JP3109693B2 - Cleaning method of alignment film for liquid crystal display panel - Google Patents

Cleaning method of alignment film for liquid crystal display panel

Info

Publication number
JP3109693B2
JP3109693B2 JP15970192A JP15970192A JP3109693B2 JP 3109693 B2 JP3109693 B2 JP 3109693B2 JP 15970192 A JP15970192 A JP 15970192A JP 15970192 A JP15970192 A JP 15970192A JP 3109693 B2 JP3109693 B2 JP 3109693B2
Authority
JP
Japan
Prior art keywords
cleaning
alignment film
liquid crystal
display panel
crystal display
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP15970192A
Other languages
Japanese (ja)
Other versions
JPH063671A (en
Inventor
秀一 嶋
浩之 西山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP15970192A priority Critical patent/JP3109693B2/en
Publication of JPH063671A publication Critical patent/JPH063671A/en
Application granted granted Critical
Publication of JP3109693B2 publication Critical patent/JP3109693B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は、液晶表示パネルを構
成する基板の表面に形成された配向膜の洗浄方法に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for cleaning an alignment film formed on a surface of a substrate constituting a liquid crystal display panel.

【0002】[0002]

【従来の技術】従来、例えば、TFT型液晶表示パネル
を製作するに当たり、カラーフィルタ側のパネル(以
下、単に「ワークA」と記す)も、TFTなどの制御素
子、電極などを形成するパネル(以下、単に「ワーク
B」と記す)も、それらの、例えば、ガラス、プラスチ
ックなどの基板を洗浄し、その表面に、例えば、ポリイ
ミドのような高分子薄膜をロールコート法などで塗布
し、その高分子薄膜をラビングして配向膜にしている。
2. Description of the Related Art Conventionally, for example, in manufacturing a TFT type liquid crystal display panel, a panel on a color filter side (hereinafter, simply referred to as "work A") also includes a panel on which control elements such as TFTs, electrodes, etc. are formed. Hereinafter, simply referred to as "work B"), for example, by cleaning a substrate such as glass or plastic, and applying a polymer thin film such as polyimide to the surface thereof by a roll coating method or the like, The alignment film is formed by rubbing a polymer thin film.

【0003】通常、このラビング処理を行うと、基板上
にその場合に生じたダストなどの異物が付着し、このよ
うな異物を除去するためにラビング処理後、洗浄を行っ
ている。
Usually, when this rubbing treatment is performed, foreign matter such as dust generated in that case adheres to the substrate, and cleaning is performed after the rubbing treatment in order to remove such foreign matter.

【0004】現在、この配向処理後の洗浄液としては、
イソプロピルアルコール(以下、単に「IPA」と記
す)と水とで行われている。通常、IPAによる洗浄
は、基板上の有機系不純物を除去することを目的とする
他、基板表面のぬれ性を向上させるために行われてい
る。そして更に、基板の洗浄後の乾燥には、IPA蒸気
乾燥が一般的に多用されている。
At present, the cleaning liquid after the alignment treatment is as follows.
It is performed with isopropyl alcohol (hereinafter simply referred to as “IPA”) and water. Usually, cleaning with IPA is performed not only for removing organic impurities on the substrate, but also for improving the wettability of the substrate surface. Further, IPA vapor drying is generally widely used for drying the substrate after cleaning.

【0005】[0005]

【発明が解決しようとする課題】このIPAと水により
洗浄を行うと、配向膜の配向力が低下することが知られ
ている。この発明者等はこの原因を究明したところ、こ
の洗浄液であるIPAが配向力の低下に大いに係わりが
あることを実験で確かめた。配向状態の良否は、リタデ
ーション値と配向ムラなどで良否を判別することができ
る。
It is known that the cleaning with IPA and water lowers the alignment force of the alignment film. After investigating the cause, the inventors of the present invention have confirmed through experiments that IPA, which is a cleaning solution, is greatly involved in lowering the alignment force. The quality of the alignment state can be determined by the retardation value and the alignment unevenness.

【0006】リタデーション値に関しては、〔表1〕に
記した条件の内、条件1によりワークをIPA洗浄した
ところ、〔表2〕に示したように、前記条件に対応した
条件番号に示されているようなリタデーション減少率に
止まった。また、配向ムラに関しては、現行(IPA及
び水)による洗浄を行った結果、〔表3〕に示したよう
に、配向ムラが100%発生していることが認められ
た。これはIPAが配向膜を膨潤させることによる。こ
の発明は前記問題点を解決することを課題とするもので
ある。
Regarding the retardation value, when the work was subjected to IPA cleaning under the condition 1 among the conditions described in [Table 1], as shown in [Table 2], the work was indicated by the condition number corresponding to the above condition. It has stopped at the retardation reduction rate as it is. Regarding the alignment unevenness, as a result of cleaning with the current method (IPA and water), it was confirmed that 100% of the alignment unevenness occurred as shown in [Table 3]. This is because IPA swells the alignment film. An object of the present invention is to solve the above problems.

【0007】[0007]

【課題を解決するための手段】そのため、この発明で
は、基板に形成した配向膜の表面を洗浄するに当たり、
洗浄液として純水のみを用いて洗浄し、その後、スピン
ドライ方式、又は、エアーナイフ方式のを用いて乾燥
するようにした。この発明はこのような洗浄方法で前記
課題を解決した。
Therefore, according to the present invention, when cleaning the surface of the alignment film formed on the substrate,
Only pure water as a cleaning solution was washed with, then spin dry method, or were to be dried using only the air knife method. The present invention has solved the above-mentioned problem by such a cleaning method.

【0008】[0008]

【作用】従って、配向膜は膨潤することが減少し、従っ
て、リタデーション値や配向ムラが改善されるので配向
力が低下しない。
Therefore, swelling of the alignment film is reduced, and the retardation value and the alignment unevenness are improved, so that the alignment force does not decrease.

【0009】[0009]

【実施例】以下、この発明の実施例を説明する。この発
明では、ワークA及びワークBのいずれのワークを洗浄
する場合にも、この発明者らは、洗浄液として「純水」
を使用した。ここで言う「純水」とは、通常、半導体製
造工場で半導体集積回路装置を製造するために用いられ
ている「純水」で充分である。通常、そのような「純
水」はダストや不純物が極めて少ない水である。
Embodiments of the present invention will be described below. In the present invention, when cleaning any of the work A and the work B, the present inventors use “pure water” as a cleaning liquid.
It was used. As used herein, “pure water” is generally sufficient to be “pure water” used for manufacturing a semiconductor integrated circuit device in a semiconductor manufacturing plant. Usually, such "pure water" is water with very little dust or impurities.

【0010】このような「純水」を用い、先ず、ワーク
A(またはワークB)を槽の中でクイックダンプリンス
で10μm以上の大きさのダストを除去し、次に、超音
波などを掛けながら洗浄し、そしてダストがワークに再
付着するのを防止するために、オバーフローリンスを行
う。そして、ワークを乾燥するのに、従来とは異なり、
スピンドライを掛けて乾燥させた。この乾燥にはエアー
ナイフ乾燥方式を用いてもよい。
[0010] Using such “pure water”, first, the work A (or work B) is subjected to quick dump rinsing in a tank to remove dust having a size of 10 μm or more, and then subjected to ultrasonic waves or the like. Washing is performed, and an overflow rinse is performed to prevent dust from re-adhering to the work. And to dry the work, unlike before,
Spin dry and dry. For this drying, an air knife drying method may be used.

【0011】前記のような「純水」による洗浄を、〔表
1〕に記載の条件2の元で行った結果、それぞれの条件
に対応して〔表2〕の条件2に示したように、リタデー
ション減少率が格段に下がることが明確になった。ま
た、「純水」による洗浄をワークBに対して行っても、
〔表3〕に示したように、ムラ発生率は20%程度と大
幅に改善されることが判った。また、いずれの場合にお
いても「純水」による配向膜の膨潤は認められなかっ
た。
As a result of performing the above-described cleaning with “pure water” under the condition 2 shown in [Table 1], as shown in the condition 2 of [Table 2] corresponding to each condition. It became clear that the rate of decrease in retardation was significantly reduced. Also, even if the cleaning with the “pure water” is performed on the work B,
As shown in [Table 3], it was found that the unevenness occurrence rate was greatly improved to about 20%. In each case, swelling of the alignment film due to “pure water” was not observed.

【0012】[0012]

【表1】 [Table 1]

【0013】[0013]

【表2】 [Table 2]

【0014】[0014]

【表3】 [Table 3]

【0015】[0015]

【発明の効果】以上、説明したように、この発明によれ
ば、配向力が低下しないことから、 1.配向力不足で生じる不良が起こらない 2.幅広く液晶材料を使用できる 3.熱処理の程度が軽くて済み、熱ダメージによる不良
などが発生せず、またタクトタイムも向上する などの優れた効果が得られた。
As described above, according to the present invention, the orientation force does not decrease. 1. Defects caused by insufficient orientation force do not occur. 2. A wide range of liquid crystal materials can be used. The heat treatment required only a small degree of heat treatment, and excellent effects such as failure due to thermal damage did not occur and tact time was improved.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平3−186817(JP,A) 特開 平1−291489(JP,A) 実開 平2−52436(JP,U) 実開 平4−1517(JP,U) (58)調査した分野(Int.Cl.7,DB名) G02F 1/1337 - 1/1337 530 G02F 1/13 101 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-3-186817 (JP, A) JP-A-1-291489 (JP, A) JP-A-2-52436 (JP, U) JP-A-4-186 1517 (JP, U) (58) Field surveyed (Int. Cl. 7 , DB name) G02F 1/1337-1/1337 530 G02F 1/13 101

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】基板に形成した配向膜の表面を洗浄するに
当たり、洗浄液として純水のみを用いて洗浄し、その
後、スピンドライのみを用いて乾燥させることを特徴と
する液晶表示パネル用配向膜の洗浄方法。
1. An alignment film for a liquid crystal display panel, wherein the surface of an alignment film formed on a substrate is cleaned using only pure water as a cleaning liquid and then dried using only spin drying. Cleaning method.
【請求項2】基板に形成した配向膜の表面を洗浄するに2. A method for cleaning a surface of an alignment film formed on a substrate.
当たり、洗浄液として純水のみを用いて洗浄し、そのRinsing with pure water only as a cleaning solution
後、エアーナイフのみを用いて乾燥させることを特徴とAfter that, it is dried using only an air knife.
する液晶表示パネル用配向膜の洗浄方法。Method for cleaning an alignment film for a liquid crystal display panel.
JP15970192A 1992-06-18 1992-06-18 Cleaning method of alignment film for liquid crystal display panel Expired - Fee Related JP3109693B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15970192A JP3109693B2 (en) 1992-06-18 1992-06-18 Cleaning method of alignment film for liquid crystal display panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15970192A JP3109693B2 (en) 1992-06-18 1992-06-18 Cleaning method of alignment film for liquid crystal display panel

Publications (2)

Publication Number Publication Date
JPH063671A JPH063671A (en) 1994-01-14
JP3109693B2 true JP3109693B2 (en) 2000-11-20

Family

ID=15699428

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15970192A Expired - Fee Related JP3109693B2 (en) 1992-06-18 1992-06-18 Cleaning method of alignment film for liquid crystal display panel

Country Status (1)

Country Link
JP (1) JP3109693B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104570496B (en) * 2015-02-04 2017-05-10 京东方科技集团股份有限公司 Method for cleaning substrate formed with oriented film

Also Published As

Publication number Publication date
JPH063671A (en) 1994-01-14

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