JPH03172728A - Reflectivity measurement device for light-transmissive member - Google Patents

Reflectivity measurement device for light-transmissive member

Info

Publication number
JPH03172728A
JPH03172728A JP31276289A JP31276289A JPH03172728A JP H03172728 A JPH03172728 A JP H03172728A JP 31276289 A JP31276289 A JP 31276289A JP 31276289 A JP31276289 A JP 31276289A JP H03172728 A JPH03172728 A JP H03172728A
Authority
JP
Japan
Prior art keywords
light
aperture part
reflected
optical system
focused
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP31276289A
Other languages
English (en)
Inventor
Hideo Takada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hoya Corp
Original Assignee
Hoya Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoya Corp filed Critical Hoya Corp
Priority to JP31276289A priority Critical patent/JPH03172728A/ja
Publication of JPH03172728A publication Critical patent/JPH03172728A/ja
Pending legal-status Critical Current

Links

JP31276289A 1989-11-30 1989-11-30 Reflectivity measurement device for light-transmissive member Pending JPH03172728A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31276289A JPH03172728A (en) 1989-11-30 1989-11-30 Reflectivity measurement device for light-transmissive member

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31276289A JPH03172728A (en) 1989-11-30 1989-11-30 Reflectivity measurement device for light-transmissive member

Publications (1)

Publication Number Publication Date
JPH03172728A true JPH03172728A (en) 1991-07-26

Family

ID=18033119

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31276289A Pending JPH03172728A (en) 1989-11-30 1989-11-30 Reflectivity measurement device for light-transmissive member

Country Status (1)

Country Link
JP (1) JPH03172728A (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003509667A (ja) * 1999-09-16 2003-03-11 エムケーエス インストゥルメンツ インコーポレーテッド 層および表面特性の光学測定方法およびその装置
JP2006234681A (ja) * 2005-02-25 2006-09-07 National Institute Of Advanced Industrial & Technology 立体双楕円型光学装置
JP2014215152A (ja) * 2013-04-25 2014-11-17 日本分光株式会社 積分球、および、反射光の測定方法
CN113776786A (zh) * 2021-09-17 2021-12-10 中国科学院西安光学精密机械研究所 一种透过率和反射率测量仪及其测量方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61292043A (en) * 1985-06-19 1986-12-22 Anritsu Corp Photodetecting probe for spectocolorimeter
JPS6454231A (en) * 1987-08-26 1989-03-01 Hitachi Ltd Measurement of surface reflection for transparent material

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61292043A (en) * 1985-06-19 1986-12-22 Anritsu Corp Photodetecting probe for spectocolorimeter
JPS6454231A (en) * 1987-08-26 1989-03-01 Hitachi Ltd Measurement of surface reflection for transparent material

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003509667A (ja) * 1999-09-16 2003-03-11 エムケーエス インストゥルメンツ インコーポレーテッド 層および表面特性の光学測定方法およびその装置
JP4909480B2 (ja) * 1999-09-16 2012-04-04 エムケーエス インストゥルメンツ インコーポレーテッド 層および表面特性の光学測定方法およびその装置
JP2006234681A (ja) * 2005-02-25 2006-09-07 National Institute Of Advanced Industrial & Technology 立体双楕円型光学装置
JP4742616B2 (ja) * 2005-02-25 2011-08-10 独立行政法人産業技術総合研究所 立体双楕円型光学装置
JP2014215152A (ja) * 2013-04-25 2014-11-17 日本分光株式会社 積分球、および、反射光の測定方法
CN113776786A (zh) * 2021-09-17 2021-12-10 中国科学院西安光学精密机械研究所 一种透过率和反射率测量仪及其测量方法

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