JPH0324487A - Nuclear magnetic resonance probe - Google Patents

Nuclear magnetic resonance probe

Info

Publication number
JPH0324487A
JPH0324487A JP1159252A JP15925289A JPH0324487A JP H0324487 A JPH0324487 A JP H0324487A JP 1159252 A JP1159252 A JP 1159252A JP 15925289 A JP15925289 A JP 15925289A JP H0324487 A JPH0324487 A JP H0324487A
Authority
JP
Japan
Prior art keywords
temperature
sample
coils
heating
tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1159252A
Other languages
Japanese (ja)
Inventor
Hiroshi Ikeda
博 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP1159252A priority Critical patent/JPH0324487A/en
Publication of JPH0324487A publication Critical patent/JPH0324487A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent a lowering of resolutions by heating a sample part concentratedly above a part facing coils wound in the perimeter of a test tube to suppress convection within the test tube. CONSTITUTION:Air kept at an optional temperature by a temperature adjusting means 10 is introduced to an air reservoir 7 to keep a temperature of a part above saddle-type coils 3a and 3b wound on a test tube 1 with nozzles 6a and 6c. This heating temperature is set at a value slightly higher than a rising temperature by an induction heating from a transmitting circuit 5. Thus, the temperature of a sample 2 above the coils 3a and 3b becomes higher than the temperature thereof 2 at a position facing the coils 3a and 3b to eliminate convection within the tube 1 thereby enabling prevention of a drop in resolutions.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、核磁気共鳴装置(NMR)に用いられるプロ
ープに関し、特に分解能を向上させることのできるブロ
ープを提供するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a probe used in a nuclear magnetic resonance apparatus (NMR), and particularly provides a probe capable of improving resolution.

[従来の技術] 近時、NMRにおいては試料に照射する高周波の周波数
が非常に高くなっており、数100MHzにまで達して
いる。
[Prior Art] Recently, in NMR, the frequency of high-frequency waves that irradiate a sample has become extremely high, reaching several hundred MHz.

[発明が解決しようとする課題] このように試料に照射される周波数が高くなると、誘電
加熱により試料の温度が上昇し、.分解能に悪影響を与
える。また、プローブのコイルへ供給される高周波電力
も増大しており、コイルの発熱による試料温度の上昇も
みられる。この温度上昇は、特に、デカップリングを行
う時に著しい。
[Problems to be Solved by the Invention] As the frequency with which the sample is irradiated increases as described above, the temperature of the sample increases due to dielectric heating. adversely affects resolution. Furthermore, the high-frequency power supplied to the probe coil is increasing, and the sample temperature is also rising due to the heat generated by the coil. This temperature increase is particularly significant when decoupling is performed.

本発明者が確認したところでは、温度上昇に伴う分解能
の低下は、主に温度上昇によって試料管内部で対流が発
生するためである。
The present inventor has confirmed that the decrease in resolution as the temperature rises is mainly due to the generation of convection inside the sample tube due to the rise in temperature.

そこで、本発明は上述した点に鑑みてなされたもので、
試料管内部での対流を抑えることにより分解能の低下を
防ぐことのできるブロープを提供することを目的とする
ものである。
Therefore, the present invention has been made in view of the above points, and
The object of the present invention is to provide a probe that can prevent a decrease in resolution by suppressing convection inside a sample tube.

[課題を解決するための手段] 上記目的を達成するため、本発明のプローブは、試料を
収容した試料管と、試料管の外周に置かれ、かつ試料液
に高周波磁界を照射するためのコイルとを備えたプロー
ブにおいて、前記試料管周囲に巻回されたコイルと対面
する部分よりも上方の試料部分を集中的に加熱する手段
を設けたことを特徴とするものである。
[Means for Solving the Problems] In order to achieve the above object, the probe of the present invention includes a sample tube containing a sample, and a coil placed on the outer periphery of the sample tube for irradiating a high-frequency magnetic field to the sample liquid. The probe is characterized in that it is provided with means for intensively heating a portion of the sample above the portion facing the coil wound around the sample tube.

以下、本発明の一実施例を図面に基づいて詳説する。Hereinafter, one embodiment of the present invention will be explained in detail based on the drawings.

[実施例] 第1図は本発明に係るプロープの一例を示す概略図、第
2図は本発明の要部を示す拡大断面図である。
[Example] Fig. 1 is a schematic diagram showing an example of a probe according to the present invention, and Fig. 2 is an enlarged sectional view showing the main part of the present invention.

第1図において、1は試料管で、内部に試料2が収容さ
れている。3a,3bは前記試料2をその間に挾むよう
に配置された鞍型コイルで、試料2に高周波磁界を照射
するためのものである。4はこれらのコイルを保持する
ためのボビンで、前記試料管の外周に任意な隙間を保っ
て配置される。
In FIG. 1, 1 is a sample tube, and a sample 2 is housed inside. 3a and 3b are saddle-shaped coils arranged so as to sandwich the sample 2 therebetween, and are used to irradiate the sample 2 with a high-frequency magnetic field. Reference numeral 4 denotes a bobbin for holding these coils, which is arranged around the outer periphery of the sample tube with an arbitrary gap maintained therebetween.

5は前記コイル3a,3bに高周波電力を印加するため
の観測用送信回路である。
5 is an observation transmitting circuit for applying high frequency power to the coils 3a and 3b.

6a乃至6dは前記ボビン4のコイル3a,3bよりも
上方部に貫通して設けられたノズルで、各ノズルは第2
図に示すように略等間隔に配置されると共に、内側の先
端が前記試料管1に接近して配置される。また、各ノズ
ルの外側端部はボビン4の外周部に固定されたリング状
の空気溜め7に連通されている。8は前記空気溜め7内
にバイブ9を介してエアーを供給するためのコンブレッ
サ、10は前記パイプ9の途中に設けられた温度調節手
段、11はこの温度調節手段の温度を設定するための人
力手段である。
6a to 6d are nozzles provided above the coils 3a and 3b of the bobbin 4, and each nozzle is a second nozzle.
As shown in the figure, they are arranged at approximately equal intervals, and their inner tips are arranged close to the sample tube 1. Further, the outer end of each nozzle communicates with a ring-shaped air reservoir 7 fixed to the outer periphery of the bobbin 4. 8 is a compressor for supplying air into the air reservoir 7 via the vibrator 9; 10 is a temperature control means provided in the middle of the pipe 9; and 11 is a human power for setting the temperature of this temperature control means. It is a means.

かようになせば、温度調節手段10により任意温度に保
たれたコンプレッサ8からのエアーが空気溜め7に導入
され各ノズル6a乃至6dより噴出するため、試料2の
コイル3a,3bより上方部分の温度を任意温度に保つ
ことができる。また、コイル3a,3bに送信回路5よ
り所望の高周波電力を供給すると、試料2のコイルと対
面している部分が誘電加熱などによってある温度まで上
昇する。そこで、温度調節手段10によるエアーの加熱
温度を前記試料が誘電加熱などにより上昇する温度より
も僅かに高い温度に設定すれば、コイル上方の試料温度
がコイルと対面する位置の試料温度よりも高くなるため
、試料の対流を防止することができる。従って、予め供
給電力に応じた試料の上昇温度を測定しておき、温度調
整手段10の設定温度を供給電力に対応して変化させれ
ば良い。ここで、入力手段11にメモリーを組込み、こ
のメモリーに前述した供給電力に応じた試料の上昇温度
をテーブルとして格納し、第1図中点線で示すように送
信回路5より観測すべき供給電力を示す出力信号を人力
手段11に導入するように構或すれば、コイル3a,3
bへの電力供給動作に連動して試料管1に吹き付けるエ
アーの温度を自動的に設定することができる。
By doing this, the air from the compressor 8 maintained at an arbitrary temperature by the temperature control means 10 is introduced into the air reservoir 7 and is ejected from each nozzle 6a to 6d, so that the air in the upper part of the sample 2 than the coils 3a and 3b is The temperature can be maintained at any desired temperature. Further, when desired high frequency power is supplied to the coils 3a and 3b from the transmitting circuit 5, the temperature of the portion of the sample 2 facing the coil increases to a certain temperature by dielectric heating or the like. Therefore, if the heating temperature of the air by the temperature adjustment means 10 is set to a temperature slightly higher than the temperature at which the sample rises due to dielectric heating, etc., the sample temperature above the coil will be higher than the sample temperature at the position facing the coil. Therefore, convection of the sample can be prevented. Therefore, it is sufficient to measure the temperature rise of the sample in advance according to the supplied power, and then change the set temperature of the temperature adjustment means 10 in accordance with the supplied power. Here, a memory is built into the input means 11, and the above-mentioned temperature rise of the sample according to the supplied power is stored in this memory as a table, and the supplied power to be observed from the transmitting circuit 5 is calculated as shown by the dotted line in FIG. If the configuration is such that the output signal shown in FIG.
The temperature of the air blown into the sample tube 1 can be automatically set in conjunction with the power supply operation to the sample tube 1.

尚、前述の説明は本発明の一例であり、実施にあたって
は幾多の変形が考えられる。例えば上記実施例では、ボ
ビンにノズルを貫通させるようにしたが、ノズルを使用
しないでボビンに直接細い孔を形成してもよい。
It should be noted that the above description is an example of the present invention, and many modifications can be made in implementing the present invention. For example, in the above embodiment, the nozzle is passed through the bobbin, but the thin hole may be formed directly in the bobbin without using a nozzle.

また、上記実施例ではエアーを試料管に吹き付けるノズ
ルは4個使用したが、これに限定されることなく任意の
数使用しても良い。
Further, in the above embodiment, four nozzles were used to spray air onto the sample tube, but the number is not limited to this and any number may be used.

さらに、他の実施例として上記実施例のように配置され
たノズル群を試料管の軸方向に沿って複数組設置しても
良い。このようになせば、試料管に収容する試料の量に
応じて効率良く試料を加熱することができる。
Furthermore, as another embodiment, a plurality of nozzle groups arranged as in the above embodiment may be installed along the axial direction of the sample tube. By doing so, the sample can be efficiently heated according to the amount of sample contained in the sample tube.

さらに、上記実施例では予め試料の温度を供給電力に応
じて測定するように述べたが、コイルと対面する部分の
試料温度を測定する手段を設け、その出力信号により温
度調節手段を制御するように構成しても良い。
Furthermore, in the above embodiment, it has been described that the temperature of the sample is measured in advance according to the supplied power, but it is also possible to provide means for measuring the temperature of the sample at the portion facing the coil, and to control the temperature adjustment means using the output signal thereof. It may be configured as follows.

さらに、上記実施例ではエアーを加熱して吹き付けた場
合を示したが、窒素ガスや不活性ガスを利用しても良い
Furthermore, although the above embodiment shows a case where heated air is blown, nitrogen gas or an inert gas may also be used.

さらに、上記実施例では試料加熱手段として加熱された
エアーを試料管に吹き付けるようにしたが、これに限定
されることなく赤外線やマイクロ波あるいはレーザなど
を利用しても良い。
Further, in the above embodiment, heated air is blown onto the sample tube as the sample heating means, but the method is not limited to this, and infrared rays, microwaves, lasers, etc. may also be used.

さらに、上記実施例ではコイルとして鞍型を使用したが
、ソレノイド型を使用しても良い。
Further, in the above embodiment, a saddle type coil is used, but a solenoid type coil may also be used.

[効果] 以上詳述したように本発明によれば、試料のコイルと対
面する部分の温度上昇に伴ってコイルより上方の試料部
分をも同時に温度上昇させることができるため、従来の
ように試料管内部で対流が発生することがなくなり分解
能の低下を防止できる。
[Effect] As detailed above, according to the present invention, as the temperature of the part of the sample facing the coil increases, the temperature of the part of the sample above the coil can also be increased at the same time. Convection is no longer generated inside the tube, and resolution degradation can be prevented.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係るプローブの一例を示す概略図、第
2図は本発明の要部を示す拡大断面図である。 1:試料管        2:試料 3a,3b:鞍型コイル  4:ボビン5:送信回路
FIG. 1 is a schematic view showing an example of a probe according to the present invention, and FIG. 2 is an enlarged sectional view showing essential parts of the present invention. 1: Sample tube 2: Samples 3a, 3b: Saddle-shaped coil 4: Bobbin 5: Transmission circuit

Claims (1)

【特許請求の範囲】[Claims] 試料を収容した試料管と、試料管の外周に置かれ、かつ
試料液に高周波磁界を照射するためのコイルとを備えた
プローブにおいて、前記試料管周囲に巻回されたコイル
と対面する部分よりも上方の試料部分を集中的に加熱す
る手段を設けたことを特徴とする核磁気共鳴プローブ。
In a probe equipped with a sample tube containing a sample and a coil placed on the outer periphery of the sample tube for irradiating a high-frequency magnetic field to the sample liquid, from the part facing the coil wound around the sample tube. A nuclear magnetic resonance probe characterized in that it is provided with means for intensively heating an upper sample portion.
JP1159252A 1989-06-21 1989-06-21 Nuclear magnetic resonance probe Pending JPH0324487A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1159252A JPH0324487A (en) 1989-06-21 1989-06-21 Nuclear magnetic resonance probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1159252A JPH0324487A (en) 1989-06-21 1989-06-21 Nuclear magnetic resonance probe

Publications (1)

Publication Number Publication Date
JPH0324487A true JPH0324487A (en) 1991-02-01

Family

ID=15689688

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1159252A Pending JPH0324487A (en) 1989-06-21 1989-06-21 Nuclear magnetic resonance probe

Country Status (1)

Country Link
JP (1) JPH0324487A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007139442A (en) * 2005-11-15 2007-06-07 Hitachi Ltd Nmr analyzer and sample management device
JP2007255991A (en) * 2006-03-22 2007-10-04 Hitachi Ltd Probe for nuclear magnetic resonance
JP2008014651A (en) * 2006-07-03 2008-01-24 National Institute For Materials Science Mas probe apparatus for solid-state nmr
JP2012247442A (en) * 2012-09-21 2012-12-13 National Institute For Materials Science Mas probe apparatus for solid-state nmr
KR200479162Y1 (en) * 2015-07-01 2015-12-24 양동길 Spectacles for preventing scratches of lens

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007139442A (en) * 2005-11-15 2007-06-07 Hitachi Ltd Nmr analyzer and sample management device
JP2007255991A (en) * 2006-03-22 2007-10-04 Hitachi Ltd Probe for nuclear magnetic resonance
JP2008014651A (en) * 2006-07-03 2008-01-24 National Institute For Materials Science Mas probe apparatus for solid-state nmr
JP2012247442A (en) * 2012-09-21 2012-12-13 National Institute For Materials Science Mas probe apparatus for solid-state nmr
KR200479162Y1 (en) * 2015-07-01 2015-12-24 양동길 Spectacles for preventing scratches of lens

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