JPH0322414A - Atmospheric pressure vapor deposition device - Google Patents
Atmospheric pressure vapor deposition deviceInfo
- Publication number
- JPH0322414A JPH0322414A JP15771589A JP15771589A JPH0322414A JP H0322414 A JPH0322414 A JP H0322414A JP 15771589 A JP15771589 A JP 15771589A JP 15771589 A JP15771589 A JP 15771589A JP H0322414 A JPH0322414 A JP H0322414A
- Authority
- JP
- Japan
- Prior art keywords
- slit plate
- gas
- inert gas
- reaction
- pressure vapor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007740 vapor deposition Methods 0.000 title 1
- 239000011261 inert gas Substances 0.000 claims abstract description 11
- 239000007789 gas Substances 0.000 claims description 11
- 238000001947 vapour-phase growth Methods 0.000 claims description 7
- 238000007599 discharging Methods 0.000 claims description 2
- 239000012495 reaction gas Substances 0.000 abstract description 10
- 239000007795 chemical reaction product Substances 0.000 abstract description 4
- 239000000428 dust Substances 0.000 abstract description 2
- 230000002159 abnormal effect Effects 0.000 abstract 1
- 238000007664 blowing Methods 0.000 abstract 1
- 238000000151 deposition Methods 0.000 abstract 1
- 230000008021 deposition Effects 0.000 abstract 1
- 238000000927 vapour-phase epitaxy Methods 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は常圧気相成長装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to an atmospheric pressure vapor phase growth apparatus.
従来の常圧気相成長装置のガス導入機構は、第2図の様
な構造となっており、外部より導入される反応ガスはス
リット板7内で分配され、第1反応ガス1と第2反応ガ
ス2が交互に流れ、ウェーハ4上で反応し、反応残ガス
は両側の排気ダクト5で排気される様な構造となってい
た。The gas introduction mechanism of a conventional atmospheric pressure vapor phase growth apparatus has a structure as shown in FIG. The structure was such that the gases 2 alternately flowed and reacted on the wafer 4, and the reaction residual gas was exhausted through exhaust ducts 5 on both sides.
上述した従来のガス導入機構は、反応残ガスが両側の排
気ダクト5で引かれる様な構造となっている為に、両側
のダクト中間部分ではよどみができ、第1反応ガスと第
2反応ガスとの反応生戒物が中間部分のスリットに堆積
し、対向する位置にあるウェーハにごみとして付着し歩
留りを悪くするという欠点がある。Since the conventional gas introduction mechanism described above has a structure in which the reaction residual gas is drawn through the exhaust ducts 5 on both sides, stagnation occurs in the middle part of the ducts on both sides, and the first reaction gas and the second reaction gas There is a disadvantage that the reaction products with the wafer are deposited in the slit in the middle portion and attached as dust to the wafer in the opposing position, resulting in poor yield.
本発明は、断面が櫛状に形成され櫛の歯と歯の間から種
類の異なる反応ガスを噴出する導通路が櫛の柄部分に設
けられたスリット板が反応室入口部分に設けられ、前記
スリット板と反応室の壁との間に反応済ガスを排出する
ための排気ダクトが設けられている常圧気相成長装置に
おいて、前記スリット板の中央部分の歯と歯の間に不括
性ガスを噴出させるための導通路が設けられていること
を特徴とする。In the present invention, a slit plate having a comb-shaped cross section and a conduction path for ejecting different types of reaction gases from between the teeth of the comb is provided at the inlet of the reaction chamber. In an atmospheric vapor phase growth apparatus in which an exhaust duct for discharging the reacted gas is provided between the slit plate and the wall of the reaction chamber, an inert gas is generated between the teeth in the central part of the slit plate. It is characterized by being provided with a conduit for spouting it.
第1図は本発明の一実施例の主要部の断面模式図である
。FIG. 1 is a schematic cross-sectional view of the main parts of an embodiment of the present invention.
第1反応ガス1と第2反応ガス2は、それぞれ混じらな
い棟に分離されたスリット板3内を通り、ウェーハ4表
面上で混じり、気相成長膜を生威し、反応残ガスはスリ
ット板3の両側に設けられた排気ダクト5に引かれてい
く。一方、スリット板3の中央部分より導入された不活
性ガス6は両側の排気ダクト5へそれぞれ引かれていく
様にする。The first reaction gas 1 and the second reaction gas 2 pass through the slit plate 3 which is separated into ridges where they do not mix, and mix on the surface of the wafer 4 to form a vapor-phase growth film, and the reaction residual gas is removed from the slit plate 3. It is drawn into exhaust ducts 5 provided on both sides of 3. On the other hand, the inert gas 6 introduced from the center of the slit plate 3 is drawn to the exhaust ducts 5 on both sides.
このように、スリット板3に不活性ガスを導入するため
の導通路を設けたことがこの発明の主要事項である。Thus, the main feature of the present invention is that the slit plate 3 is provided with a conductive path for introducing inert gas.
以上説明した様に、本発明は、両側の中間部分のスリッ
ト板より不活性ガスを導入することにより、スリット板
の中央部分のよどむ所は不活性ガスとなる為に、反応生
成物が異常堆積することがなくなるという効果を有する
。As explained above, in the present invention, by introducing inert gas through the slit plates in the middle part of both sides, the inert gas becomes stagnant in the central part of the slit plate, so that reaction products are abnormally deposited. This has the effect that there is nothing to do.
第1図は本発明の一実施例の主要部の断面模式図、第2
図は従来の常圧気相成長装置のガス導入部分の断面模式
図である。
1・・・第1反応ガス、2・・・第2反応ガス、3・・
・スリット板、4・・・ウェーハ、5・・・排気ダクト
、6・・・不活性ガス、7・・・スリット板。FIG. 1 is a schematic cross-sectional view of the main parts of an embodiment of the present invention, and FIG.
The figure is a schematic cross-sectional view of a gas introduction portion of a conventional atmospheric pressure vapor phase growth apparatus. 1... First reaction gas, 2... Second reaction gas, 3...
- Slit plate, 4... Wafer, 5... Exhaust duct, 6... Inert gas, 7... Slit plate.
Claims (1)
反応ガスを噴出する導通路が櫛の柄部分に設けられたス
リット板が反応室入口部分に設けられ、前記スリット板
と反応室の壁との間に反応済ガスを排出するための排気
ダクトが設けられている常圧気相成長装置において、前
記スリット板の中央部分の歯と歯の間に不活性ガスを噴
出させるための導通路が設けられていることを特徴とす
る常圧気相成長装置。A slit plate with a comb-shaped cross section and a conduit passage provided in the handle of the comb for ejecting different types of reaction gases from between the teeth of the comb is provided at the entrance of the reaction chamber. In a normal pressure vapor phase growth apparatus in which an exhaust duct for discharging reacted gas is provided between the chamber wall and the chamber wall, an inert gas is ejected between the teeth in the central part of the slit plate. A normal pressure vapor phase growth apparatus characterized by being provided with a conductive path.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15771589A JPH0322414A (en) | 1989-06-19 | 1989-06-19 | Atmospheric pressure vapor deposition device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15771589A JPH0322414A (en) | 1989-06-19 | 1989-06-19 | Atmospheric pressure vapor deposition device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0322414A true JPH0322414A (en) | 1991-01-30 |
Family
ID=15655796
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15771589A Pending JPH0322414A (en) | 1989-06-19 | 1989-06-19 | Atmospheric pressure vapor deposition device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0322414A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5888907A (en) * | 1996-04-26 | 1999-03-30 | Tokyo Electron Limited | Plasma processing method |
WO2017090490A1 (en) * | 2015-11-26 | 2017-06-01 | 愛知製鋼株式会社 | Field permanent magnet |
-
1989
- 1989-06-19 JP JP15771589A patent/JPH0322414A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5888907A (en) * | 1996-04-26 | 1999-03-30 | Tokyo Electron Limited | Plasma processing method |
WO2017090490A1 (en) * | 2015-11-26 | 2017-06-01 | 愛知製鋼株式会社 | Field permanent magnet |
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