JPH03131811A - Confocal scanning type transmission microscope - Google Patents

Confocal scanning type transmission microscope

Info

Publication number
JPH03131811A
JPH03131811A JP26933189A JP26933189A JPH03131811A JP H03131811 A JPH03131811 A JP H03131811A JP 26933189 A JP26933189 A JP 26933189A JP 26933189 A JP26933189 A JP 26933189A JP H03131811 A JPH03131811 A JP H03131811A
Authority
JP
Japan
Prior art keywords
light
sample
photodetector
illumination light
optical system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26933189A
Other languages
Japanese (ja)
Inventor
Kazuo Hakamata
和男 袴田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP26933189A priority Critical patent/JPH03131811A/en
Publication of JPH03131811A publication Critical patent/JPH03131811A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To eliminate the need for the scanning mechanism of a photodetector and to simplify the structure by scanning a sample in two dimensions and detecting light which is transmitted through the sample while the photodetector is fixed. CONSTITUTION:Luminous flux which is reflected by a corner cube prism 23 is deflected by an optical deflecting means 14 in exactly the same way with illumination light 11 and the light passed through this optical deflecting means 14 travels along the same optical path with illumination light 11 before deflection. Luminous flux 11' branching from the illumination optical path is made incident on an invariably constant position without reference to the deflection of the illumination light 11, so the fixed photodetector 27 detects the luminous flux. Thus, the majority of the optical system which converges the luminous flux transmitted through the sample 20 and guides it to the photodetector 27 is common to a sent light optical system and only an optical branching means such as a half-mirror 13 and a condenser lens 25 need to be provided separately. Consequently, the constitution of the optical system is simplified.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は共焦点走査型顕微鏡、特に詳細には試料を透過
した光を検出する透過型の共焦点走査型顕微鏡に関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a confocal scanning microscope, and more particularly to a transmission type confocal scanning microscope that detects light transmitted through a sample.

(従来の技術) 従来より、照明光を微小な光点に収束させ、この光点を
試料上において2次元的に走査させ、その際該試料を透
過した光あるいはそこで反射した光を光検出器で検出し
て、試料の拡大像を担持する電気信号を得るようにした
光学式走査型顕微鏡が公知となっている。
(Prior Art) Conventionally, illumination light is converged into a minute light spot, and this light spot is scanned two-dimensionally on a sample, and at that time, the light that has passed through the sample or the light that has been reflected there is detected by a photodetector. Optical scanning microscopes are known that detect electrical signals that carry an enlarged image of a sample.

なかでも、照明光を光源から発生させた上で試料上にお
いて光点に結像させる一方、この試料からの光束を再度
点像に結像させてそれを光検出器で検出するように構成
した共焦点走査型顕微鏡は、試料面上にピンホールを配
する必要が無く、実現容易となっている。
In particular, it is configured to generate illumination light from a light source and image it into a light spot on the sample, and then re-image the light flux from the sample into a point image, which is then detected by a photodetector. A confocal scanning microscope does not require a pinhole on the sample surface, making it easy to implement.

この共焦点走査型顕微鏡は基本的に、 照明光を発する光源と、 試料が載置される試料台と、 この照明光を試料上において微小な光点として結像させ
る送光光学系と、 上記試料からの光束を集光して点像に結像させる受光光
学系と、 この点像を検出する光検出器と、 上記光点を試料上において2次元的に走査させる走査機
構とから構成されるものである。
This confocal scanning microscope basically includes a light source that emits illumination light, a sample stage on which a sample is placed, a light transmission optical system that images this illumination light as a minute light spot on the sample, and the above-mentioned. It consists of a light receiving optical system that condenses the light beam from the sample and forms it into a point image, a photodetector that detects this point image, and a scanning mechanism that scans the light spot two-dimensionally on the sample. It is something that

この共焦点走査型顕微鏡には、試料で反射した光を検出
する反射型のものと、試料を透過した光を検出する透過
型のものがある。なお特開昭82−209510号およ
び同[f3−308414号公報には、この透過型の共
焦点走査型顕微鏡の一例が示されている。
There are two types of confocal scanning microscopes: a reflective type that detects light reflected by a sample, and a transmission type that detects light that has passed through the sample. Incidentally, Japanese Patent Laid-Open Nos. 82-209510 and 1982-308414 disclose an example of this transmission type confocal scanning microscope.

(発明が解決しようとする課題) 従来の共焦点走査型顕微鏡においては、上記走査機構と
して、 ■試料台を2次元的に移動させる機構、あるいは■照明
光ビームを光偏向器によって2次元的に偏向させる機構
が用いられていた。
(Problems to be Solved by the Invention) In conventional confocal scanning microscopes, the above-mentioned scanning mechanism includes: ■ a mechanism that moves the sample stage two-dimensionally, or ■ a mechanism that moves the illumination light beam two-dimensionally using an optical deflector. A deflection mechanism was used.

しかし■の機構を採用した場合には、高速走査を行なう
と試料が飛んでしまうという問題が生じていた。
However, when the mechanism (2) was adopted, there was a problem that the sample would fly away when high-speed scanning was performed.

一方、■の機構によれば十分高速の走査が可能であるが
、この機構を前述した透過型の共焦点走査型顕微鏡に適
用する場合は、別の問題が生じる。
On the other hand, although the mechanism (2) allows sufficiently high-speed scanning, another problem arises when this mechanism is applied to the above-mentioned transmission type confocal scanning microscope.

すなわちその場合は照明光が振られるため、試料を透過
した光束の結像位置もそれに応じて変化するので、光検
出器を照明光の偏向と同期させて走査させる必要が生じ
る。このような光検出器の走査機構を設けると、共焦点
走査型顕微鏡の構造は非常に複雑化する。
That is, in that case, since the illumination light is deflected, the imaging position of the light beam transmitted through the sample also changes accordingly, so it is necessary to scan the photodetector in synchronization with the deflection of the illumination light. Providing such a scanning mechanism for the photodetector makes the structure of the confocal scanning microscope extremely complicated.

このような事情に鑑み、例えば前記特開昭62−209
510号公報にも示されるように、照明光を偏向させる
振動ミラーの裏面をも反射面とし、試料を透過した光束
をこの裏面まで導いて、照明光偏向と相殺されるように
反射偏向させ、それにより光検出器の走査を不要にする
提案もなされている。
In view of these circumstances, for example, the above-mentioned Japanese Patent Application Laid-Open No. 62-209
As shown in Publication No. 510, the back surface of the vibrating mirror that deflects the illumination light is also a reflective surface, and the light beam that has passed through the sample is guided to this back surface, and is reflected and deflected so as to cancel out the deflection of the illumination light. There have also been proposals to eliminate the need for photodetector scanning.

しかしながらこのような機構においては、試料を透過し
た光束を振動ミラー裏面に導くために数多くのミラー等
が必要になるので、光学系が非常に複雑化し、その組立
、調整が非常に困難となる。
However, in such a mechanism, a large number of mirrors and the like are required to guide the light beam that has passed through the sample to the back surface of the vibrating mirror, making the optical system extremely complicated and making its assembly and adjustment extremely difficult.

本発明は上記のような事情に鑑みてなされたものであり
、光検出器を走査させる必要がなく、シかも光学系の構
成が簡単な、透過型の共焦点走査型顕微鏡を提供するこ
とを目的とするものである。
The present invention has been made in view of the above-mentioned circumstances, and an object of the present invention is to provide a transmission type confocal scanning microscope that does not require scanning a photodetector and has a simple optical system configuration. This is the purpose.

(課題を解決するための手段) 本発明による透過型の共焦点走査型顕微鏡は、先に述べ
たような試料台と、光源と、送光光学系と、光検出器と
、光点の2次元走査機構とを備えた共焦点走査型顕微鏡
において、 上記2次元走査機構として、照明光を偏向させる光偏向
手段を用いた上で、 試料を透過した光束が入射する位置に配されて該光束を
、その入射経路と同じ経路を辿るように反射させるコー
ナーキューブプリズムと、この反射した光束を、上記光
偏向手段よりも光源側の位置において、照明光の光路か
ら分岐させるハーフミラ−等の光分岐手段と、 この分岐された光束を集光して点像に結像させる集光レ
ンズとを設け、 光検出器は、この集光レンズで結像された上記点像を検
出するように配置したことを特徴とするものである。
(Means for Solving the Problems) A transmission type confocal scanning microscope according to the present invention includes the above-mentioned sample stage, light source, light transmission optical system, photodetector, and two light points. In a confocal scanning microscope equipped with a dimensional scanning mechanism, the two-dimensional scanning mechanism uses a light deflecting means that deflects the illumination light, and is arranged at a position where the light beam transmitted through the sample is incident, so that the light beam is a corner cube prism that reflects the light along the same path as its incident path, and a light branching device such as a half mirror that branches the reflected light beam from the optical path of the illumination light at a position closer to the light source than the light deflection means. and a condensing lens for condensing the branched light beam to form a point image, and a photodetector was arranged to detect the point image formed by the condensing lens. It is characterized by this.

(作  用) 上記の構成において、コーナーキューブプリズムで反射
した光束は、光偏向手段において照明光と全く同じよう
に偏向されるので、この光偏向手段を通過した後は、偏
向前の照明光と同一の光路を進むことになる。したがっ
て、この照明光光路から分岐された光束は、照明光の偏
向に係りなく常に一定位置に入射するので、固定の光検
出器により該光束を検出可能となる。
(Function) In the above configuration, the light beam reflected by the corner cube prism is deflected by the light deflection means in exactly the same way as the illumination light, so after passing through this light deflection means, it is the same as the illumination light before deflection. They will proceed along the same optical path. Therefore, the light beam branched from this illumination light optical path always enters a fixed position regardless of the polarization of the illumination light, so that the light beam can be detected by a fixed photodetector.

そして試料を透過した光束を集光して光検出器に導く受
光光学系は、大部分が送光光学系と共通化され、別途設
けるのは上記ハーフミラ−等の光分岐手段と集光レンズ
のみで済むから、光学系の構成が非常に簡単となる。
Most of the light receiving optical system that condenses the light beam that has passed through the sample and guides it to the photodetector is shared with the light transmitting optical system, and only the light branching means such as the above-mentioned half mirror and the condensing lens are separately provided. The configuration of the optical system becomes extremely simple.

(実 施 例) 以下、図面に示す実施例に基づいて本発明の詳細な説明
する。
(Example) Hereinafter, the present invention will be described in detail based on an example shown in the drawings.

図は、本発明の一実施例による透過型の共焦点走査型顕
微鏡を示すものである。図示されるようにレーザ光源1
0から射出された平行光であるレーザビーム(照明光)
 11は、ビームエキスパンダ12によりビーム径が拡
大され、ハーフミラ−13を透過して、AOD (音響
光学光偏向器) 14に入射する。照明光11はこのA
 OD 14により、紙面とほぼ直交する向きに偏向さ
れ、収差補正のためのリレーレンズ15を通過して、振
動ミラー16に入射する。
The figure shows a transmission type confocal scanning microscope according to an embodiment of the present invention. Laser light source 1 as shown
Laser beam (illumination light) which is parallel light emitted from 0
The beam diameter of the beam 11 is expanded by a beam expander 12 , passes through a half mirror 13 , and enters an AOD (acousto-optic optical deflector) 14 . The illumination light 11 is this A
The beam is deflected by the OD 14 in a direction substantially perpendicular to the plane of the paper, passes through a relay lens 15 for aberration correction, and enters a vibrating mirror 16.

振動ミラー16は図中矢印A方向に揺動し、それにより
照明光11は、上記偏向の方向とほぼ直交する方向に偏
向される。
The vibrating mirror 16 swings in the direction of arrow A in the figure, thereby deflecting the illumination light 11 in a direction substantially perpendicular to the direction of deflection described above.

偏向されたこの照明光11は、リレーレンズ17を通っ
て対物レンズ18に入射し、該対物レンズ18により、
試料20上(表面あるいは内部)において微小な光点P
に結像せしめられる。なおこの試料2゜が載置される試
料台19は、移動機構21により矢印Z方向、すなわち
対物レンズ18の光軸方向に移動されるようになってい
る。
This deflected illumination light 11 passes through the relay lens 17 and enters the objective lens 18, and the objective lens 18
A minute light spot P on the sample 20 (on the surface or inside)
image is formed. The sample stage 19 on which the sample 2° is placed is moved by a moving mechanism 21 in the direction of arrow Z, that is, in the optical axis direction of the objective lens 18.

試料20を透過した透過光11’ の光束は、対物レン
ズ22によって平行光とされ、次いでコーナーキューブ
プリズム23に入射する。透過光11′ はこのコーナ
ーキューブプリズム23により、そこへの入射経路と同
じ経路を辿るように反射され、対物レンズ22により再
度試料2o上において焦点を結び、対物レンズ18によ
り平行光とされる。平行光とされたこの透過光11’ 
は、リレーレンズ17、振動ミラー1B、!JL/−L
/ンズ15、A OD 14と、照明光11と共通の光
路を反対方向に進み、ハーフミラ−13に入射する。透
過光11’ はこのハーフミラ−13により照明光11
の光路から分岐され、リレーレンズ24を通過して、集
光レンズ25により点像Qに結像せしめられる。
A beam of transmitted light 11' that has passed through the sample 20 is converted into parallel light by an objective lens 22, and then enters a corner cube prism 23. The transmitted light 11' is reflected by the corner cube prism 23 so as to follow the same path of incidence thereon, focused again on the sample 2o by the objective lens 22, and converted into parallel light by the objective lens 18. This transmitted light 11' which has been made into parallel light
, relay lens 17, vibrating mirror 1B,! JL/-L
/ lens 15, AOD 14, and the illumination light 11, it travels in the opposite direction along the common optical path and enters the half mirror 13. The transmitted light 11' is converted into illumination light 11 by this half mirror 13.
It is branched from the optical path of , passes through the relay lens 24 , and is focused into a point image Q by the condensing lens 25 .

AOD14よりもレーザ光源1a側に配されたハーフミ
ラ−13の部分においては、勿論照明光11は偏向され
ておらず、また透過光11° も偏向されていない。し
たがってこの点像Qは、照明光11の偏向に応じて動い
てしまうことがない。この点像Qは、ピンホール板2B
を介して、光検出器27によって検出される。この光検
出器27としては例えばフォトダイオード、光電子増倍
管等が用いられ、該光検出器27からは上記点像Qの明
るさを示す信号Sが出力される。
Of course, in the portion of the half mirror 13 disposed closer to the laser light source 1a than the AOD 14, the illumination light 11 is not deflected, and the transmitted light 11° is not deflected either. Therefore, this point image Q does not move in response to the deflection of the illumination light 11. This point image Q is the pinhole plate 2B
The light is detected by the photodetector 27 via the photodetector 27. For example, a photodiode, a photomultiplier tube, or the like is used as the photodetector 27, and a signal S indicating the brightness of the point image Q is outputted from the photodetector 27.

先に述べた通り、試料20を照射する照明光11はA 
OD 14によって偏向されているので、光点Pは試料
20上をX方向に主走査し、それとともに照明光11が
振動ミラー16によって偏向されているので、光点Pは
試料20上を上記主走査の方向とほぼ直交するY方向に
副走査する。
As mentioned earlier, the illumination light 11 that irradiates the sample 20 is A
Since it is deflected by the OD 14, the light spot P scans the sample 20 in the X direction, and at the same time, since the illumination light 11 is deflected by the vibrating mirror 16, the light spot P scans the sample 20 in the main direction. Sub-scanning is performed in the Y direction, which is approximately perpendicular to the scanning direction.

以上のようにして光点Pが試料20上を2次元的に走査
することにより、光検出器27からは、該試料20の2
次元像を担持する時系列の信号Sが出力される。この信
号Sは、例えば所定周期毎に積分する等により、画素分
割された信号とされる。
As the light spot P scans the sample 20 two-dimensionally in the above manner, the photodetector 27 detects two points on the sample 20.
A time-series signal S carrying a dimensional image is output. This signal S is made into a pixel-divided signal by, for example, integrating at every predetermined period.

また本実施例においては試料台19が、移動機構21に
より、主、副走査方向X1Yと直交する矢市Z方向に移
動される。こうして試料20をZ方向に所定距離移動さ
せる毎に前記光点Pの2次元走査を行なえば、合焦点面
の情報のみが光検出器27によって検出される。そこで
、この光検出器27の出力Sをフレームメモリに取り込
むことにより、試料20をZ方向に移動させた範囲内で
、全ての面に焦点が合った画像を担う信号を得ることが
可能となる。
Further, in this embodiment, the sample stage 19 is moved by the moving mechanism 21 in the Z direction perpendicular to the main and sub-scanning directions X1Y. If the light spot P is two-dimensionally scanned each time the sample 20 is moved a predetermined distance in the Z direction in this manner, only information on the focused plane is detected by the photodetector 27. Therefore, by importing the output S of the photodetector 27 into the frame memory, it becomes possible to obtain a signal that represents an image in focus on all surfaces within the range in which the sample 20 is moved in the Z direction. .

なお照明光11を偏向させる光偏向手段としては、以上
説明したAOD14と振動ミラー16に限らず、その他
の公知のもの、例えばガルバノメータミラーやポリゴン
ミラー、さらにはEOD (電気光学光偏向器)等が用
いられてもよい。
Note that the light deflection means for deflecting the illumination light 11 is not limited to the AOD 14 and the vibrating mirror 16 described above, but may also include other known means such as a galvanometer mirror, a polygon mirror, and even an EOD (electro-optic light deflector). may be used.

また、以上述べた実施例の共焦点走査型顕微鏡は、モノ
クロの顕微鏡像を得るものであるが、本発明は、従来か
ら知られているカラー画像を得る共焦点走査型顕微鏡に
対して適用することも勿論可能である。
Furthermore, although the confocal scanning microscope of the embodiments described above is for obtaining monochrome microscopic images, the present invention is applicable to conventionally known confocal scanning microscopes for obtaining color images. Of course, this is also possible.

(発明の効果) 以上詳細に説明した通り本発明の共焦点走査型透過顕微
鏡は、試料上を2次元走査してそこを透過した光を、光
検出器を固定したまま検出できる構成となっているので
、光検出器の走査機構が不要で構造が簡素化されうる。
(Effects of the Invention) As explained in detail above, the confocal scanning transmission microscope of the present invention is configured to scan two-dimensionally over a sample and detect the light transmitted therethrough, with the photodetector fixed. Since there is no need for a scanning mechanism for the photodetector, the structure can be simplified.

その上本発明の共焦点走査型透過顕微鏡は、上記試料を
透過した透過光を光検出器まで導く受光光学系の大部分
が送光光学系と兼用されているので、振動ミラーの裏面
に上記透過光を導くように構成された従来の共焦点走査
型顕微鏡に比べれば、光学系が大幅に簡素化され、その
ために組立、調整作業も容易となって、大幅なコスト低
減が実現される。
Furthermore, in the confocal scanning transmission microscope of the present invention, most of the light receiving optical system that guides the transmitted light transmitted through the sample to the photodetector is also used as the light transmitting optical system. Compared to conventional confocal scanning microscopes configured to guide transmitted light, the optical system is significantly simplified, which simplifies assembly and adjustment operations, resulting in significant cost reductions.

【図面の簡単な説明】[Brief explanation of the drawing]

図は、本発明の一実施例による共焦点走査型顕微鏡を示
す概略側面図である。 lO・・・レーザ光源   11・・・照明光11°・
・・透過光    13・・・ハーフミラ−14・・・
AOD      15.17.24・・・リレーレン
ズ16・・・振動ミラー   18.22・・・対物レ
ンズ19・・・試料台     20・・・試料23・
・・コーナーキューブプリズム
The figure is a schematic side view showing a confocal scanning microscope according to an embodiment of the present invention. lO... Laser light source 11... Illumination light 11°.
...Transmitted light 13...Half mirror 14...
AOD 15.17.24... Relay lens 16... Vibrating mirror 18.22... Objective lens 19... Sample stage 20... Sample 23.
・Corner cube prism

Claims (1)

【特許請求の範囲】 試料が載置される試料台と、 照明光を発する光源と、 この照明光を試料上において微小な光点として結像させ
る送光光学系と、 前記照明光を偏向して前記光点を試料上において2次元
走査させる光偏向手段と、 前記試料を透過した光束が入射する位置に配されて該光
束を、その入射経路と同じ経路を辿るように反射させる
コーナーキューブプリズムと、この反射した光束を、前
記光偏向手段よりも前記光源側の位置において、照明光
の光路から分岐させる光分岐手段と、 この分岐された光束を集光して点像に結像させる集光レ
ンズと、 この点像を検出する光検出器とからなる共焦点走査型透
過顕微鏡。
[Scope of Claims] A sample stage on which a sample is placed, a light source that emits illumination light, a light transmission optical system that images the illumination light as a minute light spot on the sample, and a light transmission optical system that deflects the illumination light. a corner cube prism that is arranged at a position where the light beam transmitted through the sample is incident and reflects the light beam so as to follow the same path as the incident path; a light branching means for branching the reflected light flux from the optical path of the illumination light at a position closer to the light source than the light deflection means; and a condenser for condensing the branched light flux to form a point image. A confocal scanning transmission microscope consists of an optical lens and a photodetector that detects this point image.
JP26933189A 1989-10-17 1989-10-17 Confocal scanning type transmission microscope Pending JPH03131811A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26933189A JPH03131811A (en) 1989-10-17 1989-10-17 Confocal scanning type transmission microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26933189A JPH03131811A (en) 1989-10-17 1989-10-17 Confocal scanning type transmission microscope

Publications (1)

Publication Number Publication Date
JPH03131811A true JPH03131811A (en) 1991-06-05

Family

ID=17470875

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26933189A Pending JPH03131811A (en) 1989-10-17 1989-10-17 Confocal scanning type transmission microscope

Country Status (1)

Country Link
JP (1) JPH03131811A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03188408A (en) * 1989-12-18 1991-08-16 Olympus Optical Co Ltd Scanning type optical microscope
JPH0618785A (en) * 1990-06-15 1994-01-28 Hamamatsu Photonics Kk Confocal type laser scanning transmission microscope
JP2017521722A (en) * 2014-07-21 2017-08-03 ライカ マイクロシステムズ シーエムエス ゲゼルシャフト ミット ベシュレンクテル ハフツングLeica Microsystems CMS GmbH A microscope with a correction unit that corrects changing spherical aberration

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03188408A (en) * 1989-12-18 1991-08-16 Olympus Optical Co Ltd Scanning type optical microscope
JPH0618785A (en) * 1990-06-15 1994-01-28 Hamamatsu Photonics Kk Confocal type laser scanning transmission microscope
JP2017521722A (en) * 2014-07-21 2017-08-03 ライカ マイクロシステムズ シーエムエス ゲゼルシャフト ミット ベシュレンクテル ハフツングLeica Microsystems CMS GmbH A microscope with a correction unit that corrects changing spherical aberration

Similar Documents

Publication Publication Date Title
US4893008A (en) Scanning optical microscope
US5035476A (en) Confocal laser scanning transmission microscope
US4863226A (en) Confocal laser scanning microscope
EP0418928B1 (en) Scanning microscope and scanning mechanism for the same
US5260569A (en) Scanning microscope and scanning mechanism
JP2002228934A (en) Scanning microscope
JPS63765B2 (en)
JP2004509360A (en) Arrangement configuration for confocal autofocusing
JPH03148616A (en) Scanning type microscope
JP5495740B2 (en) Confocal scanning microscope
JPH03131811A (en) Confocal scanning type transmission microscope
JPH05288992A (en) Transmission type microscope
JPH10142507A (en) Laser scanning microscope
JPS607764B2 (en) Scanning photodetector
JPH05224127A (en) Confocal scanning type differential interfere microscope
EP0718656B1 (en) Transmission type confocal laser microscope
JPH03172815A (en) Cofocus scanning type microscope
JPH0760217B2 (en) Transmission microscope
JPH03134609A (en) Laser scanning type microscope
JP2613130B2 (en) Confocal scanning phase contrast microscope
JPH1195114A (en) Scanning optical microscope device
JPH04175713A (en) Scanning type optical microscope
JPH03134607A (en) Confocal scanning type microscope
JPH11142335A (en) Microscope
JP2608483B2 (en) Confocal scanning microscope