JPH0317581U - - Google Patents
Info
- Publication number
- JPH0317581U JPH0317581U JP7813889U JP7813889U JPH0317581U JP H0317581 U JPH0317581 U JP H0317581U JP 7813889 U JP7813889 U JP 7813889U JP 7813889 U JP7813889 U JP 7813889U JP H0317581 U JPH0317581 U JP H0317581U
- Authority
- JP
- Japan
- Prior art keywords
- power source
- characteristic measuring
- semiconductor device
- measuring device
- transient voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 7
- 230000001052 transient effect Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7813889U JPH0317581U (fr) | 1989-06-30 | 1989-06-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7813889U JPH0317581U (fr) | 1989-06-30 | 1989-06-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0317581U true JPH0317581U (fr) | 1991-02-21 |
Family
ID=31621144
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7813889U Pending JPH0317581U (fr) | 1989-06-30 | 1989-06-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0317581U (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11293978B2 (en) | 2017-09-12 | 2022-04-05 | Tokyo Electron Limited | Voltage application device for testing plurality of devices and method of forming output voltage waveform |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5719673A (en) * | 1980-07-10 | 1982-02-01 | Yokogawa Hewlett Packard Ltd | Electric current detector with resistance change-over circuit |
| JPS61169770A (ja) * | 1985-01-23 | 1986-07-31 | Chuo Riken:Kk | 試験装置の電源回路 |
-
1989
- 1989-06-30 JP JP7813889U patent/JPH0317581U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5719673A (en) * | 1980-07-10 | 1982-02-01 | Yokogawa Hewlett Packard Ltd | Electric current detector with resistance change-over circuit |
| JPS61169770A (ja) * | 1985-01-23 | 1986-07-31 | Chuo Riken:Kk | 試験装置の電源回路 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11293978B2 (en) | 2017-09-12 | 2022-04-05 | Tokyo Electron Limited | Voltage application device for testing plurality of devices and method of forming output voltage waveform |