JPH03156712A - Thin-film magnetic head - Google Patents

Thin-film magnetic head

Info

Publication number
JPH03156712A
JPH03156712A JP8530990A JP8530990A JPH03156712A JP H03156712 A JPH03156712 A JP H03156712A JP 8530990 A JP8530990 A JP 8530990A JP 8530990 A JP8530990 A JP 8530990A JP H03156712 A JPH03156712 A JP H03156712A
Authority
JP
Japan
Prior art keywords
magnetic core
lower magnetic
thin film
rear end
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8530990A
Other languages
Japanese (ja)
Other versions
JP2584332B2 (en
Inventor
Naoto Matono
直人 的野
Isao Yasuda
安田 伊佐雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP2085309A priority Critical patent/JP2584332B2/en
Publication of JPH03156712A publication Critical patent/JPH03156712A/en
Application granted granted Critical
Publication of JP2584332B2 publication Critical patent/JP2584332B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To prevent the insulation defect between conductor coil layers and a lower magnetic layer and the electrical disconnection of the conductor coil layers by forming the rear end 8 of a lower magnetic core to a multistage structure having an intermediate flat surface and depositing and forming insulating layers and the conductor coil layers on the rear end part. CONSTITUTION:The rear end part 8 has the two-stage structure having the intermediate flat surface 9 and a 1st gentle slope 10 is formed between the front surface 2a of the lower magnetic core 2 and the intermediate flat surface 9. A 2nd gentle slop 11 is formed between the intermediate flat surface 9 and the front surface 1a of a substrate 1. The insulating layers 6 are deposited and formed on the upper surface 2a of the lower magnetic core 2, the 1st slope 10, the intermediate flat surface 9, and the upper surface 1a of the substrate 1. The conductor coil layers 3 are deposited and formed on the insulating layers 6. The insulating layers 6 and the conductor coil layers 3 do not become thin. The insulation defect between the lower magnetic core 2 and the conductor coil layers 3 and the electrical disconnection of the conductor coil layers 3 are prevented in this way.

Description

【発明の詳細な説明】 (イ)産業上の利用分野 本発明は高密度の記録或いは再生に好適な薄膜磁気ヘッ
ドに関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application The present invention relates to a thin film magnetic head suitable for high-density recording or reproduction.

(ロ)従来の技術 従来、この種の薄膜磁気ヘッドは、例えば特開昭62−
46415号公報(GIIB  5/31)等に示され
ているように基板上に薄膜堆積法及びフォトリソグラフ
ィー技術を用いて磁気回路、導体コイル、電極等を絶縁
層を介して形成したものであり、従来の磁気コアと巻線
より成るバルク型磁気ヘッドに比べて、小型化、マルチ
チャンネル化が容易である。
(b) Conventional technology Conventionally, this type of thin film magnetic head has been used, for example, in
As shown in Publication No. 46415 (GIIB 5/31), etc., magnetic circuits, conductor coils, electrodes, etc. are formed on a substrate using an insulating layer using a thin film deposition method and photolithography technology. Compared to conventional bulk magnetic heads consisting of a magnetic core and windings, it is easier to downsize and create multiple channels.

第18図は従来の薄膜磁気ヘッドの上面図、第19図は
第18図のA−A’断面図である。
FIG. 18 is a top view of a conventional thin film magnetic head, and FIG. 19 is a sectional view taken along line AA' in FIG.

図中、(1)はNi−Znフェライト等の磁性材料或い
は結晶化ガラス等の非磁性材料よりなる基板で、該基板
(1)上にはセンダスト等の強磁性金属材料よりなる下
部磁性コア(2)が被着されている。前記下部磁性コア
(2)上には絶縁層(図示せず)を介して導体コイル層
(3)(3)及び上部磁性コア(4)(4)が被着形成
されている。また、前記基板(1)の下部磁性コア(2
)より後方側に位置する下部磁性コア未形成部分には、
前記導体コイル層(3)(3)・・・に連結している電
極部(5)(5)・・・が被着形成されている。前記導
体コイル層(3)は第19図に示すようにSin、等の
絶縁層(6)を介して前記下部磁性コア(2)上及び前
記基板(1)上に被着形成されている。また、前記下部
磁性コア(2)と上部磁性コア(4)(4)との間には
、ギャップスペーサが被着形成されている。
In the figure, (1) is a substrate made of a magnetic material such as Ni-Zn ferrite or a non-magnetic material such as crystallized glass, and on the substrate (1) is a lower magnetic core (made of a ferromagnetic metal material such as Sendust). 2) is coated. Conductive coil layers (3) (3) and upper magnetic cores (4) (4) are formed on the lower magnetic core (2) via an insulating layer (not shown). Further, the lower magnetic core (2) of the substrate (1)
), the part where the lower magnetic core is not formed is located on the rear side.
Electrode portions (5), (5), etc. connected to the conductor coil layers (3, (3), etc.) are formed by adhesion. As shown in FIG. 19, the conductive coil layer (3) is formed on the lower magnetic core (2) and the substrate (1) via an insulating layer (6) such as Sin. Furthermore, a gap spacer is formed between the lower magnetic core (2) and the upper magnetic core (4) (4).

しかし乍ら、上述の薄膜磁気ヘッドでは、第19図に示
すように前記下部磁性コア(2)の後方端面(7)に被
着している絶縁層(6)及び導体コイル層(3)が薄く
なり、急峻な端部イ、口では、第20図(a)(b)に
示すようにマイクロクラック(28)(28)が生じ、
更にはこれらの部分の応力集中により前記絶縁層(6)
或いは前記導体コイル層(3)が剥れ、前記導体コイル
層(3)と下部磁性コア(2)との絶縁不良、或いは前
記導体コイル層(3)の電気的断線が生じる。
However, in the above-mentioned thin film magnetic head, as shown in FIG. Microcracks (28) (28) occur at the thinner and steeper edges, as shown in FIGS. 20(a) and (b).
Furthermore, due to stress concentration in these parts, the insulating layer (6)
Alternatively, the conductor coil layer (3) may peel off, resulting in poor insulation between the conductor coil layer (3) and the lower magnetic core (2), or electrical disconnection of the conductor coil layer (3).

尚、下部磁性コア(2)を基板(1)の上面全域に形成
し、その上に絶縁層(6)を介して導体コイル層(3)
及び電極部(5)を被着することにより上述の欠点を防
止することが出来る。しかし乍ら、この場合においては
、電極部(3)の下方に絶縁層(6)を介して下部磁性
コア(2)が位置するため該下部磁性コア(2)を前記
電極部(5)から完全に絶縁することが困難である。ま
た、前記基板(1)の上面全域に下部磁性コア(2)を
形成した場合、前記基板(1)と下部磁性コア(2)と
の熱膨張係数の差により前記基板(1)に反りや割れが
発生したり、前記下部磁性コア(2)が剥離する虞れが
ある。特に、1つの大基板上に多数の薄膜磁気ヘッドを
形成する場合、上記した基板(1)の反りや割れ、下部
磁性コア(2)の剥離を防止するために第17図に示す
ように!つ1つの薄膜磁気ヘッド毎に分断して下部磁性
コア(2)(2)・・・を形成している。
Note that the lower magnetic core (2) is formed over the entire upper surface of the substrate (1), and a conductive coil layer (3) is formed on the lower magnetic core (2) with an insulating layer (6) interposed therebetween.
The above-mentioned drawbacks can be prevented by attaching the electrode portion (5). However, in this case, since the lower magnetic core (2) is located below the electrode part (3) via the insulating layer (6), the lower magnetic core (2) is separated from the electrode part (5). Difficult to completely insulate. Further, when the lower magnetic core (2) is formed over the entire upper surface of the substrate (1), the substrate (1) may warp due to the difference in thermal expansion coefficient between the substrate (1) and the lower magnetic core (2). There is a risk that cracks may occur or the lower magnetic core (2) may peel off. In particular, when forming a large number of thin film magnetic heads on one large substrate, in order to prevent the above-mentioned substrate (1) from warping or cracking, and the lower magnetic core (2) from peeling off, as shown in FIG. 17! Each thin-film magnetic head is divided into lower magnetic cores (2), (2), and so on.

(ハ)発明が解決しようとする課題 本発明は上記従来例の欠点を鑑み為されたものであり、
下部磁性コアの後方端部での導体コイル層−下部磁性層
間の絶縁不良、及び導体コイル層の電気的断線を防止し
た薄膜磁気ヘッドを提供することを目的とするものであ
る。
(c) Problems to be Solved by the Invention The present invention has been made in view of the drawbacks of the above-mentioned conventional examples.
It is an object of the present invention to provide a thin film magnetic head in which poor insulation between the conductor coil layer and the lower magnetic layer at the rear end of the lower magnetic core and electrical disconnection of the conductor coil layer are prevented.

(ニ)課題を解決するための手段 本発明は、基板上に下部磁性コア、導体コイル層及び上
部磁性コアを夫々絶縁薄膜を介して順次積層形成し、前
記基板の前記下部磁性コアより後方側に位置する下部磁
性コア未形成部分に前記導体コイル層に連結する電極部
を絶縁層を介して形成した薄膜ヘッドにおいて、前記下
部磁性コアの後方端部が中間平坦面を有する多段構造で
あり、前記後方端部上に前記絶縁層及び導体コイル層を
被着形成したことを特徴とする。
(d) Means for Solving the Problems The present invention comprises forming a lower magnetic core, a conductive coil layer, and an upper magnetic core in sequence on a substrate with an insulating thin film interposed therebetween, and forming the lower magnetic core on the rear side of the lower magnetic core of the substrate. A thin film head in which an electrode portion connected to the conductor coil layer is formed in a portion where the lower magnetic core is not formed through an insulating layer, the rear end portion of the lower magnetic core having a multi-stage structure having an intermediate flat surface, It is characterized in that the insulating layer and the conductor coil layer are formed on the rear end.

更に、本発明は、前記下部磁性コアの後方端部において
、前記下部磁性コアの上面と前記中間平坦面との間及び
前記中間平坦面と前記基板上面との間のうち少なくとも
一方をなだらかな斜面で形成したことを特徴とする。
Furthermore, in the present invention, at least one of between the upper surface of the lower magnetic core and the intermediate flat surface and between the intermediate flat surface and the upper surface of the substrate is formed into a gentle slope at the rear end of the lower magnetic core. It is characterized by being formed by.

また、本発明は、基板上に下部磁性コア、導体コイル層
及び上部磁性コアを夫々絶縁薄膜を介して順次積層形成
し、前記基板の前記下部磁性コアより後方側に位置する
下部磁性コア未形成部分に前記導体コイル層に連結する
電極部を絶縁層を介して形成した薄膜磁気ヘッドにおい
て、前記下部磁性コアの後方端部の隅部に表面形状が前
記隅部に比べてなだらかである形状補正部を形成し、前
配下部磁性コア上及び前記形状補正部上に絶縁層及び導
体コイル層を被着形成したことを特徴とする。
The present invention also provides a structure in which a lower magnetic core, a conductor coil layer, and an upper magnetic core are sequentially laminated on a substrate with an insulating thin film interposed therebetween, and a lower magnetic core located on the rear side of the lower magnetic core of the substrate is not formed. In a thin film magnetic head in which an electrode portion connected to the conductor coil layer is formed in a portion via an insulating layer, a shape correction is performed such that a surface shape of a rear end corner of the lower magnetic core is gentler than that of the corner. The present invention is characterized in that an insulating layer and a conductive coil layer are formed on the front lower magnetic core and on the shape correction portion.

更に、本発明は、前記下部磁性コアの後方端部の角部を
なだらかな斜面で形成したことを特徴とする。
Furthermore, the present invention is characterized in that the corner of the rear end of the lower magnetic core is formed with a gentle slope.

(ホ)作用 上記構成によれば、下部磁性コアの後方端部上において
も、絶縁層及び導体コイル層は被着形成され易く、前記
絶縁層及び導体コイル層は薄くならず、また応力集中も
生じない。
(E) Effect According to the above structure, the insulating layer and the conductive coil layer are easily deposited even on the rear end of the lower magnetic core, and the insulating layer and the conductive coil layer are not thinned and stress concentration is also prevented. Does not occur.

(へ)実施例 以下、図面を参照しつつ本発明の第1実施例を詳細に説
明する。
(F) Example Hereinafter, a first example of the present invention will be described in detail with reference to the drawings.

第1図は第1実施例の薄膜磁気ヘッドの上面図、第2図
は第1図のB−B’断面図であり、第18図及び第19
図と同一部分には同一符号を付し、その説明は割愛する
FIG. 1 is a top view of the thin film magnetic head of the first embodiment, FIG. 2 is a sectional view taken along line BB' in FIG. 1, and FIGS.
Components that are the same as those in the figures are given the same reference numerals, and their explanations will be omitted.

本実施例の薄膜磁気ヘッドの後方端部上は中間平坦面(
9)を有する2段構造であり、下部磁性コア(2)の上
面(2a)と中間平坦面(9)との間にはなだらかな第
1の斜面(10)が形成されており、前記中間平坦面(
9)と基板(1)の上面(1a)との間にはなだらかな
第2の斜面(11)が形成されている。前記下部磁性コ
ア(2)の上面(2a)、前記第1の斜面(10)、前
記中間平坦面(9)、前記第2の斜面(11)及び前記
基板(1)の上面(1a)には絶縁層(6)が被着形成
されており、該絶縁層(6)上には導体コイル層(3)
が被着形成されている。
The rear end of the thin film magnetic head of this example has an intermediate flat surface (
9), and a gentle first slope (10) is formed between the upper surface (2a) of the lower magnetic core (2) and the intermediate flat surface (9). Flat surface (
A gentle second slope (11) is formed between the upper surface (1a) of the substrate (1) and the upper surface (1a) of the substrate (1). on the upper surface (2a) of the lower magnetic core (2), the first slope (10), the intermediate flat surface (9), the second slope (11), and the upper surface (1a) of the substrate (1). An insulating layer (6) is formed on the insulating layer (6), and a conductive coil layer (3) is formed on the insulating layer (6).
is formed by adhesion.

次に、上記第1実施例の薄膜磁気ヘッドの製造方法、特
に下部磁性コアの後方端部近傍について@1図のB−B
’断面図に相当する第3図〜第7図に従い説明する。
Next, we will discuss the manufacturing method of the thin film magnetic head of the first embodiment, especially the vicinity of the rear end of the lower magnetic core @B-B in Figure 1.
'This will be explained with reference to FIGS. 3 to 7, which correspond to cross-sectional views.

先ず、第3図に示すように基板(1)上に下部磁性コア
(2)となる厚さ5μmの下部磁性層(12)を真空蒸
着、スパッタリング等により被着形成する。
First, as shown in FIG. 3, a lower magnetic layer (12) having a thickness of 5 μm, which will become the lower magnetic core (2), is formed on the substrate (1) by vacuum deposition, sputtering, or the like.

次に、前記下部磁性層(12)上に第1のレジスト(1
3)を塗布し、該第1のレジスト(13)を露光・現像
により下部磁性コアの所望の形状にパターン化した後、
イオンビームエツチング等のドライエツチングを行うこ
とにより第4図に示すように前記下部磁性層(12)の
不要部分を2.5μm厚除去して前記基板(1)上面(
1a)からの高さが2.5μmである中間平坦面(9)
を形成する。尚、前記第1のレジスト(13)のパター
ン化は、将来下部磁性コアが第8図に示すように配置さ
れるように行えばよい。
Next, a first resist (1) is applied on the lower magnetic layer (12).
After applying 3) and patterning the first resist (13) into the desired shape of the lower magnetic core by exposure and development,
By performing dry etching such as ion beam etching, the unnecessary portion of the lower magnetic layer (12) is removed by 2.5 μm as shown in FIG.
Intermediate flat surface (9) with a height of 2.5 μm from 1a)
form. The first resist (13) may be patterned so that the lower magnetic core will be arranged as shown in FIG. 8 in the future.

次に、前記第1のレジスト(13)を剥離・洗浄により
除去した後、第5図に示すように前記下部磁性層(12
)の上面全域に粘度100CI)以下の低粘度の第2の
レジスl−(14)を塗布する。前記第2のレジス) 
(14)は低粘度であるため、前記上部磁性層(12)
上面(12a)と前記中間平坦面(9)との間に位置す
る段差部(15)上に形成されている第2のレジスト(
14)の上面はなだらかな斜面(16)となる。
Next, after removing the first resist (13) by peeling and cleaning, the lower magnetic layer (12) is removed as shown in FIG.
) A second resist l-(14) having a low viscosity of 100 CI) or less is applied over the entire upper surface of the substrate. said second regis)
(14) has a low viscosity, so the upper magnetic layer (12)
A second resist (
The upper surface of 14) becomes a gentle slope (16).

次に、前記中間平坦面(9)上に塗布されている第2の
レジスト(14)の後方部分(14a)を露光・現像に
より除去した後、ベーク温度80〜150℃でポストベ
ークすることにより第6図に示すように前記第2のレジ
スト(14)の後方端部の形状をなだらかな斜面(17
)とすると共に前記段差部(15)の角部(18)近傍
の@2のレジスト(14)の厚みを薄くする。
Next, after removing the rear portion (14a) of the second resist (14) applied on the intermediate flat surface (9) by exposure and development, post-baking is performed at a baking temperature of 80 to 150°C. As shown in FIG. 6, the rear end of the second resist (14) is shaped like a gentle slope (17).
), and the thickness of the resist (14) @2 near the corner (18) of the stepped portion (15) is made thinner.

次に、前記第2のレジスI−(14)を形成した後、イ
オンビームエツチング等のドライエツチングを行うこと
により前記下部磁性層(12)の不要部分を除去して第
7図に示すように所定形状の下部磁性コア(2)を形成
する。このエツチングにより形成される下部磁性コア(
2)の形状は、前記角部(18)近傍では第2のレジス
) (14)の厚みが薄いためオーバーエツチングによ
りなだらかな第1の斜面(lO)となり、また、下部磁
性コア(2)の後方端部では前記第2のレジスト(14
)の後方端部の斜面(17)に沿ってエツチング除去さ
れるためなだらかな第2の斜面(11)となる。
Next, after forming the second resist I-(14), unnecessary portions of the lower magnetic layer (12) are removed by dry etching such as ion beam etching, as shown in FIG. A lower magnetic core (2) having a predetermined shape is formed. The lower magnetic core (
The shape of 2) is such that the thickness of the second resist (14) near the corner (18) is thin, resulting in a gentle first slope (lO) due to overetching. At the rear end, the second resist (14
) is removed by etching along the slope (17) at the rear end, resulting in a gentle second slope (11).

以後は、前記第2のレジスl−(14)を剥離・洗浄に
より除去した後、前記下部磁性コア(2)上に絶縁層(
6)を形成し、該絶縁層(6)上に導体コイル層(3)
を形成することにより第2図に示す本実施例の薄膜磁気
ヘッドの下部磁性コアの後方端部近傍が形成される。
Thereafter, after removing the second resist l-(14) by peeling and cleaning, an insulating layer (
6) and a conductor coil layer (3) on the insulating layer (6).
By forming , the vicinity of the rear end of the lower magnetic core of the thin film magnetic head of this embodiment shown in FIG. 2 is formed.

上述のような第1実施例の薄膜磁気ヘッドでは、下部磁
性コア(2)の後方端部Q口が中間平坦面(9)を有す
る2段構造であり、しかも下部磁性コア(2)の上面(
2a)と中間平坦面(9)との間はなだらかな第1の斜
面(10)で形成されており、また、前記中間平坦面(
9)と基板(1)上面(1a)との間はなだらかな第2
の斜面(11)で形成されているため、前記下部磁性コ
ア(2)の後方端部Ωユ上に形成される絶縁層(6)及
び導体コイル層(3)は薄くならず、前記下部磁性コア
(2)と導体コイル層(3)との間の絶縁不良、及び前
記導体コイル層(3)の電気的断線は防止される。
In the thin film magnetic head of the first embodiment as described above, the rear end Q opening of the lower magnetic core (2) has a two-stage structure with an intermediate flat surface (9), and the upper surface of the lower magnetic core (2) (
A gentle first slope (10) is formed between the intermediate flat surface (9) and the intermediate flat surface (9).
9) and the upper surface (1a) of the substrate (1).
Since the insulating layer (6) and the conductive coil layer (3) formed on the rear end Ω of the lower magnetic core (2) do not become thinner, the lower magnetic core Poor insulation between the core (2) and the conductor coil layer (3) and electrical disconnection of the conductor coil layer (3) are prevented.

尚、上記第1実施例では、下部磁性コア(2)の上面(
2a)と中間平坦面(9)の間及び前記中間平坦面(9
)と基板(1)上面(1a)との間がなだらかな第1、
第2の斜面(10)(11)により形成されているが、
上述のようななだらかな斜面でなくても多段構造であれ
ば上記した絶縁不良及び電気的断線を削減することが出
来る。
In the first embodiment, the upper surface of the lower magnetic core (2) (
2a) and the intermediate flat surface (9) and between said intermediate flat surface (9)
) and the top surface (1a) of the substrate (1).
Although it is formed by the second slope (10) (11),
Even if the structure does not have a gentle slope as described above, a multi-stage structure can reduce the above-mentioned insulation defects and electrical disconnections.

次に、本発明の第2実施例について詳細に説明する。Next, a second embodiment of the present invention will be described in detail.

第8図は第2実施例の薄膜磁気ヘッドの要部断面図であ
り、第1実施例の第2図に相当し、第2図と同一部分に
は同一符号を付し、その説明は割愛する。
FIG. 8 is a cross-sectional view of the main parts of the thin film magnetic head of the second embodiment, and corresponds to FIG. 2 of the first embodiment, and the same parts as in FIG. do.

第2実施例の薄膜磁気ヘッドでは、下部磁性コア(2)
の中間平坦面(9)と第1の斜面(10)との間に形成
された第1の隅部(19)上と、基板(1)の上面(1
a)と下部磁性コア(2)の第2の斜面(11)との間
に形成された第2の隅部(20)上とには夫々、第1、
第2の形状補正部(21)(22)が形成されている。
In the thin film magnetic head of the second embodiment, the lower magnetic core (2)
on the first corner (19) formed between the intermediate flat surface (9) and the first slope (10), and on the top surface (1) of the substrate (1).
a) and the second slope (11) of the lower magnetic core (2).
Second shape correction sections (21) and (22) are formed.

前記第1、第2の形状補正部(21)(22)はTi、
Cr、Cu、AI!、、Al−3i、Afi−Cu、A
u、W等の金属、AJl、0.、Tie、。
The first and second shape correction sections (21) and (22) are made of Ti,
Cr, Cu, AI! ,,Al-3i,Afi-Cu,A
Metals such as u, W, AJl, 0. ,Tie,.

TiN等の金属化合物、或いはポリイミド樹脂、ノボラ
ック樹脂等の有機樹脂により形成されており、上面(2
1a)(22a)はなだらかな曲面或いは斜面をしてい
る。絶縁層(6)は前記下部磁性コア(2)及び第1.
第2の形状補正部(21)(22)上に被着形成されて
いる。
It is made of a metal compound such as TiN, or an organic resin such as polyimide resin or novolac resin, and the upper surface (2
1a) (22a) has a gently curved surface or slope. An insulating layer (6) is formed between the lower magnetic core (2) and the first.
The second shape correction portions (21) and (22) are coated and formed.

次に、上記第2実施例の薄膜磁気ヘッドの製造方法、特
に第1実施例の場合と同様に下部磁性コアの後方端部近
傍について第9図〜第15図に従い説明する。
Next, a method of manufacturing the thin film magnetic head of the second embodiment will be described, particularly the vicinity of the rear end of the lower magnetic core as in the first embodiment, with reference to FIGS. 9 to 15.

先ず、第9図に示すように基板(1)上に下部磁性コア
(2)となる厚さ5μmの下部磁性層(12)を被着形
成する。
First, as shown in FIG. 9, a lower magnetic layer (12) with a thickness of 5 μm, which will become the lower magnetic core (2), is deposited on a substrate (1).

次に、前記下部磁性層(12)上に第1のレジスト(1
3)を塗布形成し、イオンビームエツチング等のドライ
エツチングを行うことにより前記下部磁性層(12)の
後方端部Ω」を第10図に示すように第1の角部(18
)、第1の傾斜部(23)、第1の隅部(19)、中間
平坦面(9)、第2の角部(24)、第2の傾斜部(2
5)及び第2の隅部(20)を有する2段形状に加工し
て下部磁性コア(2)を形成する。
Next, a first resist (1) is applied on the lower magnetic layer (12).
3) and dry etching such as ion beam etching to form the rear end Ω of the lower magnetic layer (12) into the first corner (18) as shown in FIG.
), the first inclined part (23), the first corner part (19), the intermediate flat surface (9), the second corner part (24), the second inclined part (2
5) and a two-stage shape having a second corner (20) to form a lower magnetic core (2).

次に、前記第1のレジスト(13)を除去した後、第1
1図に示すように前記下部磁性コア(2)の上面全域に
粘度100Cp以下の低粘度の第2のレジスト(I4)
を塗布する。前記第2のレジスト(14)は低粘度であ
るため、その表面形状はなだらかな形状となり、前記第
1、第2の角部(18)(24)近傍に位置する第2の
レジス) (14)は他の部分に比べて薄く形成されて
いる。尚、前記第2のレジスト(14)を塗布形成後、
ベーク温度100〜150℃でポストベークすることに
より前記第2のレジスト(14)の表面形状を更になだ
らかな形状にすることが出来る。
Next, after removing the first resist (13), the first resist (13) is removed.
As shown in Figure 1, a second resist (I4) with a low viscosity of 100 Cp or less is applied to the entire upper surface of the lower magnetic core (2).
Apply. Since the second resist (14) has a low viscosity, its surface shape is gentle, and the second resist (14) is located near the first and second corners (18) (24). ) is formed thinner than other parts. Note that after coating and forming the second resist (14),
By post-baking at a baking temperature of 100 to 150° C., the surface shape of the second resist (14) can be made even more gentle.

次に、前記第2のレジスト(14)を形成した後、イオ
ンビームエツチング等のドライエツチングを行うことに
より前記第2のレジスト(14)面全域にエツチング加
工を施す。尚、この時、第2のレジス)(14)と下部
磁性コア(2)とのエツチング速度が等しい等速エツチ
ングの条件で、且つ前記第1、第2の角部(18)(2
4)近傍でオーバーエツチングを行うことにより、第1
2図に示すように前記第1、第2の角部(18)(24
)近傍の形状を前記第2のレジストの表面形状と等しい
なだらかな第1、第2の斜面(10)(11)に加工成
形する。
Next, after forming the second resist (14), the entire surface of the second resist (14) is etched by dry etching such as ion beam etching. At this time, the second resist (14) and the lower magnetic core (2) are etched at the same speed, and the first and second corners (18) (2) are etched at the same speed.
4) By performing overetching in the vicinity, the first
As shown in Figure 2, the first and second corners (18) (24
) The shape of the vicinity is processed and formed into gentle first and second slopes (10) and (11) that are equal to the surface shape of the second resist.

次に、前記第2のレジス) (14)を除去した後、第
13図に示すように前記下部磁性コア(2)上にTi、
Cr、Cu、AX、AJ!−3i、Al−(:u、Au
、W等の金属、或いはAt、0.、Ti01、TiN等
の金属化合物を蒸着、スパッタリング等により被着、或
いはポリイミド樹脂、ノボラック四指等の有機樹脂を回
転塗布することにより形状補正層(26)を形成し、更
に前記形状補正層(26)上に前記第2のレジス) (
14)と同様の粘度を有する第3のレジスト(27)を
塗布形成する。前記第3のレジスト(27)は低粘度で
あるため、その表面形状はなだらかな形状である。また
、前記下部磁性コア(2)の前記第1、第2の隅部(1
9)(20)近傍では、第3のレジスト(27)が溜ま
るため、その部分での前記第3のレジス) (27)の
厚みは他の部分の厚みより大きくなる。これにより、前
記第1、第2の隅部(19)(20)近傍での第3のレ
ジスト(27)の表面形状は更になだらかな形状になる
Next, after removing the second resist (14), as shown in FIG.
Cr, Cu, AX, AJ! -3i, Al-(:u, Au
, W, etc., or At, 0. A shape correction layer (26) is formed by depositing a metal compound such as , Ti01, TiN, etc. by vapor deposition, sputtering, etc., or by spin coating an organic resin such as polyimide resin or novolac four fingers, and further the shape correction layer ( 26) Above said second register) (
A third resist (27) having the same viscosity as 14) is applied and formed. Since the third resist (27) has a low viscosity, its surface shape is gentle. Further, the first and second corners (1) of the lower magnetic core (2)
9) Since the third resist (27) accumulates in the vicinity of (20), the thickness of the third resist (27) at that part becomes larger than the thickness at other parts. As a result, the surface shape of the third resist (27) near the first and second corners (19) and (20) becomes even more gentle.

次に、前記第3のレジスト(27)を形成した後、第3
のレジスト(27)と形状補正層(26)とのエツチン
グ速度が等しい等速エツチングの条件で第14図に示す
ような状態を経て第15図に示すように前記下部磁性コ
ア(2)の平坦な上面(2a)及び中間平坦面(9)上
に形成された形状補正層(26)が除去されるまでイオ
ンビームエツチング等のドライエツチングを行う。前記
第1、第2の隅部(19)(20)近傍では、前記第3
のレジス)(27)の厚みが大きいため、この部分では
前記形状補正層(26)が残り、第1、第2の形状補正
部(21)(22)が形成される。前記第1、第2の形
状補正部(21)(22)の表面形状は、その部分での
第3のレジス) (27)の表面形状と同様になだらか
な曲面或いは斜面になる。
Next, after forming the third resist (27), the third resist (27) is formed.
Under uniform etching conditions in which the etching speed of the resist (27) and the shape correction layer (26) are equal, the lower magnetic core (2) is flattened as shown in FIG. 15 through the state shown in FIG. Dry etching such as ion beam etching is performed until the shape correction layer (26) formed on the flat upper surface (2a) and the intermediate flat surface (9) is removed. In the vicinity of the first and second corners (19) and (20), the third
Since the thickness of the resist (27) is large, the shape correction layer (26) remains in this part, and the first and second shape correction parts (21) and (22) are formed. The surface shape of the first and second shape correction portions (21) and (22) is a gently curved surface or slope similar to the surface shape of the third register (27) in that portion.

以後は、前記下部磁性コア(2)上及び前記第1、第2
の形状補正部(21)(22)上に絶縁層(6)を形成
し、該絶縁層(6)上に導体コイル層(3)を形成する
ことにより第8図に示す第2実施例の薄膜磁気ヘッドの
下部磁性コアの後方端部近傍が形成される。
Thereafter, on the lower magnetic core (2) and the first and second
The second embodiment shown in FIG. The vicinity of the rear end of the lower magnetic core of the thin film magnetic head is formed.

上述の第2実施例の薄膜磁気ヘッドでは、下部磁性コア
(2)の後方端部Q口が第1、第2の斜面(10)(1
1)及び第1、第2の形状補正部(21)(22)によ
りなだらかな斜面に形成されており、角部が存在しない
ため、前記後方端部Ωユ上に形成される絶縁層(6)及
び導体コイル層(3)は薄くならず、しかもその部分で
のマイクロクラックの発生がなくなり、前記下部磁性コ
ア(2)と導体コイル層(3)との間の絶縁不良、及び
前記導体コイル層(3)の電気的断線は防止される。
In the thin film magnetic head of the second embodiment described above, the rear end Q opening of the lower magnetic core (2) has the first and second slopes (10) (1
1) and the first and second shape correction portions (21) and (22), the insulating layer (6 ) and the conductor coil layer (3) are not thinned, and microcracks do not occur in those areas, resulting in poor insulation between the lower magnetic core (2) and the conductor coil layer (3), and the conductor coil. Electrical disconnection of layer (3) is prevented.

尚、上述の第2実施例では、下部磁性コア(2)の後方
端部上を2段構造で形成したが、第16図に示すように
1段構造でも上述と同様の効果を得ることが出来る。
In the second embodiment described above, a two-stage structure is formed on the rear end of the lower magnetic core (2), but as shown in FIG. 16, the same effect as described above can also be obtained with a single-stage structure. I can do it.

(ト)発明の効果 本発明に依れば、下部磁性コアの後方端部での絶縁層及
び導体コイル層の薄化、更には応力集中による絶縁不良
、断線不良等を防止した薄膜磁気ヘッドを提供し得る。
(G) Effects of the Invention According to the present invention, a thin-film magnetic head is provided which prevents thinning of the insulating layer and conductive coil layer at the rear end of the lower magnetic core, and also prevents insulation defects and disconnection defects due to stress concentration. can be provided.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図乃至第7図は本発明の第1実施例に係り、第1図
は薄膜磁気ヘッドの上面図、第2図は第1図のB−B’
断面図、第3図、第4図、第5図、第6図及び第7図は
夫々薄膜磁気ヘッドの製造方法を示す要部断面図である
。第8図乃至第16図は本発明の第2実施例に係り、第
8図は薄膜磁気ヘッドの要部断面図、第9図、第10図
、第11図、第12図、第13図、第14図及び第15
図は夫々薄膜磁気ヘッドの製造方法を示す要部断面図、
第16図は薄膜磁気ヘッドの要部断面図である。第17
図は下部磁性コアの配置パターンを示す図である。第1
8図乃至第20図は従来例に係り、第18図は薄膜磁気
ヘッドの上面図、第19図は第18図のA−A’断面図
、第20図はマイクロクラックを示す図である。 (1)・・・基板、(1a)・・・上面、(2)・・・
下部磁性コア、(2a)・・・上面、(3)・・・導体
コイル層、(4)・・・上部磁性コア、(5)・・・電
極部、(6)・・・絶縁層、いユ・・・後方端部、(9
)・・・中間平坦面、(10)・・・第1の斜面、(1
1)・・・第2の斜面、(19)・・・第1の隅部、(
20)・・・第2の隅部、(21)・・・第1の形状補
正部、(22)・・・第2の形状補正部。
1 to 7 relate to a first embodiment of the present invention, in which FIG. 1 is a top view of a thin film magnetic head, and FIG. 2 is taken along line BB' in FIG. 1.
3, FIG. 4, FIG. 5, FIG. 6, and FIG. 7 are cross-sectional views of essential parts showing a method of manufacturing a thin film magnetic head, respectively. 8 to 16 relate to a second embodiment of the present invention, in which FIG. 8 is a cross-sectional view of the main part of a thin film magnetic head, FIG. 9, FIG. 10, FIG. 11, FIG. 12, and FIG. 13. , Figures 14 and 15
The figures are a cross-sectional view of main parts showing the manufacturing method of a thin-film magnetic head, and
FIG. 16 is a sectional view of the main part of the thin film magnetic head. 17th
The figure is a diagram showing an arrangement pattern of the lower magnetic core. 1st
8 to 20 relate to a conventional example, FIG. 18 is a top view of a thin film magnetic head, FIG. 19 is a sectional view taken along line AA' in FIG. 18, and FIG. 20 is a diagram showing microcracks. (1)...Substrate, (1a)...Top surface, (2)...
Lower magnetic core, (2a)...upper surface, (3)...conductor coil layer, (4)...upper magnetic core, (5)...electrode portion, (6)...insulating layer, Iyu... Rear end, (9
)...Intermediate flat surface, (10)...First slope, (1
1)...Second slope, (19)...First corner, (
20)...Second corner, (21)...First shape correction section, (22)...Second shape correction section.

Claims (4)

【特許請求の範囲】[Claims] (1)基板上に下部磁性コア、導体コイル層及び上部磁
性コアを夫々絶縁薄膜を介して順次積層形成し、前記基
板の前記下部磁性コアより後方側に位置する下部磁性コ
ア未形成部分に前記導体コイル層に連結する電極部を絶
縁層を介して形成した薄膜磁気ヘッドにおいて、前記下
部磁性コアの後方端部が中間平坦面を有する多段構造で
あり、前記後方端部上に前記絶縁層及び導体コイル層を
被着形成したことを特徴とする薄膜磁気ヘッド。
(1) A lower magnetic core, a conductor coil layer, and an upper magnetic core are sequentially laminated on a substrate with an insulating thin film interposed therebetween, and the lower magnetic core is not formed on a portion of the substrate located on the rear side of the lower magnetic core. In a thin film magnetic head in which an electrode portion connected to a conductive coil layer is formed via an insulating layer, the rear end of the lower magnetic core has a multi-stage structure having a flat intermediate surface, and the insulating layer and the insulating layer are disposed on the rear end. A thin film magnetic head characterized by having a conductive coil layer deposited thereon.
(2)前記下部磁性コアの後方端部において、前記下部
磁性コアの上面と前記中間平坦面との間及び前記中間平
坦面と前記基板上面との間のうち少なくとも一方をなだ
らかな斜面で形成したことを特徴とする請求項(1)記
載の薄膜磁気ヘッド。
(2) At the rear end of the lower magnetic core, at least one of between the upper surface of the lower magnetic core and the intermediate flat surface and between the intermediate flat surface and the upper surface of the substrate is formed with a gentle slope. A thin film magnetic head according to claim 1, characterized in that:
(3)基板上に下部磁性コア、導体コイル層及び上部磁
性コアを夫々絶縁薄膜を介して順次積層形成し、前記基
板の前記下部磁性コアより後方側に位置する下部磁性コ
ア未形成部分に前記導体コイル層に連結する電極部を絶
縁層を介して形成した薄膜磁気ヘッドにおいて、前記下
部磁性コアの後方端部の隅部に表面形状が前記隅部に比
べてなだらかである形状補正部を形成し、前記下部磁性
コア上及び前記形状補正部上に絶縁層及び導体コイル層
を被着形成したことを特徴とする薄膜磁気ヘッド。
(3) A lower magnetic core, a conductive coil layer, and an upper magnetic core are sequentially laminated on a substrate with an insulating thin film interposed therebetween, and the lower magnetic core is not formed on a portion of the substrate located on the rear side of the lower magnetic core. In a thin film magnetic head in which an electrode portion connected to a conductor coil layer is formed via an insulating layer, a shape correction portion whose surface shape is gentler than that of the corner portion is formed at a rear end corner of the lower magnetic core. A thin film magnetic head characterized in that an insulating layer and a conductive coil layer are formed on the lower magnetic core and the shape correction section.
(4)前記下部磁性コアの後方端部の角部をなだらかな
斜面で形成したことを特徴とする請求項(3)記載の薄
膜磁気ヘッド。
(4) The thin film magnetic head according to claim (3), wherein a corner of the rear end of the lower magnetic core is formed with a gentle slope.
JP2085309A 1989-08-24 1990-03-30 Thin film magnetic head Expired - Lifetime JP2584332B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2085309A JP2584332B2 (en) 1989-08-24 1990-03-30 Thin film magnetic head

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP21789989 1989-08-24
JP1-217899 1989-08-24
JP2085309A JP2584332B2 (en) 1989-08-24 1990-03-30 Thin film magnetic head

Publications (2)

Publication Number Publication Date
JPH03156712A true JPH03156712A (en) 1991-07-04
JP2584332B2 JP2584332B2 (en) 1997-02-26

Family

ID=26426328

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04221411A (en) * 1990-12-21 1992-08-11 Nec Ibaraki Ltd Thin film magnetic head and its manufacture
JPH0757419A (en) * 1993-08-20 1995-03-03 Nec Corp Floating head slider and its production
US5555147A (en) * 1992-04-20 1996-09-10 Nec Corporation MR/inductive combined thin film magnetic head capable of reducing occurrence of a short circuit

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50142214A (en) * 1974-05-02 1975-11-15
JPS50146315A (en) * 1974-05-15 1975-11-25
JPS6254810A (en) * 1985-09-03 1987-03-10 Hitachi Ltd Thin film magnetic head
JPS6479285A (en) * 1987-09-21 1989-03-24 Komatsu Mfg Co Ltd Sealing material
JPH0386911A (en) * 1989-08-29 1991-04-11 Tdk Corp Thin-film magnetic head and production thereof

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50142214A (en) * 1974-05-02 1975-11-15
JPS50146315A (en) * 1974-05-15 1975-11-25
JPS6254810A (en) * 1985-09-03 1987-03-10 Hitachi Ltd Thin film magnetic head
JPS6479285A (en) * 1987-09-21 1989-03-24 Komatsu Mfg Co Ltd Sealing material
JPH0386911A (en) * 1989-08-29 1991-04-11 Tdk Corp Thin-film magnetic head and production thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04221411A (en) * 1990-12-21 1992-08-11 Nec Ibaraki Ltd Thin film magnetic head and its manufacture
US5555147A (en) * 1992-04-20 1996-09-10 Nec Corporation MR/inductive combined thin film magnetic head capable of reducing occurrence of a short circuit
JPH0757419A (en) * 1993-08-20 1995-03-03 Nec Corp Floating head slider and its production

Also Published As

Publication number Publication date
JP2584332B2 (en) 1997-02-26

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