JPH03165033A - Apparatus for lifting substrate from super pure water and drying substrate - Google Patents

Apparatus for lifting substrate from super pure water and drying substrate

Info

Publication number
JPH03165033A
JPH03165033A JP30552789A JP30552789A JPH03165033A JP H03165033 A JPH03165033 A JP H03165033A JP 30552789 A JP30552789 A JP 30552789A JP 30552789 A JP30552789 A JP 30552789A JP H03165033 A JPH03165033 A JP H03165033A
Authority
JP
Japan
Prior art keywords
pure water
water
pure
drying
super
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP30552789A
Other languages
Japanese (ja)
Inventor
Kazuhiko Okamura
和彦 岡村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP30552789A priority Critical patent/JPH03165033A/en
Publication of JPH03165033A publication Critical patent/JPH03165033A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To decrease impurity ions, particulates and organic materials in pure water and to improve the drying quality of substrates by providing super-pure-water manufacturing unit in or by an apparatus for lifting a substrate from super pure water and drying the substrate, manufacturing super-pure water in the vicinity of a point use, and supplying the super-pure water into a pure water tank. CONSTITUTION:A super-pure-water manufacturing unit 2 is composed of a tank 11, a pump 12, an active carbon cartridge 13, an ion-exchange cartridge 14 and a membrane filter 15. In this unit, the active carbon cartridge 13 mainly removed organic materials in the pure water. The ion-exchange cartridge 14 removes impurity ions. The membrane filter cartridge 15 removes particulates. Thus the super-pure water is manufactured. The super-pure water is supplied into a pure water tank 3 through a pure-water heating unit 4. Since all the liquid contact parts of the pure water tank 3, the pure-water heating unit 4 and the piping systems for these parts are made of Teflon, the quality of the water is hardly changed in the pure water an tank. In this way, impurity ions, particulates and organic materials in the pure water can be decreased, and the drying quality of the substrates can be improved.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体のシリコン基板、フォトマスク、液晶
パネルのガラス基板、光学レンズ等(以下、単に基板と
いう)の洗浄後の乾燥工程に用いる純水引き上げ乾燥装
置に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention is used in the drying process after cleaning of semiconductor silicon substrates, photomasks, liquid crystal panel glass substrates, optical lenses, etc. (hereinafter simply referred to as substrates). Related to pure water pulling and drying equipment.

〔従来の技術〕[Conventional technology]

従来、基板を微低速で純水槽より引き上げることにより
、水の表面張力の高いことを利用して基板に付着する水
の膜をできるだけ均一に薄くし、これを基板の熱容量、
成るいは外部からの熱で乾かしてしまうという純水引き
上げ乾燥方式において、純水槽に供給する純水は普通の
レベルの純水であった。
Conventionally, by lifting a substrate from a pure water tank at very low speed, the high surface tension of water is used to make the water film that adheres to the substrate as uniformly thin as possible.
In the pure water drying method, which uses external heat to dry the product, the pure water supplied to the pure water tank was ordinary level pure water.

また、この純水は工場の純水供給配管から、直接純水引
き上げ乾燥装置の純水槽に供給するのが一般的であった
Furthermore, this pure water was generally supplied directly from the pure water supply piping of the factory to the pure water tank of the pure water pulling and drying device.

〔発明が解決しようとする課題1 しかし、純水引き上げ乾燥方式では、基板表面に水の膜
が薄く残り、これを乾燥させるため、半導体のシリコン
基板のように高い乾燥品質が要求されるものでは、純水
の水質が問題となる。純水と言えども純水な水ではなく
、普通の純水中にはまだ、不純物イオン、微粒子、有機
物が存在しており、これらの量は乾燥品質に影響を与え
る。特に、純水は有機物を溶かさないため、純水中の有
機物はいったん基板に付着するとそのまま残留する。こ
の点がフロンやアルコールと異なる点であり、純水中の
TOC(全有機物量)が多い場合、純水引き上げ乾燥は
フロンやアルコールの蒸気乾燥より乾燥品質が落ちると
いう問題点を有する。
[Problem to be Solved by the Invention 1] However, in the deionized water pulling drying method, a thin film of water remains on the substrate surface, and in order to dry this, high drying quality is not required as with semiconductor silicon substrates. , the quality of pure water becomes an issue. Even though it is pure water, it is not pure water, and ordinary pure water still contains impurity ions, fine particles, and organic substances, and the amount of these substances affects the drying quality. In particular, since pure water does not dissolve organic substances, once the organic substances in pure water adhere to the substrate, they remain as they are. This point is different from fluorocarbons and alcohols, and when there is a large amount of TOC (total organic matter) in pure water, pure water pulling drying has the problem that the drying quality is lower than that of fluorocarbons or alcohol vapor drying.

また、純水は工場設備としての純水製造装置で集中して
製造され、工場配管でユースポイントまで送られるため
、純水引き上げ乾燥装置の純水槽に来るまでに水質が落
ちるという問題点を有する。
In addition, since pure water is produced centrally in a pure water production equipment as factory equipment and sent to the point of use via factory piping, there is a problem that the quality of the water deteriorates before it reaches the pure water tank of the pure water pulling and drying equipment. .

そこで、本発明は従来のこのような問題点を解決するた
め、純水引き上げ乾燥装置の純水槽に供給する純水を超
純水とし、純水中の不純物イオン、微粒子、有機物を低
減し、基板の乾燥品質を向上させることを目的とする。
Therefore, in order to solve these conventional problems, the present invention uses ultrapure water as the pure water supplied to the pure water tank of the pure water pulling and drying device, reduces impurity ions, fine particles, and organic substances in the pure water, The purpose is to improve the drying quality of the substrate.

[課題を解決するための手段] 本発明の超純水引き上げ乾燥装置は、基板を微低速で純
水槽より引き上げて乾かす純水引き上げ乾燥装置におい
て、純水槽に供給する純水を超純水とすることを特徴と
する。
[Means for Solving the Problems] The ultrapure water pulling and drying device of the present invention is a deionized water pulling and drying device that pulls up a substrate from a pure water tank at very low speed and dries it, in which the pure water supplied to the pure water tank is mixed with ultrapure water. It is characterized by

また、上記超純水引き上げ乾燥装置において、超純水引
き上げ乾燥装置内もしくはその脇に、超純水製造ユニッ
トを設置し、ユースポイントの近傍において超純水を製
造し、純水槽に供給する構成にしたことを特徴とする。
In addition, in the above ultrapure water pulling and drying equipment, an ultrapure water production unit is installed inside or beside the ultrapure water pulling and drying equipment, and ultrapure water is produced near the point of use and supplied to the pure water tank. It is characterized by the following.

〔作 用〕[For production]

本発明の上記の構成によれば、純水引き上げ乾燥を行う
純水槽の純水中の不純物イオン、微粒子、有機物が低減
でき、基板表面に残る薄い水の膜中の不純物イオン、微
粒子、有機物も低減されるため、これを乾かした場合の
乾燥品質も向上させることができる。
According to the above configuration of the present invention, impurity ions, fine particles, and organic substances in the pure water in the pure water tank for pulling and drying the pure water can be reduced, and impurity ions, fine particles, and organic substances in the thin water film remaining on the substrate surface can also be reduced. Therefore, the drying quality when drying this can also be improved.

[実 施 例〕 第1図は本発明の実施例における概略図であって、超純
水引き上げ乾燥装置本体1と、その脇に設置した超純水
製造ユニット2で構成されている。超純水引き上げ乾燥
装置本体1は、純水槽3、純水加熱ユニット4、遠赤外
線乾燥炉5、搬送ロボット6とクリーンユニット7を備
えたクリーンベンチ8から成る。超純水製造ユニット2
は、純水を超純水に替える装置で、タンク11、ポンプ
12、活性炭カートリッジ13、イオン交換カートリッ
ジ14、メンブランフィルタ15より成る。ここで、活
性炭カートリッジ13は主に純水中の有機物の除去、イ
オン交換カートリッジ14は不純物イオンの除去、メン
ブランフィルタカートリッジ15は微粒子の除去を行い
、このユニットの出口では、純水は比抵抗18MΩcm
以上、TOC(全有機物量)20PPb以下、微粒子0
.5um以上ゼロ、0.3um以上3個/CCというレ
ベルの超純水となっている。この超純水を純水加熱ユニ
ット4を通して純水槽3に供給しているが、純水槽3、
純水加熱ユニット4、これらの配管系共、接液部はオー
ルテフロンとしているため、純水槽内においても水質は
ほとんど変わらない、ただし、純水加熱ユニット4の加
熱温度を上げると水質が落ちるため、40℃以下として
いる。
[Embodiment] FIG. 1 is a schematic diagram of an embodiment of the present invention, which is composed of an ultrapure water pulling and drying device main body 1 and an ultrapure water production unit 2 installed beside it. The ultrapure water pulling and drying device main body 1 includes a pure water tank 3, a pure water heating unit 4, a far infrared drying oven 5, a clean bench 8 equipped with a transfer robot 6 and a clean unit 7. Ultrapure water production unit 2
1 is a device for changing pure water to ultrapure water, and is composed of a tank 11, a pump 12, an activated carbon cartridge 13, an ion exchange cartridge 14, and a membrane filter 15. Here, the activated carbon cartridge 13 mainly removes organic matter from pure water, the ion exchange cartridge 14 removes impurity ions, and the membrane filter cartridge 15 removes fine particles. At the outlet of this unit, pure water has a specific resistance of 18 MΩcm.
Above, TOC (total organic matter) 20PPb or less, fine particles 0
.. The ultra-pure water has a level of zero over 5 um and 3 over 0.3 um/CC. This ultrapure water is supplied to the pure water tank 3 through the pure water heating unit 4.
The pure water heating unit 4 and these piping systems are all made of Teflon, so the water quality hardly changes even in the pure water tank.However, as the heating temperature of the pure water heating unit 4 is raised, the water quality deteriorates. , below 40°C.

上記の構成において、基板9の入ったカセット10は、
搬送ロボット6により微低速で純水槽3より引き上げら
れ、基板の熱容量、成るいは遠赤外線乾燥炉5で乾燥さ
れる。上記のレベルの超純水を使って引き上げ乾燥した
基板の乾燥品質は、フロンやアルコールの蒸気乾燥と同
レベルである。
In the above configuration, the cassette 10 containing the substrate 9 is
The substrate is lifted out of the pure water tank 3 at a very low speed by the transfer robot 6 and dried in the heat capacity of the substrate or in the far-infrared drying oven 5. The drying quality of the substrate pulled and dried using the above-mentioned level of ultrapure water is on the same level as that of fluorocarbon or alcohol vapor drying.

本実施例では、有機物の除去を活性炭力・−トリッジの
みで行っているが、紫外線を利用した有機物酸化装置を
組み込むとさらにTOC(全有機物量)のレベルを下げ
ることが可能になる。
In this embodiment, the removal of organic matter is carried out only by activated carbon force, but if an organic matter oxidation device using ultraviolet rays is incorporated, it is possible to further lower the level of TOC (total organic matter).

また、本実施例では、超純水引き上げ乾燥装置の脇に超
純水製造ユニットを設置しているが、工場配管からの供
給で純水槽に同レベルの超純水が供給されるならば、超
純水製造ユニットを設置する必要はない。
In addition, in this example, the ultrapure water production unit is installed beside the ultrapure water pulling and drying device, but if the same level of ultrapure water is supplied to the pure water tank from the factory piping, There is no need to install an ultrapure water production unit.

〔発明の効果〕〔Effect of the invention〕

本発明は以上説明したように、純水引き上げ乾燥装置の
純水槽に供給する純水を超純水とすることにより、純水
中の不純物イオン、微粒子、有機物を低減し、基板の乾
燥品質を向上させる効果がある。
As explained above, the present invention reduces impurity ions, fine particles, and organic matter in the pure water by using ultrapure water as the pure water supplied to the pure water tank of the pure water pulling and drying device, thereby improving the drying quality of the substrate. It has the effect of improving

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の超純水引き上げ乾燥装置の概略図。 超純水引き上げ乾燥装置本体 超純水製造ユニット 純水槽 純水加熱ユニット 遠赤外線乾燥炉 搬送ロボット クリーンユニット クリーンベンチ 基板 カセット タンク ポンプ ・活性炭カートリッジ l 4 ・ ・イオン交換カートリッジ  5 ・メンブランフィルタ 以 上 FIG. 1 is a schematic diagram of the ultrapure water pulling and drying apparatus of the present invention. Ultrapure water pulling and drying equipment main body Ultrapure water production unit pure water tank Pure water heating unit Far infrared drying oven Transfer robot clean unit Clean bench substrate cassette tank pump ・Activated carbon cartridge l 4 ・ ・Ion exchange cartridge 5 ・Membrane filter Below Up

Claims (2)

【特許請求の範囲】[Claims] (1)基板を微低速で純水槽より引き上げて乾かす純水
引き上げ乾燥装置において、純水槽に供給する純水を超
純水とすることを特徴とする超純水引き上げ乾燥装置。
(1) An ultrapure water pulling and drying device that lifts and dries a substrate from a pure water tank at very low speed, characterized in that the pure water supplied to the pure water tank is ultrapure water.
(2)請求項1記載の超純水引き上げ乾燥装置において
、超純水引き上げ乾燥装置内もしくはその脇に、超純水
製造ユニットを設置し、ユースポイントの近傍において
超純水を製造し、純水槽に供給する構成にしたことを特
徴とする超純水引き上げ乾燥装置。
(2) In the ultrapure water pulling and drying apparatus according to claim 1, an ultrapure water production unit is installed in or beside the ultrapure water drawing and drying apparatus, and ultrapure water is produced near the point of use, and the ultrapure water is purified. A device for pulling and drying ultrapure water, characterized in that it is configured to supply water to an aquarium.
JP30552789A 1989-11-24 1989-11-24 Apparatus for lifting substrate from super pure water and drying substrate Pending JPH03165033A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30552789A JPH03165033A (en) 1989-11-24 1989-11-24 Apparatus for lifting substrate from super pure water and drying substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30552789A JPH03165033A (en) 1989-11-24 1989-11-24 Apparatus for lifting substrate from super pure water and drying substrate

Publications (1)

Publication Number Publication Date
JPH03165033A true JPH03165033A (en) 1991-07-17

Family

ID=17946222

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30552789A Pending JPH03165033A (en) 1989-11-24 1989-11-24 Apparatus for lifting substrate from super pure water and drying substrate

Country Status (1)

Country Link
JP (1) JPH03165033A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5621333A (en) * 1995-05-19 1997-04-15 Microconnect, Inc. Contact device for making connection to an electronic circuit device
US6046599A (en) * 1996-05-20 2000-04-04 Microconnect, Inc. Method and device for making connection
US6343369B1 (en) 1998-09-15 2002-01-29 Microconnect, Inc. Methods for making contact device for making connection to an electronic circuit device and methods of using the same
US6496026B1 (en) 2000-02-25 2002-12-17 Microconnect, Inc. Method of manufacturing and testing an electronic device using a contact device having fingers and a mechanical ground

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5621333A (en) * 1995-05-19 1997-04-15 Microconnect, Inc. Contact device for making connection to an electronic circuit device
US6091256A (en) * 1995-05-19 2000-07-18 Microconnect, Inc. Contact device for making connection to an electronic circuit device
US6046599A (en) * 1996-05-20 2000-04-04 Microconnect, Inc. Method and device for making connection
US6343369B1 (en) 1998-09-15 2002-01-29 Microconnect, Inc. Methods for making contact device for making connection to an electronic circuit device and methods of using the same
US6622289B2 (en) 1998-09-15 2003-09-16 Microconnect, Llc Methods for making contact device for making connection to an electronic circuit device and methods of using the same
US6957405B2 (en) 1998-09-15 2005-10-18 Microconnect Llc Methods for manufacturing an electronic device having an electronically determined physical test member
US7386816B2 (en) 1998-09-15 2008-06-10 Microconnect Llc Method for manufacturing an electronic device having an electronically determined physical test member
US8056031B2 (en) 1998-09-15 2011-11-08 Microconnect Corp. Methods for manufacturing an electronic device using an electronically determined test member
US8756537B2 (en) 1998-09-15 2014-06-17 Microconnect Corp. Methods for making contact device for making connection to an electronic circuit device and methods using the same
US6496026B1 (en) 2000-02-25 2002-12-17 Microconnect, Inc. Method of manufacturing and testing an electronic device using a contact device having fingers and a mechanical ground

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