JPH031439U - - Google Patents

Info

Publication number
JPH031439U
JPH031439U JP5909089U JP5909089U JPH031439U JP H031439 U JPH031439 U JP H031439U JP 5909089 U JP5909089 U JP 5909089U JP 5909089 U JP5909089 U JP 5909089U JP H031439 U JPH031439 U JP H031439U
Authority
JP
Japan
Prior art keywords
outer periphery
defect detection
conductive line
defect
semiconductor chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5909089U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5909089U priority Critical patent/JPH031439U/ja
Publication of JPH031439U publication Critical patent/JPH031439U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP5909089U 1989-05-24 1989-05-24 Pending JPH031439U (pt-PT)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5909089U JPH031439U (pt-PT) 1989-05-24 1989-05-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5909089U JPH031439U (pt-PT) 1989-05-24 1989-05-24

Publications (1)

Publication Number Publication Date
JPH031439U true JPH031439U (pt-PT) 1991-01-09

Family

ID=31585287

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5909089U Pending JPH031439U (pt-PT) 1989-05-24 1989-05-24

Country Status (1)

Country Link
JP (1) JPH031439U (pt-PT)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000026965A1 (fr) * 1998-10-30 2000-05-11 Hitachi, Ltd. Dispositif a circuit integre a semi-conducteur et carte a circuit integre
WO2008004414A1 (en) * 2006-07-07 2008-01-10 Sharp Kabushiki Kaisha Semiconductor device having defect detecting function
JP2009290132A (ja) * 2008-05-30 2009-12-10 Oki Semiconductor Co Ltd 半導体装置及び半導体チップのクラック検出方法
JP2012007978A (ja) * 2010-06-24 2012-01-12 On Semiconductor Trading Ltd 半導体集積回路
JP2013125753A (ja) * 2011-12-13 2013-06-24 Semiconductor Components Industries Llc 半導体集積回路

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000026965A1 (fr) * 1998-10-30 2000-05-11 Hitachi, Ltd. Dispositif a circuit integre a semi-conducteur et carte a circuit integre
WO2008004414A1 (en) * 2006-07-07 2008-01-10 Sharp Kabushiki Kaisha Semiconductor device having defect detecting function
JP2009290132A (ja) * 2008-05-30 2009-12-10 Oki Semiconductor Co Ltd 半導体装置及び半導体チップのクラック検出方法
JP2012007978A (ja) * 2010-06-24 2012-01-12 On Semiconductor Trading Ltd 半導体集積回路
JP2013125753A (ja) * 2011-12-13 2013-06-24 Semiconductor Components Industries Llc 半導体集積回路

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