JPH03208883A - Method and device for liquid phase epitaxial growth - Google Patents

Method and device for liquid phase epitaxial growth

Info

Publication number
JPH03208883A
JPH03208883A JP160090A JP160090A JPH03208883A JP H03208883 A JPH03208883 A JP H03208883A JP 160090 A JP160090 A JP 160090A JP 160090 A JP160090 A JP 160090A JP H03208883 A JPH03208883 A JP H03208883A
Authority
JP
Japan
Prior art keywords
melt
substrate
raw material
opening
growth chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP160090A
Other languages
Japanese (ja)
Inventor
Atsushi Shimizu
敦 清水
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP160090A priority Critical patent/JPH03208883A/en
Publication of JPH03208883A publication Critical patent/JPH03208883A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To prevent liquid drops from remaining on a substrate and to obtain a uniformly grown layer by supporting this substrate on the side wall of a vertically or diagonally slit growth chamber and epitaxially growing a single crystal on the substrate by a raw material melt introduced from above and then discharging the melt stepwise little by little. CONSTITUTION:The substrate 3 is supported in the recess on the side wall of the above-mentioned growth chamber 2 formed on a horizontal substrate holding member 1. The bottom aperture of a raw material melt tank 4 constituted slidable atop the member 1 is mated by the chamber 2 and the raw material melt 5 is introduced from the tank 4 into the chamber 2 to epitaxially grow the single crystal. The opening 8 of a jig 7 for discharging the melt is then mated with the chamber 2 and the melt 5 is housed into the opening 8. This jig 7 is slid to mate the opening 8 with a melt recovering tank 6 and to transfer the melt 5 into this tank 6. The jig 7 is slid to mate the opening 8 and the chamber 2 again and to transfer the melt 5 in the chamber 2 into the opening 8, from which the melt is discharged to the tank 6.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、半導体単結晶を液相エピタキシャル成長させ
る方法及びその装置に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method and apparatus for growing a semiconductor single crystal by liquid phase epitaxial growth.

(従来の技術) 砒化ガリウムや砒化アルミニウムガリウムなどの単結晶
を液相エピタキシャル成長させる方法として、斜めのス
リット状成長室の側壁に基板を支持し、原料融液を成長
室内に導入して基板上に単結晶をエピタキシャル成長さ
せた後、融液を下方に排出する方法は、例えば、特開昭
64−7615号で提案されている。
(Prior art) As a method for liquid-phase epitaxial growth of single crystals such as gallium arsenide and aluminum gallium arsenide, a substrate is supported on the side wall of a diagonal slit-shaped growth chamber, and a raw material melt is introduced into the growth chamber and deposited on the substrate. A method of discharging the melt downward after epitaxially growing a single crystal is proposed, for example, in Japanese Patent Laid-Open No. 7615/1983.

第2図は、この方法に使用する装置の断面図である。こ
の装置は、水平の基板保持部材1に形成された斜めのス
リット状成長室2の側壁に基板3を支持し、該保持部材
1の上面を摺動可能とする複数の原料融液槽4を配置し
、原料融液槽4の底部には原料融液5を成長室2に供給
するための開口を設け、該保持部材lの下面を摺動可能
とする複数の融液回収WJ6を配置した液相エピタキシ
ャル成長装置であって、原料融液槽4の開口を成長室2
に合わせることにより、原料融?&5を成長室2内に導
入し、該原料融液を成長温度に保持して基板3の上に所
定の単結晶をエピタキシャル成長させた後、融液回収槽
6の開口を成長室2に合わせることにより、原料融液5
を一度に排出させて結晶成長を終了させる。この方法は
、基板を保持部材の表面凹部に水平に保持し、下方に開
口を存する原料融液槽を保持部材上面に摺動させること
により、基板に原料融液を接触させる、それ以前の方法
に比べて、基板上を直接摺動する部材がないので、基板
表面を傷付ける恐れがな(、また、斜めのスリット状成
長室に基板を保持する構造を採用するところから、多数
の基板をセットすることが可能となり、量産性に優れた
方法である。
FIG. 2 is a cross-sectional view of the apparatus used in this method. This device supports a substrate 3 on the side wall of an oblique slit-shaped growth chamber 2 formed in a horizontal substrate holding member 1, and has a plurality of raw material melt tanks 4 that are slidable on the upper surface of the holding member 1. An opening for supplying the raw material melt 5 to the growth chamber 2 was provided at the bottom of the raw material melt tank 4, and a plurality of melt collection WJs 6 that were slidable on the lower surface of the holding member 1 were arranged. In the liquid phase epitaxial growth apparatus, the opening of the raw material melt tank 4 is connected to the growth chamber 2.
By adapting to the raw materials? &5 into the growth chamber 2, and after epitaxially growing a predetermined single crystal on the substrate 3 by keeping the raw material melt at the growth temperature, aligning the opening of the melt recovery tank 6 with the growth chamber 2. Accordingly, raw material melt 5
is discharged all at once to terminate crystal growth. This method is based on the previous method, in which the substrate is held horizontally in a recess on the surface of a holding member, and a raw material melt tank having an opening at the bottom is slid onto the upper surface of the holding member to bring the raw material melt into contact with the substrate. Compared to , there is no member that slides directly on the substrate, so there is no risk of damaging the substrate surface. This method has excellent mass productivity.

(発明が解決しようとする課題) しかし、この方法は、成長終了後、成長室内の原料融液
を自然落下で一度に融液回収槽に排出するために、原料
融液が完全に排出されず、基板上に原料融液が残ること
がある。
(Problem to be solved by the invention) However, in this method, after the growth is completed, the raw material melt in the growth chamber is discharged all at once into the melt collection tank by gravity, so the raw material melt is not completely discharged. , raw material melt may remain on the substrate.

特に、薄い成長層を得るために、スリット状成長室の厚
さ、即ち、液の厚さを薄くするときには、液滴が残り易
くなり、IIIII以下の液厚では、原料融液を排出す
ることができない。
In particular, when reducing the thickness of the slit-like growth chamber, that is, the thickness of the liquid, in order to obtain a thin growth layer, droplets tend to remain, and when the liquid thickness is less than III, it is difficult to drain the raw material melt. I can't.

このように、成長終了後に基板上に液滴が残ると、その
部分だけ成長層が厚くなったり、次の成長のために導入
される原料融液と混合して、原料融液の組成を変動させ
るので、所望の結晶を得ることができない。
In this way, if droplets remain on the substrate after growth, the growth layer may become thicker in that area, or they may mix with the raw material melt introduced for the next growth, changing the composition of the raw material melt. Therefore, the desired crystal cannot be obtained.

本発明は、上記の問題を解消し、成長終了後の融液の排
出を確実にし、基板上に液滴が残らないようにした液相
エピタキシャル成長方法及びその装置を提供しようとす
るものである。
The present invention aims to solve the above-mentioned problems and to provide a liquid phase epitaxial growth method and an apparatus therefor, which ensure discharge of the melt after the growth is completed and prevent droplets from remaining on the substrate.

(課題を解決するための手段) 本発明は、(1)鉛直又は斜めのスリット状成長室の側
壁に基板を支持し、原料融液を上方より導入して基板上
に単結晶をエピタキシャル成長させる方法において、成
長室の原料融液を少量づつ段階的に排出することを特徴
とする液相エピタキシャル成長方法、及び、(2)鉛直
又は斜めのスリット状成長室を有する基板保持部材と、
該成長室の側壁に設けた基板の支持手段と、上記保持部
材の上面を摺動可能とし、底部に開口を有する原料融液
槽と、上記保持部材の下方に配置する融液回収槽とを有
する液相エピタキシャル成長装置において、上記保持部
材の下面と融液回収槽上面との間に融液排出用治具を摺
動可能に配置し、該治具に成長室より小さな容積の開口
を設けて融液排出用液溜とし、該治具の開口を成長室の
下方と融液回収槽の上方との間を移動することにより、
成長室の融液を排出可能としたことを特徴とする液相エ
ピタキシャル成長装置である。
(Means for Solving the Problems) The present invention provides (1) a method in which a substrate is supported on the side wall of a vertical or diagonal slit-shaped growth chamber, and a raw material melt is introduced from above to epitaxially grow a single crystal on the substrate; (2) a substrate holding member having a vertical or diagonal slit-like growth chamber;
A support means for the substrate provided on the side wall of the growth chamber, a raw material melt tank having a sliding upper surface on the holding member and an opening at the bottom, and a melt recovery tank disposed below the holding member. In the liquid phase epitaxial growth apparatus, a melt discharge jig is slidably disposed between the lower surface of the holding member and the upper surface of the melt recovery tank, and the jig is provided with an opening having a smaller volume than the growth chamber. By using a liquid reservoir for discharging the melt and moving the opening of the jig between the lower part of the growth chamber and the upper part of the melt collection tank,
This is a liquid phase epitaxial growth apparatus characterized in that the melt in the growth chamber can be discharged.

(作用) 本発明者等は、斜めのスリット状成長室を流下する原料
融液について、融液回収槽の開口の大きさを変化させて
基板上に残る液滴の程度を調べたところ、開口を小さ(
して原料融液の流下速度を抑えることにより、液滴の残
りが少ない、即ち、液滴の残りは流下速度に依存するこ
とを見いだした。しかし、この開口を余り小さくし過ぎ
ると、融液が流れず全量が残るので、−度に自然落下さ
せる方式はやめて、本発明では、少量ずつ段階的に排出
する方法を考案した。 第1図は、本発明の1具体例で
ある液相エピタキシャル成長装置の断面図である。この
装置は、水平の基板保持部材1に鉛直又は斜めのスリッ
ト状成長室2を形成し、該成長室2の側壁に基板3を支
持する凹部設け、上記保持部材1の上面には原料融液槽
4を摺動可能とし、その底部の開口を成長室2に合わせ
ることにより、原料融液5を原料融液槽4から成長室2
に導入することができ、また、上記保持部材1の下面に
は融液排出用治具7、さらにその下面には融液回収槽6
をそれぞれ摺動可能に配置し、上記治具7の開口8を成
長室2と合わせることにより、原料融液5をこの開口8
内に収容し、次いで、上記治具7を摺動させて開口8を
融液回収槽6に合わせて原料融液を融液回収槽6内に移
した後、上記治具7を摺動させて開口8を成長室2と再
び合わせ、成長室2内の原料融液5を開口8に移し、融
液回収槽6に排出する。このように、上記治具7を成長
室2と融液回収送液6との間を往復させることにより、
原料融液5を成長室2から融液回収槽6に段階的に移す
ことができる。なお、上記治具7に複数の開口8を設け
て一度の操作でその開口の数に相当する原料融液を移す
ことも可能である。
(Function) The present inventors investigated the degree of droplets remaining on the substrate by changing the size of the opening of the melt collection tank for the raw material melt flowing down the diagonal slit-shaped growth chamber. Small (
It has been found that by suppressing the flow rate of the raw material melt, there are fewer remaining droplets, that is, the amount of droplets remaining depends on the flow rate. However, if this opening is made too small, the melt will not flow and the entire amount will remain, so instead of allowing the melt to fall naturally in one step, the present invention has devised a method of gradually discharging small amounts. FIG. 1 is a sectional view of a liquid phase epitaxial growth apparatus which is a specific example of the present invention. In this apparatus, a vertical or diagonal slit-shaped growth chamber 2 is formed in a horizontal substrate holding member 1, a recessed portion for supporting a substrate 3 is provided on the side wall of the growth chamber 2, and a raw material melt is provided on the upper surface of the holding member 1. By making the tank 4 slidable and aligning its bottom opening with the growth chamber 2, the raw material melt 5 is transferred from the raw material melt tank 4 to the growth chamber 2.
In addition, a melt discharge jig 7 is provided on the lower surface of the holding member 1, and a melt recovery tank 6 is provided on the lower surface of the holding member 1.
By aligning the opening 8 of the jig 7 with the growth chamber 2, the raw material melt 5 is placed in a slidable manner.
Then, after sliding the jig 7 to align the opening 8 with the melt recovery tank 6 and transferring the raw material melt into the melt recovery tank 6, the jig 7 is slid. The opening 8 is aligned with the growth chamber 2 again, and the raw material melt 5 in the growth chamber 2 is transferred to the opening 8 and discharged into the melt recovery tank 6. In this way, by moving the jig 7 back and forth between the growth chamber 2 and the melt recovery liquid supply 6,
The raw material melt 5 can be transferred from the growth chamber 2 to the melt recovery tank 6 in stages. It is also possible to provide a plurality of openings 8 in the jig 7 and transfer raw material melt corresponding to the number of openings in one operation.

このように、融液排出用治具7の開口8の容積と摺動速
度を制御することにより、原料融液5の排出速度、即ち
、基板3上を流れる原料融液の流下速度を容易に調節す
ることができ、基板3上の液滴の残留を防止することが
できる。
In this way, by controlling the volume and sliding speed of the opening 8 of the melt discharge jig 7, the discharge speed of the raw material melt 5, that is, the flow rate of the raw material melt flowing on the substrate 3 can be easily controlled. It is possible to adjust the amount of liquid and prevent droplets from remaining on the substrate 3.

(実施例) 第1図の液相エピタキシャル成長装置を用いて砒化ガリ
ウム結晶を成長させた。スリットの間隔が2msの成長
室に直径50mmの円形GaAs基板をセットした。
(Example) A gallium arsenide crystal was grown using the liquid phase epitaxial growth apparatus shown in FIG. A circular GaAs substrate with a diameter of 50 mm was set in a growth chamber with a slit interval of 2 ms.

なお、融液排出用治具は幅4■園で高さ4IIII、奥
行50m■の開口を有するものを用いた。原料融液槽に
は、高純度ガリウム30gとGaAs多結晶3gを入れ
て水素雰囲気中で850℃に加熱して原料を溶融し、1
”C/■inの冷却速度で848℃まで徐冷してから、
原料融液槽を摺動させて成長室に原料融液を導入した。
The melt discharging jig used had an opening with a width of 4 mm, a height of 4 mm, and a depth of 50 m. 30 g of high-purity gallium and 3 g of GaAs polycrystals were put in the raw material melt tank, and heated to 850°C in a hydrogen atmosphere to melt the raw materials.
After slowly cooling to 848℃ at a cooling rate of ``C/■in,
The raw material melt tank was slid to introduce the raw material melt into the growth chamber.

そして、上記の冷却速度で840℃まで徐冷し、この温
度を保持しながら、上記の融液排出用治具をl■l/s
eeの速度で10回往復させて融液を融液回収槽に排出
してから、室温まで冷却した。基板を取り出して観察し
たところ、表面にガリウムの液滴はなく鏡面であった。
Then, it was slowly cooled to 840°C at the above cooling rate, and while maintaining this temperature, the above melt discharge jig was heated at 1 l/s.
After reciprocating 10 times at a speed of ee and discharging the melt into a melt recovery tank, it was cooled to room temperature. When the substrate was taken out and observed, there were no gallium droplets on the surface and it was a mirror surface.

基板をへき開してその断面にフッ酸系のエツチングを施
して顕微鏡で観察したところ、厚さflu−のエピタキ
シャル成長層が認められた。 上記実施例において、融
液排出用治具を用いずに、成長室の原料融液を一度に直
接融液回収槽に自然落下させたところ、20%の割合で
基板上に液滴が残り、この部分のエピタキシャル成長層
は40〜70μmの厚さがあった。
When the substrate was cleaved, a cross section thereof was subjected to hydrofluoric acid etching, and observed under a microscope, an epitaxially grown layer with a thickness of flu- was observed. In the above example, when the raw material melt in the growth chamber was allowed to fall directly into the melt recovery tank at once without using a melt discharge jig, droplets remained on the substrate at a rate of 20%. The epitaxially grown layer in this portion had a thickness of 40 to 70 μm.

(発明の効果) 本発明は、上記の構成を採用することにより、基板上を
流れる原料融液の流下速度を遅くすることができ、その
結果、基板上に液滴が残ることを防止することができ、
均一な成長層を得ることができる。また、多層成長にお
いても原料融液の混入が防止されるので、それぞれの成
長層について、設計通りの特性を得ることができる。
(Effects of the Invention) By adopting the above configuration, the present invention can slow down the flow rate of the raw material melt flowing on the substrate, and as a result, it is possible to prevent droplets from remaining on the substrate. is possible,
A uniform growth layer can be obtained. Furthermore, since the mixing of raw material melt is prevented even in multilayer growth, designed characteristics can be obtained for each growth layer.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の1具体例である液相エピタキシャル成
長装置の断面図であり、第2図は従来装置の断面図であ
る。 第1図 第2図
FIG. 1 is a sectional view of a liquid phase epitaxial growth apparatus which is a specific example of the present invention, and FIG. 2 is a sectional view of a conventional apparatus. Figure 1 Figure 2

Claims (2)

【特許請求の範囲】[Claims] (1)鉛直又は斜めのスリット状成長室の側壁に基板を
支持し、原料融液を上方より導入して基板上に単結晶を
エピタキシャル成長させる方法において、成長室の原料
融液を少量づつ段階的に排出することを特徴とする液相
エピタキシャル成長方法。
(1) A method in which a substrate is supported on the side wall of a vertical or diagonal slit-shaped growth chamber, and a raw material melt is introduced from above to epitaxially grow a single crystal on the substrate. A liquid phase epitaxial growth method characterized by discharging water.
(2)鉛直又は斜めのスリット状成長室を有する基板保
持部材と、該成長室の側壁に設けた基板の支持手段と、
上記保持部材の上面を摺動可能とし、底部に開口を有す
る原料融液槽と、上記保持部材の下方に配置する融液回
収槽とを有する液相エピタキシャル成長装置において、
上記保持部材の下面と融液回収槽上面との間に融液排出
用治具を摺動可能に配置し、該治具に成長室より小さな
容積の開口を設けて融液排出用液溜とし、該治具k開口
を成長室の下方と融液回収槽の上方との間を移動するこ
とにより、成長室の融液を排出可能としたことを特徴と
する液相エピタキシャル成長装置。
(2) a substrate holding member having a vertical or diagonal slit-shaped growth chamber, and a substrate support means provided on the side wall of the growth chamber;
In a liquid phase epitaxial growth apparatus having a raw material melt tank whose upper surface is slidable and which has an opening at the bottom of the holding member, and a melt recovery tank disposed below the holding member,
A melt discharge jig is slidably arranged between the lower surface of the holding member and the upper surface of the melt recovery tank, and an opening with a smaller volume than the growth chamber is provided in the jig to serve as a melt discharge reservoir. A liquid phase epitaxial growth apparatus characterized in that the melt in the growth chamber can be discharged by moving the jig k opening between the lower part of the growth chamber and the upper part of the melt recovery tank.
JP160090A 1990-01-10 1990-01-10 Method and device for liquid phase epitaxial growth Pending JPH03208883A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP160090A JPH03208883A (en) 1990-01-10 1990-01-10 Method and device for liquid phase epitaxial growth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP160090A JPH03208883A (en) 1990-01-10 1990-01-10 Method and device for liquid phase epitaxial growth

Publications (1)

Publication Number Publication Date
JPH03208883A true JPH03208883A (en) 1991-09-12

Family

ID=11505996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP160090A Pending JPH03208883A (en) 1990-01-10 1990-01-10 Method and device for liquid phase epitaxial growth

Country Status (1)

Country Link
JP (1) JPH03208883A (en)

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