JPH0315972B2 - - Google Patents

Info

Publication number
JPH0315972B2
JPH0315972B2 JP9167783A JP9167783A JPH0315972B2 JP H0315972 B2 JPH0315972 B2 JP H0315972B2 JP 9167783 A JP9167783 A JP 9167783A JP 9167783 A JP9167783 A JP 9167783A JP H0315972 B2 JPH0315972 B2 JP H0315972B2
Authority
JP
Japan
Prior art keywords
inspected
inspection
reflection
defect
width
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9167783A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59217138A (ja
Inventor
Mitsutoshi Maeda
Hiroshi Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyota Central R&D Labs Inc
Original Assignee
Toyota Central R&D Labs Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyota Central R&D Labs Inc filed Critical Toyota Central R&D Labs Inc
Priority to JP9167783A priority Critical patent/JPS59217138A/ja
Publication of JPS59217138A publication Critical patent/JPS59217138A/ja
Publication of JPH0315972B2 publication Critical patent/JPH0315972B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP9167783A 1983-05-25 1983-05-25 表面欠陥検査装置 Granted JPS59217138A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9167783A JPS59217138A (ja) 1983-05-25 1983-05-25 表面欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9167783A JPS59217138A (ja) 1983-05-25 1983-05-25 表面欠陥検査装置

Publications (2)

Publication Number Publication Date
JPS59217138A JPS59217138A (ja) 1984-12-07
JPH0315972B2 true JPH0315972B2 (fr) 1991-03-04

Family

ID=14033117

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9167783A Granted JPS59217138A (ja) 1983-05-25 1983-05-25 表面欠陥検査装置

Country Status (1)

Country Link
JP (1) JPS59217138A (fr)

Also Published As

Publication number Publication date
JPS59217138A (ja) 1984-12-07

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