライダー6の後端部が近接スイッチ11により検出され
ることになる。
Here, if the gap 1a between the electrical contacts 1 to be inspected is less than the minimum allowable value in the predetermined tolerance range, the gauge 2 will not close to the gap 1a between the electrical contacts 1 to be inspected even if the base 5 moves forward to the predetermined position. The tip of the gauge 2 comes into contact with the tip of the electrical contact 1 as shown in FIG. The rear end of the sensor will be detected by the proximity switch 11.

他方、被検査電気接点1の隙間1aが所定の許容範囲に
おける最大許容値を超えたときは、第3図(E)、(F
)に示すようにリフター12の上下移動において、ゲー
ジ2と被検査電気接点1は非接触状態となるので、接続
端子13の間で非導通状態となる。また、被検査電気接
点1の先端が破損している場合も同図(G)に示すよう
にいずれか一方の接点が接続端子13の間で非導通状態
となる。
On the other hand, when the gap 1a of the electrical contact 1 to be inspected exceeds the maximum allowable value in the predetermined allowable range,
), when the lifter 12 moves up and down, the gauge 2 and the electrical contact 1 to be tested come out of contact, so that there is no conduction between the connection terminals 13. Further, even if the tip of the electrical contact 1 to be inspected is damaged, one of the contacts becomes non-conductive between the connecting terminals 13, as shown in FIG.

したがって、双方の接点が共に接続端子13の間で導通
するときのみ、ブザーやランプなどの識別手段が作動し
て被検査電気接点1の隙間1aの寸法が正常であると確
認される。また、スライダー6の後退が近接スイッチ1
1により検出された場合は隙間1aが狭すぎると識別さ
れる。そして、少なくとも一方の接点と接続端子13と
の間が非導通となった場合は被検査電気接点1の隙間1
aが広すぎるか、或いは電気接点1の先端部に破損が生
じているものと識別される。
Therefore, only when both contacts are electrically connected between the connecting terminals 13, the identification means such as a buzzer or a lamp is activated, and it is confirmed that the size of the gap 1a between the electrical contacts 1 to be inspected is normal. Also, when the slider 6 retreats, the proximity switch 1
1, it is determined that the gap 1a is too narrow. If there is no continuity between at least one of the contacts and the connecting terminal 13, the gap 1 of the electrical contact 1 to be inspected is
It is determined that a is too wide or that the tip of the electrical contact 1 is damaged.

ここで、導通を確認するタイミングとしてはりフタ−1
2の上死点と下死点の三箇所において行うこととする。
Here, the timing to check the continuity is to check the beam lid 1.
This will be done at three locations: top dead center and bottom dead center.

このように本実施例によれば、ゲージ2を上下動させて
被検査電気接点1との間で導通の成否をブザーやランプ
などの識別手段の作動によって識別するようにしたので
、被検査電気接点1の隙間1aの寸法が正常であるか否
か及び電気接点1先端部の破損を即座に確認することが
できる。
As described above, according to the present embodiment, the success or failure of continuity between the gauge 2 and the electrical contact 1 to be tested is determined by the operation of the identification means such as a buzzer or lamp by moving the gauge 2 up and down. It is possible to immediately check whether the dimensions of the gap 1a of the contact 1 are normal or not and whether the tip of the electrical contact 1 is damaged.

なお、本発明は上記実施例に限らず種々の変更が可能で
ある。例えば、上記実施例ではりフタ−12の上部に基
台5を前後移動可能に設け、基台5を介してスライダー
6を前後移動可能としたが、リフター12の上部に直接
スライダー6を設けてもよい。この場合には支持台12
も直接リフター12に固定しておく。
Note that the present invention is not limited to the above-mentioned embodiments, and various modifications can be made. For example, in the above embodiment, the base 5 is provided on the top of the lifter 12 so as to be movable back and forth, and the slider 6 is movable back and forth via the base 5. Good too. In this case, the support stand 12
is also fixed directly to the lifter 12.

また、上記実施例では被検査電気接点1に対して基台5
を前後移動可能とするとともに、リフター12を上下動
可能に構成したが、これに限らず被検査電気接点1の開
口部方向を上記実施例から例えば90度向回転せた場合
には電気接点検査装置も同様に90度向回転せた構成と
し、この場合リフター12はゲージ2を被検査電気接点
1の開口部方向に対して直交する左右両方向に各々移動
させる構成となる。
Furthermore, in the above embodiment, the base 5 is
Although the lifter 12 is configured to be movable back and forth, and the lifter 12 is movable up and down, the present invention is not limited to this, and if the opening direction of the electrical contact 1 to be inspected is rotated, for example, by 90 degrees from the above embodiment, the electrical contact inspection can be performed. The apparatus is also configured to be rotated by 90 degrees, and in this case, the lifter 12 is configured to move the gauge 2 in both left and right directions orthogonal to the opening direction of the electrical contact 1 to be tested.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明に係る電気接点検査装置に
よれば、被検査電気接点の隙間の寸法の相違を機械的な
接触方式によって識別可能であるので、従来のような画
像処理装置に比べて、構造を簡略化しコストを大幅に低
減できる。また、ゲージを櫛歯形状に形成したので、多
極数の場合の全極数を同時に検査することができ、その
結果画像処理装置よりも検査時間が少なくて済み、検査
効率が著しく向上する。
As explained above, according to the electrical contact inspection device according to the present invention, differences in the gap dimensions of the electrical contacts to be inspected can be identified by a mechanical contact method, so compared to conventional image processing devices. This simplifies the structure and significantly reduces costs. Furthermore, since the gauge is formed into a comb-teeth shape, all the number of poles can be inspected at the same time in the case of a large number of poles, and as a result, the inspection time is shorter than that of an image processing device, and the inspection efficiency is significantly improved.

また、本発明に係る電気接点検査方法によれば、被検査
電気接点の隙間の寸法が正常か否かを容易に識別可能で
あるので、検査の自動化が図れるという効果を奏する。
Further, according to the electrical contact testing method according to the present invention, it is possible to easily identify whether the size of the gap between the electrical contacts to be tested is normal or not, so that the testing can be automated.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る電気接点検査装置の一実施例を示
す側面図、 第2図は同検査装置の正面図、 第3図(A)〜(G)は同実施例のゲージによる各種電
気接点の検査状態を示す拡大図、第4図は電気接点を多
極数としそれに対応するゲージの部分斜視図、 第5図は被検査電気接点の拡大斜視図である。 1・・・被検査電気接点、2・・・ゲージ、4・・・ホ
ルダー    5・・・基台、6・・・スライダー(第
一の移動手段)、7・・・スプリング、  8・・・支
持台、9・・・調節ねじ、    10・・・ストッパ
ねじ、11・・・近接スイッチ、 12・・−リフター (第二の移動手段) 3・・・接続端子 (接続手段)
Fig. 1 is a side view showing an embodiment of the electrical contact inspection device according to the present invention, Fig. 2 is a front view of the same inspection device, and Figs. 3 (A) to (G) are various types of gauges of the same embodiment. FIG. 4 is a partial perspective view of a gauge corresponding to a multi-pole electrical contact, and FIG. 5 is an enlarged perspective view of the electrical contact to be tested. DESCRIPTION OF SYMBOLS 1... Electric contact to be inspected, 2... Gauge, 4... Holder 5... Base, 6... Slider (first moving means), 7... Spring, 8... Support stand, 9...adjustment screw, 10...stopper screw, 11...proximity switch, 12...-lifter (second moving means) 3...connection terminal (connection means)

Claims (1)

【特許請求の範囲】 1、櫛歯形状に形成し且つ二股形状に形成した被検査電
気接点の隙間許容範囲における最小許容値に等しく厚さ
を設定した導電性のゲージと、このゲージを固定して被
検査電気接点の開口部方向に所定距離移動させる第一の
移動手段と、この第一の移動手段によるゲージの移動方
向に対して直交する両方向にゲージを所定距離各々移動
させる第二の移動手段と、上記被検査電気接点とゲージ
の各端部を電気的に接続する接続手段とを備え、上記第
二の移動手段でゲージを所定距離各々移動させた際に上
記被検査電気接点との間で導通の成否を各々識別するこ
とを特徴とする電気接点検査装置。 2、第一の移動手段が被検査電気接点の開口部方向に対
して逆方向に移動することを検知する近接スイッチを有
する請求項1記載の電気接点検査装置。 3、櫛歯形状に形成し且つ二股形状に形成した被検査電
気接点の隙間許容範囲における最小許容値に等しく厚さ
を設定した導電性のゲージを被検査電気接点の開口部方
向に所定距離移動させ、次いで上記ゲージを被検査電気
接点の開口部方向に対して直交する両方向に所定距離各
々移動させて被検査電気接点とゲージとの間で導通の成
否を各々識別することを特徴とする電気接点検査方法。 4、ゲージを被検査電気接点の開口部方向に所定距離移
動させた際に、その逆方向の移動を検知してなる請求項
3記載の電気接点検査方法。
[Claims] 1. A conductive gauge formed in a comb shape and a bifurcated shape and having a thickness set equal to the minimum allowable value in the gap tolerance range of the electrical contact to be inspected, and this gauge is fixed. a first moving means that moves the gauge a predetermined distance in the direction of the opening of the electrical contact to be inspected, and a second moving means that moves the gauge a predetermined distance in both directions perpendicular to the direction in which the gauge is moved by the first moving means. and connecting means for electrically connecting the electrical contacts to be inspected and each end of the gauge, the electrical contact being electrically connected to the electrical contacts to be inspected when each of the gauges is moved a predetermined distance by the second moving means. An electrical contact testing device characterized by determining the success or failure of continuity between the two. 2. The electrical contact testing device according to claim 1, further comprising a proximity switch for detecting that the first moving means moves in a direction opposite to the opening direction of the electrical contact to be tested. 3. Move a conductive gauge formed into a comb tooth shape and bifurcated shape with a thickness set equal to the minimum allowable value in the gap tolerance range of the electrical contact to be tested a predetermined distance in the direction of the opening of the electrical contact to be tested. and then moving the gauge by a predetermined distance in both directions orthogonal to the opening direction of the electrical contact to be tested to identify whether continuity is established between the electrical contact to be tested and the gauge. Contact inspection method. 4. The electrical contact testing method according to claim 3, wherein when the gauge is moved a predetermined distance toward the opening of the electrical contact to be tested, movement in the opposite direction is detected.
JP2045836A 1990-02-28 1990-02-28 Electric contact inspection device and its inspection method Expired - Lifetime JPH0782062B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2045836A JPH0782062B2 (en) 1990-02-28 1990-02-28 Electric contact inspection device and its inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2045836A JPH0782062B2 (en) 1990-02-28 1990-02-28 Electric contact inspection device and its inspection method

Publications (2)

Publication Number Publication Date
JPH03249572A true JPH03249572A (en) 1991-11-07
JPH0782062B2 JPH0782062B2 (en) 1995-09-06

Family

ID=12730309

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2045836A Expired - Lifetime JPH0782062B2 (en) 1990-02-28 1990-02-28 Electric contact inspection device and its inspection method

Country Status (1)

Country Link
JP (1) JPH0782062B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0578482U (en) * 1991-12-26 1993-10-26 松下電工株式会社 Jig for removing frame of IC socket
JP2006162370A (en) * 2004-12-06 2006-06-22 Fujitsu Ltd Circuit board testing device
JP2006170833A (en) * 2004-12-16 2006-06-29 Fujitsu Ltd Device of testing connector

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0578482U (en) * 1991-12-26 1993-10-26 松下電工株式会社 Jig for removing frame of IC socket
JP2006162370A (en) * 2004-12-06 2006-06-22 Fujitsu Ltd Circuit board testing device
JP2006170833A (en) * 2004-12-16 2006-06-29 Fujitsu Ltd Device of testing connector

Also Published As

Publication number Publication date
JPH0782062B2 (en) 1995-09-06

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